Anomaly detection apparatus, method, intelligent electronic switch, processor and electromechanical device

Abstract

The embodiment of the application provides an abnormality detection device, method, intelligent electronic switch, processor and electromechanical equipment, wherein the abnormality detection device comprises an intelligent electronic switch and a processor, the intelligent electronic switch has a detection end, so that in the actual application process, the processor can send a test signal to the detection end of the intelligent electronic switch after receiving a first indication signal of an abnormality, and then determines an abnormality type indicated by an abnormality signal based on a feedback test result signal, for example, a load open-circuit abnormality, a control line abnormality or an intelligent electronic switch over-temperature abnormality and the like, and further, a warning signal can be sent to tell a device user to maintain or replace, thereby effectively avoiding the problem of safety accidents caused by control logic confusion.

Description

Technical Field

[0001] This application relates to the field of semiconductor technology, and in particular to an anomaly detection device, method, intelligent electronic switch, processor, and electromechanical equipment. Background Technology

[0002] In electromechanical equipment, a smart electronic switch is connected between the load and the power supply. It is used to connect or disconnect a load line. The smart electronic switch has one or more diagnostic capabilities and protection features, such as protection against over-temperature, overload, overcurrent and short-circuit events. It can disconnect the power switch in the smart electronic switch in the event of over-temperature, overload or short-circuit events, thereby disconnecting the path between the power supply and the load.

[0003] A smart electronic switch may include multiple terminals connected to a processor. For example, the smart electronic switch receives a switch control signal output by the processor through the input terminal to control the power switch to be turned on or off, and outputs an indication signal to reflect the operating status of the power switch through the feedback terminal.

[0004] However, in some cases, when the processor sends an on control signal to the input of the smart electronic switch, the indication signal it receives from the feedback of the smart electronic switch may be an abnormal signal. The abnormal signal may indicate multiple types of abnormalities, which may cause the processor to be unable to accurately determine the cause of the abnormality, thus leading to control errors. Summary of the Invention

[0005] The technical problem to be solved by the embodiments of this application is to provide an anomaly detection device, method, intelligent electronic switch, processor and electromechanical equipment to address the shortcomings of the prior art, thereby solving the problem that the processor cannot determine the cause of the abnormal feedback signal.

[0006] To address the aforementioned technical problems, the first aspect of this application provides an anomaly detection device, including an intelligent electronic switch and a processor;

[0007] The intelligent electronic switch includes an input terminal, a feedback terminal, a detection terminal, and a load output terminal. The processor includes a first output terminal and a first receiving terminal. The input terminal is connected to the first output terminal to form a control circuit. The feedback terminal is connected to the first receiving terminal to form a feedback circuit. The detection terminal is connected to the first output terminal to form a test circuit. The load output terminal is used to connect to a load.

[0008] The processor outputs an activation control signal to the intelligent electronic switch through the control circuit, and the intelligent electronic switch feeds back a first indication signal through the feedback circuit;

[0009] When the processor determines that the first indication signal is an abnormal signal, it also sends a test signal to the smart electronic switch through the test line. The smart electronic switch feeds back the test result signal through the feedback line. The processor also determines the abnormality type indicated by the abnormal signal based on the received test result signal.

[0010] Optionally, the anomaly type includes at least one of the following: control circuit anomaly, load open circuit anomaly, and intelligent electronic switch over-temperature anomaly.

[0011] Optionally, when the abnormal signal is a low-level signal and the test signal is an enable control signal, if the test result signal is different from the low-level signal and different from the fault high-level signal, then the processor determines that the abnormality type indicated by the abnormal signal is the control circuit abnormality; or, if the test result signal remains a low-level signal, then the processor determines that the abnormality type indicated by the abnormal signal is the load open-circuit abnormality; or

[0012] When the abnormal signal is a low-level signal and the test signal is a shutdown control signal, if the test result signal is a fault high-level signal, the processor determines that the abnormality type indicated by the abnormal signal is the load open-circuit abnormality; or, if the test result signal remains a low-level signal, the processor determines that the abnormality type indicated by the abnormal signal is the control circuit abnormality; or

[0013] When the abnormal signal is a fault high-level signal and the test signal is an on / off control signal, if the test result signal remains a fault high-level signal, the processor determines that the abnormality type indicated by the abnormal signal is an over-temperature abnormality of the intelligent electronic switch; or, if the test result signal is a low-level signal, the processor determines that the abnormality type indicated by the abnormal signal is an abnormality of the control circuit and an open-circuit abnormality of the load; or

[0014] When the abnormal signal is a fault high-level signal and the test signal is a shutdown control signal, if the test result signal remains a fault high-level signal, the processor determines that the abnormal type indicated by the abnormal signal is the load open circuit abnormality and control circuit abnormality; or, if the test result signal is a low-level signal, the processor determines that the abnormal type indicated by the abnormal signal is the intelligent electronic switch over-temperature abnormality.

[0015] Optionally, the intelligent electronic switch further includes a current generating circuit, the output terminal of which is connected to the input terminal;

[0016] When the test signal is received at the detection terminal, the current generating circuit starts to work, and the current generated by it flows through the input terminal to make the level of the input terminal a high-level signal.

[0017] Optionally, when both the test result signal and the abnormal signal are low-level signals, the processor determines that the abnormality type indicated by the abnormal signal is a load open-circuit abnormality; or

[0018] When the test result signal is different from a low-level signal and different from a fault high-level signal, and the abnormal signal is a low-level signal, the processor determines that the abnormality type indicated by the abnormal signal is a control circuit abnormality; or

[0019] When the test result signal is different from both a low-level signal and a fault high-level signal, and the abnormal signal is a fault high-level signal, the processor determines that the abnormality type indicated by the abnormal signal is an over-temperature abnormality of the intelligent electronic switch; or

[0020] When the test result signal is a low-level signal and the abnormal signal is a fault high-level signal, the processor determines that the abnormality type indicated by the abnormal signal includes control circuit abnormality and load open circuit abnormality.

[0021] A second aspect of this application provides an intelligent electronic switch, including an input terminal, a feedback terminal, a detection terminal, a load output terminal, a control circuit, and a power switch. The input terminal, the feedback terminal, and the detection terminal are respectively used to connect to a processor, and the load output terminal is used to connect to a load and the power switch.

[0022] The control circuit is connected to the input terminal, the feedback terminal, and the control terminal of the power switch respectively. It controls the on / off state of the power switch according to the switch control signal received at the input terminal and feeds back a first indication signal through the feedback terminal.

[0023] The control circuit is also connected to the detection terminal, and receives test signals through the detection terminal. Based on the test signals, it controls the on / off state of the power switch and feeds back test result signals through the feedback terminal. The test signal is output to the detection terminal by the processor when it determines that the first indication signal is an abnormal signal. The test result signal is used by the processor to determine the type of abnormality indicated by the abnormal signal.

[0024] Optionally, when the first indication signal is an abnormal signal, the abnormality type it indicates includes at least one of the following: abnormality of the control circuit between the processor and the input terminal, abnormality of the load open circuit, and abnormality of the intelligent electronic switch over-temperature.

[0025] Optionally, the control circuit controls the power switch to turn on when it receives an on control signal at the input terminal; when an open-circuit fault occurs in the load, the first indication signal output through the feedback terminal is a low-level signal; or, when an over-temperature fault occurs in the power switch, the first indication signal output through the feedback terminal is a fault high-level signal; or, when the intelligent electronic switch is working normally, the first indication signal output is different from both the low-level signal and the fault high-level signal; or

[0026] When the control circuit receives a shutdown control signal at the input terminal, it controls the power switch to shut down and performs load open circuit detection. When an open circuit abnormality occurs in the load, the first indication signal output through the feedback terminal is a fault high-level signal, and when the load connection is normal, the first indication signal output through the feedback terminal is a low-level signal.

