A method for fabricating a subsurface defect calibration plate based on an ultrathin glass cap and the calibration plate itself.

CN121521580BActive Publication Date: 2026-04-03ZHEJIANG UNIV
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Patent Information

Authority / Receiving Office
CN · China
Patent Type
Patents(China)
Current Assignee / Owner
Filing Date
2026-01-13
Publication Date
2026-04-03

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Abstract

This application provides a method for fabricating a subsurface defect calibration plate based on an ultrathin glass cap and a calibration plate itself, belonging to the field of optical detection and calibration technology. The method includes: preparing a main glass substrate and a glass cover plate, both made of glass, with the glass cover plate being an ultrathin cover plate; fabricating simulated defect structures on the surface of the main glass substrate using micro-nano fabrication technology, using the surface containing the simulated defect structures as the defect surface; coating the defect surface with an optical adhesive, determining the coating thickness of the optical adhesive based on the refractive index between the optical adhesive and the main glass substrate; and bonding the glass cover plate to the defect surface to form the subsurface defect calibration plate. The method for fabricating a subsurface defect calibration plate based on an ultrathin glass cap and the calibration plate provided in this application are used to achieve stable encapsulation and accurate calibration of subsurface defects.
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Citation Information

Patent Citations

  • Subsurface constant value calibration standard template

    CN117517333A

  • Calibration plate for detecting subsurface depth and preparation method thereof

    CN118225795A