A test method and system for increasing reliability of an SSD by intelligently controlling a crystal oscillator

Abstract

The application discloses a kind of by intelligent control crystal oscillator increases the test method and system of SSD reliability, method includes: obtaining the reference data of SSD under normal crystal oscillator condition;Setting test parameters, and send control instruction, wherein test parameters include test environment parameters and test working parameters;Receive control instruction, carry out the dynamic control and reliability test of crystal oscillator, and collect and record test output data, when satisfying test stop condition, end test, compare test output data with reference data, generate SSD reliability report.The application can actively simulate various possible crystal oscillator abnormal conditions and boundary conditions through the dynamic control and reliability test of crystal oscillator, so as to more comprehensively investigate the performance of SSD under different timing stress, find out potential defects and reliability hidden danger difficult to find by traditional test method, especially deep problems related to crystal oscillator frequency stability, enhance the reliability of SSD.

Description

Technical Field

[0001] This invention relates to the field of semiconductor memory, and more particularly to a testing method and system for increasing the reliability of SSDs by intelligently controlling crystal oscillators. Background Technology

[0002] Solid-state drives (SSDs), with their advantages of high-speed read / write speeds, low power consumption, and shock resistance, have become core storage devices in servers, data centers, and consumer electronics. As storage capacity expands to TB / PB levels and high-speed protocols like NVMe become more widespread, the requirements for internal timing accuracy in SSDs are becoming increasingly stringent. The crystal oscillator, as the "heart" of the SSD, provides the reference clock signal to the controller CPU, directly affecting the synchronization and accuracy of data transmission. In 24 / 7 uninterrupted operation scenarios (such as data centers), the frequency stability, temperature drift characteristics, and anti-interference capabilities of the crystal oscillator are crucial to ensuring the long-term reliable operation of the SSD.

[0003] Current SSD reliability testing primarily focuses on environmental stresses such as flash memory chip lifespan (P / E cycles) and temperature cycling, with insufficient coverage of dynamic performance testing for the core component, the crystal oscillator. However, crystal oscillators may experience frequency shifts after extreme temperature and voltage fluctuations or prolonged operation, leading to timing mismatches between the controller and flash memory chips, resulting in data transmission errors, CRC check failures, and even firmware crashes. Therefore, there is an urgent need for an intelligent testing method targeting the characteristics of crystal oscillators in SSDs to proactively identify potential risks and improve the overall reliability of SSDs.

[0004] While the importance of crystal oscillators to SSDs is self-evident, existing SSD reliability testing methods and related technologies still have the following shortcomings in considering crystal oscillator factors: Static testing is the primary method, lacking dynamic intelligent control: Traditional SSD reliability testing typically uses a fixed-frequency crystal oscillator, or only performs simple calibration of the crystal oscillator frequency at the beginning of the test, or tests at a few extreme frequency points. This static testing method cannot simulate the dynamic changes that crystal oscillators may experience in real-world complex working environments, such as frequency drift, transient disturbances, or frequency shifts caused by long-term aging.

[0005] Limitations of environmental adaptability testing: Although existing tests include environmental tests such as high and low temperatures, they often treat the crystal oscillator as part of the SSD as a whole and conduct passive testing, rather than actively and intelligently controlling the behavior of the crystal oscillator under specific environmental stresses to examine the fault tolerance and stability boundaries of the SSD system. There is insufficient specialized and in-depth testing of the frequency characteristics changes of the crystal oscillator itself caused by temperature, voltage, and load variations and their impact on the core functions of the SSD.

[0006] The simplification and lack of intelligence in fault injection: When conducting some reliability enhancement tests, crystal oscillator faults (such as power outages or short circuits) may be artificially introduced. However, this method is too crude and cannot accurately simulate more common and subtle problems that crystal oscillators may encounter in real-world applications, such as subtle frequency shifts, increased phase noise, and intermittent faults. There is a lack of refined crystal oscillator abnormal state injection and control mechanisms based on preset thresholds and intelligent judgment.

[0007] Insufficient exploration of the deep-seated impacts caused by crystal oscillator anomalies: Existing tests may focus more on macro-level aspects such as whether data is read and written correctly and whether performance indicators meet the standards. There is a lack of systematic monitoring and analysis methods for the potential and cumulative deep-seated impacts that may be caused by small frequency deviations of the crystal oscillator, such as timing errors inside the controller, abnormal instruction execution, data verification errors, and GC process disorder.

