Dynamic parameter testing system and method for bidirectional TVS device

Abstract

The application discloses a dynamic parameter testing system and method of a bidirectional TVS device, relates to the technical field of parameter testing, and dynamically generates specific micro-assistance units for each group of dynamic parameter data groups to be tested, receives corresponding dynamic parameter data groups through an input port, and identifies and discharges interference data of the dynamic parameter data groups by using a testing mechanism of the micro-assistance units; simulation testing events in a twin model are injected into the micro-assistance units, low-quality data in the dynamic parameter data groups is discharged by using interaction of the simulation testing events, when the number of interactions reaches a preset threshold, the micro-assistance units are input into an actual testing environment, dynamic parameter testing of the bidirectional TVS device is carried out by using residual dynamic parameter data groups carried by the micro-assistance units, and effective testing data is output through an output port. The application solves the problem of inaccurate dynamic parameter measurement caused by low data quality, environmental interference and incomplete testing coverage in the traditional testing method.

Description

Technical Field

[0001] This invention relates to the field of parameter testing technology, specifically to a dynamic parameter testing system and method for bidirectional TVS devices. Background Technology

[0002] A bidirectional TVS (Transient Voltage Suppressor) is a semiconductor device used to protect electronic circuits from surge voltage impacts. Its core characteristic is that when subjected to a transient overvoltage exceeding its breakdown voltage, the device's impedance drops sharply, discharging the excessive current to ground and clamping the voltage to a safe level, thus protecting downstream circuits. Compared to a unidirectional TVS, a bidirectional TVS has symmetrical voltage-current characteristics, making it suitable for AC signal lines or DC bus protection scenarios where polarity may reverse. Its dynamic parameters, such as breakdown voltage, clamping voltage, response time, and surge current withstand capability, directly determine the accuracy and response speed of the protection action and are core indicators for evaluating device performance.

[0003] As a critical transient voltage protection component, the testing accuracy of bidirectional TVS devices, such as breakdown voltage, clamping current, and response time, directly affects device selection and circuit protection reliability. However, in actual testing, factors such as strong electromagnetic environments, interference from multiple devices, and data transmission losses make it difficult to guarantee data quality using traditional testing methods, leading to deviations in test results.

[0004] Existing testing systems lack targeted anti-interference mechanisms. The raw data collected is easily mixed with interference data such as inherent equipment noise and electromagnetic radiation. Moreover, the interference characteristics of different acquisition devices vary greatly, and general filtering methods have limited effectiveness. Relying on manually setting fixed thresholds to filter abnormal data cannot adapt to the time-series fluctuation characteristics of dynamic parameters, and it is easy to misjudge or miss low-quality data. Data acquisition, preprocessing and actual testing are disconnected, and there is a lack of intermediate verification mechanisms. Low-quality data directly enters the testing process, resulting in distorted results, and the synchronization of multi-channel data is insufficient. Data transmission and testing are susceptible to external electromagnetic interference and environmental noise. The lack of closed protection mechanisms leads to a high risk of data tampering or distortion.

[0005] Therefore, in order to address the above problems, there is an urgent need for a dynamic parameter testing system and method for bidirectional TVS devices. Summary of the Invention

[0006] To address the shortcomings of existing technologies, this invention provides a dynamic parameter testing system and method for bidirectional TVS devices, which solves the problems in dynamic parameter testing of bidirectional TVS devices, such as the susceptibility of raw data to equipment interference and external environmental influences, the difficulty in screening low-quality data, and the insufficient data synchronization and security in multiple testing stages.

[0007] To achieve the above objectives, the present invention provides the following technical solution: a dynamic parameter testing system for bidirectional TVS devices, comprising: a data acquisition and packaging module, used to receive raw dynamic data streams, dynamically generate specific micro-assistance units for each set of dynamic parameter data clusters to be tested, receive the corresponding dynamic parameter data clusters through an inlet, and use the verification mechanism of the micro-assistance units to identify and eliminate interference data in the dynamic parameter data clusters; a twin testing module, used to input the micro-assistance units into the twin model of the bidirectional TVS device, inject simulated test events from the twin model into the micro-assistance units, use the interaction of simulated test events to eliminate low-quality data in the dynamic parameter data clusters, and input the micro-assistance units into the actual test environment when the number of interactions reaches a preset threshold; and a test execution module, used to receive all micro-assistance units that have reached the preset threshold, use the remaining dynamic parameter data clusters carried by the micro-assistance units to perform dynamic parameter testing on the bidirectional TVS device, and output valid test data through an output port.

