Apparatus and method for optically characterizing textile samples

Abstract

An apparatus (100) for optically characterizing a textile sample (106) includes a display subsystem (102) including a viewing window (108). The radiation subsystem (114) comprises a radiation source (120) for directing the first, ultraviolet radiation (122) and the second, visible radiation (123) towards the sample (106) and causing the sample (106) to generate fluorescent radiation (124) and reflected radiation (125). The sensing subsystem (126) includes an imager (130) for capturing fluorescent radiation (124) and reflected radiation (125) in the array of pixels (408). The control subsystem (132) comprises a processor (136) for controlling the display subsystem (102), the radiation subsystem (114), and the sensing subsystem (126), and for creating fluorescent and reflected radiation images (400) containing spectral information and spatial information about the fluorescent radiation (124) and the reflected radiation (125).

Description

Technical Field

[0001] This invention relates to the field of textile characteristic measurement. More specifically, this invention relates to an apparatus and method for optically characterizing textile samples. This invention can be used in both online and offline applications. Background Technology

[0002] Textiles are woven or knitted fabrics made from yarns, but they also include fibers (natural, synthetic, and blended), yarns, or any other products made from these combinations. The final visual perception of a fabric is very important to the end user. Visual perception includes, but is not limited to, pattern, color, and brightness. Brightness is generally defined as a property of visual perception where the source appears to be radiating or reflecting light. For textiles, brightness is a function of reflected light and fluorescent emission. Fluorescent pigments are one way to increase the brightness of a fabric. Fluorescent materials are defined as materials that, after absorbing light or other electromagnetic radiation, emit light radiation of a wavelength that is typically longer than the wavelength of the absorbed electromagnetic radiation. Therefore, fluorescent materials not only reflect incident light but also emit additional light of a longer wavelength. In particular, if the absorbed electromagnetic radiation is in the ultraviolet (UV) range and the emitted light is visible, then the fluorescent material appears brighter.

[0003] Fluorescent pigments fall into at least three main categories: inorganic fluorescent agents, optical brighteners, and solar fluorescent agents. Their main differences lie in their chemical composition and optical characteristics, and consequently, their applications. For example, inorganic fluorescent agents are typically activated by light radiation in the ultraviolet (UV) to visible light (300-420 nm) range, while optical brighteners are activated in the near-ultraviolet (340-400 nm) range, and solar fluorescent agents are activated and emit light in the visible light (400-700 nm) range.

[0004] Fluorescent properties can be imparted to textiles in a variety of ways, such as, but not limited to, (a) coating fabrics with fluorescent materials in resin mixtures, (b) introducing fluorescent materials into fibers during the spinning stage, (c) coating fibers, and (d) finishing textiles or performing household washing with fluorescent materials.

[0005] The quality and application of fluorescent pigments are crucial parameters for maintaining, monitoring, and controlling optimal morphological properties during textile processes. Although these methods have existed for many years, the formulation and quality control of fluorescent material applications have remained challenging, primarily due to a lack of suitable measuring instruments and a limited understanding of fluorescent materials.

[0006] US-2015 / 0131090A1 discloses a multi-angle spectral imaging measurement method and apparatus. It provides an illumination device that emits illumination light from two or more angular directions onto the surface of a sample to be measured, an imaging optical lens, and a monochromatic two-dimensional image sensor. This configuration provides a method and apparatus that captures a two-dimensional image of the sample surface at each measurement wavelength and accurately measures the multi-angle and spectral information of each pixel in the two-dimensional image within a short time. In one embodiment, a fluorescent object is illuminated with monochromatic light, and a spectral light receiver is used to measure the fluorescence color.

[0007] US-2016 / 0258881A1 discloses a method for labeling industrially processed materials. This method involves selectively attaching a luminescent marker to and / or into the industrially processed material in the presence of ambient light. The marker is present in minute quantities insufficient to be optically detected under ambient light, but sufficient for non-destructive optical inspection of the material and / or the material in the field or in situ. The material is irradiated with light of a specific wavelength. When the luminescent marker is present in the material, it emits cold light of a characteristic wavelength. The light emitted by the material is detected by a spectrometer, which may include a CCD chip as a photosensitive element. Summary of the Invention

[0008] One object of the present invention is to more comprehensively characterize textile samples in terms of their optical properties.

[0009] This and other objectives are achieved by the apparatus and method defined in the independent claim. The dependent claims define preferred embodiments.

