Device and method for testing and evaluating puncture resistance of rubber material based on road surface simulation

Abstract

This application relates to the field of puncture resistance technology for rubber, and discloses a testing device and evaluation method for the puncture resistance performance of rubber materials based on road surface simulation. The evaluation method includes: S1, sample preparation; S2, puncture test; S3, parameter extraction; S4, calculating the motion state correction coefficient of the rubber sample and using the motion state correction coefficient to perform a first-level correction of puncture energy consumption; S5, calculating the puncture speed correction coefficient of the probe under test and using the puncture speed correction coefficient to perform a second-level correction of puncture energy consumption; S6, changing the probe under test or the rubber sample, and repeating S2 to S5 to obtain performance data under different temperatures and different puncture patterns. In this way, the puncture energy consumption is continuously corrected twice based on the motion state correction coefficient and the puncture speed correction coefficient of the rubber sample, taking into account the mapping of actual working conditions and rate dependence, simulating the actual working conditions of tires as much as possible, thereby effectively improving the predictive ability of laboratory test results for real-world performance.

Description

Technical Field

[0001] This application relates to the field of rubber puncture resistance technology, for example to a test device and evaluation method for the puncture resistance performance of rubber materials based on road surface simulation. Background Technology

[0002] Rubber materials are widely used in tires and protective components of engineering machinery, agricultural vehicles, and special transportation equipment. Their puncture resistance directly affects the safety and service life of equipment in complex operating environments. In typical working conditions such as mines, construction sites, and farmland, rubber products frequently come into contact with various sharp foreign objects, such as broken metal fasteners, irregular fragments of ore and rock, sharp metal plate edges, and high-speed flying processing debris. These objects are diverse in shape, high in hardness, and have complex damage mechanisms, causing multi-dimensional effects on rubber.

[0003] Current industry-standard puncture resistance evaluation methods are generally limited to using conical or standard needle probes of a single geometry, conducting static puncture tests under constant or room temperature conditions. These methods fail to accurately reproduce the complex damage effects of sharp objects on rubber in real-world road surfaces. For example, the mechanisms of extrusion fracturing caused by blunt fracture surfaces and high-speed puncture cutting caused by extremely sharp metal fragments are drastically different, and traditional probes cannot cover these diverse damage modes. Furthermore, laboratory puncture tests cannot simulate real-world puncture conditions, leading to deviations in experimentally calculated results from actual values ​​and consequently, inaccurate predictions.

[0004] It should be noted that the information disclosed in the background section above is only used to enhance the understanding of the background of this application, and therefore may include information that does not constitute prior art known to those skilled in the art. Summary of the Invention

[0005] To provide a basic understanding of some aspects of the disclosed embodiments, a brief summary is given below. This summary is not intended as a general commentary, nor is it intended to identify key / important components or describe the scope of protection of these embodiments, but rather as a prelude to the detailed description that follows.

[0006] This disclosure provides a puncture resistance testing device and evaluation method for rubber materials based on road surface simulation, so as to improve the predictive ability of laboratory test results for real-world performance.

[0007] In some embodiments, the method for evaluating the puncture resistance of rubber materials based on road surface simulation includes: S1, sample preparation: preparing a rubber sample according to test requirements and placing the rubber sample in a standard laboratory environment for a first preset time; S2, puncture test: selecting a probe to be tested to perform a puncture test on the rubber sample, and collecting force, displacement, and temperature data during the test to generate a force-displacement curve and a related temperature curve; S3, parameter extraction: analyzing the force-displacement curve and calculating the puncture parameters of this test, the puncture parameters including puncture energy consumption; S4, first-level correction: calculating the motion state correction coefficient of the rubber sample, and using the motion state correction coefficient to perform a first-level correction on the puncture energy consumption; S5, second-level correction: calculating the puncture speed correction coefficient of the probe to be tested, and using the puncture speed correction coefficient to perform a second-level correction on the puncture energy consumption; S6, repeated test: replacing the probe to be tested or the rubber sample, repeating the above steps to obtain performance data under different temperatures and different puncture patterns.

[0008] In some embodiments, the puncture resistance testing device for rubber materials based on road surface simulation includes: a constant temperature test chamber with a built-in programmable temperature control module for simulating the working environment of rubber under different climatic conditions; a material testing machine installed in the constant temperature test chamber to meet the puncture test requirements under different speed conditions; a puncture probe set including standardized puncture probes of various biomimetic geometric shapes, the puncture probes being installed in the material testing machine and driven by the material testing machine to puncture the rubber sample located in the constant temperature test chamber; and a data acquisition and control unit, communicatively connected to the programmable temperature control module and the material testing machine, for controlling the temperature of the constant temperature test chamber and the operating parameters of the material testing machine, and for real-time acquisition of force, displacement, and time data during the test process.

[0009] The puncture resistance testing device and evaluation method for rubber materials based on road surface simulation provided in this disclosure can achieve the following technical effects: Force, displacement, and temperature data are collected during the puncture test to generate force-displacement curves and related temperature curves, thereby obtaining the puncture parameters of the rubber sample. The puncture penetration energy is continuously corrected twice based on the motion state correction coefficient and puncture speed correction coefficient of the rubber sample, taking into account the mapping of actual working conditions and rate dependence, simulating the actual working conditions of the tire as much as possible, thus effectively improving the predictive ability of laboratory test results for real-world performance.