[0008] Lack of verification of the fault tolerance capability of crystal oscillator and SSD: SSD controllers usually have a certain fault tolerance mechanism, but existing tests rarely actively and intelligently control the crystal oscillator to generate a specific range of anomalies in order to verify the effectiveness and boundaries of the SSD controller's fault tolerance capability, dynamic adjustment capability and data consistency maintenance capability when facing such timing anomalies. Summary of the Invention

[0009] To address the shortcomings of existing technologies, this invention provides a testing method and system for increasing SSD reliability through intelligent control of crystal oscillators, thereby enabling crystal oscillator testing under dynamic control and thus verifying and improving SSD reliability.

[0010] Therefore, the technical solution adopted by the present invention is as follows: This invention provides a testing method for increasing SSD reliability through intelligent control of a crystal oscillator, the method comprising: Obtain benchmark data for the SSD under normal crystal oscillator conditions; Set test parameters and send control commands, whereby test parameters include test environment parameters and test operation parameters; Receive control commands, perform dynamic control and reliability testing of the crystal oscillator, collect and record test output data, end the test when the test stop condition is met, compare the test output data with the benchmark data, and generate an SSD reliability report.

[0011] According to the above scheme, the dynamic control and reliability testing of crystal oscillators specifically include crystal oscillator frequency drift compensation testing based on dynamic thresholds, intelligent stress testing of crystal oscillator start-up reliability, and accelerated long-term reliability testing of crystal oscillators with multi-stress coordination.

[0012] According to the above scheme, the test environment parameters include test temperature, humidity, and voltage; the test operating parameters include crystal oscillator operating mode, frequency parameters, drift rate, and threshold conditions.

[0013] According to the above scheme, the crystal oscillator frequency drift compensation test based on dynamic threshold is specifically set to perform temperature cycle test, record the frequency offset in real time, and set the compensation threshold. When the frequency offset reaches the compensation threshold, the crystal oscillator control parameters are adjusted to bring the frequency offset back to the normal threshold, and the compensation response time and SSD read / write error rate are recorded.

[0014] According to the above scheme, the intelligent stress test for the reliability of crystal oscillator startup is specifically set up with low voltage scenario and high temperature aging scenario. In the low voltage scenario, the SSD power supply voltage is reduced and the success rate of crystal oscillator startup is tested during the reduction process. In the high temperature aging scenario, the crystal oscillator is continuously aged for a certain period of time under a preset temperature environment and the crystal oscillator startup critical value is recorded and the safety factor is calculated.

[0015] According to the above scheme, the accelerated long-term reliability test of the multi-stress coordinated crystal oscillator specifically involves performing frequency scanning cycles on the crystal oscillator at fixed intervals and recording the changes in the resonance curve, as well as applying multiple times the rated voltage at room temperature to detect the mean time between failures of the SSD crystal oscillator.

[0016] According to the above scheme, the test stop conditions specifically include reaching the preset test duration or number of cycles, triggering the preset critical error condition, or reaching the preset test target.

[0017] According to the above scheme, the test output data includes the SSD's return data, status code, SMART log, error report, actual crystal oscillator output frequency, and real-time environmental parameters; the SSD reliability report includes the SSD's performance under different crystal oscillator stress conditions, the range of crystal oscillator parameters for stable operation, and sensitive points.

[0018] This invention also provides a testing system for increasing SSD reliability through intelligent control of a crystal oscillator, the system comprising: The SSD module under test, which contains an SSD sample to be tested; The environmental stress application module is used to apply environmental stress to the SSD module under test and the smart crystal oscillator control module, and to set the test environment parameters. The main control and data analysis module is used to set test operating parameters and send control commands, as well as receive test output data and compare it with normal data to determine the reliability performance of the SSD and generate an SSD reliability report. The intelligent crystal oscillator control module is used to receive control commands, set parameters according to the control commands, and perform tests. When the test stop condition is met, the test ends and the test output data is sent. The status monitoring and feedback module is used to monitor the test status of the SSD under test and the output parameters of the crystal oscillator control module in real time and feed them back to the main control and data analysis module.

[0019] The present invention also provides a computer storage medium storing a computer program executable by a processor, the computer program performing the test method described above for increasing SSD reliability through intelligent control of a crystal oscillator.