[0010] According to the present invention, a textile sample is irradiated with both ultraviolet (UV) and visible electromagnetic radiation. The fluorescent radiation emitted due to UV radiation and the reflected visible radiation are both detected and combined to produce a "brightness" measurement. Furthermore, both the fluorescent and reflected radiation are detected by an imager comprising a pixel array. Therefore, the fluorescent radiation, reflected radiation, and their combination carry embedded spatial information. In particular, the resulting brightness image has proven to be very useful for optically characterizing textile samples.

[0011] In this document, the term "brightness" refers to the intensity of both fluorescence and reflected radiation. It is generally accepted that the ultraviolet range of the electromagnetic spectrum encompasses wavelengths between 10 nm and 400 nm, while the visible range encompasses wavelengths between 400 nm and 700 nm.

[0012] An apparatus for optically characterizing textile samples includes a display subsystem with an observation window. A radiation subsystem has a radiation source for guiding a first radiation desired in the ultraviolet range of the electromagnetic spectrum and a second radiation desired in the visible range of the electromagnetic spectrum through the observation window toward the sample, thereby causing the sample to emit fluorescent and reflected radiation. A sensing subsystem has an imager for capturing the fluorescent and reflected radiation in an array of pixels, wherein each pixel records the intensity of both the fluorescent and reflected radiation at its pixel location. A control subsystem has a processor for controlling the display, radiation, and sensing subsystems, and for generating fluorescence and reflected radiation images containing spectral and spatial information about the sample's fluorescence and reflected radiation.

[0013] In some embodiments, the display subsystem further includes a sample press for pressing the sample onto the observation window.

[0014] In some embodiments, the demonstration subsystem further includes a calibration plate for generating fluorescent and reflected radiation with known characteristics in response to radiation with known characteristics.

[0015] In some embodiments, the radiation subsystem further includes optical devices for shaping and / or filtering the first and second radiations from the radiation source to generate the first and / or second radiations.

[0016] In some embodiments, the radiation subsystem further includes detectors for detecting features of the first radiation and / or the second radiation.

[0017] In some embodiments, the radiation source is configured to produce first radiation and second radiation with a desired intensity distribution.

[0018] In some embodiments, the radiation source is configured to generate first radiation and second radiation within discrete radiation ranges.

[0019] In some embodiments, the radiation source is configured to generate a first radiation and a second radiation having an intensity distribution that varies over time.

[0020] In some embodiments, the radiation source is configured to sequentially generate first radiation and second radiation.

[0021] In some embodiments, the radiation source is configured to generate both first and second radiation simultaneously.

[0022] In some embodiments, the radiation source is configured to produce first and second radiation in a time-shifted manner, such that they partially overlap in time.

[0023] In some embodiments, the radiation source is configured to periodically generate first radiation and / or second radiation over time.

[0024] In some embodiments, the pixel array is a two-dimensional array of pixels.

[0025] In some embodiments, the sensing subsystem further includes a variable filter for selectively blocking a portion of the fluorescent radiation and / or reflected radiation from reaching the imager.

[0026] In some embodiments, the control subsystem further includes a machine interface for receiving commands from another instrument and sending information to it.

[0027] In some embodiments, the control subsystem further includes a human-machine interface for receiving commands from the user and sending information to the user.

[0028] In some embodiments, the control subsystem is configured to classify patterns in fluorescent and / or reflected radiation images, including the percentage of fluorescent and / or reflected radiation images represented by each pattern in the patterns.

[0029] In some embodiments, the control subsystem is configured to classify patterns in fluorescent and / or reflected radiation and fluorescent images, including the orientation of each pattern in the patterns, wherein the orientation is at least one of horizontal, vertical and random.

[0030] According to another aspect of the invention, a method for optically characterizing a textile sample is described. The method includes the steps of: displaying the sample on an observation window via a display subsystem; guiding a first radiation required in the ultraviolet range of the electromagnetic spectrum and a second radiation required in the visible light range of the electromagnetic spectrum from a radiation source through the observation window toward the sample, thereby causing the sample to produce fluorescent radiation and reflected radiation; capturing the fluorescent radiation and the reflected radiation with a sensing subsystem including an imager in a pixel array, wherein each pixel records the intensity of both the fluorescent radiation and the reflected radiation at the pixel location; and controlling the display subsystem, the radiation subsystem, and the sensing subsystem via a processor, and generating a fluorescence and reflected radiation image containing both spectral and spatial information regarding the fluorescent radiation and the reflected radiation of the sample.

[0031] Some embodiments also include using a press to press the sample onto the observation window.

[0032] Some embodiments also include using optics to shape and / or filter the first and second radiations from the radiation source before the first and / or second radiations reach the sample.

[0033] Some embodiments also include using a detector to detect the characteristics of the first radiation and / or the second radiation.

