A three-axis high-precision relay electromagnetic suction curve testing device and method

CN121347022BActive Publication Date: 2026-10-27GUIZHOU ZHENHUA QUNYING ELECTRIC CO LTD
View PDF 1 Cites 0 Cited by

Patent Information

Application Number
CN202511451758.1
Authority / Receiving Office
CN · China
Patent Type
Patents(China)
Current Assignee / Owner
Filing Date
2025-10-11
Publication Date
2026-10-27
Estimated Expiration
2045-10-11

AI Technical Summary

Technical Problem

虽然目前有类似采用传感器式的测试电磁吸力曲线的办法,但由于继电器衔铁断开瞬间电磁吸力会由一个较大值突变为一个较小值,在这个过程,衔铁会行程会变化较大,而传感器的响应速度无法满足这个过程的位移测试,无法真实表现继电器的吸力曲线,需要靠拟合完成

Benefits of technology

[0014]本发明相对于现有技术而言,可在位移精度为0.01mm且完全规避继电器衔铁打开瞬间力和位移突变的前提下,完成电磁吸力曲线的测试,保证电磁吸力曲线的真实性,更接近实际,更能指导实际,由此通过机械结构创新与多维调节系统的融合,解决了传统电磁吸力测试中磁路定位精度不足、多维度调节受限、接触稳定性差三大核心问题,显著提升了曲线测试的真实性和可靠性。

✦ Generated by Eureka AI based on patent content.

Smart Images

  • Figure CN121347022B_ABST
    Figure CN121347022B_ABST
Patent Text Reader

Abstract

The present application relates to the mechanical technical field, disclose a kind of three axial high-precision relay electromagnetic attraction curve testing device, including force gage clamping mechanism and magnetic circuit clamping mechanism, the force gage clamping mechanism on be used for clamping force gage table stand, table stand is fixed on carousel and is rotated by carousel;Magnetic circuit clamping mechanism on be used for clamping relay magnetic circuit portion positioning block, positioning block has pressing plate for pressing tightly fixed on, positioning block is installed on slider, positioning block is installed with line pressing rod across, line pressing rod inner end is used to contact relay magnetic circuit portion, line pressing rod outer end has nut for connecting external power supply.The present application can be in displacement accuracy is 0.01mm and completely avoid the premise that relay armature opens instantaneous force and displacement mutation, complete electromagnetic attraction curve test, ensure the authenticity of electromagnetic attraction curve, more close to actual, more can guide actual.
Need to check novelty before this filing date? Find Prior Art

Description

Technical Field

[0001] This invention relates to the field of mechanical technology. Background Technology

[0002] The electromagnetic attraction force curve is a key parameter that needs to be controlled in the design and production of electromagnetic relays. Accurately testing the electromagnetic attraction force curve of a relay is essential to verifying the correctness of its design and is also a prerequisite for improving relay production levels and achieving future calibration-free relays. While there are currently methods for testing the electromagnetic attraction force curve using sensors, the electromagnetic attraction force abruptly changes from a large value to a small value the instant the relay armature disconnects. During this process, the armature travel changes significantly, and the response speed of sensors cannot meet the displacement measurement requirements of this process. Therefore, these methods cannot accurately represent the relay's attraction force curve and require fitting to achieve the desired result. Summary of the Invention

[0003] The purpose of this invention is to provide a triaxial high-precision relay electromagnetic attraction curve testing device and method, which enables the testing of electromagnetic attraction curves with a displacement accuracy of 0.01mm and completely avoids sudden changes in force and displacement at the moment the relay armature is opened. This ensures the authenticity of the electromagnetic attraction curve, making it closer to reality and more instructive for practical applications.

[0004] To solve the above-mentioned technical problems, the present invention provides a triaxial high-precision relay electromagnetic attraction curve testing device, including a force gauge clamping mechanism and a magnetic circuit clamping mechanism. The force gauge clamping mechanism has a frame for clamping the force gauge, which is fixed on a turntable and rotated by the turntable. The magnetic circuit clamping mechanism has a positioning block for clamping the magnetic circuit part of the relay. The positioning block has a pressure plate for pressing and fixing. The positioning block is mounted on a slider. A pressure rod is horizontally installed on the positioning block. The inner end of the pressure rod is used to contact the magnetic circuit part of the relay. The outer end of the pressure rod has a nut for connecting to an external power supply. The positioning block also has a pressure rod for pressing against the pressure plate. A micrometer knob is connected and installed on the pressure rod for adjusting the lateral position. The micrometer knob adjustment accuracy is 0.01mm.

