Measuring system and measuring method applied to a display screen

Abstract

The application discloses a kind of applied to display screen measurement system and measurement method, there is test pattern on display screen, measurement system includes: high-speed deflection mirror, photoelectric sensor and processor.High-speed deflection mirror is opposite test pattern on display screen, high-speed deflection mirror is used to rotate at preset angle and make test pattern pass the light beam deflection of high-speed deflection mirror;Photoelectric sensor is connected with high-speed deflection mirror, and photoelectric sensor is used to collect the luminous flux data of light beam deflected by high-speed deflection mirror;Processor is connected with photoelectric sensor, and processor is used to receive luminous flux data and obtain the attenuation rate slope of test pattern according to luminous flux data, attenuation rate slope is used to indicate the halo intensity of test pattern.Through the cooperation of high-speed deflection mirror, photoelectric sensor and processor, more accurate quantification is realized to the halo intensity of test pattern, while also greatly shorten the time of single measurement, improve the detection efficiency of product.

Description

Technical Field

[0001] This application relates to the field of display technology, and more particularly to a measurement system and measurement method for use in display screens. Background Technology

[0002] In displays, halos can occur at the boundaries between adjacent bright and dark areas due to light scattering. These halos spread from bright areas to dark areas, reducing contrast and significantly impacting visual experience and image quality, especially when presenting high dynamic range content. To optimize display quality, current standards require quantitative assessment of halos. However, commonly used methods primarily rely on subjective human evaluation, brightness distribution analysis, or dynamic halo capture. Subjective human evaluation depends on visual judgment, resulting in inaccurate results. Brightness analysis requires a darkroom environment, is cumbersome, and cannot separate dynamic halos from ambient stray light. Dynamic halo capture uses cameras and has a wide threshold range, limiting its versatility. All these methods struggle to objectively and accurately quantify halos. Summary of the Invention

[0003] This application provides a measurement system and method that can improve the accuracy of halos on a quantitative display screen.

[0004] In a first aspect, this application provides a measurement system for a display screen, the display screen having a test pattern, the measurement system comprising: A high-speed deflecting mirror is positioned directly opposite the test pattern on the display screen. The high-speed deflecting mirror is used to rotate at a preset angle and deflect the beam of light passing through the test pattern. The photoelectric sensor is connected to a high-speed deflection mirror and is used to collect the luminous flux data of the beam deflected by the high-speed deflection mirror. The processor is connected to the photoelectric sensor. The processor receives light flux data and obtains the attenuation rate slope of the test pattern based on the light flux data. The attenuation rate slope is used to represent the halo intensity of the test pattern.

[0005] In some feasible implementations, the photoelectric sensor is used to collect luminous flux data at least once within the time it takes for the high-speed deflector to deflect a unit degree.

[0006] In some feasible implementations, the photoelectric sensor collects light flux data once for every unit angle the high-speed deflecting mirror deflects.

[0007] In some feasible implementations, the measurement system also includes a converter electrically connected to both the photoelectric sensor and the processor. The converter is used to convert the luminous flux data collected by the photoelectric sensor into a digital signal, and the sampling rate of the converter is positively correlated with the sampling rate of the photoelectric sensor.

[0008] Secondly, this application provides a measurement method applied to a measurement system, the measurement system including a high-speed deflection mirror, a photoelectric sensor, and a processor, the measurement method including the following steps: Control the high-speed deflection mirror to face the test pattern, and control the high-speed deflection mirror to deflect the beam of light passing through the high-speed deflection mirror at a preset angle so that the test pattern is deflected. The photoelectric sensor is controlled to collect the luminous flux data of the light beam deflected by the high-speed deflection mirror; The control processor obtains the attenuation slope of the test pattern based on the luminous flux data. The attenuation slope is used to represent the halo intensity of the test pattern.

[0009] In some feasible implementations, the preset angle includes multiple sub-angles, and the control processor obtains the attenuation rate slope of the test pattern based on the luminous flux data, including: Based on the luminous flux data collected by the photoelectric sensor, the luminous flux data of the beam deflected by the high-speed deflecting mirror when it is stationary is obtained, which is used as the initial luminous flux. Based on the light flux data collected by the photoelectric sensor, the light flux data of the beam deflected by the high-speed deflecting mirror at each sub-angle is obtained, and multiple sub-light fluxes are obtained. The attenuation slope of the test pattern is obtained based on the initial luminous flux and multiple sub-luminous fluxes.

[0010] In some feasible implementations, the slope of the attenuation rate of the test pattern is obtained based on the initial luminous flux and multiple sub-luminous fluxes, including: Data preprocessing is performed on multiple sub-optical fluxes; Based on the initial light flux, each sub-light flux after data preprocessing is normalized to obtain normalized light flux data; Logarithmic transformation is performed on the normalized luminous flux data to obtain linear luminous flux data; The fitting equation is obtained by performing a linear fitting on the linear luminous flux data; The attenuation slope of the test pattern is obtained based on the fitted equation.