[0034] Some embodiments also include generating first radiation and / or second radiation with a desired intensity distribution.

[0035] Some embodiments also include generating first and second radiation within discrete radiation ranges.

[0036] Some embodiments also include first and second radiation generated with an intensity distribution that varies over time.

[0037] Some embodiments also include generating the first radiation and the second radiation sequentially.

[0038] Some embodiments also include the simultaneous generation of first radiation and second radiation.

[0039] Some embodiments also include generating the first and second radiations in a time-shifted manner, such that they partially overlap in time.

[0040] Some embodiments also include generating first radiation and / or second radiation periodically over time.

[0041] Some embodiments also include selectively blocking fluorescent radiation and reflected radiation from reaching the imager, respectively.

[0042] Some embodiments also include classifying patterns in fluorescent and / or reflected radiation images, including the percentage of fluorescent and / or reflected radiation images represented individually by one of each pattern.

[0043] Some embodiments also include classifying patterns in fluorescent and / or reflected radiation images, including the orientation of each pattern, wherein the orientation is at least one of horizontal, vertical, and random. Attached Figure Description

[0044] Other advantages of the invention will become apparent when considered in conjunction with the accompanying drawings and detailed description, which are not to scale to show details more clearly, wherein the same reference numerals denote the same elements throughout the plurality of views, and wherein:

[0045] Figure 1 This is a functional block diagram of a measuring device according to an embodiment of the present invention.

[0046] Figures 2A to 2E This is a comparison diagram of radiation source wavelength and output level for selecting a radiation profile according to various embodiments of the present invention.

[0047] Figure 3A This is a fluorescence chart comparing the radiation level and fluorescence level of three different materials according to an embodiment of the present invention.

[0048] Figure 3B This is a fluorescence chart comparing radiation levels with fluorescence levels for three different radiation wavelengths, according to an embodiment of the present invention.

[0049] Figure 3C This is a fluorescence chart comparing radiation levels with fluorescence levels for three different fluorescence wavelengths, according to an embodiment of the present invention.

[0050] Figure 4 This is an example of a fluorescent pattern according to an embodiment of the present invention. Detailed Implementation

[0051] Now for reference Figure 1 The diagram illustrates a device 100 according to the invention, which can be used for offline and online measurements. The device 100 includes a sample display subsystem 102, a radiation subsystem 114, a sensing subsystem 126, and a control subsystem 132, each of which will be explained in more detail below.

[0052] Figure 1 Other aspects of the device 100 are also shown, including the sample material to be measured 106, the sample press 104, the sample or observation window 108, the reference fluorescent sheet 109, the radiation source 120, the radiation shaping and filtering optics 118, the radiation measuring radiometer 116, the variable optical filter 128, the imager 130, the signal processor 136, the user interface 138, and the machine interface 134, all of which will be described in more detail below in the relevant subsystems.

[0053] Sample display subsystem

[0054] The sample display subsystem 102 displays the fluorescent sample material 106 to the device 100. The sample 106 can be any form of textile, including, but not limited to, fibers, slivers, or fabrics. Some embodiments include two display objectives. One objective is to display as much of the sample 106 as possible to the device 100, and another objective is to display a consistent sample angle. One method to achieve these objectives is to use a sample press 104 to press the sample 106 against the sample window 108 using constant pressure.

[0055] The sample display subsystem 102 also includes a reference fluorescent sheet 109, whose reflected radiation and fluorescence characteristics are known. The purpose of the reference fluorescent sheet 109 is to allow the device 100 to self-calibrate to known reference reflected radiation and fluorescence levels. Furthermore, it serves as a self-test, where the device 100 can automatically detect malfunctions such as component failures. When the device 100 is measuring the sample 106, the reference fluorescent sheet 109 can be shielded from radiations 122 and 123 so that they do not reflect / fluoresce, or the reflected / fluorescent radiation it produces can be shielded from the imager 130 in some way so that they do not interfere with fluorescence readings from the sample 106.

[0056] Radiation subsystem

[0057] The radiation subsystem 114 is responsible for irradiating and exciting the fluorescent sample 106 with radiations 122 and 123, wherein the radiations 122 and 123 have a desired profile in terms of their wavelengths and associated energies. Specifically, its purpose is to control and ensure a known profile of radiations 122 and 123 on the sample 106. The desired profile of radiations 122 and 123 depends at least in part on the characteristics of the sample 106 and the properties of the sample 106 to be measured. The desired profile of radiations 122 and 123 is controlled as described below. Some parameters of radiations 122 and 123 include, but are not limited to, wavelength, power, beam uniformity, and beam angle 110, which is the angle between the radiations 122 and 123 emitted by the radiation source 120 and the plane of the sample window 108. The beam angle 110 can be set, for example, 45 degrees, such as... Figure 1 As shown.