[0008] Furthermore, the micro-assistance unit is constructed as a logical container with a closed boundary, the boundary of which is formed by a virtualized isolation medium. This virtualized isolation medium is implemented through encrypted data encapsulation and protocol isolation technology to ensure that the data inside the micro-assistance unit is completely isolated from the external environment during transmission and interaction, preventing external electromagnetic interference or data tampering. The micro-assistance unit includes an inlet, an interference rejection outlet, and an output outlet. The inlet is used to receive the dynamic parameter data group and subsequent simulation test events, and adopts a one-way valve logic control to allow only data to flow in, and can be dynamically closed within one interaction cycle. The interference rejection outlet is used to discharge the identified interference data and low-quality data to a designated destruction point in real time during the inspection and interaction process, and adopts a filtering transmission mechanism to ensure that only data marked as interference and low-quality data can pass through. The output outlet is used to output the remaining valid test data after passing the test execution module test.

[0009] Furthermore, the verification mechanism is specifically a set of intelligent identification algorithms dynamically loaded based on the acquisition device type corresponding to the dynamic parameter data cluster. The generation logic of the verification mechanism includes: using a device interference mode database to define unique interference characteristics for each type of acquisition device; when the data acquisition and encapsulation module receives the dynamic parameter data cluster, it automatically matches the corresponding verification mechanism according to the acquisition device type of the dynamic parameter data cluster and injects it into the micro-assistance unit; the verification mechanism scans the dynamic parameter data cluster in real time, identifies abnormal data segments, marks the abnormal data segments as interference data, and discharges them through the interference elimination port.

[0010] Furthermore, the twin testing module is configured to execute ordered collision interaction logic, specifically including: when a simulated test event enters a micro-assistance unit through the inlet, the inlet of the micro-assistance unit is immediately closed, forming a one-way interaction environment, until the interaction is completed and the simulated test event is discharged, at which point the inlet is reopened to receive new simulated test events; after each interaction, the simulated test event is self-updated and optimized according to the interaction result, and at the same time, the simulated test event and the micro-assistance unit record each other's unique identification code; in subsequent collisions, the updated simulated test event automatically avoids all micro-assistance units with recorded identification codes by comparing the identification codes.

[0011] Furthermore, the self-updating optimization of the simulated test event based on the interaction results specifically involves: dynamically adjusting its detection strategy and sensitivity parameters for the next interaction based on the type and characteristics of the low-quality data marked after the simulated test event interacts with the dynamic parameter data group. Specific logic includes: if the interaction result shows that the low-quality data exhibits amplitude anomalies, optimizing the amplitude detection algorithm in the simulated test event and adding a dynamic adjustment function for the amplitude threshold; if the low-quality data is time-series jitter, strengthening the time-series consistency check logic; determining the feedback score of the interaction result through reinforcement learning, and adjusting the sensitivity of the simulated test event to data anomalies based on the feedback score; after each interaction, when the simulated test event is discharged through the output port, automatically calling the update algorithm to ensure that the event completes its evolution before the next interaction.

[0012] Furthermore, it also includes a coordination and control module, which is linked with the twin test module and the test execution module to monitor the number of interactions completed in each micro-assistance unit in real time. The working logic of the coordination and control module includes: each micro-assistance unit is set with an independent interaction count counter. When the counter value reaches a preset threshold, the unit is marked as ready. When all micro-assistance units in the same batch are marked as ready, the coordination and control module sends a batch start command to the test execution module to trigger the initialization of the actual test environment.

[0013] Furthermore, the actual test in the test execution module is completed within the closed environment of the micro-assistance unit. The execution logic of the actual test includes: the test stimulus generated by the actual test environment is isolated by the closed boundary of the micro-assistance unit and directly acts on the remaining dynamic parameter data group within the unit to avoid external environmental interference; the micro-assistance unit acts as a data carrier, and its internal data group is connected to the interface of the real bidirectional TVS device to perform dynamic parameter testing. The test process is only carried out inside the micro-assistance unit; after the test is completed, the valid test data is exported through the output port of the micro-assistance unit, and a data integrity check code is attached before the output.

[0014] Furthermore, the designated destruction point is specifically a virtual data recycling station, used to receive interference data and low-quality data discharged from the interference elimination port. The logical architecture of the designated destruction point includes: connecting to the interference elimination port through a security protocol, receiving the discharged data in real time, recording the micro-assistance unit identification code of the data source, clearing the received data, and releasing storage resources. At the same time, the designated destruction point integrates an analysis submodule to statistically analyze the type and frequency of the destroyed data, generate an interference pattern report, and feed it back to the verification mechanism and simulation test events for optimization of the verification mechanism and simulation test events.

