一种基于机器视觉的漆包线表面缺陷检测与分类方法

By combining frequency domain analysis and phase sampling with convolutional neural network parameterization, the problem of misjudgment of surface scratches on enameled wires was solved, achieving high-precision defect detection and classification, reducing the false detection rate and improving the stability and adaptability of detection.

CN121304647BActive Publication Date: 2026-07-17SHANDONG HUAWU ELECTRIC CO LTD

Patent Information

Authority / Receiving Office
CN · China
Patent Type
Patents(China)
Current Assignee / Owner
SHANDONG HUAWU ELECTRIC CO LTD
Filing Date
2025-11-24
Publication Date
2026-07-17

AI Technical Summary

Technical Problem

Existing image analysis methods struggle to distinguish between genuine spiral scratches and pseudo-stripe signals on the surface of enameled wires in high-speed sampling environments, resulting in a high misjudgment rate. Furthermore, convolutional neural networks have difficulty generalizing to different line speeds, exposure times, or variations in wire spin angular velocity.

Method used

By acquiring single-pixel time series of line scan images, performing frequency domain transformation to determine the main peak index, calculating the helical bispectral locking degree, performing phase sampling and convolutional neural network parameterization based on the helical bispectral locking degree, optimizing the training process, and using the power function of the helical bispectral locking degree as sample weights, high-precision automatic identification and classification of surface defects of enameled wire can be achieved.

Benefits of technology

It achieves high-precision automatic identification and classification of real defects on the surface of enameled wire under different line speeds, exposure and lighting conditions, reducing the false detection rate and maintaining the stability and versatility of the detection.

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Abstract

本发明涉及机器视觉技术领域,公开了一种基于机器视觉的漆包线表面缺陷检测与分类方法,包括:首先采集线扫图像,提取固定横向位置的单像素时间序列,经窗处理后进行频域变换,在零频至奈奎斯特频率范围内依据功率谱确定主峰位置;以主峰为基准计算螺旋双谱锁定度;根据该锁定度确定相位采样分辨率,对单像素及相邻像素时间序列进行相位重采样,生成相位对齐的二维图块;再以螺旋双谱锁定度对卷积神经网络各层通道增益和通道偏置进行参数化,将二维图块输入网络得到缺陷概率;以螺旋双谱锁定度的幂函数作为样本权重,优化二元交叉熵损失函数;对同一轴向区段的多个缺陷概率取算术平均值,当平均值达到或超过预设阈值时判定为有缺陷。
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