[0011] Among some feasible implementations, the measurement methods also include: Identify the edges of the test pattern; The first region, the second region, the third region, and the fourth region are obtained based on the edges of the test pattern; The first fitting equation is based on the luminous flux data of the first region; The second fitting equation is based on the luminous flux data of the second region; The third fitting equation is based on the luminous flux data of the third region; The fourth fitting equation is based on the luminous flux data of the fourth region; The attenuation slope of the test pattern is obtained by comparing the slopes of the first, second, third, and fourth fitting equations.

[0012] In some feasible implementations, the measurement method also includes obtaining the attenuation slope of the test pattern based on the minimum value of the slopes of the first fitting equation, the second fitting equation, the third fitting equation, and the fourth fitting equation.

[0013] In some feasible implementations, after obtaining the attenuation slope of the test pattern, the measurement method also includes: Establish at least three evaluation intervals, which are used to evaluate the perceptual characteristics of the human eye to the halo of the test pattern; The attenuation slope is compared with the size of the evaluated interval to determine the perceptual characteristics of the halo of the test pattern to the human eye.

[0014] A high-speed deflecting mirror rapidly rotates at a preset angle to deflect the light beam of the test pattern. During this process, a photoelectric sensor simultaneously collects the luminous flux data of the beam deflected by the high-speed deflecting mirror. After receiving the luminous flux data collected by the photoelectric sensor, the processor processes it based on algorithms and a mathematical model of halo attenuation to obtain the attenuation rate slope, thereby determining the halo intensity of the test pattern. Through the cooperation of the high-speed deflecting mirror, photoelectric sensor, and processor, point-to-point scanning measurement of the test pattern is achieved. The response speed of the high-speed deflecting mirror can reach the millisecond or even microsecond level, which is much faster than mechanically moving the entire sensor or camera. The photoelectric sensor can concentrate all its light-sensing capabilities and dynamic range to measure the luminous flux of a single point, and can simultaneously and accurately capture the high-intensity signal at the center of the halo and the weak signal at the edge, obtaining a wider dynamic range and a higher signal-to-noise ratio. The processor can simultaneously perform high-speed data acquisition. This allows for more accurate quantification of the halo intensity of the test pattern, while also significantly shortening the time for a single measurement and improving the product's detection efficiency. Attached Figure Description

[0015] To more clearly illustrate the technical solutions in the embodiments of this application or the background art, the accompanying drawings used in the embodiments of this application or the background art will be described below.

[0016] Figure 1 This is a schematic diagram illustrating the halo effect involved in this application; Figure 2 A schematic diagram of the structure of a measurement system provided in this application; Figure 3 A schematic diagram of another measurement system provided in this application; Figure 4 A flowchart of the measurement method provided in this application; Figure 5 The normalized luminous flux as a function of off-axis angle involved in this application The curve of change; Figure 6 The normalized luminous flux data, after logarithmic transformation and linear fitting, involved in this application, varies with off-axis angle. The curve of change; Figure 7 This is a schematic diagram of the test pattern involved in this application.

[0017] Attached image annotations: 100 - Measurement system, 110 - High-speed deflection mirror, 120 - Photoelectric sensor, 130 - Processor, 140 - Converter, 200 - Display screen, 210 - Test pattern, 211 - First area, 212 - Second area, 213 - Third area, 214 - Fourth area. Detailed Implementation

[0018] To make the objectives, technical solutions, and advantages of this application clearer, the application will now be described in further detail with reference to the accompanying drawings.

[0019] Please see Figure 1 The halo effect on the display screen is essentially the spatial diffusion of stray light in Mini LED local dimming scenarios: light from bright areas is scattered towards dark areas through optical structures such as diffusion films and light guide plates, forming a light intensity distribution that decreases exponentially from the central bright area outwards. The area closer to the center is the strong halo region, and the area closer to the edges is the weak halo region. The physical law governing this is that stray light intensity decreases exponentially with increasing off-axis angle, where the off-axis angle is the angle between the measurement direction and the screen normal. The mathematical model is:

[0020] In formula (1): I ( θ ( ) is the off-axis angle θ stray light intensity at the location; I 0 represents the stray light intensity at 0° (facing the screen); θ max The maximum angle measured within the off-axis angle range; K halo The attenuation slope reflects the rate of attenuation of stray light with respect to the off-axis angle. K halo The larger the angle, the faster the stray light intensity decays with increasing off-axis angle, the smaller the diffusion range, and the weaker the halo effect; conversely, K halo The smaller the value, the slower the stray light intensity decays with increasing off-axis angle, the larger the diffusion range, and the more severe the halo effect. For example... K halo A value of 0.05 indicates that the halo has a large-scale diffusion. K haloA value of 0.1 indicates moderate diffusion of the halo. K halo A value of 0.15 indicates that the halo diffuses over a small area. K halo The halo effect ratio at 0.05 K halo The halo effect is more severe when the value is 0.10. K halo The halo effect ratio at a value of 0.1 is greater than that at a value of 0.1. K halo The halo effect is more severe when the value is 0.15. Based on a mathematical model of halo effect attenuation, this application provides a measurement system and method for use on a display screen 200 to calculate the accurate attenuation rate slope in order to quantify the halo intensity of the test pattern 210 on the display screen 200.