[0015] The dynamic parameter testing method for bidirectional TVS devices, applying the aforementioned dynamic parameter testing method, includes: receiving the raw dynamic data stream; dynamically generating a specific micro-assistance unit for each set of dynamic parameter data clusters to be tested; receiving the corresponding dynamic parameter data clusters through the inlet port; using the verification mechanism of the micro-assistance unit to identify and eliminate interference data in the dynamic parameter data clusters; inputting the micro-assistance unit into the twin model of the bidirectional TVS device; injecting simulated test events from the twin model into the micro-assistance unit; using the interaction of simulated test events to eliminate low-quality data in the dynamic parameter data clusters; when the number of interactions reaches a preset threshold, inputting the micro-assistance unit into the actual test environment; receiving all micro-assistance units that have reached the preset threshold; using the remaining dynamic parameter data clusters carried by the micro-assistance unit to perform dynamic parameter testing on the bidirectional TVS device; and outputting valid test data through the output port.

[0016] The present invention has the following beneficial effects: The dynamic parameter testing system and method for this bidirectional TVS device, by generating a miniature assisting unit with a specific verification mechanism and combining it with a precise matching algorithm for the device interference mode database, can specifically identify interference data from different acquisition devices. Simultaneously, the virtualized isolation medium with enclosed boundaries isolates external electromagnetic interference and tampering, filtering interference at its source and preventing inferior data from affecting the test benchmark, thus laying a reliable data foundation for subsequent testing. The ordered collision interaction logic and the simulated test event self-updating mechanism work together to avoid disordered interference from multiple events by dynamically closing the input port, prevent duplicate interactions by comparing identification codes, and optimize the detection strategy based on the characteristics of low-quality data, efficiently eliminating problems such as timing jitter and amplitude anomalies. The data allows for continuous evolution of simulated test events, improving the accuracy of data filtering and reducing invalid operations in actual testing. The closed environment of the micro-assistance unit isolates external interference, and the coordination control module ensures that units in the same batch are ready synchronously, avoiding test deviations caused by substandard data from some units. The valid data output with additional check codes after testing further ensures the reliability of the results. In addition, the interference analysis feedback at the designated destruction point feeds back into the verification mechanism and the optimization of simulated test events, forming a closed loop of data processing, testing, and optimization. Overall, this significantly improves the anti-interference capability and accuracy of dynamic parameter testing of bidirectional TVS devices, reduces the risk of test misjudgment due to data problems, and ensures the accuracy of device performance evaluation.

[0017] Of course, any product implementing this invention does not necessarily need to achieve all of the advantages described above at the same time. Attached Figure Description

[0018] Figure 1 This is a structural diagram of the dynamic parameter testing system for the bidirectional TVS device of the present invention.

[0019] Figure 2 This is a flowchart of the dynamic parameter testing method for the bidirectional TVS device of the present invention. Detailed Implementation

[0020] This application embodiment achieves interference filtering and quality control throughout the entire process from data acquisition to actual testing through a dynamic parameter testing system and method for bidirectional TVS devices, ensuring the purity of test data, while improving the accuracy and efficiency of dynamic parameter testing, forming a virtuous cycle of data optimization, testing, and feedback.

[0021] The overall concept of this application's embodiments is as follows: To address the issues of data susceptibility to interference and low-quality data affecting accuracy in dynamic parameter testing of bidirectional TVS devices, this paper focuses on end-to-end data protection and twin pre-optimization. It generates miniature assisting units with specific verification mechanisms through data acquisition and encapsulation modules to filter interference from the original data. These units are then imported into a twin model, where simulated test events are used to eliminate low-quality data and optimize events. After all units have completed a preset number of interactions, they are uniformly entered into the actual test environment. Under the closed protection of the units, the test is completed and valid data is output, achieving accurate and interference-resistant dynamic parameter testing.

[0022] Please see Figure 1 This invention provides a technical solution: a dynamic parameter testing system for a bidirectional TVS device, comprising: a data acquisition and packaging module, used to receive raw dynamic data streams, dynamically generate specific micro-assistance units for each set of dynamic parameter data clusters to be tested, receive the corresponding dynamic parameter data clusters through an inlet, and use the verification mechanism of the micro-assistance units to identify and remove interference data from the dynamic parameter data clusters; a twin testing module, used to input the micro-assistance units into the twin model of the bidirectional TVS device, inject simulated test events from the twin model into the micro-assistance units, use the interaction of simulated test events to remove low-quality data from the dynamic parameter data clusters, and when the number of interactions reaches a preset threshold, input the micro-assistance units into the actual test environment; and a test execution module, used to receive all micro-assistance units that have reached the preset threshold, use the remaining dynamic parameter data clusters carried by the micro-assistance units to perform dynamic parameter testing on the bidirectional TVS device, and output valid test data through an output port.

