基于广义光瞳函数的光学系统波像差获取方法
By combining ray tracing and coordinate scaling, the problem of wavefront aberration calculation deviation caused by exit pupil deformation in off-axis fields of view of optical systems is solved, realizing accurate wavefront aberration calculation across the entire field of view and providing a reliable tool for optical system design and optimization.
CN121431014BActive Publication Date: 2026-07-17CHANGGUANG SATELLITE TECH CO LTD
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- CHANGGUANG SATELLITE TECH CO LTD
- Filing Date
- 2025-11-11
- Publication Date
- 2026-07-17
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Figure CN121431014B_ABST
Abstract
基于广义光瞳函数的光学系统波像差获取方法,属于光学系统的成像质量检测技术领域。解决了现有技术中因出瞳变形适应性不足而导致轴外视场波像差计算偏差大，以及难以同时适用于轴上与轴外视场波像差计算的问题。本发明的方法包括：获取待检测的光学系统的入射波长和视场角；获得入瞳与出瞳参数，利用傍轴光线追迹算法确定入瞳位置及入瞳直径，以及对应的出瞳位置；确定在所述波长和视场角下的子午方向工作F数TFNO和弧矢方向F数SFNO；根据TFNO和SFNO获得归一化光瞳平面；进一步生成入射光线阵列；根据实际光线追迹算法，将入射光线阵列追迹至像面；确定虚拟参考球面参数；获得光学系统波像差。本发明可以应用于光学系统设计技术领域。
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