[0058] Radiation source 120 directs a first radiation 122 in the ultraviolet range of the electromagnetic spectrum and a second radiation 123 in the visible range of the electromagnetic spectrum through sample window 108 toward sample 106. The first radiation 122 and the second radiation 123 can be emitted sequentially, simultaneously, or in a time-shifted manner, such that they partially overlap in time. The first radiation 122 and / or the second radiation 123 can be emitted periodically in time, i.e., periodically switched on and off. Sequential emission can be controlled by processor 136. The first radiation 122 can cause sample 106 to produce fluorescent radiation 124. The first radiation 122 and / or the second radiation 123 can cause the sample to produce reflected radiation 125.

[0059] The radiation subsystem 114 may include a plurality of radiation sources 120 arranged in different configurations. For example, in one embodiment, such as Figure 1 As shown, this configuration can combine two radiation sources 120 oriented in opposite directions. In another embodiment, the configuration can combine four radiation sources 120, wherein the sample 106 is radiated from four different directions. Each of the plurality of radiation sources 120 can be configured to emit both the first radiation 122 and the second radiation 123, as shown. Figure 1 As shown in the diagram. Alternatively, one of the plurality of radiation sources 120 may be configured to emit only the first radiation 122, while another of the plurality of radiation sources 120 may be configured to emit only the second radiation 123.

[0060] In another embodiment, the radiation subsystem 114 may include only one radiation source 120. In this case, the radiation source 120 is configured to emit a first radiation 122 and a second radiation 123 sequentially or simultaneously.

[0061] In some embodiments, the radiation source 120 may be movable within the device 100. For example, in some embodiments, the source 120 may be moved to provide different angles of incidence of radiation 122 on the sample window 108. In some embodiments, the sources 120 may be moved to have different proximity to the sample window 108 or different radial angles.

[0062] Examples of radiation source 120 may include, but are not limited to, one or more of light-emitting diodes (LEDs), halogen lamps, mercury vapor lamps, incandescent lamps, deuterium lamps, fluorescent lamps, and xenon lamps. Furthermore, each radiation source 120 may be combined with one or more of the aforementioned lamps. For example, one embodiment may include multiple groups of ultraviolet LEDs emitting the first radiation 122 and visible LEDs emitting the second radiation 123. In such an embodiment, each group of LEDs may be controlled separately by processor 136 from the other groups.

[0063] In one embodiment, color measurements of sample 106 are performed in the CIELAB color space using irradiation with a second visible light radiation 123. The color image of sample 106 is processed in the same manner as described below for all other images.

[0064] The output level and spectral characteristics of the radiation source 120 can be customized for a given brightness application and measurement. Figures 2A-2D This customization of the first radiation 122 is illustrated only by example. Figures 200a-200d illustrate the wavelength of radiation 122 on the x-axis 204 and the output level of radiation 122 on the y-axis 202. In these examples, two sets of ultraviolet LEDs operate at 360nm and 380nm with various combinations and intensities.

[0065] exist Figure 2A In Figure 200a, as shown in spectrum 212a, the 360nm LED array operates at its full output level. Figure 2B In Figure 200b, as shown in spectrum 212b, the 360nm LED array operates at 50% output level. Figure 2A and Figure 2B In the middle, the 380nm LED array is completely turned off. Figure 2C Example 200c is depicted, in which the 380nm LED group operates at its full output level, but the 360nm LED group is completely off. Figure 2D Another example 200d is shown, where both LED groups operate at 50% of their output level. Other combinations of wavelength and output level are also considered in this paper.

[0066] Figure 2EA graph 200e shows a spectrum 212e established by a first radiation 122 and a second radiation 123. The first peak of spectrum 212e at 360 nm (UV) is due to the first radiation 122. The second peak at 530 nm (green) and the third peak at 650 nm (red) are due to the second radiation 123. The first radiation 122 is emitted by a first group of UV LEDs, while the second radiation 123 is emitted by a second group of green LEDs and a third group of red LEDs, respectively.

[0067] One design objective is to maintain the uniformity and stability of radiations 122, 123 within the region of sample window 108 and / or sample 106. One approach is to use radiation 122, 123 shaping and filtering optics 118 to fine-tune radiations 122, 123 to the desired wavelength range and to shape radiations 122, 123 for uniformity, directionality, and coverage. In some embodiments, radiations 122, 123 are monitored and controlled via closed-loop feedback control through radiation 122, 123 detectors 116.