[0005] The turntable is mounted on the positioning frame, and a drive wheel is installed between the turntable and the positioning frame to drive the turntable to rotate. The drive wheel is coaxially connected to a sleeve for inserting and rotating the handle. The positioning frame is mounted on the mounting plate, and a shaft is mounted on the mounting plate near the edge by a hexagonal screw. The shaft is connected to the turntable by a bearing.

[0006] The mounting plate is mounted on the XY axis slide using a first hex socket screw, and the XY axis slide is mounted on the base plate using a slide hex socket screw.

[0007] The positioning frame is mounted on the mounting plate via a pad, and the positioning frame and the pad are connected by hexagonal screws inside the pad.

[0008] The positioning frame has a U-shaped opening. A spring is connected to the drive wheel at the bottom of the U-shape inside the positioning frame. The drive wheel is located at the opening of the U-shape and can be placed in the inner cavity of the U-shape. An adjusting screw passes through the spring and is installed to abut against the drive wheel. A cover plate is installed on the top surface of the middle of the positioning frame by a second internal hexagon screw.

[0009] An L-shaped support frame is fixed horizontally and vertically on the positioning block. The pressure plate is inserted horizontally and longitudinally into the support frame, and the micrometer knob is inserted horizontally into the support frame. A spring is installed between the pressure plate and the positioning block. The support plate is fixed to the pressure plate, and the pressure rod is embedded in the support plate.

[0010] The positioning block is installed on the mounting plate. A guide post passes vertically through the mounting plate and is installed on the slider. The slider is mounted on a guide rail composed of two guide baffles. The guide baffles are fixed to the base plate. A second hexagonal screw is inserted into the mounting plate to fix the mounting plate and the guide post relative to each other. An adjusting screw is embedded in the mounting plate to adjust the up and down movement of the support frame. The guide post passes through the support frame, and the support frame is fixed to the positioning block.

[0011] A pin is inserted vertically downwards on the support frame at the position where the pressure plate passes through, and there is a hole on the pressure plate directly opposite the pin.

[0012] The guide baffle is equipped with tightening screws to fix the slider, and the end of the guide baffle has a guide pin to limit the slider.

[0013] The frame has holes for at least three hexagonal socket screws to secure the force gauge.

[0014] Compared with existing technologies, this invention can complete the electromagnetic attraction curve test with a displacement accuracy of 0.01mm and completely avoid the instantaneous force and displacement change when the relay armature is opened. This ensures the authenticity of the electromagnetic attraction curve, which is closer to reality and can better guide practice. By integrating mechanical structure innovation and multi-dimensional adjustment system, this invention solves the three core problems of insufficient magnetic circuit positioning accuracy, limited multi-dimensional adjustment, and poor contact stability in traditional electromagnetic attraction testing, and significantly improves the authenticity and reliability of curve testing.

[0015] The above description is merely an overview of the technical solution of the present invention. In order to better understand the technical means of the present invention and to implement it in accordance with the contents of the specification, and to make the above and other objects, features and advantages of the present invention more apparent and understandable, specific embodiments of the present invention are described below. Attached Figure Description

[0016] One or more embodiments are illustrated by way of example with reference numerals in the accompanying drawings. These illustrations do not constitute a limitation on the embodiments. Elements with the same reference numerals in the drawings are denoted as similar elements. Unless otherwise stated, the figures in the drawings are not to be limited by scale.

[0017] Figure 1 This is a schematic diagram of the structure of at least one embodiment of the present invention; Figure 2 yes Figure 1 Schematic diagram of the clamping mechanism of the force gauge; Figure 3 yes Figure 1 Schematic diagram of the central magnetic circuit clamping mechanism; Figure 4 This is a graph showing the armature stroke-electromagnetic attraction force curve drawn from the actual use of at least one embodiment of the present invention.