[0021] Please see Figure 2 The measurement system 100 provided in this application includes: a high-speed deflection mirror 110, a photoelectric sensor 120, and a processor 130. The high-speed deflection mirror 110 faces the test pattern 210 on the display screen 200. The high-speed deflection mirror 110 is used to rotate at a preset angle and deflect the light beam of the test pattern 210 passing through the high-speed deflection mirror 110. The photoelectric sensor 120 is connected to the high-speed deflection mirror 110 and is used to collect the luminous flux data of the light beam deflected by the high-speed deflection mirror 110. The processor 130 is communicatively connected to the photoelectric sensor 120 and is used to receive the luminous flux data and obtain the attenuation slope of the test pattern 210 based on the luminous flux data. The attenuation slope is used to represent the halo intensity of the test pattern 210.

[0022] The high-speed deflecting mirror 110 is a reflector driven by a high-precision motor, which can be a piezoelectric ceramic motor or a voice coil motor. When a specific voltage or current signal is applied, the motor drives the reflector to deflect slightly and at high speed around one or more axes. For example, under the action of the motor, the high-speed deflecting mirror 110 can adjust its angle from 0 degrees to 60 degrees at a speed of 10 milliseconds per degree, and the total time for the high-speed deflecting mirror 110 to rotate from 0 degrees to 60 degrees is only 0.6 seconds. The light beam emitted from the test pattern 210 on the display screen 200 shines on the mirror surface of the high-speed deflecting mirror 110. When the high-speed deflecting mirror 110 is stationary, the light beam is reflected in a fixed direction. When the high-speed deflecting mirror 110 is controlled to rotate at high speed at a preset angle, for example, controlling the high-speed deflecting mirror 110 to rotate from 0 degrees to 60 degrees, the direction of the reflected light beam will change rapidly accordingly. This allows a single fixed photoelectric sensor 120 to receive light from different positions of the test pattern 210 without moving the sensor itself.

[0023] The photoelectric sensor 120 is used to collect luminous flux data of a light beam deflected by the high-speed deflecting mirror 110 at different off-axis angles. Luminous flux is the light energy passing through per unit time, and it is converted into a corresponding electrical signal (usually voltage or current). For example, the photoelectric sensor 120 can be a silicon photodiode or a photomultiplier tube. The light beam deflected by the high-speed deflecting mirror 110 is focused or directly illuminates the photosensitive surface of the photoelectric sensor 120. The semiconductor material inside the sensor generates electron-hole pairs under photon excitation, forming a photocurrent. The magnitude of this photocurrent is proportional to the intensity of the incident light, i.e., the luminous flux. The sensor outputs this analog photocurrent signal or converts it into a digital signal via the converter 140 for acquisition by the processor 130.

[0024] The processor 130 first sends a command to the driver of the high-speed deflecting mirror 110, instructing it to start working at a preset angle and speed. Simultaneously, the processor 130 synchronously acquires luminous flux data from the photoelectric sensor 120. The processor 130 can be a microcontroller, digital signal processor, or computer, etc. After receiving the luminous flux data, the processor 130 uses a mathematical algorithm to process the data and obtain a fitted curve. The attenuation rate slope is the slope of the fitted curve; a larger attenuation rate slope indicates faster halo attenuation and a weaker halo effect; a smaller attenuation rate slope indicates slower halo attenuation and a stronger halo effect.

[0025] By coordinating the high-speed deflection mirror 110, photoelectric sensor 120, and processor 130, point-to-point scanning measurement of the test pattern 210 is achieved. The photoelectric sensor 120 can concentrate its full photosensitivity and dynamic range to measure the luminous flux of a single point, simultaneously and accurately capturing both the high-intensity signal at the center of the halo and the weak signal at the edges, achieving a wider dynamic range and a higher signal-to-noise ratio, thus enabling more accurate quantification of the halo's attenuation characteristics. The high-speed deflection mirror 110 has a response speed of milliseconds or even microseconds, far faster than mechanically moving the entire sensor or camera. The processor 130 can simultaneously perform high-speed data acquisition. This allows the system to complete the scanning of the entire test pattern 210 in a very short time, solving the problems of slow mechanical movement and easy wear in fiber optic scanning methods. This significantly shortens the time for a single measurement and improves the product's testing efficiency. The high-speed deflection mirror 110 covers an off-axis angle range of 0 to 60 degrees, meeting the needs of formal scenarios such as automotive (driver's view of the in-vehicle screen) and home use (side view of the display screen 200), overcoming the limitation of camera imaging methods that can only measure the angle directly in front. The output of the measurement system 100 is the attenuation rate slope, providing an objective, quantifiable, and comparable evaluation standard for halo intensity, facilitating performance comparison between different display devices, iterative optimization in product development, and quality control on the production line.