[0010] The above general description and the description below are exemplary and illustrative only and are not intended to limit this application. Attached Figure Description

[0011] One or more embodiments are illustrated by way of example with reference to the accompanying drawings. These illustrations and drawings do not constitute a limitation on the embodiments. Elements having the same reference numerals in the drawings are shown as similar elements. The drawings are not to be scaled. And wherein: Figure 1 This is a three-dimensional schematic diagram of the puncture resistance testing device for rubber materials based on road surface simulation provided in the embodiments of this disclosure; Figure 2 This is a front view of the puncture resistance testing device for rubber materials based on road surface simulation provided in this embodiment of the present disclosure; Figure 3 This is a schematic diagram of the belt drive mechanism provided in an embodiment of this disclosure; Figure 4 This is a schematic diagram of the structure of the multi-faceted frustum probe provided in the embodiments of this disclosure; Figure 5 This is a schematic diagram of the structure of the thin-blade probe provided in the embodiments of this disclosure; Figure 6 This is a schematic diagram of the oblique needle probe provided in the embodiments of this disclosure; Figure 7 This is a schematic diagram of the structure of the test bench provided in the embodiments of this disclosure; Figure 8 This is a schematic diagram of the first method for evaluating the puncture resistance of rubber materials based on road surface simulation provided in this disclosure embodiment; Figure 9 This is a schematic diagram of the second method for evaluating the puncture resistance of rubber materials based on road surface simulation, provided in the embodiments of this disclosure; Figure 10 This is a schematic diagram of the third method for evaluating the puncture resistance of rubber materials based on road surface simulation, provided in the embodiments of this disclosure.

[0012] Figure label: 10. Constant Temperature Test Chamber; 11. First Platform; 12. Second Platform; 13. Air Outlet; 14. Heating Module; 141. Heating Wire; 142. Fan; 15. Control Panel; 20. Material Testing Machine; 21. Drive Motor; 22. Transmission Mechanism; 221. Small Pulley; 222. Large Pulley; 223. Belt; 224. Wheel; 225. Guide Post; 226. Guide Component; 227. Guide Groove; 23. Puncture Module; 24. Test Stand; 241. Base; 242. Top cover; 243, clasp; 244, annular cover plate; 245, center hole; 246, clasp; 30, multi-faceted pyramidal probe; 31, first base; 32, first body; 33, first probe; 40, thin blade probe; 41, second base; 42, second body; 43, second probe; 50, oblique needle probe; 51, third base; 52, third body; 53, needle tip; 60, rubber sample; 61, perforation; 70, temperature sensor; 80, six-component force sensor. Detailed Implementation

[0013] To provide a more detailed understanding of the features and technical content of the embodiments of this disclosure, the implementation of the embodiments of this disclosure will be described in detail below with reference to the accompanying drawings. The accompanying drawings are for illustrative purposes only and are not intended to limit the embodiments of this disclosure. In the following technical description, for ease of explanation, several details are used to provide a full understanding of the disclosed embodiments. However, one or more embodiments may still be implemented without these details. In other cases, well-known structures and devices may be simplified in their depiction to simplify the drawings.

[0014] The terms "first," "second," etc., used in the specification, claims, and accompanying drawings of this disclosure are used to distinguish similar objects and are not necessarily used to describe a specific order or sequence. It should be understood that such data can be interchanged where appropriate for the embodiments of this disclosure described herein. Furthermore, the terms "comprising" and "having," and any variations thereof, are intended to cover non-exclusive inclusion.

[0015] Unless otherwise stated, the term "multiple" means two or more.

[0016] In this embodiment of the disclosure, the character " / " indicates that the objects before and after it are in an "or" relationship. For example, A / B means: A or B.

[0017] The term "and / or" describes an association between objects, indicating that three relationships can exist. For example, A and / or B means: A or B, or A and B.

[0018] The term "correspondence" can refer to an association or binding relationship. The correspondence between A and B means that there is an association or binding relationship between A and B.

[0019] Combination Figures 1 to 3 As shown in the figure, this disclosure provides a puncture resistance testing device for rubber materials based on road surface simulation, including: a constant temperature test chamber 10, a material testing machine 20, a puncture probe set, and a data acquisition and control unit.

[0020] The constant temperature test chamber 10 has a built-in programmable temperature control module, which has the ability to accurately control the temperature over a wide temperature range from room temperature to 150 ℃, and is used to simulate the working environment of rubber under different climatic conditions.

[0021] The material testing machine 20 is an electrically driven reciprocating structure, and its moving speed can be steplessly adjusted within a certain range to meet the puncture test requirements under different speed conditions.

[0022] The multi-functional puncture probe kit includes standardized puncture probes with various biomimetic geometric shapes to simulate different types of sharp road debris. The puncture probes are connected to the puncture module 23 of the material testing machine 20 via a standardized quick-change clamp, thereby ensuring the coaxiality and repeatability of the puncture probe installation.

