Test equipment, test method and design method of circuit structure

Abstract

The embodiment of the invention provides test equipment, a test method and a design method of a circuit structure. The test equipment comprises an input mechanism, a receiving mechanism and an image acquisition mechanism, the input mechanism comprises a first contact, and the input mechanism is in contact with a to-be-detected device through the first contact. The receiving mechanism and the input mechanism are arranged on the two sides of a to-be-detected device in the first direction, the receiving mechanism comprises a receiving assembly and a developing assembly, and the developing assembly is located on the side, away from the input mechanism, of the receiving assembly. The receiving assembly receives a signal from a to-be-detected device and drives the developing assembly to convert first image information into second image information. The image acquisition mechanism is arranged on one side, deviating from the input mechanism, of the development assembly and is used for receiving the second image information, so that the whole-surface test of the to-be-detected device can be realized, and the connectivity test of the to-be-detected device in a specific area is realized.

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