Full-automatic AOI (automatic optical inspection) equipment for chips

CN121666042APending Publication Date: 2026-03-13ZHONGSHAN BOCEDA ELECTRONICS TECH CO LTD
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Patent Information

Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
Filing Date
2025-12-19
Publication Date
2026-03-13

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Abstract

The invention relates to the technical field of chip detection, in particular to chip full-automatic AOI detection equipment which comprises a rack, and a feeding mechanism is mounted on one side of the surface of the rack; a four-axis mold expanding platform used for feeding is installed on the surface of the machine frame. A detection mechanism is arranged on the surface of the rack and located on one side of the four-axis mold expanding platform. A double-rotating-disc mechanism is installed on the surface of the machine frame, and a discharging mechanism is installed on the surface of the machine frame and located on one side of the detection mechanism. During chip feeding, feeding is more efficient and faster through four-axis movement, and feeding work of products of different sizes is met; two groups of carrying functions are realized through the material taking rotary table and the material measuring rotary table, and meanwhile, the material receiving rotary table is used for realizing intermediate material receiving; separation work of defective products and non-defective products can be achieved through the detection mechanism, the mixing phenomenon of the defective products and the non-defective products is avoided, meanwhile, through arrangement of the discharging mechanism, the non-stop material receiving function is achieved, and the working efficiency during discharging is improved.
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