[0023] The data acquisition and control unit, consisting of an industrial computer and test control software, communicates with the programmable temperature control module and the material testing machine 20. Operation is performed via the control panel 15 to control the temperature of the constant temperature test chamber 10 and the operating parameters of the material testing machine 20, while simultaneously acquiring force, displacement, temperature, and time data in real time during the test. The industrial computer is equipped with a 16-channel synchronous data acquisition card. The test control software integrates a graphical user interface, supporting test program parameter settings, including ambient temperature setting range of -40℃ to 150℃, probe type selection, puncture speed adjustment, and puncture stroke setting. The software can display force-displacement and temperature curves in real time and refresh data at a certain frequency. The system has a built-in energy integration algorithm module, which automatically calculates the area under the force-displacement curve during each puncture test using the trapezoidal numerical integration method. After the test, a test report containing the maximum puncture force, puncture displacement, and puncture energy consumption indicators is automatically generated.

[0024] The puncture resistance testing device for rubber materials provided in this embodiment takes into account the high sensitivity of the mechanical properties of rubber materials to temperature, and the significant change in their puncture resistance under high temperature softening or low temperature embrittlement conditions. It integrates multiple types of biomimetic puncture probes, has wide temperature range environment simulation capabilities, and supports full-process data acquisition and energy quantification analysis. It can perform high-fidelity and high-repeatability evaluation of the puncture resistance of rubber materials under real complex working conditions.

[0025] The temperature control module of the constant temperature test chamber 10 adopts a PID control algorithm, with a temperature control accuracy of ±1℃. The air circulation system inside the chamber is driven by a fan, and the air duct design optimized by computational fluid dynamics ensures that the temperature distribution uniformity deviation does not exceed 2℃. The rubber sample pre-balancing platform is made of thermally conductive aluminum alloy, and its surface has an array of positioning grooves, which can simultaneously accommodate no fewer than 5 standard-sized rubber samples for pretreatment. During the pretreatment process, the platform uses heat conduction to bring the rubber samples to the preset temperature within 30 minutes, and an embedded temperature sensor monitors the surface temperature gradient of the rubber samples in real time.

[0026] Optionally, the puncture probe kit includes three standardized puncture probe types: a multi-faceted pyramid probe 30, a thin-blade probe 40, and an oblique needle probe 50, all of which are connected to the puncture module 23 of the material testing machine 20 via a unified quick-change clamp.

[0027] Optionally, combined Figure 4 As shown, the multi-faceted frustum probe 30 includes a first base 31, a first body 32, and a first probe 33. The first base 31 is square or circular in shape, the first body 32 is an irregular multi-faceted frustum geometry (e.g., a pentagonal frustum) with multiple edges of unequal length and inclined surfaces with tilt angles within a preset acute angle range, and the top of the first probe 33 is an irregular plane or a short edge. Optionally, the preset acute angle range is from 15° to 35°. The multi-faceted frustum probe 30 is used to accurately simulate the microscopic morphology of ore fracture surfaces.

[0028] Optionally, combined Figure 5 As shown, the thin-blade probe 40 includes a second base 41, a second body 42, and a second probe 43. The second base 41 is square or circular in shape. The second body 42 is a long strip structure made of high-speed steel with a rectangular cross-section. The cutting edge of the second probe 43 is precision ground to form a sharp-angled wedge-shaped cutting edge. The thin-blade probe 40 is used to simulate the geometric characteristics of the sharp edge of a metal plate.

[0029] Optionally, combined Figure 6 As shown, the beveled needle probe 50 includes a third base 51 and a third body 52. ​​The third base 51 is square or circular in shape. The third body 52 is made of TC4 titanium alloy cylindrical needle, and the tip 53 of the needle is obliquely cut by a CNC grinder to form an acute-angled conical bevel cutting surface with a cutting radius of less than 0.01 mm. The beveled needle probe 50 is used to simulate the sharp characteristics of metal drill chips.

[0030] Optionally, see again Figures 1 to 3The material testing machine 20 includes a drive motor 21, a transmission mechanism 22, a puncture module 23, and a test bench 24. A first platform 11 is provided on the outer wall of the constant temperature test chamber 10, and the drive motor 21 is mounted on the first platform 11. The puncture module 23 is connected to the drive motor 21 via the transmission mechanism 22. Specifically, the transmission mechanism 22 adopts a belt drive. A small pulley 221 is coaxially connected to the power output shaft of the drive motor 21, and a large pulley 222 is located below the small pulley 221. A belt 223 is fitted onto the small pulley 221 and the large pulley 222. A vertically placed wheel disc 224 is connected to one end face of the large pulley 222, and the surface of the wheel disc 224 is provided with guide posts 225 protruding along its own axial direction. A guide member 226 is connected to the top of the puncture module 23, and the guide member 226 has a guide groove 227, the length direction of which is arranged along the radial direction of the wheel disc 224. Guide post 225 is disposed within guide groove 227. Puncture module 23 is a cylindrical structure with its central axis arranged vertically. The bottom of puncture module 23 penetrates the wall of constant temperature test chamber 10 and extends into the interior of constant temperature test chamber 10. The puncture probe is mounted on the bottom of puncture module 23 by a clamp, thus the entire puncture probe is located within constant temperature test chamber 10. Test platform 24 is disposed within constant temperature test chamber 10 and located below the puncture probe.