[0018] In the diagram: 1-Guide post, 2-Support frame, 3-Positioning block, 4-Pin, 5-Pressure rod, 6-Nut, 7-Hex nut, 8-Spring 1, 9-Pressing rod, 10-Rotating shaft hexagonal screw, 11-Table holder, 12-First hexagonal screw, 13-Rotating handle, 14-Second hexagonal screw, 15-Sliding block, 16-Spring 2, 17-Cover plate, 18-Positioning frame, 19-Adjusting screw, 20-Plate hexagonal screw, 21-Plate, 22-Turntable 23-Sleeve, 24-Drive wheel, 25-Rotating pin, 26-Base plate, 27-XY axis slide, 28-Mounting plate, 29-Pin, 30-Slide internal hex screw, 31-Shaft, 32-Bearing, 33-Guide pin, 34-Slider, 35-Guide baffle, 36-Tightening screw, 37-Adjusting screw, 38-Internal hex screw, 39-Hanging plate, 40-Micrometer knob, 41-Spring three, 42-Pressure plate, 43-Support plate, 44-Internal hex screw. Detailed Implementation

[0019] To make the objectives, technical solutions, and advantages of this invention clearer, the embodiments of this invention will be described in detail below with reference to the accompanying drawings. However, those skilled in the art will understand that many technical details are presented in the embodiments of this invention to facilitate a better understanding of this application. However, the technical solutions claimed in this application can be implemented even without these technical details and various variations and modifications based on the following embodiments. The division of the following embodiments is for ease of description and should not constitute any limitation on the specific implementation of this invention. The embodiments can be combined with and referenced by each other without contradiction.

[0020] Example 1 like Figures 1-4The device shown is a triaxial high-precision relay electromagnetic attraction curve testing device, including a force gauge clamping mechanism and a magnetic circuit clamping mechanism. The force gauge clamping mechanism has a frame 11 for clamping the force gauge, which is fixed on a turntable 22 and rotated by the turntable 22. The magnetic circuit clamping mechanism has a positioning block 3 for clamping the magnetic circuit part of the relay. The positioning block 3 has a pressure plate 42 for pressing and fixing. The positioning block 3 is mounted on a slider 34. A pressure rod 9 is horizontally installed on the positioning block 3. The inner end of the pressure rod 9 is used to contact the magnetic circuit part of the relay, and the outer end of the pressure rod 9 has a nut 6 for connecting to an external power supply. The positioning block 3 also has a pressure rod 5 for pressing against the pressure plate 42. A micrometer knob 40 is connected and installed on the pressure rod 5 for adjusting the lateral position. The micrometer knob 40 has an adjustment accuracy of 0.01mm.

[0021] Example 2 Based on embodiment 1, the turntable 22 is mounted on the positioning frame 18, and a drive wheel 24 is installed between the turntable 22 and the positioning frame 18 to drive the turntable 22 to rotate. The drive wheel 24 is coaxially connected to a sleeve 23 for inserting and rotating the handle 13. The positioning frame 18 is mounted on the mounting plate 28, and a shaft 31 is mounted on the mounting plate 28 near the edge via a hexagonal screw 10. The shaft 31 is connected to the turntable 22 via a bearing 32.

[0022] The mounting plate 28 is mounted on the XY axis slide 27 by the first hexagon socket screw 12, and the XY axis slide 27 is mounted on the base plate 26 by the slide hexagon socket screw 30.

[0023] The positioning frame 18 is mounted on the mounting plate 28 via a pad 21, and the positioning frame 18 and the pad 21 are connected by hexagonal screws 20 on the pad.

[0024] The positioning frame 18 has a U-shaped opening. A second spring 16 is connected to the drive wheel 24 at the bottom of the U-shape inside the positioning frame 18. The drive wheel 24 is located at the U-shaped opening and can be placed in the U-shaped cavity. An adjusting screw 19 passes through the second spring 16 and is installed to abut against the drive wheel 24. A cover plate 17 is installed on the top surface of the middle part of the positioning frame 18 through a second internal hexagon screw 14.