[0020] The beneficial effects of this invention are as follows: By dynamically controlling and reliably testing the crystal oscillator, this invention can actively simulate various possible abnormal crystal oscillator conditions and boundary conditions, thereby more comprehensively examining the performance of SSDs under different timing stresses, uncovering potential defects and reliability issues that are difficult to detect using traditional testing methods, especially deep-seated problems related to crystal oscillator frequency stability, thus enhancing the reliability of SSDs; and by setting test environment parameters, the behavior of the crystal oscillator under specific environmental stresses can be actively and intelligently controlled to examine the fault tolerance and stability boundaries of the SSD system, increasing the specialized and in-depth testing of the frequency characteristics changes of the crystal oscillator itself caused by temperature, voltage, and load variations and their impact on the core functions of the SSD.

[0021] Furthermore, this invention simulates the frequency stability of crystal oscillators under extreme environments through crystal oscillator frequency drift compensation testing based on dynamic thresholds, thereby verifying the reliability and stability of SSD data read and write; through intelligent stress testing of crystal oscillator start-up reliability, it simulates critical start-up conditions and tests the start-up success rate under extreme operating conditions, verifying the reliability of SSD during cold starts or voltage fluctuations; through multi-stress collaborative crystal oscillator long-term reliability acceleration testing, by superimposing multiple stress factors such as temperature, vibration, and power supply noise, it can accelerate the exposure of potential faults in long-term crystal oscillator operation and predict the reliability of SSD throughout its life cycle. Attached Figure Description

[0022] Figure 1 This is a schematic flowchart of a test method for increasing SSD reliability through intelligent control of a crystal oscillator according to an embodiment of the present invention. Figure 2 This is a test flowchart of another embodiment of the present invention; Figure 3 This is a diagram showing the specific test node steps of another embodiment of the present invention. Detailed Implementation

[0023] To make the objectives, technical solutions, and advantages of this invention clearer, the invention will be further described in detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative and not intended to limit the invention.

[0024] Example 1 To address the shortcomings of existing crystal oscillator technologies, such as the lack of dynamic control testing and environmental adaptability testing, this invention provides a testing method and system for increasing SSD reliability through intelligent crystal oscillator control. Figure 1As shown, the method includes: Obtain benchmark data for the SSD under normal crystal oscillator conditions; Set test parameters and send control commands, whereby test parameters include test environment parameters and test operation parameters; Receive control commands, perform dynamic control and reliability testing of the crystal oscillator, collect and record test output data, end the test when the test stop condition is met, compare the test output data with the benchmark data, and generate an SSD reliability report.

[0025] In addition, this embodiment also provides a test system for increasing SSD reliability through intelligent crystal oscillator control, used in the test method for increasing SSD reliability through intelligent crystal oscillator control described in this embodiment. As shown in the figure, the system includes: The SSD module under test, which contains an SSD sample to be tested; The environmental stress application module is used to apply environmental stress to the SSD unit under test and the crystal oscillator control module, and to set the test environment parameters. The main control and data analysis module is used to set test operating parameters and send control commands, as well as receive test output data and compare it with normal data to determine the reliability performance of the SSD. The intelligent crystal oscillator control module is used to receive control commands, perform tests, and send test output data. The status monitoring and feedback module is used to monitor the test status of the SSD under test and the output parameters of the crystal oscillator control module in real time and feed them back to the main control and data analysis module.

[0026] Specifically, the SSD under test is connected to the test system, and minor hardware modifications are made to the SSD to replace the original crystal oscillator or connect control signals, or to connect to the intelligent crystal oscillator control module through external intervention. The main control and data analysis module configures the initial operating parameters (such as nominal frequency) of the intelligent crystal oscillator control module, as well as various threshold conditions that may be used in subsequent tests (such as frequency drift threshold range, anomaly injection trigger conditions, recovery conditions, etc.). The initial conditions of the environmental stress application module and the test case set are configured, including read / write mode, data mode, stress level, etc.

[0027] Specifically, benchmark data of the SSD under normal crystal oscillator conditions is obtained. Under the condition that the intelligent crystal oscillator control module outputs a stable nominal frequency, a comprehensive functional and performance baseline test is performed on the SSD under test to obtain various benchmark data of the SSD under normal crystal oscillator conditions as a reference for subsequent comparative analysis.