[0027] Optionally, the control circuit controls the power switch to turn on when the test signal is an on control signal; when an open circuit abnormality occurs in the load, the test result signal output through the feedback terminal is a low-level signal; or, when an over-temperature abnormality occurs in the power switch, the test result signal output through the feedback terminal is a fault high-level signal; or, when the intelligent electronic switch is working normally, the test result signal output is different from both the low-level signal and the fault high-level signal; or

[0028] When the test signal is a shutdown control signal, the control circuit controls the power switch to turn off and performs load open circuit detection. When an open circuit abnormality occurs in the load, the test result signal output through the feedback terminal is a fault high-level signal. When the load connection is normal, the test result signal output through the feedback terminal is a low-level signal.

[0029] Optionally, the intelligent electronic switch further includes a current generating circuit, the output terminal of which is connected to the input terminal;

[0030] The enable terminal of the current generating circuit is connected to the control circuit. When the detection terminal receives the test signal, the control circuit controls the current generating circuit to start working, so that the current generated by the current generating circuit flows through the input terminal, making the level of the input terminal a high-level signal. Alternatively, the enable terminal of the current generating circuit is connected to the detection terminal. When the detection terminal receives the test signal, the current generating circuit starts working, and the current it generates flows through the input terminal, making the level of the input terminal a high-level signal.

[0031] A third aspect of this application also provides an integrated circuit chip, including the intelligent electronic switch described in the first aspect above.

[0032] A fourth aspect of this application provides a chip product including a smart electronic switch as described in the second aspect above, wherein the control circuit is located on a first integrated circuit chip and the power switch is located on a second integrated circuit chip.

[0033] A fifth aspect of this application provides a processor, including a first output terminal, a first receiving terminal, and a processing circuit. The first output terminal is used to connect to the input terminal and the detection terminal of an intelligent electronic switch respectively to form a control circuit and a test circuit. The first receiving terminal is used to connect to the feedback terminal of the intelligent electronic switch to form a feedback circuit.

[0034] The processing circuit is connected to the first output terminal and the first receiving terminal. The processing circuit is used to output an activation control signal through the control line and receive a first indication signal through the feedback line.

[0035] When the first indication signal is determined to be an abnormal signal, the processing circuit is further configured to output a test signal through the test line, receive a test result signal through the feedback line, and determine the type of abnormality indicated by the abnormal signal based on the test result signal.

[0036] Optionally, the anomaly type includes at least one of the following: control circuit anomaly, load open circuit anomaly, and intelligent electronic switch over-temperature anomaly.

[0037] Optionally, when the abnormal signal is a low-level signal and the test signal is an enable control signal, if the test result signal is different from the low-level signal and different from the fault high-level signal, then the processing circuit determines that the abnormality type indicated by the abnormal signal is the control circuit abnormality; or, if the test result signal remains a low-level signal, then the processing circuit determines that the abnormality type indicated by the abnormal signal is the load open-circuit abnormality; or

[0038] When the abnormal signal is a low-level signal and the test signal is a shutdown control signal, if the test result signal is a fault high-level signal, the processing circuit determines that the abnormal signal indicates an open-circuit load abnormality; or, if the test result signal remains a low-level signal, the processing circuit determines that the abnormal signal indicates a control circuit abnormality.

[0039] When the abnormal signal is a high-level fault signal and the test signal is an on / off control signal, if the test result signal remains a high-level fault signal, the processing circuit determines that the abnormality type indicated by the abnormal signal is an over-temperature abnormality of the intelligent electronic switch; or, if the test result signal is a low-level signal, the processing circuit determines that the abnormality type indicated by the abnormal signal is an abnormality of the control circuit and an open-circuit abnormality of the load; or

[0040] When the abnormal signal is a fault high-level signal and the test signal is a shutdown control signal, if the test result signal remains a fault high-level signal, the processing circuit determines that the abnormal type indicated by the abnormal signal is the load open circuit abnormality and control circuit abnormality; or, if the test result signal is a low-level signal, the processing circuit determines that the abnormal type indicated by the abnormal signal is the intelligent electronic switch over-temperature abnormality.

[0041] Optionally, the test signal is used to indicate that the input level of the intelligent electronic switch is a high-level signal. In this case, when both the test result signal and the abnormal signal are low-level signals, the processor determines that the abnormal signal indicates an open-circuit load abnormality; or, when the test result signal is different from both a low-level signal and a fault high-level signal, and the abnormal signal is a low-level signal, the processor determines that the abnormal signal indicates a control circuit abnormality; or, when the test result signal is different from both a low-level signal and a fault high-level signal, and the abnormal signal is a fault high-level signal, the processor determines that the abnormal signal indicates an over-temperature abnormality of the intelligent electronic switch; or, when the test result signal is a low-level signal and the abnormal signal is a fault high-level signal, the processor determines that the abnormal signal indicates both a control circuit abnormality and an open-circuit load abnormality.

[0042] The sixth aspect of this application provides an anomaly detection method, including:

[0043] The processor sends an on / off control signal to the intelligent electronic switch via the control circuitry.

[0044] The intelligent electronic switch outputs a first indication signal through a feedback circuit;

[0045] When the processor determines that the first indication signal is an abnormal signal, it sends a test signal to the smart electronic switch through the test line.

[0046] The intelligent electronic switch feeds back the test result signal through the feedback circuit;

[0047] The processor determines the type of anomaly indicated by the anomaly signal based on the test result signal.

[0048] A seventh aspect of this application provides an electromechanical device, including an anomaly detection device, a power supply, and a load as described in the first aspect above, wherein the positive terminal of the power supply is connected to the power supply terminal, the negative terminal of the power supply is connected to the power supply ground terminal, one end of the load is connected to the load output terminal of an intelligent electronic switch, and the other end of the load is connected to the power supply ground terminal or the power supply terminal.

[0049] In the embodiments of this application, the intelligent electronic switch has a detection terminal. In practical applications, after receiving the first indication signal of an abnormality, the processor can send a test signal to the detection terminal of the intelligent electronic switch. Based on the feedback test result signal, the abnormality type indicated by the abnormal signal can be determined, such as an open circuit abnormality, a control circuit abnormality, or an over-temperature abnormality of the intelligent electronic switch. Furthermore, a reminder signal can be issued to inform the device user to perform maintenance or replacement, effectively avoiding safety accidents caused by chaotic control logic. Attached Figure Description

[0050] To more clearly illustrate the technical solutions in the embodiments of this application or the prior art, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of this application. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0051] Figure 1a This is a circuit module diagram of an electromechanical device provided in the first embodiment of this application;

[0052] Figure 1b This is another circuit module diagram of the electromechanical equipment provided in the first embodiment of this application;

[0053] Figure 2 This is a schematic diagram of the circuit module of the anomaly detection device provided in the first embodiment of this application;

[0054] Figure 3 These are two waveform diagrams of the feedback signal when the abnormal signal is a low-level signal and the test signal is an enable control signal;

[0055] Figure 4 These are two waveform diagrams of the feedback signal when the abnormal signal is a low-level signal and the test signal is a shutdown control signal;

[0056] Figure 5 These are two waveform diagrams of the feedback signal when the abnormal signal is a fault high-level signal and the test signal is an enable control signal;

[0057] Figure 6These are two waveform diagrams of the feedback signal when the abnormal signal is a fault high-level signal and the test signal is a shutdown control signal;

[0058] Figure 7a and Figure 7b These are two circuit module diagrams of the anomaly detection device provided in the second embodiment of this application;

[0059] Figure 8 These are schematic diagrams of two waveforms: an abnormal signal being a low-level signal and a test signal causing the current-generating circuit to operate.