[0025] Example 3 Based on embodiment 1, an L-shaped support frame 2 is fixed horizontally and vertically on the positioning block 3, a pressure plate 42 is inserted horizontally and longitudinally on the support frame 2, and a micrometer knob 40 is inserted horizontally on the support frame 2; a spring 41 is installed between the pressure plate 42 and the positioning block 3; a support piece 43 is fixed to the pressure plate 42, and a pressure rod 5 is embedded in the support piece 43.

[0026] The positioning block 3 is installed on the mounting plate 39. A guide post 1 passes vertically through the mounting plate 39 and is installed on the slider 34. The slider 34 is mounted on a guide rail composed of two guide baffles 35. The guide baffles 35 are fixed to the base plate 26. A second hexagonal screw 14 is inserted into the mounting plate 39 to fix the mounting plate 39 and the guide post 1 relative to each other. An adjusting screw 37 is embedded in the mounting plate 39 to adjust the up and down movement of the support frame 2. The guide post 1 passes through the support frame 2, and the support frame 2 is fixed to the positioning block 3.

[0027] A pin 4 is vertically inserted downwards on the support frame 2, directly opposite the position through which the pressure plate 42 passes. The pressure plate 42 has a hole directly opposite the pin 4.

[0028] The guide baffle 35 is equipped with tightening screws 36 for fixing the slider 34, and the end of the guide baffle 35 has a guide pin 33 for limiting the slider 34.

[0029] The frame 11 has holes for at least three hexagonal socket screws 10 for fixing the force measuring instrument.

[0030] Example 4 In the above embodiment, the XY-axis slide 27 is mounted on the base plate 26 by hexagonal screws 30 and pins 29. The mounting plate 28 is fixed to the XY-axis slide 27 by four hexagonal screws. The shaft 31 is fixed to the mounting plate 28 by hexagonal screws and connected to the turntable 22 by bearings 32. The dial indicator 11 is fixed to the turntable 22 by hexagonal screws 10, so that the turntable 22 can drive the dial indicator 11 to rotate together. The dial indicator 11 has three tightening screws for fixing the digital writing test meter. The pad 21 and the positioning frame 18 are fixed to the mounting plate by hexagonal screws. The rotating handle 13 is assembled with the drive wheel 24 by the sleeve 23, pin 25, and then fixed to the sliding block to form a rotating device. This rotating device is built into the positioning frame 18. The cover plate 17 is fixed above the positioning frame 18 by hexagonal screws 14 and spring 2 16 to prevent the rotating device from falling off. The rotating device can move back and forth in the positioning frame 18 by adjusting screws 19. The XY axis slide 27 is a standard part, with a built-in micrometer knob, which can be used to achieve precise movement of the X and Y axes.

[0031] The guide baffle 35 is mounted on the base plate 26 by hexagon socket screws 38. The slider 34 is built into the guide rail of the guide baffle 35 and can move back and forth on the guide rail. It can be fixed to the guide baffle 35 by tightening screws 36. Two pins 33 are added to the front end of the guide rail of the guide baffle 35 and embedded in the base plate 26. These pins prevent the slider 34 from sliding and avoid it from exceeding the guide rail. The guide post 1 is assembled with the slider 34, and the hanging plate 39 is fitted with the guide post 1. The hanging plate 39 can move up and down automatically on the guide post 1 and can be fixed to the guide post 1 by hexagon socket screws 14. The adjusting screw 37 is embedded in the hanging plate 39 and is screwed together with the support frame 2, which can adjust the up and down movement of the support frame 2. The support frame 2 is fitted together with the guide post 1 and fixed to the positioning block 3 by rotating shaft hexagon socket screws 10. The wire clamping system, consisting of clamping rod 9, nut 6, hexagonal nut 7, and spring 8, is embedded in positioning block 3. Clamping plate 42 is secured to positioning block 3 via spring 3 41 and hexagonal screw 12. Pin 4 passes through support frame 2 and clamping plate 42, allowing clamping plate 42 to move up and down around pin 4. Support plate 43 is fixed to clamping plate 42 via hexagonal screw, clamping rod 5 is embedded in support plate 43, and micrometer knob 40 is embedded in support frame 2. Clamping rod 5 can move up and down and be limited via micrometer knob 40.