[0031] Combination Figure 1 and Figure 7 As shown, the test bench 24 includes a base 241 and a top cover 242. The base 241 is cylindrical, with multiple circumferential locking holes 243 at its bottom and an open top. The top cover 242 is cylindrical with the same diameter as the base 241. The bottom of the top cover 242 is open, and an annular cover plate 244 is provided at its top. The central hole 245 of the annular cover plate 244 serves as an opening for the puncture probe to pass through. Multiple locking posts 246 are arranged circumferentially inside the top cover 242. The length of the locking posts 246 is vertical, and the top of the locking posts 246 is connected to the bottom of the annular cover plate 244, meaning the locking posts 246 are located inside the top cover 242. The rubber sample 60 has multiple perforations 61, and the number of perforations 61, locking holes 243, and locking posts 246 are equal and correspond one-to-one in position. The locking post 246 passes through the perforation 61 on the rubber sample 60 and is fastened in the corresponding locking hole 243, thereby fixing the rubber sample 60 in the test bench 24.

[0032] During the test, the drive motor 21 starts, driving the wheel 224 to rotate via the small pulley 221, belt 223, and large pulley 222. The guide post 225 rotates along with the wheel 224. Constrained by the guide groove 227, the rotational motion of the guide post 225 is converted into the linear motion of the puncture module 23, which in turn moves the puncture probe downwards. The puncture probe pierces the rubber sample 60 through the central hole 245 of the upper cover 242. The drive motor 21 reverses direction, and the puncture probe moves away from the rubber sample 60. Thus, the forward and reverse rotation of the drive motor 21 drives the puncture probe to move up and down.

[0033] A temperature sensor 70 is installed inside the constant temperature test chamber 10 to detect the test environment temperature.

[0034] A six-component force sensor 80 is provided on the top of the guide 226 for detecting the puncture force.

[0035] Both the temperature sensor 70 and the six-component force sensor 80 are connected to the data acquisition and control unit to obtain the test temperature and puncture force in real time.

[0036] Optionally, see again Figure 1 and Figure 2 The outer wall of the constant temperature test chamber 10 is provided with a second platform 12, and the heating module 14 is installed on the second platform 12. Air vents 13 are provided on the wall of the constant temperature test chamber 10, and the air vents 13 correspond to the heating module 14. After the heating module 14 is powered on, the heating wire 141 heats up, and the heat is sent into the constant temperature test chamber 10 through the air vents 13 via its own fan 142.

[0037] Based on the aforementioned road surface simulation-based rubber material puncture resistance testing device, combined with Figure 8 As shown in the embodiments of this disclosure, a method for evaluating the puncture resistance of rubber materials based on road surface simulation is also provided, including: S1, Sample preparation: Prepare a rubber sample according to the test requirements and place the rubber sample in a standard laboratory environment for a first preset time.

[0038] S2, Puncture Test: Select the probe to be tested to perform a puncture test on the rubber sample, and collect force, displacement and temperature data during the test to generate force-displacement curves and related temperature curves.

[0039] S3, Parameter Extraction: Analyze the force-displacement curve and calculate the puncture parameters of this test, including the energy consumed during puncture.

[0040] S4, First-level correction: Calculate the motion state correction coefficient of the rubber sample and use the motion state correction coefficient to perform first-level correction on the puncture energy consumption.

[0041] S5, Secondary Correction: Calculate the puncture velocity correction coefficient of the probe under test, and use the puncture velocity correction coefficient to perform secondary correction on the puncture energy consumption to obtain the puncture penetration energy.

[0042] S6, Repeat the test: Replace the probe or rubber sample and repeat S2 to S5 to obtain performance data under different temperatures and different puncture patterns.

[0043] First, natural rubber and butadiene rubber compound were prepared and mixed according to the test requirements. The compound was then vulcanized and molded under preset process conditions using a flat vulcanizing machine. The compound was then cut into rubber samples of a certain thickness according to standard dimensions. The samples were placed in a standard laboratory environment with a temperature of 23±2 ℃ and a humidity of 50±5% for 24 hours to allow the internal stress of the rubber samples to fully relax.

[0044] Select the appropriate probe according to the test plan and install it into the quick-change fixture of the material testing machine. Tighten the fixture using a torque wrench. Fix the rubber sample in the test bench of the material testing machine to prevent the rubber sample from sliding during the test. Then close the door of the constant temperature test chamber to allow the ambient temperature inside the chamber to quickly stabilize at the preset value and maintain it at this temperature for a first preset time to ensure that the rubber sample and the environment are fully thermally balanced. Optionally, the first preset time is greater than or equal to 2 hours.

[0045] Set appropriate piercing speed and piercing stroke or triggering conditions in the material testing machine control software, and then start the test. The probe under test is inserted vertically into the fixed rubber sample at a constant speed until it completely penetrates the rubber sample or reaches the predetermined depth. Throughout the process, the material testing machine will automatically move downward at the set speed, while the six-component force sensor records the force exerted by the probe on the rubber sample in real time.

