Defect detection method and device based on cooling fin image recognition and medium
CN121661007APending Publication Date: 2026-03-13AGIS INTELLIGENT SYST (SHENZHEN) CO LTD
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Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2025-12-05
- Publication Date
- 2026-03-13
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Figure CN121661007A_ABST
Abstract
The invention discloses a defect detection method and device based on cooling fin image recognition and a medium, and relates to the technical field of intelligent detection, and the method comprises the steps: collecting image data, carrying out the denoising, enhancement and geometric correction processing, and generating a preprocessed image; performing edge detection and contour feature extraction on the preprocessed image to generate structured contour data; carrying out geometric modeling on the structured contour data by adopting a triangulation algorithm to generate a three-dimensional geometric model; performing geometric deviation comparison on the three-dimensional geometric model, marking a geometric deviation area, and generating a defect marked three-dimensional geometric model; combining the defect marking three-dimensional geometric model with the preprocessed image, and performing surface texture comparison and defect prediction to generate a defect comprehensive result; and according to a defect comprehensive result, performing heat distribution anomaly analysis on the defect marking three-dimensional geometric model and the preprocessed image to generate a defect detection result. According to the invention, the effects of high precision, repeatability and quantifiability are achieved.
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