[0068] Sensing Subsystem

[0069] The sensing subsystem 126 is responsible for sensing and measuring the fluorescence radiation 124 and the reflected second radiation 125 generated by the sample 106 when it is irradiated.

[0070] One objective of the sensing subsystem 126 may be to separate the reflected radiation 125, which has the same wavelength as the first radiation 122, from the emitted fluorescence signal 124 in the spectrum. One way to achieve this objective is to use a variable optical filter 128. For example, in one embodiment, the sample 106 includes an optical brightener, the radiation source 120 is configured to emit the first radiation 122 in the ultraviolet spectral range of 340-400 nm, while the fluorescence emission 124 is in the spectral range of 420-470 nm. In this case, the variable optical filter 128 rejects any spectral signal in the 340-400 nm range and allows only radiation in the 420-470 nm range to pass through in order to capture the fluorescence radiation 124. Alternatively, for another application, the variable optical filter 128 rejects one range and allows another range to pass through, as shown in the given application. One way to implement the variable optical filter 128 is to combine a filter wheel with several bandpass filters, wherein the processor 136 controls the filter wheel and selects the appropriate bandpass filter for a given application.

[0071] The actual sensing and measurement are performed by imager 130. Imager 130 measures not only the amount of fluorescence emission 124 and reflected radiation 125, but also the distribution and spatial characteristics of fluorescence emission 124 and reflected radiation 125 within the field of view of imager 130. In one embodiment, imager 130 may be a focal plane array device sensitive to the desired spectral range of fluorescence emission 124 and reflected radiation 125. In another embodiment, imager 130 may be a line scan array that is scanned across the field of view to create a two-dimensional image. Scanning may be accomplished by mechanical movement of imager 130 or by mechanical movement of mirrors on fixed imager 130. In yet another embodiment, imager 130 may be a hyperspectral imaging device. Regardless of the specific imaging method used, measurements of a given sample 106 include the levels, spectral responses, and spatial information of both fluorescence emission 124 and reflected radiation 125. For the remainder of this document, we will refer to this output of imager 130 as a brightness image.

[0072] Online sensing can be performed in either static or dynamic mode. In static mode, sample 106 is brought into the field of view of imager 130 on sample window 108 and stopped for measurement. In dynamic mode, sample 106 moves through sample window 108, and radiation subsystem 114 and sensing subsystem 126 operate at a sufficiently fast speed related to the speed of sample movement. In offline mode, sample 106 can be manually placed on sample 108 as needed.

[0073] Control Subsystem

[0074] The control subsystem 132 is responsible for the control, processing, and interface functions of the device 100. This is accomplished under the control of the processor 136. Control functions include, but are not limited to, controlling the operation of other subsystems in a manner generally described elsewhere herein. It also processes images using a selected measurement method. The results of the measurement method are transmitted to the user interface 138 and / or the machine interface 134. The machine interface 134 may include, but is not limited to, an electronic interface to a textile machine or information system.

[0075] Measurement methods

[0076] The measurement method is based on the processing of images of fluorescence emission 124 and reflected radiation 125, which can be one-dimensional or two-dimensional images, where each pixel has 408 elements (one image element, such as...). Figure 4 (As shown) indicates the brightness level at a specific location on sample 106. Measurements may include, but are not limited to, two categories: (a) statistical analysis and (b) pattern analysis.

[0077] Statistical analysis

[0078] The first measurement category is based on statistical analysis, which provides a basic statistical assessment of luminance levels, and may include (a) average luminance levels, (b) minimum luminance levels and their locations, (c) maximum luminance levels and their locations, (d) uniformity of luminance levels, and (e) graphs of luminance.

[0079] Therefore, for a given brightness sample 106 irradiated by an appropriate radiation subsystem 114, the brightness image can be represented as:

[0080]

[0081] in

[0082] a(λ j ) is the weighting factor for the fluorescence image at different wavelengths.

[0083] Where λ min <λ j <λ max j = 1, 2, ..., k

[0084] b(λ j ) is the weighting factor for the luminance image of wavelength.

[0085] Where λ min <λ j <λ max j = 1, 2, ..., k

[0086] BI(λ j ) is a brightness image of sample 106 within one or more wavelength ranges, where

[0087] λ min <λ j <λ max j = 1, 2, ..., k

[0088] FI(λ j () is a fluorescence image of sample 106 in one or more wavelength ranges, where

[0089] λ min <λ j <λ max j = 1, 2, ..., k

[0090] LI(λ j () is a luminance image of sample 106 in one or more wavelength ranges, where

[0091] λ min <λ j <λ max j = 1, 2, ..., k

[0092] n is the number of spatial points in the image along the horizontal direction.