[0026] In some feasible implementations, within the time it takes for the high-speed deflecting mirror 110 to deflect a unit degree, the photoelectric sensor 120 is used to acquire luminous flux data at least once. The time required for the high-speed deflecting mirror 110 to deflect one degree is positively correlated with the response time of the photoelectric sensor 120. For example, if the high-speed deflecting mirror 110 requires 10 milliseconds to deflect one degree, and the response time of the photoelectric sensor 120 is less than or equal to 1 microsecond, the photoelectric sensor 120 can acquire at least 100 luminous flux data values ​​within these 10 milliseconds of deflection. By averaging these 100 luminous flux data values, random noise, such as circuit thermal noise and background light fluctuations, can be greatly filtered out, resulting in a very smooth and accurate luminous flux measurement value, thereby improving measurement accuracy.

[0027] In some feasible implementations, the photoelectric sensor collects luminous flux data once for every unit angle the high-speed deflecting mirror rotates. For example, if the high-speed deflecting mirror 110 rotates by 0.1 degrees and its deflection speed is 10 milliseconds per degree, the photoelectric sensor collects luminous flux data of the beam deflected by the high-speed deflecting mirror once for every 0.1-degree rotation. The photoelectric sensor 120 collects luminous flux data of the beam deflected by the high-speed deflecting mirror 110 at each 0.1-degree position. This means that the sampling angle of the photoelectric sensor 120 perfectly matches the minimum change value of the rotation angle of the high-speed deflecting mirror 110. This matching ensures that the luminous flux data at each angular position can be accurately recorded, avoiding measurement errors caused by angular offset, thereby ensuring the real-time performance and accuracy of data acquisition.

[0028] Please see Figure 3The measurement system 100 also includes a converter 140, which is electrically connected to both the photoelectric sensor 120 and the processor 130. The converter 140 converts the luminous flux data collected by the photoelectric sensor 120 into a digital signal. The sampling rate of the converter 140 is positively correlated with the sampling rate of the photoelectric sensor 120. The converter 140 receives the luminous flux data collected by the photoelectric sensor 120, converts it into a digital signal, and transmits it to the processor 130 so that the processor 130 can calculate the attenuation rate slope. The sampling rate of converter 140 is positively correlated with the sampling rate of photoelectric sensor 120, meaning that the higher the sampling rate of photoelectric sensor 120, the higher the sampling rate of converter 140. For example, if the response time of photoelectric sensor 120 is 1 microsecond and it collects luminous flux data every 0.1 degrees, equivalent to collecting 100 data points per second, then the sampling rate of converter 140 can be 100kHz. This means converter 140 performs luminous flux data conversion every 0.1 degrees, with each conversion taking 0.1 seconds, equivalent to converter 140 converting 100 data points per second. This allows the high-speed deflection mirror 110 to simultaneously acquire and convert luminous flux data during the scanning of test pattern 210. The high resolution and high signal-to-noise ratio of converter 140 ensure accurate conversion of luminous flux data, reducing signal distortion and noise interference.

[0029] For example, the high-speed deflection mirror 110 has an angle range of 0 to 60 degrees, a resolution of 0.01 degrees, and a response speed of 10 milliseconds per degree; the photoelectric sensor 120 is a silicon photodiode with a spectral response range of 400nm-1100nm, covering the blue light excitation spectrum of MiniLED, a response time of less than or equal to 1 microsecond, and a linearity of less than or equal to 0.5%; the converter 140 uses a 16-bit AD conversion with a sampling rate of 100kHz. The high-speed deflection mirror 110 faces the display screen 200 and rotates continuously from 0 degrees to 60 degrees at a speed of 10 milliseconds per degree. During this process, the high-speed deflection mirror 110 rotates 0.1 degrees per millisecond, and the minimum change in the angle of rotation of the high-speed deflection mirror 110 is 0.1 degrees. The photoelectric sensor 120 records the luminous flux data of the beam deflected by the high-speed deflection mirror 110 at each 0.1 degree interval, for a total of 600 sample values. At the same time, the converter 140 converts these luminous flux data and transmits them to the processor 130. The processor 130 converts these luminous flux data to obtain the attenuation slope of the test pattern 210, thereby determining the halo intensity of the test pattern 210.

[0030] Please see Figure 4 This application also provides a measurement method applied to a measurement system 100, which includes a high-speed deflection mirror 110, a photoelectric sensor 120, and a processor 130. The measurement method includes the following steps: S101 controls the high-speed deflection mirror to face the test pattern and controls the high-speed deflection mirror to rotate at a preset angle so that the beam of light passing through the high-speed deflection mirror is deflected.