[0023] Specifically, the micro-assistance unit is constructed as a logical container with a closed boundary, the boundary of which is formed by a virtualized isolation medium. This virtualized isolation medium is implemented through encrypted data encapsulation and protocol isolation technology to ensure that the data inside the micro-assistance unit is completely isolated from the external environment during transmission and interaction, preventing external electromagnetic interference or data tampering. The micro-assistance unit includes an inlet, an interference rejection outlet, and an output outlet. The inlet is used to receive dynamic parameter data clusters and subsequent simulated test events, and adopts a one-way valve logic control to allow only data to flow in, and can be dynamically closed within one interaction cycle. The interference rejection outlet is used to discharge identified interference data and low-quality data to a designated destruction point in real time during the inspection and interaction process, and adopts a filtering transmission mechanism to ensure that only data marked as interference and low-quality data can pass through. The output outlet is used to output the remaining valid test data after passing the test execution module's test.

[0024] In this implementation scheme, the technical implementation of the virtualization isolation medium includes: the essence of the medium is to create a logically absolutely secure and physically difficult-to-break trusted execution environment, which can be achieved through software-defined boundary and confidential computing or data encapsulation and authentication. Specifically, the software-defined boundary and confidential computing means that the micro-assistance unit can be instantiated in an enclave created based on confidential computing technology. The enclave is a hardware-isolated and encrypted area in memory, and even the operating system kernel cannot access its contents. When the micro-assistance unit is transmitted between twin model servers or resides in the industrial control computer of the test execution module, its internal data and verification mechanism are always in an encrypted state. Only authorized code, i.e., the legitimate module of this system, can decrypt and access it, thus achieving hardware-level logical isolation and effectively preventing data leakage or tampering caused by external malicious software or underlying system vulnerabilities. The data encapsulation and authentication are as follows: On the resource-constrained edge side, a lightweight encryption and authentication protocol is adopted. When the micro-assistance unit is generated, it is encrypted with a session key derived from the system master key and an authentication code is attached. Any tampering with the data will cause authentication failure, thus logically determining that the unit has failed and discarding it, achieving logical isolation of cryptographic strength.

[0025] The inlet, interference exclusion port, and output port together form a controlled data pipeline. The one-way valve logic at the inlet ensures the purity of the data source and prevents backflow contamination. The filtering transmission at the interference exclusion port ensures that only explicitly marked data is removed. The airtight seal of the output port guarantees the safety of the final output.

[0026] The structure of the miniature auxiliary unit is the physical foundation of the entire system. Its isolation characteristics ensure that data is not contaminated in complex transmission and testing environments. Its three-port design provides the platform for the implementation of verification mechanisms and collision interaction logic, fundamentally cutting off the path of external interference and laying a solid foundation for high-precision testing.

[0027] Specifically, the verification mechanism is a set of intelligent identification algorithms dynamically loaded based on the type of acquisition device corresponding to the dynamic parameter data cluster. The generation logic of the verification mechanism includes: using the device interference pattern database to define the unique interference characteristics for each type of acquisition device; when the data acquisition and encapsulation module receives the dynamic parameter data cluster, it automatically matches the corresponding verification mechanism according to the acquisition device type of the dynamic parameter data cluster and injects it into the micro-assistance unit; the verification mechanism scans the dynamic parameter data cluster in real time, identifies abnormal data segments, marks the abnormal data segments as interference data, and discharges them through the interference elimination port.

[0028] In this implementation plan, the construction of the equipment interference mode database specifically includes: the database is essentially a device noise fingerprint database. Its acquisition process involves long-term collection of the background noise of various sensors under typical operating environments, their output response under known standard signal inputs, and their drift characteristics under different temperature, humidity, and electromagnetic environments. Big data analytics are then used to establish characteristic noise models for each type of device. For example, for a current sensor, its fingerprint may include its unique PWM switching noise spectrum; for a thermocouple, its fingerprint may include a response delay model caused by its inherent thermal inertia.

[0029] The dynamic loading of the intelligent recognition algorithm set is like equipping a data cluster with a dedicated quality inspector. When the data acquisition and packaging module identifies the type of device from which the data cluster comes, it will call the preset algorithm combination from the algorithm library, such as the combination of the sliding window comparator algorithm and the wavelet transform anomaly detection algorithm, and inject these algorithms into the inspection mechanism of the newly generated micro-assistance unit after instantiation.