[0046] The testing device synchronously collects force, displacement, and temperature data in real time during the test at a fixed sampling frequency. All data is synchronized via timestamps, generating force-displacement curves and related temperature curves in real time, which are dynamically displayed on a graphical interface. After the test, the system automatically analyzes the force-displacement curves and extracts indicators such as the maximum puncture force, puncture displacement, and puncture energy consumption. The original energy characterization obtained by integrating the force-displacement curve is used to reflect the energy absorption behavior of the rubber material under applied load during the puncture process.

[0047] The motion state correction coefficient of the rubber sample is calculated, and the puncture energy is corrected using this coefficient at the first stage to obtain the puncture energy after the first stage correction. The puncture velocity correction coefficient of the probe under test is then calculated, and the puncture energy is corrected using this coefficient at the second stage, further correcting the puncture energy after the first stage correction to obtain the puncture penetration energy. The puncture penetration energy is an equivalent energy parameter obtained by introducing correction factors such as motion state and puncture rate based on the puncture energy, and is used to characterize the puncture resistance of rubber materials under actual working conditions.

[0048] Replace the probe or rubber sample to be tested, repeat the puncture test and data correction, and obtain performance data under different temperatures and different puncture patterns.

[0049] The puncture resistance evaluation method for rubber materials based on road surface simulation provided in this disclosure collects force, displacement, and temperature data during the puncture test, generating force-displacement curves and related temperature curves to obtain the puncture parameters of the rubber sample. The puncture energy is then corrected twice based on the motion state correction coefficient and puncture speed correction coefficient of the rubber sample to obtain the puncture penetration energy. This design considers actual working conditions and rate dependence, simulating the actual working conditions of the tire as closely as possible, thereby effectively improving the predictive ability of laboratory test results for real-world performance.

[0050] Furthermore, by integrating multiple types of biomimetic puncture probes and wide-temperature-range environmental simulation capabilities, it is possible to conduct high-fidelity assessments of the puncture resistance of rubber materials under real and complex working conditions. Quick-change probe fixtures and standardized testing procedures ensure the efficiency and repeatability of the testing process, making it particularly suitable for the research and development and quality control of rubber products such as engineering machinery tires and puncture-resistant pads.

[0051] Optionally, the energy consumption of punctures is calculated using the trapezoidal numerical integration method, and the calculation formula is as follows: ; in, To pierce and consume energy, For instantaneous piercing force, For puncture displacement; The rubber sample is punctured or completely cut, therefore it can be... The integral is approximately: ; in, This is the contact point between the probe to be tested and the rubber sample. This marks the end point of the test between the probe and the rubber sample.

[0052] In this way, the puncture process can be quantitatively analyzed through automatic data acquisition and energy integration algorithms, thereby improving the accuracy and repeatability of test results. Optionally, for needle-type or pyramidal probes, the penetration energy per unit thickness is defined and calculated using the following formula: ; in, Penetration energy per unit thickness The thickness of the rubber sample. As a normalized index, it is used to evaluate the puncture resistance of rubber materials per unit thickness.

[0053] Optionally, S4, calculate the motion state correction factor of the rubber specimen, and use the motion state correction factor to perform a first-order correction on the puncture energy dissipation, including: S41, obtain the penetration energy of the reference tire under real puncture conditions and the penetration energy measured under standard puncture conditions in the laboratory.

[0054] S42, calculate the first ratio of the penetration energy under the actual puncture condition to the penetration energy measured under the standard puncture condition in the laboratory, and use the first ratio as the motion state correction coefficient.

[0055] S43, the product of the motion state correction coefficient and the puncture energy consumption is used as the first-level corrected puncture energy consumption.

[0056] The specific calculation formula is as follows: ; ; in, This is a correction factor for motion state. To reference the penetration energy under actual tire puncture conditions, For reference, the penetration energy of the tire was measured under standard puncture conditions in the laboratory. This is the energy consumption for puncture after primary correction.

[0057] Optionally, S5, calculate the puncture velocity correction coefficient of the probe under test, and use the puncture velocity correction coefficient to perform secondary correction on the puncture energy consumption, including: S51, calculate the second ratio of the equivalent puncture rate corresponding to the actual test speed to the laboratory reference rate; S52, Calculate the puncture rate correction factor based on the second ratio and the strain rate sensitivity index of the rubber sample; S53, the product of the puncture speed correction coefficient and the puncture energy consumption after the first correction is used as the puncture energy consumption after the second correction.

[0058] The specific calculation formula is as follows: ; ; in, This is a correction factor for the piercing speed. To test the equivalent puncture rate corresponding to the actual usage speed, For laboratory reference rate, This is the strain rate sensitivity index for the rubber sample. This is the energy consumption for puncture after secondary correction.

[0059] Combination Figure 9 As shown in the embodiments of this disclosure, another method for evaluating the puncture resistance of rubber materials based on road surface simulation is provided, including: S1, Sample preparation: Prepare a rubber sample according to the test requirements and place the rubber sample in a standard laboratory environment for a first preset time.