[0031] When the high-speed deflecting mirror 110 is stationary, its surface faces the test pattern 210. At this time, the angle between the measurement direction and the normal direction of the display screen 200 is 0 degrees, i.e., the off-axis angle is 0 degrees. When measuring the halo intensity of the test pattern 210, the high-speed deflecting mirror 110 is controlled to rotate at a preset angle, for example, gradually rotating from 0 degrees to 60 degrees. During this process, the light beam from the test pattern 210 passing through the high-speed deflecting mirror 110 is deflected along with the rotation of the high-speed deflecting mirror 110. The resolution of the high-speed deflecting mirror 110 can reach 0.01 degrees, and its speed can be greater than 10 milliseconds per degree. The high resolution of the high-speed deflecting mirror 110 ensures that it can accurately capture the light beam of the test pattern 210, avoiding measurement deviations caused by mechanical errors. The rapid rotation of the high-speed deflecting mirror significantly improves measurement efficiency and is suitable for dynamic halo analysis.

[0032] S102 controls the photoelectric sensor to collect the luminous flux data of the beam deflected by the high-speed deflection mirror.

[0033] The photoelectric sensor 120 synchronously acquires luminous flux data at each step angle of the high-speed deflecting mirror 110. Its spectral response range covers the blue light excitation spectrum of the display screen 200. It converts the light signal into an electrical signal through the photoelectric effect and transmits it to the processor 130. The fast response time and wide spectral range of the photoelectric sensor 120 ensure accurate capture of weak halo signals, avoiding signal loss. The photoelectric sensor 120 is synchronized with the step angle of the high-speed deflecting mirror 110; for example, the photoelectric sensor 120 acquires luminous flux data every 0.1 degrees, ensuring that the spatial resolution of the data is consistent with the scanning path.

[0034] S103, the control processor obtains the attenuation rate slope of the test pattern based on the luminous flux data. The attenuation rate slope is used to represent the halo intensity of the test pattern.

[0035] After receiving digitized luminous flux data or converting analog luminous flux data into digital data, the processor 130 generates an attenuation rate slope based on a mathematical model of the halo effect, using algorithms such as linear regression or differential calculation. This slope quantifies the rate of attenuation of the halo intensity from the center to the edge. For example, the degree of halo diffusion is characterized by fitting the slope of the luminous flux and angle curves. A larger attenuation rate slope indicates that the halo attenuates faster and the halo intensity of the test pattern 210 is weaker; a smaller attenuation rate slope indicates that the halo attenuates slower and the halo intensity of the test pattern 210 is stronger.

[0036] In some feasible implementations, the preset angle includes multiple sub-angles. The control processor 130 obtains the attenuation rate slope of the test pattern 210 based on the luminous flux data, including: obtaining the luminous flux data of the beam deflected by the high-speed deflecting mirror 110 when it is stationary based on the luminous flux data collected by the photoelectric sensor 120, as the initial luminous flux; obtaining the luminous flux data of the beam deflected by the high-speed deflecting mirror 110 at each sub-angle based on the luminous flux data collected by the photoelectric sensor 120, obtaining multiple sub-luminous fluxes; and obtaining the attenuation rate slope of the test pattern 210 based on the initial luminous flux and the multiple sub-luminous fluxes. For example, the preset angle of rotation of the high-speed deflecting mirror 110 is from 0 degrees to 60 degrees, and the range from 0 degrees to 60 degrees includes multiple sub-angles of 0.1 degrees, that is, the minimum angle change value of the rotation angle of the high-speed deflecting mirror 110 is 0.1 degrees. After receiving the luminous flux data collected by the photoelectric sensor 120, the processor 130 takes the luminous flux of the beam deflected by the height deflection mirror when the high-speed deflection mirror 110 is stationary as the initial luminous flux, that is, the luminous flux when the off-axis angle is 0 degrees. Based on the luminous flux data of the beam deflected by the high-speed deflection mirror 110 at each 0.1 degree position collected by the photoelectric sensor 120, multiple sub-luminous fluxes are obtained.

[0037] The following provides a detailed explanation of how the processor 130 obtains the attenuation rate slope based on the initial luminous flux and multiple sub-luminous fluxes.

[0038] In some feasible implementations, the slope of the attenuation rate of the test pattern 210 is obtained based on the initial luminous flux and multiple sub-luminous fluxes. This includes: preprocessing the multiple sub-luminous fluxes; normalizing each preprocessed sub-luminous flux based on the initial luminous flux to obtain normalized luminous flux data; performing a logarithmic transformation on the normalized luminous flux data to obtain linear luminous flux data; performing linear fitting on the linear luminous flux data to obtain a fitting equation; and obtaining the attenuation rate slope of the test pattern 210 based on the fitting equation. Preprocessing the multiple sub-luminous flux data preserves the true trend of luminous flux variation, and normalizing the preprocessed luminous flux data eliminates differences in absolute brightness between different panels. Performing a logarithmic transformation on the normalized luminous flux data converts the luminous flux data curve into a linear curve, facilitating slope fitting and thus making it easier to extract the accurate attenuation rate slope.