[0060] Figure 9 These are two waveform diagrams showing the abnormal signal being a fault high-level signal and the test signal causing the current generating circuit to operate.

[0061] Figure 10 This is an interactive schematic diagram of the anomaly detection method provided in the embodiments of this application. Detailed Implementation

[0062] The technical solutions of the embodiments of this application will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of this application, and not all embodiments. Based on the embodiments of this application, all other embodiments obtained by those of ordinary skill in the art without creative effort are within the scope of protection of this application.

[0063] The terms "comprising" and "having," and any variations thereof, appearing in this application specification, claims, and drawings, are intended to cover non-exclusive inclusion. For example, a process, method, system, product, or device that includes a series of steps or modules is not limited to the listed steps or units, but may optionally include steps or units not listed, or may optionally include other steps or units inherent to these processes, methods, products, or devices. Furthermore, the terms "first," "second," and "third," etc., are used to distinguish different objects and are not used to describe a specific order. Connections in this application include direct connections and indirect connections. An indirect connection refers to the presence of other electronic components, pins, etc., between the two connected components. The term "XX terminal" mentioned in this application may or may not be an actual terminal, such as simply one end of a component or one end of a wire. The term "and / or includes three cases" mentioned in this application, such as A and / or B, includes A, B, and A and B.

[0064] First Embodiment

[0065] This application provides an electromechanical device. Figure 1a This is a circuit module diagram of an electromechanical device provided in the first embodiment of this application; Figure 1bThis is another circuit module diagram of the electromechanical equipment provided in the first embodiment of this application. Please refer to... Figure 1a and Figure 1b The electromechanical equipment includes a power supply 10, a load 20, an intelligent electronic switch 30 (shown in the dashed box in the figure), and a processor 40 (shown in the solid box in the figure). The power supply 10 is generally a battery, typically a rechargeable battery, providing voltages such as 12V, 24V, 36V, 48V, and 60V. Other types of batteries or power supplies can also be used, such as AC / DC converters or DC / DC converters. The load 20 includes at least one of resistive, inductive, and capacitive loads. For example, in the case of an automobile, resistive loads include seat adjustment devices, auxiliary heating devices, window heating devices, light-emitting diodes (LEDs), rear lighting, or other resistive loads. Inductive loads include pumps, actuators, motors, anti-lock braking systems (ABS), electronic braking systems (EBS), fans, or other systems that include inductive loads for one or more wiper systems. Capacitive loads include lighting elements such as xenon arc lamps. In the illustration, load 20 is shown as a single element for illustrative purposes only. Load 20 is typically a more complex load, such as a module or subsystem with numerous components. Processor 40 is connected to intelligent electronic switch 30 for controlling intelligent electronic switch 30. Simultaneously, intelligent electronic switch 30 feeds back its status and relevant parameter information to processor 40, such as diagnostic parameters, current parameters, voltage parameters, etc., for processor 40 to process. Processor 40 includes one or more microprocessors, digital signal processors (DSPs), application-specific integrated circuits (ASICs), field-programmable gate arrays (FPGAs), or any other equivalent integrated or discrete logic circuits, and any combination of these components.

[0066] In this embodiment, the intelligent electronic switch 30 includes a power supply terminal VCC, a power ground terminal GND, and a load output terminal OUT. The power supply terminal VCC is connected to the positive terminal of the power supply 10 via a fuse 50, and the power ground terminal GND is connected to the negative terminal of the power supply 10. In this embodiment, a reverse polarity protection diode D4 and a current-limiting resistor R1 are connected in parallel between the power ground terminal GND and the negative terminal of the power supply 10. The load output terminal OUT is connected to one end of the load 20, and the other end of the load 20 is connected to either the negative or positive terminal of the power supply 10. (Refer to...) Figure 1a As shown. Additionally, in other embodiments of this application, the reverse polarity protection diode D4 and / or current-limiting resistor R1 may not be provided between the power supply ground terminal GND and the negative terminal of power supply 10, such as... Figure 1b As shown.

[0067] In this embodiment, refer to Figure 1a and Figure 1bAs shown, the intelligent electronic switch 30 also includes an input terminal Input, a power switch M0, a control circuit 300, and a feedback terminal IS. The processor 40 includes a first output terminal TX1, a first receiving terminal RX1, and a processing circuit 400. The input terminal Input is connected to the first output terminal TX1 of the processor 40, and the feedback terminal IS is connected to the first receiving terminal RX1 of the processor 40. Both the input terminal Input and the feedback terminal IS are connected to the control circuit 300. The control circuit 300 is also connected to the control terminal (gate) of the power switch M0. The first terminal of the power switch M0 is connected in series with the load 20 via the load output terminal OUT, and its second terminal is connected to the power supply terminal VCC. The control circuit 300 is used to control whether the power switch M0 is turned on according to the switch control signal received by the input terminal Input, and to feed back the state and related parameter information of the intelligent electronic switch 30 through the feedback terminal IS. Correspondingly, the processing circuit 400 can obtain the information fed back by the intelligent electronic switch 30 through the first receiving terminal RX1, and then control the state of the intelligent electronic switch 30. In the figure, the first terminal of the power switch M0 is the source and the second terminal is the drain. However, this application is not limited to this. In other embodiments of this application, the first terminal of the power switch M0 is the drain and the second terminal is the source.

[0068] In this embodiment, the power switch M0 is an NMOS transistor, PMOS transistor, junction FET, etc. The illustration uses an NMOS transistor as an example. The power switch M0 can be implemented as a silicon device, or it can be implemented using other semiconductor materials, such as silicon carbide (SiC), gallium arsenide (GaAs), or gallium nitride (GaN). The power switch M0 can also be an LDMOS (Lateral Double-Diffused Metal Oxide Semiconductor FET) or a VDMOS (Vertical Double-Diffused MOSFET), etc.

[0069] exist Figure 1a In this configuration, power switch M0 is connected as a high-side switch, which connects the power supply terminal VCC to the load 20. One end of power switch M0 is connected to the load output terminal OUT, and the other end is connected to the power supply terminal VCC. However, this application is not limited to this; please refer to other embodiments of this application. Figure 1b Power switch M0 is connected as a low-side switch, which is a switch connected between load 20 and power supply ground GND. At this time, one end of power switch M0 is connected to power supply ground GND, and the other end of power switch M0 is connected to load output OUT.

[0070] The inventors of this application discovered during the application of electromechanical equipment (including a smart electronic switch 30 and a processor 40) that: when the processor 40 sends an on control signal (ON signal) to the input terminal Input of the smart electronic switch 30, under normal circumstances, the smart electronic switch 30 will receive the on control signal (ON signal) through the input terminal Input and control the power switch M0 to turn on based on the on control signal (ON signal). Subsequently, it will feed back relevant parameter information of the power switch M0 through the feedback terminal IS so that the processor 40 can understand the working status of the smart electronic switch 30 in a timely manner. However, in some cases, the feedback signal received by the processor 40 from the smart electronic switch 30 may be an abnormal signal, such as low power. The abnormal signal (L signal) or fault high-level signal may be caused by at least one of the following reasons: load open circuit abnormality, control circuit abnormality between input terminal Input and processor 40, and intelligent electronic switch 30 over-temperature abnormality. However, processor 40 cannot distinguish which cause the abnormal signal, which may lead to control error. Therefore, after processor 40 sends an ON control signal to input terminal Input, if the first indication signal received is an abnormal signal, further operation is required to determine the abnormality type and output different types of warning signals, such as displaying warning signals on the display screen of the electromechanical equipment to inform the user of the possible cause of the equipment failure.