[0060] S2, Puncture Test: Select the probe to be tested to perform a puncture test on the rubber sample, and collect force, displacement and temperature data during the test to generate force-displacement curves and related temperature curves.

[0061] S3, Parameter Extraction: Analyze the force-displacement curve and calculate the puncture parameters of this test, including the energy consumed during puncture.

[0062] S4, First-level correction: Calculate the motion state correction coefficient of the rubber sample and use the motion state correction coefficient to perform first-level correction on the puncture energy consumption.

[0063] S5, Secondary Correction: Calculate the puncture velocity correction coefficient of the probe under test, and use the puncture velocity correction coefficient to perform secondary correction on the puncture energy consumption to obtain the puncture penetration energy.

[0064] S7, Level 3 Correction: Calculate the temperature correction coefficient of the rubber sample and use the temperature correction coefficient to perform a level 3 correction on the puncture energy consumption to obtain the new puncture penetration energy.

[0065] S8, Repeat the test: Replace the probe or rubber sample and repeat S2 to S7 to obtain performance data under different temperatures and different puncture patterns.

[0066] After performing a secondary correction for puncture energy consumption and before repeating the test, a temperature correction factor for the rubber sample is calculated, and a tertiary correction for puncture energy consumption is performed using this temperature correction factor. Optionally, if simulating tire puncture at room temperature, temperature correction is not required.

[0067] Optionally, S7, calculate the temperature correction factor for the rubber sample and use the temperature correction factor to perform a three-level correction for puncture energy consumption, including: S71, calculate the temperature difference between the test temperature and the reference temperature; S72, Calculate the temperature correction factor based on the temperature difference and the material thermal sensitivity coefficient of the rubber sample; S73, the product of the temperature correction factor and the second-level correction puncture energy consumption is used as the third-level correction puncture energy consumption.

[0068] The specific calculation formula is as follows: ; ; in, This is the temperature correction factor. The material thermal sensitivity coefficient of the rubber sample. For the test temperature, For reference temperature, This is the energy consumption for puncture after three levels of correction.

[0069] Combination Figure 10 As shown in the embodiments of this disclosure, another method for evaluating the puncture resistance of rubber materials based on road surface simulation is provided, including: S1, Sample preparation: Prepare a rubber sample according to the test requirements and place the rubber sample in a standard laboratory environment for a first preset time.

[0070] S2, Puncture Test: Select the probe to be tested to perform a puncture test on the rubber sample, and collect force, displacement and temperature data during the test to generate force-displacement curves and related temperature curves.

[0071] S3, Parameter Extraction: Analyze the force-displacement curve and calculate the puncture parameters of this test, including the energy consumed during puncture.

[0072] S4, First-level correction: Calculate the motion state correction coefficient of the rubber sample and use the motion state correction coefficient to perform first-level correction on the puncture energy consumption.

[0073] S5, Secondary Correction: Calculate the puncture velocity correction coefficient of the probe under test, and use the puncture velocity correction coefficient to perform secondary correction on the puncture energy consumption to obtain the puncture penetration energy.

[0074] S7, Level 3 Correction: Calculate the temperature correction coefficient of the rubber sample and use the temperature correction coefficient to perform a level 3 correction on the puncture energy consumption to obtain the new puncture penetration energy.

[0075] S9, Level 4 Correction: Calculate the geometric correction coefficient of the probe under test, and use the geometric correction coefficient to perform a level 4 correction on the puncture energy consumption to obtain the final puncture penetration energy.

[0076] S10, Repeat the test: Replace the probe or rubber sample and repeat S2 to S9 to obtain performance data under different temperatures and different puncture patterns.

[0077] After performing a three-level correction on the puncture energy consumption, and before repeating the experiment, the geometric correction coefficient of the probe under test is calculated, and a four-level correction on the puncture energy consumption is performed using the geometric correction coefficient. It should be noted that if temperature correction is not required, S9 is executed after performing a two-level correction on the puncture energy consumption. At this point, the final puncture penetration energy is the equivalent energy parameter obtained by incorporating correction factors such as motion state, puncture rate, temperature, and probe geometry based on the puncture energy consumption.

[0078] Optionally, S9, calculate the geometric correction coefficient of the probe under test, and use the geometric correction coefficient to perform a four-level correction on the puncture energy consumption, including: S91, calculate the fourth ratio of the effective projected area of ​​the reference probe in the insertion direction to the instantaneous maximum effective projected area of ​​the probe under test in the perpendicular insertion direction, and use the fourth ratio as the geometric correction coefficient. S92, the product of the geometric correction coefficient and the puncture energy consumption after the third-level correction is used as the puncture energy consumption after the fourth-level correction.

[0079] The specific calculation formula is as follows: ; ; in, This is the geometric correction factor. The effective projected area of ​​the reference probe in the insertion direction is (generally, a standard multi-faceted frustum probe is selected, whose projected area is 1.0 mm²). It is the instantaneous maximum effective projected area of ​​the probe under test in the vertical insertion direction (for needle probes, it is generally the cross-sectional area of ​​the needle tip; for thin blade probes, it is generally the equivalent area of ​​the product of the blade width and the penetration depth; for multi-faceted probes, it is generally the projected area of ​​the bottom surface). The energy consumption for puncture after level four correction.