[0032] Example 5 Based on the aforementioned embodiments, the working principle is as follows: The force gauge is installed in the frame 11 and fixed by tightening screws. The force gauge installed in the frame 11 can be precisely moved back and forth by the XY axis slide table 27, and the force gauge can be measured by rotating the handle 13. The magnetic circuit part of the relay to be measured is installed in the positioning block 3 and fixed by the pressure plate 42. Then, the armature opening gap is precisely controlled by the pressure rod 5 and the micrometer knob 40. The lead wire of the magnetic circuit part is made into contact by the lead wire pressing system composed of the wire pressing rod 9, nut 6, hexagonal nut 7, and spring 8. An external power supply is applied to the nut 6 to energize the magnetic circuit part. The magnetic circuit part installed in the positioning block 3 can be moved back and forth by the slider 34 and can be moved up and down by adjusting the screw 37.

[0033] Specifically: First, the force gauge is installed in the holder 11 and fixed by tightening the screws. Then, the magnetic circuit part of the relay to be measured is installed in the positioning block 3 and fixed by the pressure plate 42. The magnetic circuit part is fixed in the required position by moving the slider 34 and adjusting the screw 37. The lead wire of the magnetic circuit part is made into contact by the lead wire clamping system composed of the clamping rod 9, nut 6, hexagonal nut 7, and spring 8. An external power supply is applied to the nut 6, and the product pull-in voltage is applied so that the armature pole surface and the yoke pole surface are completely flat. Adjust the micrometer knob 40 so that the positioning surface of the pressure rod 5 coincides with the armature surface when the armature pole surface and the yoke pole surface are completely flat. At this time, the positioning surface of the pressure rod 5 falls on the fixed point on the armature surface and is on a straight line parallel to the armature rotation axis. The micrometer's smallest graduation is 0.01mm. Adjusting the micrometer knob 40 depresses the lever 5, which in turn depresses the armature. Based on the lever principle, the distance at which the armature's tail magnetic shield point moves away from the yoke pole surface for every 0.01mm the armature moves closer to the fixed point. This distance represents the working air gap of the armature in this state. Keeping the working air gap constant, the force gauge in the holder 11 is used to move the probe of the force gauge to the position of the armature head to be measured via the XY-axis slide 27. Adjusting the handle 13 rotates the force gauge. Reading the value when the armature leaves the equilibrium position allows measurement of the electromagnetic attraction force under the corresponding working air gap. Continuing to adjust the micrometer knob 40 allows measurement of the electromagnetic attraction force under different working air gaps. Based on this series of data, a graph can be plotted as follows: Figure 4 The armature stroke-electromagnetic attraction curve is shown.

[0034] Because it uses screw locking, the torque is not very large, so no special braking mechanism is needed when replacing the relay; the relay can be installed and removed manually.

[0035] Therefore, this invention, based on a three-layer adjustment architecture of "XY-axis slide + rotary table + Z-axis guide column," achieves omnidirectional precision control of the testing system in the spatial coordinate system. The XY-axis slide provides a millimeter-level planar adjustment foundation through the rigid connection between the base plate and the mounting plate; the active wheel transmission mechanism between the rotary table and the positioning frame, combined with the sleeve-type handle, can achieve 0-360° stepless rotation positioning, overcoming the limitation of traditional devices that can only test in one direction; and the positioning block, through the sliding cooperation between the guide column and the hanging plate, combined with the support frame lifting structure driven by the adjusting screw, enables the magnetic circuit assembly to achieve a vertical adjustment accuracy of 0.01mm, ensuring that the relay magnetic circuit part and the force gauge always maintain the theoretically designed relative positional relationship, eliminating the distortion of the suction curve caused by positioning deviation from the mechanical structure level.

[0036] Those skilled in the art will understand that the above embodiments can be modified in form and detail in practical applications without departing from the spirit and scope of the invention.