[0039] For example: First, noise removal is performed on multiple sub-luminous fluxes. Moving average filtering is used to remove environmental noise, such as 2% random noise. Then, each sub-luminous flux is divided by the initial luminous flux to obtain the normalized luminous flux of each sub-luminous flux, i.e., the normalized luminous flux data. A logarithmic transformation is performed on the normalized luminous flux data. Based on the mathematical model of the halo shown in equation (1), the natural logarithm of the normalized luminous flux data is taken to obtain a linear relationship:

[0040] To perform a linear fit on equation (2), for example, by using the least squares method to perform a first-order polynomial fit on equation (2), we obtain the fitted equation:

[0041] In equation (3), the absolute value of the slope a is the attenuation slope. K halo , K halo =-a.

[0042] Please see Figure 5 and Figure 6 The attenuation slope is obtained. K halo Then, the processor 130 can visualize its output values, and can also display the fitting effect verified by the luminous flux attenuation curve and the logarithmic coordinate curve. For example Figure 5 The normalized luminous flux corresponding to the sub-luminous flux shown is as a function of off-axis angle The curve of change, and Figure 6 The normalized luminous flux data shown, after logarithmic transformation and linear fitting, varies with off-axis angle. The curve showing the change.

[0043] The measurement method further includes: identifying the edges of the test pattern 210; obtaining a first region 211, a second region 212, a third region 213, and a fourth region 214 based on the edges of the test pattern 210; formulating a first fitting equation based on the luminous flux data of the first region 211; a second fitting equation based on the luminous flux data of the second region 212; a third fitting equation based on the luminous flux data of the third region 213; and a fourth fitting equation based on the luminous flux data of the fourth region 214; and comparing the slopes of the first, second, third, and fourth fitting equations to obtain the attenuation rate slope of the test pattern 210. Please refer to [link to relevant documentation]. Figure 6The boundary between the dark and bright areas is the edge of the test pattern 210. The first region 211, the second region 212, the third region 213, and the fourth region 214 correspond to the upper, right, lower, and left regions outside the test pattern 210, respectively. Steps S101-S103 are repeated to obtain the first, second, third, and fourth fitting equations for the first region 211, the second region 212, the third region 213, and the fourth region 214, respectively. The slopes of these equations are then compared to obtain the attenuation rate slope of the test pattern 210. By dividing the halo edge into four parts and performing independent linear fitting on each part, the spatial attenuation characteristics of the halo are sampled in multiple dimensions. This approach considers the spatial non-uniformity of the halo, avoiding the randomness and bias of measurements in a single direction, and making the measurement results more reflective of the overall behavior of the halo. By fitting multiple points and directions, the resulting slope dataset reveals the true physical laws of halo attenuation better than a single slope, thus improving the accuracy of the final evaluation results.

[0044] In some feasible implementations, the minimum value of the slopes of the first, second, third, and fourth fitting equations is used to obtain the attenuation rate slope of the test pattern 210. The smaller the absolute value of the attenuation rate slope, the slower the light intensity of the test pattern 210 attenuates, and the more severe the halo effect. Taking the minimum value of the attenuation rate slope, i.e., the smallest negative number in absolute value, is equivalent to finding the edge with the slowest attenuation and the most significant halo effect. Using the minimum value of the slopes of the first, second, third, and fourth fitting equations as the attenuation rate slope of the entire test pattern 210 means that the performance of the test pattern 210 in all directions is better than or equal to this minimum value, thereby ensuring the rigor of product evaluation and improving product yield and the reliability of user experience.

[0045] For example, please see Figure 7Taking an 8-bit display as an example, its resolution is 1920×1080, suitable for OLED, LCD, and Mini / Micro LED. First, a test pattern 210 is generated on the display screen 200. The test pattern 210 is a white square displaying pixels at the geometric center of the display screen 200, with a grayscale value of 255, corresponding to 100% brightness, and k ranging from 5% to 20%. The area surrounding the white square is completely black, with a grayscale value of 0, corresponding to 0% brightness. The first region 211, the third region 213, the fourth region 214, and the second region 212 in the figure correspond to the test areas above, below, left, and right of the white square, respectively. The shortest distance between the boundary of each region and the boundary of the white square is 200 pixels. Then, the light beams of each region are rapidly deflected by a high-speed deflecting mirror 110, and the photoelectric sensor 120 collects the luminous flux data of each region as it is rotated from 0 degrees to 60 degrees by the high-speed deflecting mirror 110. The processor 130 processes the luminous flux data of each region to obtain the slope of the fitting equation corresponding to each region, and takes the minimum slope value as the attenuation rate slope of the test pattern 210.