[0071] Specifically, to address the problem that the processor 40 cannot determine the type of exception indicated by the exception signal, embodiments of this application provide an exception detection device. Figure 2 This is a schematic diagram of the circuit module of the anomaly detection device provided in the first embodiment of this application. (Refer to...) Figure 1a , Figure 1b and Figure 2 As shown, the anomaly detection device provided in this embodiment may include the processor 40 and the intelligent electronic switch 30 described above. The intelligent electronic switch 30 also includes a detection terminal Test, which is connected to the control circuit 300 and the first output terminal TX1. In this embodiment, the input terminal Input of the intelligent electronic switch 30 is connected to the first output terminal TX1 of the processor 40 to form a control line 601, the feedback terminal IS is connected to the first receiving terminal RX1 to form a feedback line 603, and the detection terminal Test is connected to the first output terminal TX1 to form a test line 602.

[0072] In this embodiment, the processor 40 outputs an activation control signal to the intelligent electronic switch 30 via control line 601, and the intelligent electronic switch 30 feeds back a first indication signal via feedback line 603. When the processor 40 determines that the first indication signal is an abnormal signal, it also sends a test signal to the intelligent electronic switch 30 via test line 602. Correspondingly, the intelligent electronic switch 30 feeds back a test result signal via feedback line 603, and the processor 40 further determines the type of abnormality indicated by the received test result signal.

[0073] For example, refer to Figure 2 As shown, the processing circuit 400 in the processor 40 may include a first control unit 401 and an anomaly judgment unit 402. The first control unit 401 is connected to the anomaly judgment unit 402 and the first output terminal TX1, respectively. The anomaly judgment unit 402 is also connected to the first receiving terminal RX1. The first control unit 401 is used to output an enable control signal to the input terminal Input through the first output terminal TX1. The anomaly judgment unit 402 receives a first indication signal through the first receiving terminal RX1 and judges whether the first indication signal is different from a low-level signal and different from a fault high-level signal. The judgment result is then output to the first control unit 401 so that the first control unit 401 can perform subsequent operations based on the judgment result. For example, when the first indication signal is a low-level signal or a fault high-level signal, the anomaly judgment unit 402 determines that the first indication signal is an abnormal signal. At this time, the first control unit 401 will output a test signal through the detection line 602 to further determine the abnormal type indicated by the abnormal signal based on the test result signal fed back by the intelligent electronic switch 30. When the first indication signal is different from both the low-level signal and the fault high-level signal, the anomaly judgment unit 402 determines that the first indication signal is a normal signal.

[0074] Continue to refer to Figure 2As shown, in this embodiment, the control circuit 300 in the intelligent electronic switch 30 includes a logic control unit 301 and a switch control unit 302. The logic control unit 301 is connected to the input terminal Input, the detection terminal Test, and the switch control unit 302. The switch control unit 302 is also connected to the control terminal of the power switch M0. The logic control unit 301 can control the power switch M0 to turn on or off based on the switch control signal received from the input terminal Input via the switch control unit 302. Optionally, the switch control unit 302 may include a boost power supply module and a drive module (not shown) connected to each other. The boost power supply module is connected to the power supply terminal VCC, and the drive module is connected to the boost power supply module and the control terminal of the power switch M0. The boost power supply module provides energy to the switch control unit 302. The output voltage of the boost power supply module is higher than the voltage of the power supply terminal VCC to achieve voltage boosting, for example, 3V, 4V, 5V, 6V, etc., higher than the voltage of the power supply terminal VCC.

[0075] In this embodiment, the boost power supply module is a charge pump, and the drive module includes a pull-up current source, a pull-down current source, a charging switch, a discharging switch, etc. The connection method and working principle of the boost power supply module and the drive module are conventional technologies in the art and will not be described in detail here. In addition, in other embodiments of this application, the boost power supply module and the drive module may also be other implementations known to those skilled in the art, which will not be described in detail here.

[0076] Optionally, the control circuit 300 further includes a signal processing unit 303, a monitoring unit 304, an anomaly handling unit 305, and a load open-circuit detection unit 306. The signal processing unit 303 is connected to the feedback terminal IS, the monitoring unit 304, the anomaly handling unit 305, and the load open-circuit detection unit 306, respectively. The monitoring unit 304 monitors the temperature of the power switch M0, the current flowing through the power switch M0, and other status information, and outputs a monitoring signal. The anomaly handling unit 305 outputs a fault high-level signal when the power switch M0 is abnormally turned off. The load open-circuit detection unit... Unit 306 is used to detect whether there is an open circuit abnormality in the load connected to the load output terminal OUT when the power switch M0 is turned off. When the load is open circuit abnormal, it outputs a high-level fault signal and when the load connection is normal, it outputs a low-level signal. When the signal processing unit 303 receives the high-level fault signal, it connects the feedback terminal IS and the abnormality processing unit 305 and outputs the high-level fault signal. When it does not receive the high-level fault signal, it connects the feedback terminal IS and the monitoring unit 304 and outputs the monitoring signal. That is, the output priority of the abnormality processing unit 305 is higher than the output priority of the monitoring unit 304.

[0077] Understandably, in practical applications, the monitoring unit 304 may include a current monitoring unit and a temperature monitoring unit. The current monitoring unit is used to collect the current flowing through the power switch M0 and output a current monitoring signal, while the temperature monitoring unit is used to detect the temperature of the power switch M0 and output a temperature monitoring signal. Under default conditions, the signal processing unit 303 is used to connect the current monitoring unit and the feedback terminal IS, but it can also control the intelligent electronic switch 30 to output a temperature monitoring signal through the feedback terminal IS based on the diagnostic selection function of the processor 40. The load open circuit detection unit 306 only performs load open circuit abnormality detection when the power switch M0 is in the off state, and does not work when the power switch M0 is on. In addition, the intelligent electronic switch 30 or the control circuit 300 may also include other functional units, such as a voltage protection unit, a short circuit detection unit, etc., which are not limited in this application.

[0078] In the embodiments of this application, when the first control unit 401 of the processor 40 outputs an enable control signal through the first output terminal TX1, under normal circumstances, the first indication signal received by the anomaly judgment unit 402 through the first receiving terminal RX1 is different from both the low-level signal and the fault high-level signal. Moreover, the level value of the first indication signal may be a real-time changing value or a constant value. Therefore, when the first indication signal received by the anomaly judgment unit 402 through the feedback terminal IS is a low-level signal or a fault high-level signal, it considers the first indication signal to be an anomaly signal, but the anomaly type indicated by the anomaly signal needs to be further determined.

[0079] Optionally, if the first indication signal is a low-level signal, this may be caused by the following reasons: First, due to an abnormality in the control circuit between the first output terminal TX1 and the input terminal Input, the input terminal Input does not actually receive the ON control signal output by the first output terminal TX1. In this case, the intelligent electronic switch 30 controls the power switch M0 to turn off and performs load open-circuit detection. Subsequently, when there is no open-circuit abnormality in the load, it outputs a low-level signal (L) indicating that the load connection is normal. Second, when the control circuit 601 between the first output terminal TX1 and the input terminal Input is normal, the input terminal Input will receive the ON control signal output by the first output terminal TX1. Therefore, the logic control unit 301 will control the power switch M0 to turn on via the drive unit. However, if the load connected to the load output terminal OUT actually has an open-circuit abnormality, this will cause the current flowing through the power switch M0 to be 0, which will also cause the feedback terminal IS to output a low-level signal. Given the above two possibilities, when the processing circuit 400 issues an ON control signal but receives a low-level signal (L), it cannot accurately determine the abnormality type indicated by the abnormal signal.

[0080] To address this issue, the processor 40 can send a test signal to the smart electronic switch 30 via the test line 602.