[0030] The verification mechanism is the unique core of the micro-assistance unit. It directly relies on the structure of the micro-assistance unit and performs preliminary cleansing for subsequent twin tests, reducing the pressure of simulated test events. The interference pattern reports it generates can then be fed back to the database to optimize future verification mechanisms, forming a learning loop. This achieves targeted data cleansing, improving the accuracy and efficiency of initial screening and avoiding the false deletions or missed detections caused by the one-size-fits-all approach of general algorithms.

[0031] Specifically, the twin testing module is configured to execute ordered collision interaction logic, which includes: when a simulated test event enters a micro-assistant unit through the inlet, the inlet of the micro-assistant unit is immediately closed, forming a one-way interaction environment. The inlet is only reopened to receive new simulated test events after the interaction is completed and the simulated test event is discharged; after each interaction, the simulated test event is self-updated and optimized according to the interaction result. At the same time, the simulated test event and the micro-assistant unit record each other's unique identification code; in subsequent collisions, the updated simulated test event automatically avoids all micro-assistant units with recorded identification codes by comparing the identification codes.

[0032] In this implementation scheme, the simulated test event can be concretized into an executable, parameterized test script or data structure. The essence of injection is to schedule and execute this test script or data structure in the simulation engine of the twin model, allowing it to perform computational analysis on the data clusters within the micro-assistance unit.

[0033] The essence of the inlet closure rule is to force serialization, which avoids race conditions and result chaos that may be caused by multiple events accessing the data cluster concurrently, and ensures the purity of each interaction and the traceability of the results.

[0034] Identifier code management and avoidance essentially implement a distributed, collaborative exploration strategy, ensuring that limited test event resources can efficiently cover as many non-repetitive test scenarios as possible, avoiding ineffective and repetitive testing.

[0035] This logic is the core scheduling rule for the efficient and orderly operation of the twin test module. It relies heavily on the three-port structure of the micro-assistance units and directly utilizes the self-updating capability of simulated test events. The identification code mechanism serves as the link connecting each micro-assistance unit and the simulated test events. This makes the virtual testing process resemble a well-organized many-to-one expert consultation rather than a chaotic brawl, improving testing efficiency and coverage while ensuring test depth.

[0036] Specifically, the self-updating optimization of the simulated test event based on the interaction results is as follows: Based on the type and characteristics of the low-quality data marked after the simulated test event interacts with the dynamic parameter data group, the detection strategy and sensitivity parameters for the next interaction are dynamically adjusted. The specific logic includes: if the interaction result shows that the low-quality data exhibits amplitude anomalies, the amplitude detection algorithm in the simulated test event is optimized, and a dynamic adjustment function for the amplitude threshold is added; if the low-quality data is time-series jitter, the time-series consistency check logic is strengthened; the feedback score of the interaction result is determined through reinforcement learning, and the sensitivity of the simulated test event to data anomalies is adjusted based on the feedback score; after each interaction, when the simulated test event is discharged through the output port, the update algorithm is automatically called to ensure that the event completes its evolution before the next interaction.

[0037] In this implementation plan, the essence of the evolutionary mechanism is to endow the test script with learning capabilities, transforming it from mechanical execution to intelligent exploration. Reinforcement learning is the preferred solution to achieve this goal. The interaction result can be converted into a reward signal, and the detection parameters inside the script can be adjusted according to this reward, such as slightly reducing sensitivity to reduce errors.

[0038] The update process can be encapsulated in an update agent. When the simulated test event is discharged, the update agent reads its interaction history, calculates the new parameters, generates an evolved new event script, and then puts it back into the event pool of the twin model, waiting for the next collision.

[0039] Self-updating optimization is key to the twin test module's ability to become increasingly intelligent with each test. It transforms the collision interaction logic from a static loop into a dynamic, continuously optimizing, adaptive system. The evolved events can interact more effectively with subsequent micro-assistance units. This enables test cases to self-evolve, significantly improving the intelligence and efficiency of virtual testing, allowing the system to automatically identify and focus on critical test scenarios that best expose data quality issues.

[0040] Specifically, it also includes a coordination and control module, which works in conjunction with the twin test module and the test execution module to monitor the number of interactions completed within each micro-assistance unit in real time. The working logic of the coordination and control module includes: each micro-assistance unit is set with an independent interaction count counter. When the counter value reaches a preset threshold, the unit is marked as ready. When all micro-assistance units in the same batch are marked as ready, the coordination and control module sends a batch start command to the test execution module to trigger the initialization of the actual test environment.

[0041] In this implementation scheme, the coordination control essentially acts as the central scheduler of the test pipeline. It maintains a global view and monitors the maturity of each micro-assistance unit, i.e., the number of interactions.