[0093] m is the number of spatial points in the vertical direction of the image, and

[0094] i xy The sample at the x and y coordinate positions at the wavelength λ j The energy level.

[0095] The statistical evaluation of the brightness level of sample 106 can be calculated as follows:

[0096]

[0097] in

[0098] Avg(λ j ) is the overall brightness level of sample 106 over a single wavelength range or multiple wavelength ranges, where λ max <λ j <λ max j = 1, 2, ..., n

[0099] Min(λ j ) is the minimum brightness level of sample 106 within a single wavelength range or multiple wavelength ranges, where λ min <λ j <λ max j = 1, 2, ..., n

[0100] Max(λ j ) is the maximum brightness level of sample 106 in a single wavelength range or multiple wavelength ranges, where λ min <λ j <λ max j = 1, 2, ..., n

[0101] Unif(λ j ) represents the uniformity of the brightness level of sample 106 over a single wavelength or multiple wavelength ranges, where λ max <λ j <λ max j = 1, 2, ..., n

[0102] n is the number of spatial points in the image along the horizontal direction.

[0103] m is the number of spatial points in the vertical direction of the image, and

[0104] i xy Sample 106 at the x and y coordinate positions at wavelength λ j The combined incident radiation and fluorescence emission levels at the location.

[0105] We also defined the term "fluorescence chart," which presents the emission fluorescence levels of sample 106 for different first radiation 122 parameters. The purpose of the fluorescence chart is to make it easier and better to characterize the fluorescence of sample 106. This may also be beneficial in the process of preparing fluorescent pigments.

[0106] As previously described, the radiation subsystem 114 can be controlled by the processor 136 for different radiation levels 122, 123 and spectral characteristics. Furthermore, the sensing subsystem 126 can also be controlled by the processor 136 for spectral sensing of the emitted signals 124, 125.

[0107] Figures 3A-3C Examples depicting how various samples 106a-106c respond to various first radiation 122 levels are presented. This feature quantifies the optimal first radiation 122 level for a given fluorescence application requirement.

[0108] Figure 3A Example 300a is depicted, in which three different fluorescent pigment samples 106a-106c are exposed to different levels of first radiation 122, and the fluorescence level of each sample 106a-106c is plotted on the y-axis 302, compared with the level of first radiation 122 on the x-axis 304. This allows for quantitative comparison and selection of the optimal sample 106 for a given application of fluorescent pigment.

[0109] Figure 3B Example 300b is shown, in which a sample 106 of a fluorescent pigment is exposed to three different first radiations 122 with different spectral characteristics. This produces graphs 306, 308, and 310. Figure 3C Example 300c is shown, in which a sample 106 of a fluorescent pigment is exposed to a first radiation 122 with different spectral characteristics, and fluoresces at three wavelengths 312, 314, and 316. Based on this application, these graphs can help understand and select the optimal radiation source and emission output.

[0110] Pattern Analysis

[0111] The second type of measurement is based on pattern analysis, which provides pattern information once discovered. The main difference between statistical analysis and pattern analysis lies in the inclusion of spatial information. In pattern analysis, the positions and relationships between all pixels in an image are considered, while in statistical analysis, spatial information is not considered. Pattern analysis can be performed using fluorescence images, reflectance images, and / or luminance images. For simplicity, the following description only refers to luminance images, which is a general approach.

[0112] Pattern analysis may include (a) the number of patterns found in the brightness image, (b) the total area of ​​all patterns in the brightness image, (c) the average size of all patterns, (d) the percentage of patterns with a horizontal orientation, (e) the percentage of patterns with a vertical orientation, and (f) the percentage of patterns with an unordered or random orientation.

[0113] We define a pattern set:

[0114] P(λ j )={p1,p2,.....,p l}, (6)

[0115] Where P(λ) j ) is a set of fluorescent patterns p1 to p l They exist in the brightness image FI(λ) within a single or multiple wavelength range. j In ), where λ min <λ j <λ max ,j=1,2,...,k.

[0116] Each pattern p l A set of pixels i contained in a cluster that has clustering requirements. xy Clustering requirements may vary depending on the application. One example is when all neighboring i... xy When the value is larger than the threshold calculated statically or dynamically.

[0117] exist Figure 4 Example of fluorescent patterns 402, 404, and 406 is shown in pattern diagram 400. In this example, there are three fluorescent patterns 402, 404, and 406, each with a different orientation and size as shown. For example, pattern 402 is a substantially horizontal pattern, while pattern 404 is a substantially vertical pattern. Pattern 406 is a disordered or random pattern.