[0028] Specifically, during the testing process, the main control and data analysis module continuously collects return data, status codes, SMART logs, and error reports from the SSD, as well as the actual output frequency from the intelligent crystal oscillator control module and real-time environmental parameters from the environmental stress application unit. The collected data is recorded and stored in detail, and analyzed offline or online. By comparing the SSD's performance under different crystal oscillator conditions, the relationship between crystal frequency changes and SSD reliability indicators (such as data integrity, error rate, stability, and lifespan) is analyzed. The test terminates when the test stop conditions are met. At this point, the main control and data analysis module generates a detailed reliability test report based on the test data, indicating the SSD's performance under different crystal oscillator stress conditions, the range of crystal oscillator parameters for stable operation, sensitive points, and potential design flaws or improvement directions.

[0029] Preferably, the test stop conditions specifically include reaching a preset test duration or number of cycles, or triggering a preset critical error condition, wherein critical error conditions include the SSD becoming completely unresponsive, or the data being severely corrupted and unrecoverable.

[0030] The crystal oscillator control module includes a programmable and precisely controllable crystal oscillator source, a circuit that can externally intervene in the SSD's onboard crystal oscillator, such as adjusting its power supply voltage and load; it can receive control commands, precisely set and dynamically adjust the output clock frequency and phase, simulate various states such as frequency drift, jitter, and instantaneous jumps, and can monitor its own output.

[0031] Preferably, the main control and data analysis unit is composed of a high-performance computer or an embedded system, which can send control commands to the intelligent crystal oscillator control module, set its working mode, frequency parameters, drift rate, and threshold conditions, send various read, write, erase, and Trim test command sequences to the SSD unit under test, and interact with the SSD unit under test through standard interfaces (such as SATA, NVMe, PCIe), as well as collect the output data and status information (such as SMART data and error logs) of the SSD under different crystal oscillator conditions, and compare and analyze the collected data to evaluate the reliability performance of the SSD under different crystal oscillator conditions.

[0032] Preferably, the environmental stress application module is an integrated unit of one or more programmable temperature chambers, humidity chambers, and voltage regulators, which can apply specific environmental stresses such as temperature, humidity, and voltage to the SSD unit under test or the smart crystal oscillator control module to simulate real application scenarios or conduct accelerated aging tests.

[0033] This invention, through dynamic control and reliability testing of the crystal oscillator, can actively simulate various possible crystal oscillator anomalies and boundary conditions, thereby more comprehensively examining the performance of the SSD under different timing stresses. It uncovers potential defects and reliability issues that are difficult to detect using traditional testing methods, especially deep-seated problems related to crystal oscillator frequency stability, thus enhancing the reliability of the SSD. Furthermore, by actively and intelligently controlling the behavior of the crystal oscillator under specific environmental stresses through test environment parameters, it examines the fault tolerance and stability boundaries of the SSD system, increasing the specialized and in-depth testing of the frequency characteristics changes of the crystal oscillator itself caused by temperature, voltage, and load variations and their impact on the core functions of the SSD.

[0034] Furthermore, by introducing an intelligent crystal oscillator control module, proactive, dynamic, and precise timing control is achieved. Unlike traditional testing where the crystal oscillator frequency is fixed or only simple static switching is performed, this embodiment of the invention, through its intelligent crystal oscillator control module, can proactively, dynamically, and precisely set and adjust the crystal oscillator frequency, drift rate, jitter characteristics, etc., and can simulate various abnormal crystal oscillator states. This proactive control makes the testing more targeted and flexible, enabling more diverse testing of crystal oscillator performance. It can significantly improve the comprehensiveness and depth of SSD reliability testing, enhance the accuracy of assessing SSD timing fault tolerance capabilities, provide data support for SSD applications in extreme environments, and reduce potential product risks.

[0035] Example 2 Based on Example 1, this example provides a test method for increasing SSD reliability through intelligent control of crystal oscillators. Specifically, the dynamic control and reliability test of the crystal oscillator is a crystal oscillator frequency drift compensation test based on dynamic threshold. By monitoring the crystal oscillator frequency offset in real time and setting a dynamic compensation threshold, the crystal oscillator control parameters (such as load capacitance and power supply voltage) are automatically adjusted during SSD operation to simulate frequency stability under extreme conditions and verify data read and write reliability.