[0042] The principle of starting only when all units in the same batch are ready essentially introduces a synchronization barrier, ensuring the fairness and consistency of physical testing and avoiding the idleness of the test system or the incomparability of test results due to some data clusters not being ready.

[0043] The coordination and control module acts as a bridge and controller connecting the twin test module and the test execution module. It enables virtual test phases, which might otherwise complete asynchronously, to proceed in unison into the final actual test phase, ensuring the coordinated operation of the system as a whole. This achieves optimized allocation of test resources and standardized management of the test process, avoiding confusion and resource waste, and guaranteeing the comparability and reliability of the final test results.

[0044] Specifically, the actual test in the test execution module is completed in the closed environment inside the micro-assistance unit. The execution logic of the actual test includes: the test stimulus generated by the actual test environment is isolated by the closed boundary of the micro-assistance unit and directly acts on the remaining dynamic parameter data group inside the unit to avoid external environmental interference; the micro-assistance unit, as a data carrier, interfaces its internal data group with the interface of the real bidirectional TVS device to perform dynamic parameter testing. The test process is only carried out inside the micro-assistance unit; after the test is completed, the valid test data is exported through the output port of the micro-assistance unit, and a data integrity check code is attached before the output.

[0045] In this implementation scheme, the essence of internal closed-loop testing is to fully implement the protective function of the micro-assistance unit. Even in the most easily disturbed real-world physical test environment, the data cluster remains protected within the logic container. Test stimuli are applied to the data cluster through a secure, controlled interface, and the interactive computation between the data cluster and the TVS is still completed within the unit.

[0046] Internal closed-loop testing demonstrated that the micro-assistance unit is not only a data carrier in the virtual world but also a secure bridge connecting the virtual and real worlds, heavily reliant on its closed structure. This enabled a seamless and secure transition from virtual to physical testing, ensuring the authenticity and validity of the final test data and ultimately realizing the value of the entire system.

[0047] Specifically, the designated destruction point is a virtual data recycling station used to receive interference data and low-quality data discharged from the interference elimination port. The logical architecture of the designated destruction point includes: connecting to the interference elimination port through a security protocol, receiving the discharged data in real time, recording the micro-assistance unit identification code of the data source, clearing the received data, and releasing storage resources. At the same time, the designated destruction point integrates an analysis submodule to statistically analyze the type and frequency of the destroyed data, generate an interference pattern report, and feed it back to the verification mechanism and simulation test events for optimization of the verification mechanism and simulation test events.

[0048] In this implementation plan, the destruction point is essentially a secure data termination and intelligence gathering station. Its destruction action ensures that low-quality data will not resurface and prevents the leakage of sensitive test information, thus elevating it beyond a simple garbage dump to an important node in a feedback learning loop.

[0049] The data destruction point, closely connected to the interference elimination point, marks the end of the data cleansing process. Simultaneously, the generated analysis report is fed back to the data acquisition and packaging module and the twin testing module, forming a continuous feedback chain that runs throughout the system, greatly enhancing its intelligence and long-term adaptability. This not only ensures data security but also transforms the data destruction process from a cost center to a value center, driving continuous optimization of the entire system through data analysis.

[0050] Please see Figure 2 The dynamic parameter testing method for bidirectional TVS devices, applying the aforementioned dynamic parameter testing method, includes: receiving the raw dynamic data stream; dynamically generating a specific micro-assistance unit for each set of dynamic parameter data clusters to be tested; receiving the corresponding dynamic parameter data clusters through the inlet; using the verification mechanism of the micro-assistance unit to identify and eliminate interference data in the dynamic parameter data clusters; inputting the micro-assistance unit into the twin model of the bidirectional TVS device; injecting simulated test events from the twin model into the micro-assistance unit; using the interaction of simulated test events to eliminate low-quality data in the dynamic parameter data clusters; when the number of interactions reaches a preset threshold, inputting the micro-assistance unit into the actual test environment; receiving all micro-assistance units that have reached the preset threshold; using the remaining dynamic parameter data clusters carried by the micro-assistance unit to perform dynamic parameter testing on the bidirectional TVS device; and outputting valid test data through the output port.

[0051] In summary, this application has at least the following effects: Through micro-assistance units and their specific verification mechanisms, interference in the raw data can be proactively identified and eliminated before testing, ensuring the cleanliness of the test source. The twin test module allows data to interact with evolving, self-learning simulated test events multiple times, identifying and eliminating low-quality data in advance in the virtual environment. This not only protects expensive real test equipment but also makes the testing process itself increasingly accurate through iterative optimization. The closed logic container based on encryption encapsulation technology provides continuous isolation protection for data from acquisition, transmission, virtual testing to final execution, effectively resisting external electromagnetic interference and data tampering risks, and ensuring the credibility of test results.