[0118] In addition to classifying the orientation of patterns 402, 404, and 406, the dimensions of each pattern 402, 404, and 406 are calculated. In the example 400 shown, pattern 402 accounts for approximately 5.2% of the total field of view, pattern 404 accounts for approximately 2.1% of the total field of view, and pattern 406 accounts for approximately 11.2% of the total field of view.

[0119] Therefore, various embodiments of the apparatus and methods described herein provide a more thorough analysis of the fluorescence of textiles by providing fluorescence data in a highly selectable radiation profile 122 and in a two-dimensional image of sample 106, and also provide other benefits described herein.

[0120] For purposes of description and illustration, the above description of preferred embodiments of the invention has been provided. It is not intended to be exhaustive or to limit the invention to the precise forms disclosed. Obvious modifications or variations are possible based on the foregoing teachings. The embodiments chosen and described are intended to provide the best illustration of the principles of the invention and its practical application, thereby enabling those skilled in the art to use the invention in various embodiments, with various modifications suitable for the particular use conceived. All such modifications and variations are within the scope of the invention as defined by the appended claims when interpreted according to the fair, legal, and just scope imposed upon them.

Claims

1. An apparatus (100) for optically characterizing textile samples (106), the apparatus (100) comprising: The display subsystem (102) includes an observation window (108). A radiation subsystem (114) includes a radiation source (120) for guiding a first radiation (122) desired in the ultraviolet range of the electromagnetic spectrum and a second radiation (123) desired in the visible range of the electromagnetic spectrum through the observation window (108) toward the sample (106), and causing the sample (106) to produce fluorescence radiation (124) and reflected radiation (125). A sensing subsystem (126) includes an imager (130) for capturing the fluorescence radiation (124) and the reflected radiation (125) in an array of pixels (408), wherein each pixel (408) records the intensity of both the fluorescence radiation (124) and the reflected radiation (125) at the pixel location, and A control subsystem (132) includes a processor (136) for controlling the display subsystem (102), the radiation subsystem (114), and the sensing subsystem (126), and for generating a fluorescence and reflection radiation image (400) containing both spectral and spatial information about the fluorescence radiation (124) and the reflected radiation (125) of the sample (106), and for processing the reflected radiation and fluorescence image (400) into a brightness image. in: α(λ j ) is the weighting factor for the fluorescence image at different wavelengths. among them min <l j <l max ,j=1,2,...,k, b(λ j ) is the weighting factor for the reflected radiation image at different wavelengths. among them min <l j <l max ,j=1,2,...,k, BI(λ j ) is a brightness image of sample (106) in one or more wavelength ranges, where l min <l j <l max ,j=1,2,...,k, FI(λ j ) is a fluorescence image of sample (106) in one or more wavelength ranges, where l min <l j <l max ,j=1,2,...,k, LI(λ j ) is a reflection radiation image of sample (106) in one or more wavelength ranges, where l min <l j <l max ,j=1,2,...,k, n is the number of spatial points in the image along the horizontal direction. m is the number of spatial points in the vertical direction of the image, and i xy The sample at the x and y coordinate positions at the wavelength λ j The energy levels.

2. The device according to claim 1, wherein the display subsystem (102) further comprises a sample press (104) for pressing the sample (106) onto the observation window (108).

3. The device according to claim 1, wherein the display subsystem (102) further includes a calibration plate (109) for generating fluorescent radiation (124) and reflected radiation (125) having known characteristics in response to radiation (122) having known characteristics.

4. The device according to claim 1, wherein the radiation subsystem (114) further comprises an optical device (118) for shaping and / or filtering the first radiation (122) and the second radiation (123) from the radiation source (120) to generate the first radiation (122) and / or the second radiation (123).

5. The device according to claim 1, wherein the radiation subsystem (114) further includes a detector (116) for detecting the characteristics of the first radiation (122) and / or the second radiation (123).

6. The device according to claim 1, wherein, The radiation source (120) is configured to generate the first radiation (122) and the second radiation (123) having an intensity distribution that varies over time.

7. The device according to claim 1, wherein, The radiation source (120) is configured to sequentially generate the first radiation (122) and the second radiation (123).

8. The device according to claim 1, wherein, The radiation source (120) is configured to simultaneously generate the first radiation (122) and the second radiation (123).

9. The device according to claim 1, wherein, The radiation source (120) is configured to generate the first radiation (122) and the second radiation (123) in a time-shifted manner, such that they partially overlap in time.