[0081] In one possible design, when the exception signal is a low-level signal (L) and the test signal is an on / off control signal (ON), the processor 40 determines the exception type indicated by the exception signal based on the test result signal. For example, Figure 3 These are schematic diagrams of two feedback signal waveforms when the abnormal signal is a low-level signal and the test signal is an enable control signal. As an example, in... Figure 3 In (a), if the test result signal is different from both the low-level signal (L) and the high-level fault signal (fault), then the processor 40 determines that the abnormality type indicated by the abnormal signal is a control circuit abnormality. That is, when the logic control unit 301 receives the ON control signal through the detection terminal Test, it controls the power switch M0 to turn on. Since the test result signal is neither a low-level signal nor a high-level fault signal, this indicates that the load connected to the load output terminal OUT has not experienced an open-circuit abnormality. Therefore, in this example, the abnormality type indicated by the abnormal signal is a control circuit abnormality. As another example, in Figure 3 In (b), if the test result signal remains low (L), the processor 40 determines that the abnormality type indicated by the abnormal signal is a load open circuit abnormality. In this example, when the logic control unit 301 receives the ON control signal through the detection terminal Test, it controls the power switch M0 to turn on. If the test result signal remains low (L), this indicates that an open circuit abnormality has actually occurred in the load, causing the feedback terminal IS to output a low-level signal (L). Therefore, in this example, the abnormality type indicated by the abnormal signal is a load open circuit abnormality, and the control line 601 is not abnormal.

[0082] In another possible design, when the exception signal is a low-level signal (L) and the test signal is a shutdown control signal (OFF), the processor 40 determines the exception type indicated by the exception signal based on the test result signal. For example, Figure 4 These are schematic diagrams of two feedback signal waveforms when the abnormal signal is a low-level signal and the test signal is a shutdown control signal. As an example, in... Figure 4 In (a), if the test result signal is a fault high-level signal, the processor 40 determines that the abnormality type indicated by the abnormal signal is an open-circuit load abnormality. That is, when the logic control unit 301 receives the shutdown control signal (OFF) through the detection terminal Test, it will control the power switch M0 to turn off and will perform an open-circuit load detection. Since the test result signal is a fault high-level signal, this indicates that there is an open-circuit load abnormality but the control line 601 is normal. As another example, in Figure 4In (b), if the test result signal remains low (L), the processor 40 determines that the abnormality indicated by the abnormal signal is a control circuit abnormality. In this example, when the logic control unit 301 receives the shutdown control signal (OFF) through the detection terminal Test, it controls the power switch M0 to turn off. If the test result signal remains low (L), this indicates that the load connection is normal but the control circuit is abnormal.

[0083] Optionally, if the first indication signal is a fault high-level signal, this may be caused by the following reasons: First, due to an abnormality in the control line between the first output terminal TX1 and the input terminal Input, the input terminal Input does not actually receive the turn-on control signal output by the first output terminal TX1. In this case, the intelligent electronic switch 30 controls the power switch M0 to turn off and performs load open-circuit detection. Subsequently, when there is an open-circuit abnormality in the load, it outputs a fault high-level signal. Second, when the control line 601 between the first output terminal TX1 and the input terminal Input is normal, the input terminal Input will receive the turn-on control signal (ON) output by the first output terminal TX1. Therefore, the logic control unit 301 will control the power switch M0 to turn on via the drive unit. However, due to an over-temperature problem, the power switch M0 of the intelligent electronic switch 30 is turned off, thereby outputting a fault high-level signal (ON) through the feedback terminal IS. Given the above two possibilities, when the processing circuit 400 issues an turn-on control signal (ON) but receives a fault high-level signal (ON), it cannot accurately determine the cause of the fault. At this point, the processor 40 can send a test signal through the test line 602.

[0084] In one possible design, when the abnormal signal is a high-level fault signal and the test signal is an ON control signal, the processor 40 determines the type of abnormality indicated by the abnormal signal based on the test result signal. For example, Figure 5 These are schematic diagrams of two feedback signal waveforms when the abnormal signal is a fault high-level signal and the test signal is an enable control signal. As an example, in... Figure 5 In (a), if the test result signal still remains a high-level fault signal, the processor 40 determines that the abnormality type indicated by the abnormal signal is an over-temperature abnormality of the intelligent electronic switch 30. That is, when the logic control unit 301 receives the ON control signal through the detection terminal Test, it controls the power switch M0 to turn on. Since the test result signal is a high-level fault signal, this indicates that the load has not experienced an open-circuit abnormality and the control line 601 is normal. Therefore, in this example, the abnormality type indicated by the abnormal signal is an over-temperature abnormality of the intelligent electronic switch 30 causing an output high-level fault signal. As another example, in Figure 5In (b), if the test result signal is a low-level signal (L), the processor 40 determines that the abnormality type indicated by the abnormal signal is a load open-circuit abnormality and a control circuit abnormality. In this example, when the logic control unit 301 receives the on-state control signal (ON) through the detection terminal Test, it controls the power switch M0 to turn on. Since the test result signal becomes a low-level signal (L), this indicates that the load has actually experienced an open-circuit abnormality. Correspondingly, the control circuit abnormality causes the input terminal Input to not receive the on-state control signal (ON). Therefore, the fault high-level signal (fault) corresponding to the first indication signal is the output when the load open-circuit detection is performed and the load is in an open-circuit abnormality. Thus, in this example, the abnormality type indicated by the abnormal signal is a load open-circuit abnormality and a control circuit abnormality.

[0085] In another possible design, when the abnormal signal is a high-level fault signal and the test signal is an OFF control signal, the processor 40 determines the type of abnormality indicated by the abnormal signal based on the test result signal. For example, Figure 6 These are schematic diagrams of two feedback signal waveforms when the abnormal signal is a fault high-level signal and the test signal is a shutdown control signal. As an example, in... Figure 6 In (a), if the test result signal remains a fault high-level signal, the processor 40 determines that the abnormality type indicated by the abnormal signal is an open-circuit load abnormality. That is, when the logic control unit 301 receives the shutdown control signal (OFF) through the detection terminal Test, it controls the power switch M0 to turn off and performs an open-circuit load detection. Since the test result signal is a fault high-level signal, this indicates that an open-circuit load abnormality exists. Therefore, the abnormality type indicated by the abnormal signal is a control circuit abnormality and an open-circuit load abnormality. As another example, in Figure 6 In (b), if the test result signal is a low-level signal (L), it indicates that there is no open circuit abnormality in the load, and correspondingly, there is no abnormality in the control circuit 601. Therefore, the processor 40 determines that the abnormality type indicated by the abnormal signal is the over-temperature abnormality of the intelligent electronic switch 30.

[0086] In the embodiments of this application, after the processor determines the type of abnormality indicated by the abnormal signal, it can issue different warning signals based on the type of abnormality so that the device user can be informed of the device's operating status in a timely manner and carry out targeted abnormality handling.

[0087] In the anomaly detection device provided in this application embodiment, the intelligent electronic switch has a detection end. In practical application, after the processor receives the first indication signal of an anomaly, it can send a test signal to the detection end of the intelligent electronic switch. Then, based on the feedback test result signal, it can determine the type of anomaly indicated by the anomaly signal, such as an open circuit anomaly, a control circuit anomaly, or an over-temperature anomaly of the intelligent electronic switch. Furthermore, it can issue a reminder signal to inform the device user to perform maintenance or replacement, effectively avoiding safety accidents caused by chaotic control logic.

[0088] That is, embodiments of this application also provide an intelligent electronic switch, which is the aforementioned Figures 1a to 2 The intelligent electronic switch 30 is described above. This application also provides a processor, which is the aforementioned... Figures 1a to 2 The processor 40, used in conjunction with the intelligent electronic switch 30, is used to control the connection and disconnection of the line between the load and the power supply via the intelligent electronic switch 30.