[0052] Those skilled in the art will understand that embodiments of the present invention can be provided as methods or systems. Therefore, the present invention can take the form of a completely hardware embodiment, a completely software embodiment, or an embodiment combining software and hardware aspects. Furthermore, the present invention can take the form of a computer program product embodied on one or more computer-usable storage media (including, but not limited to, disk storage, CD-ROM, optical storage, etc.) containing computer-usable program code.

[0053] This invention is described with reference to flowchart illustrations and structural diagrams of methods and systems according to embodiments of the invention. It should be understood that the combination of each process and module in the flowchart and structural diagram can be implemented by computer program instructions. These computer program instructions can be provided to a processor of a general-purpose computer, special-purpose computer, embedded processor, or other programmable data processing device to produce a machine, such that the instructions, which execute via the processor of the computer or other programmable data processing device, generate instructions for implementing the process. Figure 1 One or more processes and structures Figure 1 A device for a function specified in one or more modules.

[0054] These computer program instructions may also be stored in a computer-readable storage medium that can direct a computer or other programmable data processing device to function in a particular manner, such that the instructions stored in the computer-readable storage medium produce an article of manufacture including instruction means, which are implemented in a process Figure 1 One or more processes and structures Figure 1 The function specified in one or more modules.

[0055] These computer program instructions may also be loaded onto a computer or other programmable data processing equipment to cause a series of operational steps to be performed on the computer or other programmable equipment to produce a computer-implemented process, thereby providing instructions that execute on the computer or other programmable equipment for implementing the process. Figure 1 One or more processes and structures Figure 1The steps of a specified function in one or more modules.

[0056] Although preferred embodiments of the invention have been described, those skilled in the art, upon learning the basic inventive concept, can make other changes and modifications to these embodiments. Therefore, the appended claims are intended to be interpreted as including both the preferred embodiments and all changes and modifications falling within the scope of the invention.

[0057] Obviously, those skilled in the art can make various modifications and variations to this invention without departing from its spirit and scope. Therefore, if these modifications and variations fall within the scope of the claims of this invention and their equivalents, this invention also intends to include these modifications and variations.

Claims

1. A dynamic parameter testing system for bidirectional TVS devices, characterized in that, include: The data acquisition and packaging module is used to receive the raw dynamic data stream, dynamically generate specific micro-assistance units for each set of dynamic parameter data clusters to be tested, receive the corresponding dynamic parameter data clusters through the inlet, and use the verification mechanism of the micro-assistance units to identify and remove interference data in the dynamic parameter data clusters. The micro-assistance unit is constructed as a logical container with a closed boundary, the boundary of which is composed of a virtualized isolation medium. This virtualized isolation medium is implemented through encrypted data encapsulation and protocol isolation technology to ensure that the data inside the micro-assistance unit is completely isolated from the external environment during transmission and interaction, preventing external electromagnetic interference or data tampering. The micro-assistance unit includes an inlet, an interference rejection outlet, and an output outlet. The inlet is used to receive the dynamic parameter data and subsequent simulation test events. It adopts a one-way valve logic control, which only allows data to flow in and can be dynamically closed within one interaction cycle. The interference rejection port is used to discharge the identified interference data and low-quality data to the designated destruction point in real time during the inspection and interaction process. It adopts a filtering transmission mechanism to ensure that only data marked as interference and low-quality data can pass through. The output port is used to output the remaining valid test data after the test is completed by the test execution module; The twin test module is used to input the micro-assistance unit into the twin model of the bidirectional TVS device, inject the simulated test events in the twin model into the micro-assistance unit, use the interaction of the simulated test events to remove low-quality data in the dynamic parameter data cluster, and when the number of interactions reaches a preset threshold, input the micro-assistance unit into the actual test environment. The test execution module is used to receive all micro-assistance units that have reached the preset threshold, use the remaining dynamic parameter data carried by the micro-assistance units to perform dynamic parameter testing on the bidirectional TVS device, and output valid test data through the output port.

2. The dynamic parameter testing system for a bidirectional TVS device according to claim 1, characterized in that, The verification mechanism is specifically a set of intelligent recognition algorithms that are dynamically loaded based on the type of acquisition device corresponding to the dynamic parameter data set; The generation logic of the verification mechanism includes: using the device interference mode database to define the unique interference characteristics for each type of acquisition device; when the data acquisition and encapsulation module receives the dynamic parameter data group, it automatically matches the corresponding verification mechanism according to the acquisition device type of the dynamic parameter data group and injects it into the micro-assistance unit. The system uses a verification mechanism to scan dynamic parameter data clusters in real time, identify abnormal data segments, mark them as interference data, and remove them through the interference elimination port.