Claims

1. A triaxial high-precision relay electromagnetic attraction force curve testing device, characterized in that: The device includes a force gauge clamping mechanism and a magnetic circuit clamping mechanism. The force gauge clamping mechanism has a frame (11) for clamping the force gauge. The frame (11) is fixed on the turntable (22) and rotated by the turntable (22). The magnetic circuit clamping mechanism has a positioning block (3) for clamping the magnetic circuit part of the relay. The positioning block (3) has a pressure plate (42) for pressing and fixing. The positioning block (3) is installed on the slider (34). A pressure rod (9) is installed horizontally on the positioning block (3). The inner end of the pressure rod (9) is used to contact the magnetic circuit part of the relay. The outer end of the pressure rod (9) has a nut (6) for connecting to an external power supply. The positioning block (3) also has a pressure rod (5) for pressing against the pressure plate (42). A micrometer knob (40) is connected and installed on the pressure rod (5) for adjusting the lateral position. The micrometer knob (40) has an adjustment accuracy of 0.01mm. The turntable (22) is mounted on the positioning frame (18). A drive wheel (24) is installed between the turntable (22) and the positioning frame (18) to drive the turntable (22) to rotate. The drive wheel (24) is coaxially connected to a sleeve (23) for inserting the rotating handle (13). The positioning frame (18) is mounted on the mounting plate (28). A shaft (31) is mounted on the mounting plate (28) near the edge by a rotating shaft hexagon screw (10). The shaft (31) is connected to the mounting turntable (22) by a bearing (32). The mounting plate (28) is mounted on the XY axis slide (27) by a first hexagon screw (12). The XY axis slide (27) is mounted on the base plate (26) by a slide hexagon screw (30). An L-shaped support frame (2) is horizontally and vertically fixed on the positioning block (3). A pressure plate (42) is horizontally and longitudinally inserted into the support frame (2). A micrometer knob (40) is horizontally and laterally inserted into the support frame (2). A spring (41) is installed between the pressure plate (42) and the positioning block (3). A support plate (43) is fixed to the pressure plate (42), and a pressure rod (5) is embedded in the support plate (43). The positioning block (3) is installed on the hanging plate (39), and a guide post (1) passes vertically through the hanging plate (39). 9) and installed on the slider (34). The slider (34) is mounted on the guide rail formed by two guide baffles (35). The guide baffles (35) are fixed to the base plate (26). A second internal hex screw (14) is inserted into the hanging plate (39) to fix the hanging plate (39) and the guide post (1) relative to each other. An adjusting screw (37) is embedded on the hanging plate (39) to adjust the support frame (2) to move up and down. The guide post (1) passes through the support frame (2). The support frame (2) is fixed to the positioning block (3).

2. The triaxial high-precision relay electromagnetic attraction force curve testing device as described in claim 1, characterized in that: The positioning frame (18) is mounted on the mounting plate (28) via a pad (21), and the positioning frame (18) and the pad (21) are connected by a hexagonal screw (20) inside the pad.

3. The triaxial high-precision relay electromagnetic attraction force curve testing device as described in claim 1, characterized in that: The positioning frame (18) is U-shaped. The bottom of the U-shape inside the positioning frame (18) is connected to the drive wheel (24) by a spring (16). The drive wheel (24) is located at the U-shaped opening and can be placed in the U-shaped cavity. An adjusting screw (19) passes through the spring (16) to install and press against the drive wheel (24). A cover plate (17) is installed on the top surface of the middle part of the positioning frame (18) by a second internal hexagon screw (14).

4. The triaxial high-precision relay electromagnetic attraction force curve testing device as described in claim 1, characterized in that: A pin (4) is inserted vertically downwards on the support frame (2) at the position where the pressure plate (42) passes through, and there is a hole on the pressure plate (42) directly opposite the pin (4).

5. The triaxial high-precision relay electromagnetic attraction force curve testing device as described in claim 1, characterized in that: The guide baffle (35) is equipped with tightening screws (36) for fixing the slider (34), and the end of the guide baffle (35) has a guide pin (33) for limiting the slider (34).

6. The triaxial high-precision relay electromagnetic attraction force curve testing device and method as described in claim 1, characterized in that: The frame (11) has holes for at least three hexagonal socket screws (10) for fixing the force measuring instrument.

Citation Information

Patent Citations

  • Electromagnetic relay electromagnetic suction force testing method and positioning clamp

    CN116224191A