10. The device according to claim 1, wherein, The radiation source (120) is configured to periodically generate the first radiation (122) and / or the second radiation (123) over time.

11. The device according to claim 1, wherein the pixel (408) array is a two-dimensional pixel (408) array.

12. The device of claim 1, wherein the sensing subsystem (126) further comprises a variable filter (128) for selectively blocking a portion of the fluorescent radiation (124) and / or reflected radiation (125) from reaching the imager (130).

13. The device according to claim 1, wherein the control subsystem (132) is configured to classify patterns (402, 404, 406) in the fluorescent and / or reflected radiation images (400) including a percentage of the fluorescent and / or reflected radiation images (400) represented by each of the patterns (402, 404, 406).

14. The device according to claim 1, wherein the control subsystem (132) is configured to classify patterns (402, 404, 406) in the fluorescent and / or reflected radiation image (400), including the orientation of each of the patterns (402, 404, 406), wherein the orientation is at least one of horizontal, vertical and random.

15. A method for optically characterizing textile samples (106), the method comprising the steps of: The sample (106) is displayed on the observation window (108) using the display subsystem (102). A desired first radiation (122) in the ultraviolet range of the electromagnetic spectrum and a desired second radiation (123) in the visible range of the electromagnetic spectrum are guided from a radiation subsystem (114) with a radiation source (120) through an observation window (108) toward the sample (106), thereby causing the sample (106) to produce fluorescent radiation (124) and reflected radiation (125). The fluorescence radiation (124) and the reflected radiation (125) are captured in the pixel (408) array by a sensing subsystem (126) with an imager (130), wherein each pixel (408) records the intensity of both the fluorescence radiation (124) and the reflected radiation (125) at the pixel location, and Using a processor (136), the display subsystem (102), the radiation subsystem (114), and the sensing subsystem (126) are controlled to generate a fluorescence and reflection radiation image (400) containing both spectral and spatial information related to the fluorescence radiation (124) and the reflected radiation (125) of the sample (106); and the reflected radiation and fluorescence image (400) are processed into a brightness image. in: a(λ j ) is the weighting factor for the fluorescence image at different wavelengths. among them min <l j <l max ,j=1,2,...,k, b(λ j ) is the weighting factor for the reflected radiation image at different wavelengths. among them min <l j <l max ,j=1,2,...,k, BI(λ j ) is a brightness image of sample (106) in one or more wavelength ranges, where l min <l j <l max ,j=1,2,...,k, FI(λ j ) is a fluorescence image of sample (106) in one or more wavelength ranges, where l min <l j <l max ,j=1,2,...,k, LI(λ j ) is a reflection radiation image of sample (106) in one or more wavelength ranges, where l min <λ j <λ max ,j=1,2,...,k, n is the number of spatial points in the image along the horizontal direction. m is the number of spatial points in the vertical direction of the image, and i xy The sample at the x and y coordinate positions at the wavelength λ j The energy levels.

16. The method of claim 15, further comprising pressing the sample (106) onto the observation window (108) using a press (104).

17. The method of claim 15, further comprising shaping and / or filtering the first radiation (122) and the second radiation (123) from the radiation source (120) using an optical device (118) before the first radiation (122) and / or the second radiation reach the sample (106).

18. The method of claim 15, further comprising using a detector (116) to detect features of the first radiation (122) and / or the second radiation (123).

19. The method of claim 15, further comprising generating the first radiation (122) and the second radiation (123) having an intensity distribution that varies over time.

20. The method of claim 15 further comprises sequentially generating the first radiation (122) and the second radiation (123).

21. The method of claim 15, further comprising simultaneously generating the first radiation (122) and the second radiation (123).

22. The method of claim 15 further comprises generating the first radiation (122) and the second radiation (123) in a time-off manner such that they partially overlap in time.

23. The method of claim 15 further comprises periodically generating the first radiation (122) and / or the second radiation (123) over time.

24. The method of claim 15 further comprises selectively blocking the fluorescent radiation (124) and the reflected radiation (125) from reaching the imager (130), respectively.

25. The method of claim 15, further comprising classifying the patterns (402, 404, 406) in the reflected radiation and fluorescence and / or reflected images (400) as a percentage of the fluorescent and / or reflected radiation images (400) represented by each of the patterns (402, 404, 406).

26. The method according to any one of claims 15-25, further comprising classifying the patterns (402, 404, 406) in the fluorescence and / or reflected radiation image (400) including the orientation of each of the patterns (402, 404, 406), wherein the orientation is at least one of horizontal, vertical and random.

Images