[0089] This application also provides an integrated circuit chip, which includes the aforementioned intelligent electronic switch, i.e., the aforementioned intelligent electronic switch is fabricated on the same semiconductor substrate. The power supply terminal VCC is the power supply pin, the power ground terminal GND is the power ground pin, and the load output terminal OUT is the load output pin.

[0090] Other embodiments of this application also provide a chip product, which includes the aforementioned intelligent electronic switch. The control circuit 300 may be located on a first integrated circuit chip, and the power switch M0 may be located on a second integrated circuit chip. That is, the first integrated circuit chip is fabricated on one semiconductor substrate, and the second integrated circuit chip is fabricated on another semiconductor substrate. Additional pins may be added to the first and second integrated circuit chips as needed. Here, the first and second integrated circuit chips are packaged into a single product.

[0091] In addition, in other embodiments of this application, the anomaly detection device, processor, smart electronic switch, etc. of this embodiment can be applied to multiple fields, such as automotive electronics, industrial automation, aerospace, etc.

[0092] Second Embodiment

[0093] Please see Figure 7a and Figure 7b As shown, Figure 7a and Figure 7bThese are two circuit module diagrams of the anomaly detection device provided in the second embodiment of this application. This embodiment is similar to the first embodiment, therefore, the parts not described in this embodiment can be referred to in the first embodiment. The main difference between this embodiment and the first embodiment is that the function of the detection terminal Test is different, and the processing scheme of the intelligent electronic switch 30 for testing based on the test signal is different.

[0094] For example, refer to Figure 7a and Figure 7b As shown, in this embodiment, the intelligent electronic switch 30 further includes a current generating circuit 307, the output terminal of which is connected to the input terminal Input. In this embodiment, the current generating circuit 307 includes a first current source I1 and a first switch K1, wherein the first current source I1 and the first switch K1 are connected in series. Specifically, the first end of the first current source I1 is connected to the power supply terminal VCC, and the other end is connected to the first end of the first switch K1. The second end of the first switch K1 is connected to the input terminal Input. Alternatively, the positions of the first switch K1 and the first current source I1 can be interchanged, with the first end of the first switch K1 connected to the power supply terminal VCC and the second end of the first current source I1 connected to the input terminal Input.

[0095] As an example, the enable terminal of the current generating circuit 307 is connected to the control circuit 300. In this case, when the detection terminal Test receives a test signal, the control circuit 300 controls the current generating circuit 307 to start working, causing the current generated by the current generating circuit 307 to flow through the input terminal Input, so that the level of the input terminal Input is a high-level signal. (Refer to...) Figure 7a As shown, the enable terminal of the current generating circuit 307 is the control terminal of the first switch K1. That is, the control terminal of the first switch K1 is connected to the logic control unit 301. When the logic control unit 301 receives a test signal at the detection terminal Test, it controls the first switch K1 to turn on, so that the current generating circuit 307 starts to work and the current it generates flows through the input terminal Input, so that the level of the input terminal Input is a high level signal.

[0096] As another example, the enable terminal of the current generating circuit 307 is connected to the detection terminal Test. When the detection terminal Test receives a test signal, the current generating circuit 307 starts working, and the current it generates flows through the input terminal Input, so that the level of the input terminal Input is a high-level signal. (See reference...) Figure 7bAs shown, the control terminal of the first switch K1 is connected to the detection terminal Test. When the detection terminal Test receives a test signal, the first switch K1 turns on and the current generating circuit 307 starts to work. The current generated by it flows through the input terminal Input, so that the signal obtained by the logic control unit 301 from the input terminal Input is a high-level signal, thereby controlling the power switch M0 to turn on via the switch control unit 302.

[0097] It is understood that in this embodiment, the current generating circuit 307 is connected between the power supply terminal VCC and the input terminal Input. In other embodiments, the current generating circuit 307 can also be connected between the input terminal Input and the power supply ground terminal GND, as long as the current generating circuit 307 can form a current path when the first switch K1 is turned on. The first current source I1 can be any type of fixed current source or variable current source, and can be in the form of voltage-controlled current source or current-controlled current source, etc. In other embodiments, the current source can also be replaced with other types of components, such as resistors, which will not be described in detail in this application.

[0098] In this embodiment, the test signal mainly controls the current generating circuit 307 to work, so that the level of the input terminal Input becomes high, thereby enabling the logic control unit 301 to control the power switch M0 to turn on via the switch control unit 302, and then enabling the intelligent electronic switch 30 to output the test result signal through the feedback terminal IS.

[0099] In one possible design, Figure 8 These are schematic diagrams of two waveforms: a low-level abnormal signal and a test signal activating the current-generating circuit. As an example, in... Figure 8 In (a), when both the test result signal and the abnormal signal are low-level signals (L), the processor 40 determines that the abnormal signal indicates an open-circuit load. That is, during the test phase, a high-level signal (H) at the input terminal allows the logic control unit 301 to control the power switch M0 to turn on via the switch control unit 302. If the test result signal output through the feedback terminal IS remains low-level (L) at this time, it indicates that an open-circuit load has actually occurred. Since the abnormal signal is also low-level (L), it indicates that the control circuit 601 is normal. As another example, in Figure 8In (b), when the test result signal is different from both the low-level signal (L) and the high-level fault signal (fault), and the abnormal signal is a low-level signal (L), the processor 40 determines that the abnormality type indicated by the abnormal signal is a control circuit abnormality. Specifically, during the test phase, a high-level signal (H) at the input terminal allows the logic control unit 301 to control the power switch M0 to turn on via the switch control unit 302. If the test result signal output through the feedback terminal IS is different from both the low-level signal (L) and the high-level fault signal (fault), it indicates that the load connection is normal and the intelligent electronic switch 30 is working normally. Therefore, the abnormal signal being a low-level signal (L) is due to the control circuit abnormality causing the intelligent electronic switch 30 to not receive the turn-on control signal, resulting in the output when the load open-circuit detection result is normal.

[0100] In another possible design, Figure 9 These are schematic diagrams of two waveforms: an abnormal signal (a high-level fault signal) and a test signal that activates the current-generating circuit. As an example, in... Figure 9 In (a), when the test result signal is different from both the low-level signal (L) and the fault high-level signal (fault), and the abnormal signal is the fault high-level signal, the processor 40 determines that the abnormality type indicated by the abnormal signal is an over-temperature abnormality of the intelligent electronic switch 30. That is, during the test phase, a high-level signal (H) at the input terminal allows the logic control unit 301 to control the power switch M0 to turn on via the switch control unit 302. If the test result signal output through the feedback terminal IS at this time is neither a fault high-level signal (fault) nor a low-level signal (L), it indicates that the load is actually connected normally. Therefore, the abnormal signal being a fault high-level signal (fault) is due to an over-temperature abnormality occurring during normal operation of the intelligent electronic switch 30, indicating that the control line 601 is connected normally. As another example, in Figure 9 In (b), when the test result signal is a low-level signal (L) and the abnormal signal is a high-level fault signal (fault), the processor 40 determines that the abnormality type indicated by the abnormal signal is a control circuit abnormality and a load open-circuit abnormality. Specifically, during the test phase, a high-level signal at the input terminal allows the logic control unit 301 to control the power switch M0 to turn on via the switch control unit 302. If the test result signal output through the feedback terminal IS is a low-level signal (L) at this time, it indicates that the load has actually experienced an open-circuit abnormality. Correspondingly, the high-level fault signal (fault) is due to the control circuit abnormality causing the intelligent electronic switch 30 to not receive the turn-on control signal, which is why it outputs when the load open-circuit detection result is abnormal.