[0036] Based on this, this embodiment provides an SSD test platform (including a programmable crystal oscillator module, such as a differential temperature compensated crystal oscillator TCXO), a frequency counter (accuracy ≥ ±0.1ppm), a high and low temperature chamber (temperature range (-40)℃-85℃, referring to MIL-STD-883E standard), an integrated crystal oscillator control interface (I2C / SPI), and supports dynamic adjustment of load capacitance (5pF-30pF) and power supply voltage (1.8V±0.1V).

[0037] Specifically, in this embodiment, the normal drift threshold of the crystal oscillator frequency is set as follows: frequency deviation ≤ ±5ppm, which is the standard for commercial SSDs; the compensation trigger threshold is: when the deviation is > ±5ppm, compensation is initiated, and the deviation is pulled back to within ±3ppm by adjusting the load capacitance (step size 0.5pF) or voltage (step size 0.02V); in addition, the failure threshold is set as follows: if the deviation is > ±10ppm for more than 100ms, the crystal oscillator is determined to have failed.

[0038] The specific testing procedure in this embodiment is as follows: Obtain the reference data of the SSD under normal crystal oscillator conditions; in this embodiment, normal crystal oscillator conditions include calibrating the crystal oscillator reference frequency to 25MHz at room temperature of 25℃; Set the test parameters and send control commands. The test parameters include test environment parameters and test operation parameters. In this embodiment, the high and low temperature chamber is set to cyclically impact from -40℃ to 85℃ to -40℃ at a rate of 5℃ / min, and the number of cycles is set to 100. The system receives control commands and performs crystal oscillator frequency drift compensation tests based on dynamic thresholds. It records the frequency offset in real time. When the compensation threshold is triggered, it adjusts the load capacitance (0.5pF step) or voltage (0.02V step) to pull the offset back within ±3ppm. It automatically adjusts the crystal oscillator parameters and records the compensation response time. Simultaneously, it monitors the SSD read / write error rate (e.g., UBER). The test ends when the test stop condition is met. The test output data is compared with the baseline data to generate an SSD reliability report. The test stop condition is reaching a preset test duration or number of cycles, triggering a preset critical error condition, or reaching a preset test target. In this embodiment, the test target is a compensation response time <10ms and a compensated SSD read / write error rate UBER ≤1e-15.

[0039] Example 3 Based on Example 1, this example provides a test method for increasing SSD reliability through intelligent control of crystal oscillators. Specifically, the dynamic control and reliability test of the crystal oscillator is an intelligent stress test of the crystal oscillator start-up reliability. Based on the simulation of critical start-up conditions of numerically controlled variable resistors, the start-up success rate under extreme conditions is tested by actively increasing the load on the crystal oscillator circuit (such as series variable resistors), quantifying the "start-up safety factor", and verifying the reliability of the SSD during cold starts or voltage fluctuations.

[0040] Based on this, this embodiment introduces an integrated digitally controlled variable resistor module into the SSD crystal oscillator circuit. The variable resistor Rs can be adjusted in a range of 0Ω-100kΩ with an adjustment step of 100Ω. It can also control the switch S0 to short-circuit / connect Rs via GPIO. During normal operation, S0 is turned on to short-circuit Rs, and during testing, S0 is turned off and connected to Rs.

[0041] The specific testing procedure in this embodiment is as follows: Obtain the reference data of SSD under normal crystal oscillator conditions; in this embodiment, the reference oscillation resistor R0 is tested at room temperature of 25℃: gradually increase the variable resistor Rs until the crystal oscillator cannot start oscillating, and record the critical value Rc, R0=Rc / 2; Set test parameters and send control commands, whereby the test parameters include test environment parameters and test operation parameters; in this embodiment, low voltage scenario environment parameters and high temperature aging scenario environment parameters are set respectively. The system receives control commands and performs intelligent stress testing on the reliability of the crystal oscillator startup. In a low-voltage scenario, the SSD power supply voltage is reduced from 5±0.5V to 3.3±0.5V, and the startup success rate is tested. In a high-temperature aging scenario, the system is continuously aged at 85℃ for 1000 hours, with Rc measured every 200 hours and the safety factor calculated. If the safety factor drops to <1.5, the system is considered to have failed. The test ends when the test stop conditions are met, and the test output data is compared with the baseline data to generate an SSD reliability report. The test stop conditions are reaching a preset test duration, triggering a preset critical error condition, or reaching a preset test target. In this embodiment, the test target is a startup success rate ≥99.9% and a safety factor ≥2.0.