[0080] Thus, a four-level calibration logic is introduced, following a "macro to micro" logic, correcting in the order of "motion state - velocity effect - temperature effect - effective projected area". First, motion state correction correlates laboratory conditions with real-world operating conditions. Then, velocity and temperature effect corrections address the material's rate and temperature dependence. Finally, effective projected area correction standardizes geometric factors, simulating the actual puncture condition of a tire as accurately as possible. This sequence avoids cross-interference between correction factors, ensuring the independence and effectiveness of each correction level. The four-level calibration logic sequentially considers real-world operating condition mapping, rate dependence, temperature dependence, and probe geometric differences, effectively improving the predictive ability of laboratory test results for real-world performance.

[0081] Optionally, for thin-blade probes, the energy per unit cutting length is defined and calculated using the following formula: ; in, Energy per unit cutting length For cutting energy, For effective cutting length.

[0082] Optionally, to standardize quantification, a dimensionless puncture resistance index (RSI) is defined, and its calculation formula is as follows: ; in, For piercing energy, The thickness of the rubber sample. The force of penetration.

[0083] It should be noted that if two-stage correction is applied to the energy consumption of punctures, then here... for If a three-level correction is applied to the energy consumption of punctures, then here... for Similarly, if a four-level correction is applied to the energy consumption of punctures, then here... for In this way, the normalized index, combined with multi-level correction logic, eliminates the influence of probe geometric differences and sample thickness, making the laboratory data more consistent with actual usage.

[0084] The technical solutions of this disclosure can be embodied in the form of a software product. This computer software product is stored in a storage medium and includes one or more instructions to cause a computer device (which may be a personal computer, server, or network device, etc.) to execute all or part of the steps of the method described in this disclosure. The aforementioned storage medium can be a non-transitory storage medium, such as a USB flash drive, external hard drive, read-only memory (ROM), random access memory (RAM), magnetic disk, or optical disk, etc., and other media capable of storing program code.

[0085] The foregoing description and accompanying drawings fully illustrate embodiments of this disclosure to enable those skilled in the art to practice them. Other embodiments may include structural, logical, electrical, procedural, and other changes. The embodiments represent only possible variations. Individual components and functions are optional unless explicitly required, and the order of operation may vary. Parts and features of some embodiments may be included or substituted for parts and features of other embodiments. Furthermore, the terminology used herein is for descriptive purposes only and is not intended to limit the claims. Without further limitations, an element defined by the phrase "comprising a…" does not exclude the presence of additional identical elements in the process, method, or apparatus that includes said element. Throughout this document, each embodiment may emphasize differences from other embodiments, and similar or identical parts between embodiments may be referred to mutually. For methods, products, etc., disclosed in the embodiments, if they correspond to the method section disclosed in the embodiments, the relevant details may be referred to the description of the method section.

[0086] Those skilled in the art will recognize that the units and algorithm steps of the various examples described in conjunction with the embodiments disclosed herein can be implemented in electronic hardware, or a combination of computer software and electronic hardware. Whether these functions are implemented in hardware or software depends on the specific application and design constraints of the technical solution. Those skilled in the art can use different methods to implement the described functions for each specific application, but such implementation should not be considered beyond the scope of the embodiments of this disclosure. Those skilled in the art will clearly understand that, for the sake of convenience and brevity, the specific working processes of the systems, devices, and units described above can be referred to the corresponding processes in the foregoing method embodiments, and will not be repeated here.

[0087] The methods and products disclosed in the embodiments herein (including but not limited to devices and equipment) can be implemented in other ways. For example, the device embodiments described above are merely illustrative. For instance, the division of units may be merely a logical functional division, and in actual implementation, there may be other division methods. For example, multiple units or components may be combined or integrated into another system, or some features may be ignored or not executed. In addition, the mutual coupling or direct coupling or communication connection shown or discussed may be through some interfaces, and the indirect coupling or communication connection of devices or units may be electrical, mechanical, or other forms. The units described as separate components may or may not be physically separate. The components shown as units may or may not be physical units, that is, they may be located in one place or distributed across multiple network units. Some or all of the units can be selected to implement this embodiment according to actual needs. In addition, the functional units in the embodiments of this disclosure may be integrated into one processing unit, or each unit may exist physically separately, or two or more units may be integrated into one unit.

[0088] The flowcharts and block diagrams in the accompanying drawings illustrate the architecture, functionality, and operation of possible implementations of systems, methods, and computer program products according to embodiments of this disclosure. In this regard, each block in a flowchart or block diagram may represent a module, segment, or portion of code containing one or more executable instructions for implementing a specified logical function. In some alternative implementations, the functions marked in the blocks may occur in a different order than that shown in the drawings. For example, two consecutive blocks may actually be executed substantially in parallel, and they may sometimes be executed in reverse order, depending on the functions involved. In the descriptions corresponding to the flowcharts and block diagrams in the accompanying drawings, the operations or steps corresponding to different blocks may also occur in a different order than disclosed in the description, and sometimes there is no specific order between different operations or steps. For example, two consecutive operations or steps may actually be executed substantially in parallel, and they may sometimes be executed in reverse order, depending on the functions involved. Each block in a block diagram and / or flowchart, and combinations of blocks in a block diagram and / or flowchart, can be implemented using a dedicated hardware-based system that performs the specified function or action, or using a combination of dedicated hardware and computer instructions.