[0046] It is important to note that in actual product inspection, to ensure... K halo To ensure accuracy and repeatability, measurements were repeated 10 times at the same location on the same panel. Please refer to Table 1. K halo A coefficient of variation (CV) of less than or equal to 2% indicates that the manufactured display panel meets industrial-grade measurement requirements. The formula for calculating the coefficient of variation is:

[0047] In equation (4), CV is the coefficient of variation of the attenuation slope, σ is the standard deviation of the measured data, and μ is the average value of the measured data.

[0048] Table 1

[0049] In some feasible implementations, the attenuation slope of the test pattern 210 is obtained. K halo The measurement method further includes: establishing at least three evaluation intervals to assess the human eye's perception characteristics of the halo of the test pattern 210; and comparing the attenuation rate slope with the size of the evaluation intervals to determine the human eye's perception characteristics of the halo of the test pattern 210. The human eye's halo perception threshold, i.e., the minimum discernible luminance, is 0.002 cd / m², which reflects the human eye's ability to resolve halos in low-light environments. When the luminance is below 0.002 cd / m², the human eye cannot distinguish the presence of a halo. This application uses the attenuation rate slope...K halo As a quantitative indicator of halo intensity, at least two evaluation intervals were established, combined with the minimum discernible brightness of the human eye, to evaluate the perceptual characteristics of the current test pattern 210. The attenuation rate slope obtained through detection was then used to evaluate the halo intensity. K halo The test pattern 210 is compared with the evaluation interval to determine the perceptual characteristics of the human eye to the test pattern 210.

[0050] For example, please refer to Table 2, when the attenuation rate slope K halo When the value is greater than or equal to 0.20, it indicates that the halo effect of test pattern 210 is extremely slight, and can only be seen by careful comparison against a pure black background; when the attenuation rate slope is... K halo When the value is greater than or equal to 0.15 and less than 0.20, it indicates that the halo effect of test pattern 210 is slight. This halo is not visible when viewing a 200-degree display screen in normal use; it may only be noticeable in dark movie conditions. When the attenuation rate slope... K halo When the value is greater than or equal to 0.10 and less than 0.15, it indicates that the halo effect of test pattern 210 is moderate. This halo can be seen in dark-field movie conditions, but it does not affect the display screen 200 from displaying normal content; when the attenuation rate slope is... K halo When the value is greater than or equal to 0.05 and less than 0.10, it indicates that the halo effect of test pattern 210 is obvious and can be seen even when the display screen 200 is against a gray background, affecting the user's viewing experience; when the attenuation rate slope is... K halo When the value is less than 0.05, it indicates that the halo effect of the test pattern 210 is severe. The test pattern 210 can be seen even against a bright background, which greatly affects the user's viewing experience.

[0051] Table 2

[0052] Compared to traditional halo measurement methods, such as camera imaging and fiber optic scanning, the measurement method provided in this application does not require a threshold dependency, avoiding the calibration requirement for a brightness threshold of 0.002 cd / m² found in traditional camera methods, and eliminating the need for readjustment due to changes in ambient light. Attenuation slope K halo It is a relative value, which is only related to the stray light decay rate and is not affected by the absolute brightness of the screen or ambient light. It is applicable to various real-world scenarios and improves the stability of halo intensity measurement.

[0053] The measurement method provided in this application uses a high-speed deflecting mirror 110 to rapidly rotate and deflect the light beam of the test pattern 210. A photoelectric sensor 120 collects the luminous flux data of the light beam deflected by the high-speed deflecting mirror 110 during this process. The control processor 130, based on a mathematical model of halo attenuation and combined with a logarithmic linear fitting method, transforms the spatial diffusion of the halo effect into an attenuation rate slope. K halo This specific value, and the attenuation slope K halo As a quantitative indicator of the halo effect, it enables the measurement of the halo intensity of the test pattern 210 from multiple perspectives, improving the measurement efficiency of the test pattern 210 and solving the drawback of relying on a single human eye perception threshold to evaluate the halo effect in traditional methods. This improves the objectivity and efficiency of the evaluation of the halo effect of the display screen 200, and also realizes noise-resistant quantitative measurement of the halo effect, eliminating the interference of background light and ambient light, and improving the accuracy of the measurement system 100.

[0054] It should be noted that all directional indicators (such as up, down, left, right, front, back, etc.) in the embodiments of this application are only used to explain the relative positional relationship and movement of each component in a certain specific posture (as shown in the figure). If the specific posture changes, the directional indicator will also change accordingly.

[0055] Furthermore, the use of terms such as "first," "second," etc., in this application is for descriptive purposes only and should not be construed as indicating or implying their relative importance or implicitly specifying the number of technical features indicated. Therefore, a feature defined as "first" or "second" may explicitly or implicitly include at least one of that feature. In the description of this application, "multiple" means at least two, such as two, three, etc., unless otherwise explicitly specified.