[0042] The oscillation start-up criterion is that the crystal oscillator output frequency reaches 90% of the nominal value and remains stable for 10ms; the safety factor is calculated as (critical oscillation resistance value - actual circuit resistance value) / actual circuit resistance value.

[0043] Example 4 Based on Example 1, this example provides a testing method to increase SSD reliability through intelligent control of crystal oscillators. Specifically, the dynamic control and reliability testing of the crystal oscillator is a multi-stress collaborative long-term reliability acceleration test. By superimposing multiple stress factors such as temperature, vibration, and power supply noise, and by intelligently controlling crystal oscillator parameters (such as aging test voltage and frequency scanning range), potential faults in the long-term operation of the crystal oscillator (such as soldering fatigue and internal component aging) are exposed more quickly, and the reliability of the SSD during its life cycle is predicted.

[0044] The specific testing procedure in this embodiment is as follows: Obtain benchmark data for the SSD under normal crystal oscillator conditions; Test parameters are set and control commands are sent. The test parameters include test environment parameters and test operation parameters. In this embodiment, temperature stress parameters, vibration stress parameters, and power supply noise parameters are set respectively. The temperature stress parameter is set to a cycle of -40℃ to 85℃, 10℃ / min, and a holding time of 30min / cycle. The vibration stress parameter is set to a sweep frequency vibration of 10Hz-2000Hz, acceleration of 10g, and 0.5 hours each for the X / Y / Z axes. The power supply noise parameter is set to inject random noise of 10mV-100mV and 1kHz-1MHz into the crystal oscillator power supply terminal to simulate motherboard power supply interference. The system receives control commands and performs accelerated long-term reliability testing of the crystal oscillator under multi-stress coordination. Every 100 hours, the crystal oscillator is scanned at frequencies from 0.1MHz to 50MHz, and the changes in the resonance curve are recorded. A bandwidth increase of >20% is considered performance degradation. Additionally, 1.2 times the rated voltage is applied at 25°C to simulate accelerated aging of internal components. The test ends when the test stop conditions are met, and the test output data is compared with baseline data to generate an SSD reliability report. The test stop conditions are reaching a preset test duration, triggering a preset critical error condition, or reaching a preset test target. In this embodiment, the test target is an SSD crystal oscillator mean time between failures (MTBF) ≥ 1 million hours.

[0045] Example 5 Based on Examples 1-4, this example provides a testing method for increasing SSD reliability through intelligent control of the crystal oscillator, such as... Figure 2 As shown, the specific steps are as follows: Prepare the SSD sample to be tested, build and deploy the intelligent crystal oscillator control module and the main control and data analysis module. If an integrated environmental stress module is available, connect the temperature chamber, humidity chamber and / or voltage chamber and set the environmental stress. Otherwise, skip the environmental stress setting and connect the status monitoring and feedback module. An initialization command is issued, and the intelligent crystal oscillator control module receives the command and sets the reference clock. Send read, write, erase, and trim commands to the SSD sample under test, and monitor the SSD status in real time; Based on the test content, determine whether drift or jitter needs to be added to the crystal oscillator. If so, dynamically adjust the frequency of the intelligent crystal oscillator control module, add drift, jump, or jitter parameters, record the holding stress time, and collect SSD output data to determine if the test sequence is complete. If not, resend the command to the SSD. If complete, determine whether environmental stress needs to be set again. If not, send the output data to the main control and data analysis module for comparison with normal data to determine data completeness, statistical error rate, latency, and UBER, thereby generating an SSD reliability assessment report. The test content is as follows: Figure 3As shown, it includes crystal oscillator frequency drift compensation test based on dynamic threshold, intelligent stress test for crystal oscillator start-up reliability, and accelerated long-term reliability test for crystal oscillators with multi-stress coordination.

[0046] It should be noted that, depending on the implementation needs, the various steps / components described in this application can be broken down into more steps / components, or two or more steps / components or parts of the operation of steps / components can be combined into new steps / components to achieve the purpose of this invention.

[0047] The order of the steps in the above embodiments does not imply the order of execution. The execution order of each process should be determined by its function and internal logic, and should not constitute any limitation on the implementation process of the embodiments of this application.

