A method for fabricating a subsurface defect calibration plate based on an ultrathin glass cap and the calibration plate itself.
CN121521580BActive Publication Date: 2026-04-03ZHEJIANG UNIV
2 Cites 0 Cited by
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- Filing Date
- 2026-01-13
- Publication Date
- 2026-04-03
Smart Images

Figure CN121521580B_ABST
Abstract
This application provides a method for fabricating a subsurface defect calibration plate based on an ultrathin glass cap and a calibration plate itself, belonging to the field of optical detection and calibration technology. The method includes: preparing a main glass substrate and a glass cover plate, both made of glass, with the glass cover plate being an ultrathin cover plate; fabricating simulated defect structures on the surface of the main glass substrate using micro-nano fabrication technology, using the surface containing the simulated defect structures as the defect surface; coating the defect surface with an optical adhesive, determining the coating thickness of the optical adhesive based on the refractive index between the optical adhesive and the main glass substrate; and bonding the glass cover plate to the defect surface to form the subsurface defect calibration plate. The method for fabricating a subsurface defect calibration plate based on an ultrathin glass cap and the calibration plate provided in this application are used to achieve stable encapsulation and accurate calibration of subsurface defects.
Need to check novelty before this filing date? Find Prior Art
Citation Information
Patent Citations
Subsurface constant value calibration standard template
CN117517333A
Calibration plate for detecting subsurface depth and preparation method thereof
CN118225795A