3. The dynamic parameter testing system for a bidirectional TVS device according to claim 1, characterized in that, The twin testing module is configured to execute ordered collision interaction logic, specifically including: When a simulated test event enters a micro-assistance unit through the inlet, the inlet of the micro-assistance unit is immediately closed, forming a one-way interactive environment. The inlet will only reopen to receive new simulated test events after the interaction is completed and the simulated test event is discharged. After each interaction, the simulated test event is self-updated and optimized based on the interaction results. At the same time, the simulated test event and the micro-assistance unit record each other's unique identification codes. In subsequent collisions, the updated simulated test events automatically avoid all micro-assistive units with recorded identifier codes by comparing identifier codes.

4. The dynamic parameter testing system for a bidirectional TVS device according to claim 1, characterized in that, The self-updating and optimization of the simulated test event based on the interaction results specifically involves: dynamically adjusting the detection strategy and sensitivity parameters for the next interaction based on the type and characteristics of the low-quality data marked after the simulated test event interacts with the dynamic parameter data set. The specific logic includes: If the interaction results show that the low-quality data is abnormal in amplitude, the amplitude detection algorithm in the simulation test event will be optimized and the dynamic adjustment function of amplitude threshold will be added. If the low-quality data is time series jitter, the timing consistency check logic will be strengthened. Reinforcement learning is used to determine the feedback score of the interaction results, and the sensitivity of simulated test events to data anomalies is adjusted based on the feedback score. After each interaction, when the simulated test event is discharged through the output port, the update algorithm is automatically invoked to ensure that the event completes its evolution before the next interaction.

5. The dynamic parameter testing system for a bidirectional TVS device according to claim 1, characterized in that, It also includes a coordination and control module, which is linked with the twin testing module and the test execution module to monitor in real time the number of interactions completed within each micro-assistance unit; The working logic of the coordination and control module includes: each micro-assistance unit is set with an independent interaction count counter. When the counter value reaches a preset threshold, the unit is marked as ready. When all micro-assistance units in the same batch are marked as ready, the coordination and control module sends a batch start command to the test execution module to trigger the initialization of the actual test environment.

6. The dynamic parameter testing system for a bidirectional TVS device according to claim 1, characterized in that, The actual tests in the test execution module are performed within the closed environment of the micro-assistance unit. The execution logic of the actual tests includes: The test stimuli generated in the actual test environment are isolated by the closed boundary of the micro-assistance unit and directly act on the remaining dynamic parameter data clusters within the unit, avoiding interference from the external environment; The micro-assistance unit serves as a data carrier, connecting its internal data clusters to the interface of a real bidirectional TVS device for dynamic parameter testing. The testing process is conducted entirely within the micro-assistance unit. After the test is completed, the valid test data is exported through the output port of the micro-assistance unit, with a data integrity check code attached before the output.

7. The dynamic parameter testing system for a bidirectional TVS device according to claim 1, characterized in that, The designated destruction point is specifically a virtual data recycling station, used to receive interference data and low-quality data discharged from the interference elimination port. The logical architecture of the designated destruction point includes: connecting to the interference elimination port through a security protocol, receiving the discharged data in real time, recording the micro-assistance unit identification code of the data source, clearing the received data, and releasing storage resources. At the same time, the designated destruction point integrates an analysis submodule to statistically analyze the type and frequency of the destroyed data, generate an interference pattern report, and feed it back to the verification mechanism and simulation test events for optimization of the verification mechanism and simulation test events.

8. A method for testing the dynamic parameters of a bidirectional TVS device, using the dynamic parameter testing system for a bidirectional TVS device as described in any one of claims 1-7, characterized in that, include: It receives the raw dynamic data stream, dynamically generates a specific micro-assistance unit for each set of dynamic parameter data clusters to be tested, receives the corresponding dynamic parameter data clusters through the inlet, and uses the verification mechanism of the micro-assistance unit to identify and remove interference data in the dynamic parameter data clusters. The micro-assistance unit is input into the twin model of the bidirectional TVS device, and the simulated test events in the twin model are injected into the micro-assistance unit. The low-quality data in the dynamic parameter data cluster is discharged by the interaction of the simulated test events. When the number of interactions reaches a preset threshold, the micro-assistance unit is input into the actual test environment. It receives all miniature auxiliary units that have reached the preset threshold, uses the remaining dynamic parameter data carried by the miniature auxiliary units to perform dynamic parameter testing on the bidirectional TVS device, and outputs valid test data through the output port.

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