[0048] It should be understood that those skilled in the art can make improvements or modifications based on the above description, and all such improvements and modifications should fall within the protection scope of the appended claims.

Claims

1. A testing method for increasing SSD reliability through intelligent control of a crystal oscillator, characterized in that, The method includes: Obtain benchmark data for the SSD under normal crystal oscillator conditions; Set test parameters and send control commands, whereby test parameters include test environment parameters and test operation parameters; Receive control commands, perform dynamic control and reliability testing of the crystal oscillator, collect and record test output data, end the test when the test stop condition is met, compare the test output data with the benchmark data, and generate an SSD reliability report; Specifically, the dynamic control and reliability testing of crystal oscillators includes crystal frequency drift compensation testing based on dynamic thresholds, intelligent stress testing of crystal oscillator start-up reliability, and accelerated long-term reliability testing of crystal oscillators with multi-stress coordination.

2. The testing method for increasing SSD reliability through intelligent control of a crystal oscillator according to claim 1, characterized in that, Test environment parameters include test temperature, humidity, and voltage; test operating parameters include crystal oscillator operating mode, frequency parameters, drift rate, and threshold conditions.

3. The testing method for increasing SSD reliability through intelligent control of a crystal oscillator according to claim 1, characterized in that, The crystal oscillator frequency drift compensation test based on dynamic threshold is specifically set to perform temperature cycling tests, record the frequency offset in real time, and set a compensation threshold. When the frequency offset reaches the compensation threshold, the crystal oscillator control parameters are adjusted to bring the frequency offset back to the normal threshold, and the compensation response time and SSD read / write error rate are recorded.

4. The testing method for increasing SSD reliability through intelligent control of a crystal oscillator according to claim 1, characterized in that, The intelligent stress test for crystal oscillator start-up reliability is specifically set up with low voltage and high temperature aging scenarios. In the low voltage scenario, the SSD power supply voltage is reduced and the crystal oscillator start-up success rate is tested during the reduction process. In the high temperature aging scenario, the crystal oscillator is continuously aged for a certain period of time under a preset temperature environment, and the crystal oscillator start-up critical value and safety factor are recorded.

5. The testing method for increasing SSD reliability through intelligent control of a crystal oscillator according to claim 1, characterized in that, The accelerated long-term reliability test of the multi-stress synergy crystal oscillator involves performing frequency scanning cycles on the crystal oscillator at fixed intervals and recording the changes in the resonance curve, as well as applying multiple times the rated voltage at room temperature to detect the mean time between failures (MTBF) of the SSD crystal oscillator.

6. The testing method for increasing SSD reliability through intelligent control of a crystal oscillator according to claim 1, characterized in that, The test stop conditions specifically include reaching the preset test duration or number of loops, triggering a preset critical error condition, or reaching the preset test objective.

7. The testing method for increasing SSD reliability through intelligent control of a crystal oscillator according to claim 1, characterized in that, Test output data includes SSD return data, status codes, SMART logs, error reports, actual crystal oscillator output frequency, and real-time environmental parameters; SSD reliability report includes SSD performance under different crystal oscillator stress conditions, stable operating crystal oscillator parameter range, and sensitive points.

8. A testing system for increasing SSD reliability through intelligent control of a crystal oscillator, characterized in that, The system includes: The SSD module under test, which contains an SSD sample to be tested; The environmental stress application module is used to apply environmental stress to the SSD module under test and the smart crystal oscillator control module, and to set the test environment parameters. The main control and data analysis module is used to set test operating parameters and send control commands, as well as receive test output data and compare it with normal data to determine the reliability performance of the SSD and generate an SSD reliability report. The intelligent crystal oscillator control module is used to receive control commands, set parameters according to the control commands, and perform tests. When the test stop condition is met, the test ends and the test output data is sent. The status monitoring and feedback module is used to monitor the test status of the SSD under test and the output parameters of the crystal oscillator control module in real time and feed them back to the main control and data analysis module. Specifically, the dynamic control and reliability testing of crystal oscillators includes crystal frequency drift compensation testing based on dynamic thresholds, intelligent stress testing of crystal oscillator start-up reliability, and accelerated long-term reliability testing of crystal oscillators with multi-stress coordination.

9. A computer storage medium, characterized in that, It contains a computer program that can be executed by a processor, which performs the test method for increasing SSD reliability by intelligently controlling the crystal oscillator as described in any one of claims 1-7.

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