[0101] Understandably, when the intelligent electronic switch 30 is working normally, the level of the feedback signal output through the feedback terminal IS is generally between 0 level and fault high level, and it can be a real-time value that changes with current or temperature.

[0102] In this embodiment, the intelligent electronic switch includes a current generating circuit. When the processor determines that the first indication signal is an abnormal signal, it will send a test signal to the detection terminal through the detection line. This will cause the current generating circuit to pull the level of the input terminal to a high level signal, so that the intelligent electronic switch can feed back a test result signal. In this way, the processor can determine the abnormality type indicated by the abnormal signal based on the test result signal, thus avoiding the problem of logic control errors.

[0103] Figure 10 This is an interactive schematic diagram of the anomaly detection method provided in the embodiments of this application. Figure 10 The method can be referred to the previous ones. Figures 1a-9 The implementation of the anomaly detection device is discussed, but not limited to it. Nevertheless, for ease of explanation, the description... Figure 10 When using this method, refer to Figures 1a-9 Here, the anomaly detection method may include the following steps:

[0104] S101, The processor sends an opening control signal to the intelligent electronic switch through the control circuit;

[0105] S102, The intelligent electronic switch outputs a first indication signal through the feedback circuit;

[0106] S103, The processor determines that the first indication signal is an abnormal signal;

[0107] S104. The processor sends a test signal to the intelligent electronic switch through the test circuit.

[0108] S105, the intelligent electronic switch feeds back the test result signal through the feedback circuit;

[0109] S106. The processor determines the type of abnormality indicated by the abnormal signal based on the test result signal.

[0110] In this embodiment, the processor interacts and communicates with the intelligent electronic switch, and can analyze the abnormal signal indicated by the abnormal signal fed back by the intelligent electronic switch, and then issue a timely reminder signal, such as displaying a warning signal on the display screen of the electromechanical equipment, to inform the equipment user of the abnormal signal indicated by the processor, so that the equipment user can handle it in a timely and accurate manner, avoiding the problem of possible processor control errors.

[0111] Those skilled in the art will clearly understand that, for the sake of convenience and brevity, the above-described division of functional units and modules is merely an example. In practical applications, the above functions can be assigned to different functional units and modules as needed, that is, the internal structure of the device can be divided into different functional units or modules to complete all or part of the functions described above. The functional units and modules in the embodiments can be integrated into one processing unit, or each unit can exist physically separately, or two or more units can be integrated into one unit. The integrated unit can be implemented in hardware or as a software functional unit. Furthermore, the specific names of the functional units and modules are only for easy differentiation and are not intended to limit the scope of protection of this application. The specific working process of the units and modules in the above system can be referred to the corresponding process in the foregoing method embodiments, and will not be repeated here.

[0112] It should be understood that "a plurality of" as used herein refers to two or more. Other embodiments of this application will readily occur to those skilled in the art upon consideration of the specification and practice of the application disclosed herein. This application is intended to cover any variations, uses, or adaptations of this application that follow the general principles of this application and include common knowledge or customary techniques in the art not disclosed herein. The specification and examples are to be considered exemplary only, and the true scope and spirit of this application are indicated by the following claims.

[0113] It should be noted that the various embodiments in this specification are described in a progressive manner, with each embodiment focusing on its differences from other embodiments. Similar or identical parts between embodiments can be referred to interchangeably. For the apparatus embodiments, since they are basically similar to the method embodiments, the description is relatively simple; relevant parts can be referred to the descriptions in the method embodiments.

[0114] The above-disclosed embodiments are merely preferred embodiments of this application and should not be construed as limiting the scope of this application. Therefore, any equivalent variations made in accordance with the claims of this application shall still fall within the scope of this application.

Claims

1. An anomaly detection device, characterized in that, Including intelligent electronic switches and processors; The intelligent electronic switch includes an input terminal, a feedback terminal, a detection terminal, and a load output terminal. The processor includes a first output terminal and a first receiving terminal. The input terminal is connected to the first output terminal to form a control circuit. The feedback terminal is connected to the first receiving terminal to form a feedback circuit. The detection terminal is connected to the first output terminal to form a test circuit. The load output terminal is used to connect to a load. The processor outputs an activation control signal to the intelligent electronic switch through the control circuit, and the intelligent electronic switch feeds back a first indication signal through the feedback circuit; When the processor determines that the first indication signal is an abnormal signal, it also sends a test signal to the smart electronic switch through the test line. The smart electronic switch feeds back the test result signal through the feedback line. The processor also determines the abnormality type indicated by the abnormal signal based on the received test result signal.

2. The anomaly detection device according to claim 1, characterized in that, The abnormality type includes at least one of the following: control circuit abnormality, load open circuit abnormality, and intelligent electronic switch over-temperature abnormality.

3. The anomaly detection device according to claim 1 or 2, characterized in that, When the abnormal signal is a low-level signal and the test signal is an enable control signal, if the test result signal is different from the low-level signal and different from the fault high-level signal, the processor determines that the abnormal type indicated by the abnormal signal is the control circuit abnormality; or, if the test result signal remains a low-level signal, the processor determines that the abnormal type indicated by the abnormal signal is the load open circuit abnormality. or When the abnormal signal is a low-level signal and the test signal is a shutdown control signal, if the test result signal is a fault high-level signal, the processor determines that the abnormal type indicated by the abnormal signal is the load open circuit abnormality; or, if the test result signal remains a low-level signal, the processor determines that the abnormal type indicated by the abnormal signal is the control circuit abnormality. or When the abnormal signal is a fault high-level signal and the test signal is an on control signal, if the test result signal remains a fault high-level signal, the processor determines that the abnormal type indicated by the abnormal signal is the intelligent electronic switch over-temperature abnormality; or, if the test result signal is a low-level signal, the processor determines that the abnormal type indicated by the abnormal signal is the control circuit abnormality and the load open circuit abnormality. or When the abnormal signal is a fault high-level signal and the test signal is a shutdown control signal, if the test result signal remains a fault high-level signal, the processor determines that the abnormal type indicated by the abnormal signal is the load open circuit abnormality and control circuit abnormality; or, if the test result signal is a low-level signal, the processor determines that the abnormal type indicated by the abnormal signal is the intelligent electronic switch over-temperature abnormality.

4. The anomaly detection device according to claim 1 or 2, characterized in that, The intelligent electronic switch also includes a current generating circuit, the output terminal of which is connected to the input terminal. When the test signal is received at the detection terminal, the current generating circuit starts to work, and the current generated by it flows through the input terminal to make the level of the input terminal a high-level signal.

5. The anomaly detection device according to claim 4, characterized in that, When both the test result signal and the abnormal signal are low-level signals, the processor determines that the abnormality type indicated by the abnormal signal is a load open-circuit abnormality; or When the test result signal is different from a low-level signal and different from a fault high-level signal, and the abnormal signal is a low-level signal, the processor determines that the abnormality type indicated by the abnormal signal is a control circuit abnormality; or When the test result signal is different from both a low-level signal and a fault high-level signal, and the abnormal signal is a fault high-level signal, the processor determines that the abnormality type indicated by the abnormal signal is an over-temperature abnormality of the intelligent electronic switch; or When the test result signal is a low-level signal and the abnormal signal is a fault high-level signal, the processor determines that the abnormality type indicated by the abnormal signal includes control circuit abnormality and load open circuit abnormality.