[0056] In this application, unless otherwise expressly specified and limited, the terms "connection," "fixed," etc., should be interpreted broadly. For example, "fixed" can mean a fixed connection, a detachable connection, or an integral part; it can mean a mechanical connection or an electrical connection; it can mean a direct connection or an indirect connection through an intermediate medium; it can mean the internal communication of two components or the interaction between two components, unless otherwise expressly limited. Those skilled in the art can understand the specific meaning of the above terms in this application according to the specific circumstances.

[0057] Furthermore, the technical solutions of the various embodiments of this application can be combined with each other, but only if they are based on the ability of those skilled in the art to implement them. When the combination of technical solutions is contradictory or cannot be implemented, it should be considered that such combination of technical solutions does not exist and is not within the scope of protection claimed by this application.

[0058] The above description is merely a specific embodiment of this application, but the scope of protection of this application is not limited thereto. Any variations or substitutions that can be easily conceived by those skilled in the art within the scope of the technology disclosed in this application should be included within the scope of protection of this application. Therefore, the scope of protection of this application should be determined by the scope of the claims.

Claims

1. A measurement method, characterized in that, The measurement method employs a measurement system applied to a display screen displaying a test pattern. The measurement system includes a high-speed deflection mirror, a photoelectric sensor, and a processor. The high-speed deflection mirror faces the test pattern on the display screen and rotates at a preset angle to deflect the light beam passing through it. The photoelectric sensor is connected to the high-speed deflection mirror and collects luminous flux data of the deflected light beam. The processor is communicatively connected to the photoelectric sensor and receives the luminous flux data, obtaining the attenuation slope of the test pattern based on the data. The attenuation slope represents the halo intensity of the test pattern. The measurement method includes the following steps: The high-speed deflection mirror is controlled to face the test pattern, and the high-speed deflection mirror is controlled to rotate at a preset angle so that the light beam passing through the high-speed deflection mirror is deflected. The photoelectric sensor is controlled to collect the luminous flux data of the light beam deflected by the high-speed deflection mirror; The processor is controlled to obtain the attenuation rate slope of the test pattern based on the luminous flux data. The attenuation rate slope is used to represent the halo intensity of the test pattern. The preset angle includes multiple sub-angles. The process of controlling the processor to obtain the attenuation rate slope of the test pattern based on the luminous flux data includes: obtaining the luminous flux data of the beam deflected by the high-speed deflecting mirror when it is stationary based on the luminous flux data collected by the photoelectric sensor, as the initial luminous flux; obtaining the luminous flux data of the beam deflected by the high-speed deflecting mirror at each sub-angle based on the luminous flux data collected by the photoelectric sensor, and obtaining multiple sub-angles. The process involves: obtaining the attenuation rate slope of the test pattern based on the initial luminous flux and the plurality of sub-luminous fluxes; and obtaining the attenuation rate slope of the test pattern based on the initial luminous flux and the plurality of sub-luminous fluxes, which includes: preprocessing the plurality of sub-luminous fluxes; normalizing each preprocessed sub-luminous flux based on the initial luminous flux to obtain normalized luminous flux data; performing a logarithmic transformation on the normalized luminous flux data to obtain linear luminous flux data; performing linear fitting on the linear luminous flux data to obtain a fitting equation; and obtaining the attenuation rate slope of the test pattern based on the fitting equation.

2. The measurement method as described in claim 1, characterized in that, The measurement method further includes: Identify the edges of the test pattern; Based on the edges of the test pattern, a first region, a second region, a third region, and a fourth region are obtained; The first fitting equation is obtained based on the luminous flux data of the first region; The second fitting equation is obtained based on the luminous flux data of the second region; The third fitting equation is obtained based on the luminous flux data of the third region. The fourth fitting equation is obtained based on the luminous flux data of the fourth region. The attenuation slope of the test pattern is obtained by comparing the slopes of the first fitting equation, the second fitting equation, the third fitting equation, and the fourth fitting equation.

3. The measurement method as described in claim 2, characterized in that, The measurement method further includes obtaining the attenuation slope of the test pattern based on the minimum value of the slopes of the first fitting equation, the second fitting equation, the third fitting equation, and the fourth fitting equation.

4. The measurement method as described in claim 1, characterized in that, Within the time it takes for the high-speed deflecting mirror to deflect a unit degree, the photoelectric sensor is used to collect light flux data at least once.

5. The measurement method as described in claim 4, characterized in that, For every unit angle the high-speed deflecting mirror deflects, the photoelectric sensor collects light flux data once.

6. The measurement method as described in claim 1, characterized in that, The measurement system also includes a converter, which is electrically connected to the photoelectric sensor and the processor respectively. The converter is used to convert the light flux data collected by the photoelectric sensor into a digital signal, and the sampling rate of the converter is positively correlated with the sampling rate of the photoelectric sensor.

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