HIFU irradiation device and method for evaluating state thereof
By evaluating the ultrasonic imaging probe by sending low-intensity ultrasound waves into the HIFU irradiation device and fitting the distribution function with Gaussian or Lorentz functions, the problem of thermal stress caused by reflected waves was solved, thus extending the probe's lifespan and improving its performance stability.
Patent Information
- Application Number
- CN202480044562.8
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Priority Date
- 2023-07-11
- Filing Date
- 2024-06-28
- Publication Date
- 2026-01-30
AI Technical Summary
In the prior art, the ultrasound imaging probe of the HIFU irradiation device is affected by thermal stress due to the concentration of reflected ultrasound waves used for treatment, resulting in a shortened lifespan and making it impossible to effectively assess the extent of the impact.
The control unit controls the therapeutic ultrasound transducers to send low-intensity evaluation ultrasound waves, receives and measures the intensity distribution of multiple transducers, and uses Gaussian or Lorentz functions to fit the distribution function to evaluate the effect of reflected waves on the transducers.
This technology enables the assessment of the thermal stress effects on ultrasonic imaging probes, extending their service life and preventing performance degradation caused by thermal stress.
Smart Images

Figure CN121443225A_ABST
Abstract
Citation Information
Patent Citations
Ultrasonic treatment apparatus
JP1996071069A
Ultrasonic treatment apparatus
JP2014030509A