6. A smart electronic switch, characterized in that, It includes an input terminal, a feedback terminal, a detection terminal, a load output terminal, a control circuit, and a power switch. The input terminal, the feedback terminal, and the detection terminal are respectively used to connect to the processor, and the load output terminal is used to connect to the load and the power switch. The control circuit is connected to the input terminal, the feedback terminal, and the control terminal of the power switch respectively. It controls the on / off state of the power switch according to the switch control signal received at the input terminal and feeds back a first indication signal through the feedback terminal. The control circuit is also connected to the detection terminal, and receives test signals through the detection terminal. Based on the test signals, it controls the on / off state of the power switch and feeds back test result signals through the feedback terminal. The test signal is output to the detection terminal by the processor when it determines that the first indication signal is an abnormal signal. The test result signal is used by the processor to determine the type of abnormality indicated by the abnormal signal.

7. The intelligent electronic switch according to claim 6, characterized in that, When the first indication signal is an abnormal signal, the abnormality type it indicates includes at least one of the following: abnormality of the control circuit between the processor and the input terminal, abnormality of the load open circuit, and abnormality of the intelligent electronic switch over-temperature.

8. The intelligent electronic switch according to claim 6 or 7, characterized in that, When the control circuit receives the turn-on control signal at the input terminal, it controls the power switch to turn on. When the load experiences an open circuit abnormality, the first indication signal output through the feedback terminal is a low-level signal. Alternatively, when the power switch experiences an over-temperature abnormality, the first indication signal output through the feedback terminal is a fault high-level signal. Or, when the intelligent electronic switch is working normally, the first indication signal output is different from both the low-level signal and the fault high-level signal. or When the control circuit receives a shutdown control signal at the input terminal, it controls the power switch to shut down and performs load open circuit detection. When an open circuit abnormality occurs in the load, the first indication signal output through the feedback terminal is a fault high-level signal, and when the load connection is normal, the first indication signal output through the feedback terminal is a low-level signal.

9. The intelligent electronic switch according to claim 6 or 7, characterized in that, The control circuit controls the power switch to turn on when the test signal is the turn-on control signal. When the load has an open circuit abnormality, the test result signal output through the feedback terminal is a low-level signal. Alternatively, when the power switch has an over-temperature abnormality, the test result signal output through the feedback terminal is a fault high-level signal. Or, when the intelligent electronic switch is working normally, the test result signal output is different from both the low-level signal and the fault high-level signal. or When the test signal is a shutdown control signal, the control circuit controls the power switch to turn off and performs load open circuit detection. When an open circuit abnormality occurs in the load, the test result signal output through the feedback terminal is a fault high-level signal. When the load connection is normal, the test result signal output through the feedback terminal is a low-level signal.

10. The intelligent electronic switch according to claim 6 or 7, characterized in that, It also includes a current generating circuit, the output terminal of which is connected to the input terminal; The enable terminal of the current generating circuit is connected to the control circuit. When the detection terminal receives the test signal, the control circuit controls the current generating circuit to start working, so that the current generated by the current generating circuit flows through the input terminal, making the level of the input terminal a high-level signal. Alternatively, the enable terminal of the current generating circuit is connected to the detection terminal. When the detection terminal receives the test signal, the current generating circuit starts working, and the current it generates flows through the input terminal, making the level of the input terminal a high-level signal.

11. An integrated circuit chip, characterized in that, Including the intelligent electronic switch as described in any one of claims 6-10.

12. A chip product, characterized in that, Includes the intelligent electronic switch as described in any one of claims 6-10, wherein the control circuit is located on a first integrated circuit chip and the power switch is located on a second integrated circuit chip.

13. A processor, characterized in that, It includes a first output terminal, a first receiving terminal, and a processing circuit. The first output terminal is used to connect to the input terminal and the detection terminal of the intelligent electronic switch respectively to form a control circuit and a test circuit. The first receiving terminal is used to connect to the feedback terminal of the intelligent electronic switch to form a feedback circuit. The processing circuit is connected to the first output terminal and the first receiving terminal. The processing circuit is used to output an activation control signal through the control line and receive a first indication signal through the feedback line. When the first indication signal is determined to be an abnormal signal, the processing circuit is further configured to output a test signal through the test line, receive a test result signal through the feedback line, and determine the type of abnormality indicated by the abnormal signal based on the test result signal.

14. The processor according to claim 13, characterized in that, The abnormality type includes at least one of the following: abnormality of the control circuit, abnormality of the load connected to the intelligent electronic switch being open-circuited, and abnormality of the intelligent electronic switch being over-temperature.

15. The processor according to claim 13 or 14, characterized in that, When the abnormal signal is a low-level signal and the test signal is an enable control signal, if the test result signal is different from the low-level signal and different from the fault high-level signal, the processing circuit determines that the abnormal type indicated by the abnormal signal is the control circuit abnormality; or, if the test result signal remains a low-level signal, the processing circuit determines that the abnormal type indicated by the abnormal signal is the load open circuit abnormality connected to the intelligent electronic switch. or When the abnormal signal is a low-level signal and the test signal is a shutdown control signal, if the test result signal is a fault high-level signal, the processing circuit determines that the abnormal type indicated by the abnormal signal is an open-circuit abnormality of the load connected to the intelligent electronic switch; or, if the test result signal remains a low-level signal, the processing circuit determines that the abnormal type indicated by the abnormal signal is an abnormality of the control circuit. or When the abnormal signal is a fault high-level signal and the test signal is an on control signal, if the test result signal remains a fault high-level signal, the processing circuit determines that the abnormal type indicated by the abnormal signal is an over-temperature abnormality of the intelligent electronic switch; or, if the test result signal is a low-level signal, the processing circuit determines that the abnormal type indicated by the abnormal signal is an abnormality of the control circuit and an open-circuit abnormality of the load connected to the intelligent electronic switch. or When the abnormal signal is a fault high-level signal and the test signal is a shutdown control signal, if the test result signal remains a fault high-level signal, the processing circuit determines that the abnormal type indicated by the abnormal signal is an open circuit abnormality of the load connected to the intelligent electronic switch and an abnormality of the control circuit; or, if the test result signal is a low-level signal, the processing circuit determines that the abnormal type indicated by the abnormal signal is an over-temperature abnormality of the intelligent electronic switch.

16. The processor according to claim 13 or 14, characterized in that, The test signal is used to indicate that the input level of the intelligent electronic switch is a high-level signal. In this case, if both the test result signal and the abnormal signal are low-level signals, the processor determines that the abnormal signal indicates an open-circuit load abnormality. Alternatively, if the test result signal is different from both a low-level signal and a fault high-level signal, and the abnormal signal is a low-level signal, the processor determines that the abnormal signal indicates a control circuit abnormality. Alternatively, if the test result signal is different from both a low-level signal and a fault high-level signal, and the abnormal signal is a fault high-level signal, the processor determines that the abnormal signal indicates an over-temperature abnormality of the intelligent electronic switch. Alternatively, if the test result signal is a low-level signal, and the abnormal signal is a fault high-level signal, the processor determines that the abnormal signal indicates both a control circuit abnormality and an open-circuit load abnormality.

17. An anomaly detection method, characterized in that, include: The processor sends an on / off control signal to the intelligent electronic switch via the control circuitry. The intelligent electronic switch outputs a first indication signal through a feedback circuit; When the processor determines that the first indication signal is an abnormal signal, it sends a test signal to the smart electronic switch through the test line. The intelligent electronic switch feeds back the test result signal through the feedback circuit; The processor determines the type of anomaly indicated by the anomaly signal based on the test result signal.

18. An electromechanical device, characterized in that, Includes the anomaly detection device, power supply, and load as described in any one of claims 1-5, wherein the positive terminal of the power supply is connected to the power supply terminal, the negative terminal of the power supply is connected to the power supply ground terminal, one end of the load is connected to the load output terminal of the intelligent electronic switch, and the other end of the load is connected to the power supply ground terminal or the power supply terminal.

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