Claims

1. A method for evaluating the puncture resistance of a rubber material based on a road surface simulation, characterized by, include: S1, Sample preparation: Prepare a rubber sample according to the test requirements, and place the rubber sample in a standard laboratory environment for a first preset time; S2, Puncture Test: Select the probe to be tested to perform a puncture test on the rubber sample, and collect force, displacement and temperature data during the test to generate force-displacement curves and related temperature curves; S3, Parameter Extraction: Analyze the force-displacement curve and calculate the puncture parameters of this test, including the energy consumed during puncture; S4, First-level correction: Calculate the motion state correction coefficient of the rubber sample, and use the motion state correction coefficient to perform first-level correction on the puncture energy consumption; wherein, calculating the motion state correction coefficient of the rubber sample and using the motion state correction coefficient to perform first-level correction on the puncture energy consumption includes: obtaining the penetration energy of a reference tire under actual puncture conditions and the penetration energy measured under laboratory standard puncture conditions; calculating a first ratio of the penetration energy under actual puncture conditions to the penetration energy measured under laboratory standard puncture conditions, and using the first ratio as the motion state correction coefficient; and using the product of the motion state correction coefficient and the puncture energy consumption as the puncture energy consumption after first-level correction. S5, Secondary Correction: Calculate the puncture speed correction coefficient of the probe under test, and use the puncture speed correction coefficient to perform secondary correction on the puncture energy consumption to obtain the puncture penetration energy; wherein, calculating the puncture speed correction coefficient of the probe under test and using the puncture speed correction coefficient to perform secondary correction on the puncture energy consumption includes: calculating a second ratio between the equivalent puncture rate corresponding to the actual test speed and the laboratory reference rate; calculating the puncture speed correction coefficient based on the second ratio and the strain rate sensitivity index of the rubber sample; and using the product of the puncture speed correction coefficient and the puncture energy consumption after primary correction as the puncture energy consumption after secondary correction; the formula for calculating the puncture speed correction coefficient is: ， in, This is a correction factor for the piercing speed. To test the equivalent puncture rate corresponding to the actual usage speed, For laboratory reference rate, This is the strain rate sensitivity index of the rubber sample. S6, Repeat the test: Replace the probe to be tested or the rubber sample, repeat the above steps, and obtain performance data under different temperatures and different puncture patterns.

2. The method for evaluating the puncture resistance of rubber materials based on road surface simulation according to claim 1, characterized in that, The calculation of the energy consumed by the puncture includes: The energy consumption of the puncture was calculated using the trapezoidal numerical integration method. ， in, The energy consumed by the piercing is... For instantaneous piercing force, For puncture displacement; Will The integral is approximately: ， in, This is the contact point between the probe under test and the rubber sample. This is the end point of the test between the probe under test and the rubber sample.

3. The method for evaluating the puncture resistance of rubber materials based on road surface simulation according to claim 1, characterized in that, Between S5 and S6, it also includes: S7, Third-level correction: Calculate the temperature correction factor of the rubber sample, and use the temperature correction factor to perform a third-level correction on the puncture energy consumption: Calculate the temperature difference between the test temperature and the reference temperature; The temperature correction factor is calculated based on the temperature difference and the material thermal sensitivity coefficient of the rubber sample. The product of the temperature correction coefficient and the second-level correction puncture energy consumption is used as the third-level correction puncture energy consumption, thus obtaining the new puncture penetration energy.

4. The method for evaluating the puncture resistance of rubber materials based on road surface simulation according to claim 3, characterized in that, Between S6 and S7, it also includes: S8, Level 4 calibration: Calculate the geometric correction coefficient of the probe under test, and use the geometric correction coefficient to perform a level 4 calibration on the puncture energy consumption: Calculate the fourth ratio of the effective projected area of ​​the reference probe in the insertion direction to the instantaneous maximum effective projected area of ​​the probe under test in the perpendicular insertion direction, and use the fourth ratio as the geometric correction coefficient; The product of the geometric correction coefficient and the third-level correction puncture energy consumption is used as the fourth-level correction puncture energy consumption, thus obtaining the final puncture penetration energy.

5. The method for evaluating the puncture resistance of rubber materials based on road surface simulation according to any one of claims 1 to 4, characterized in that, The calculation of the puncture parameters includes: The puncture force of the probe under test and the thickness of the rubber sample are obtained. Calculate the product of the piercing force and the thickness; The ratio of the corrected puncture penetration energy to the product is used as the puncture resistance index.

6. A device for testing the puncture resistance of rubber materials based on road surface simulation, characterized in that, The method for evaluating the puncture resistance of rubber materials based on road surface simulation, as described in any one of claims 1 to 5, wherein the puncture resistance testing device for rubber materials based on road surface simulation comprises: The constant temperature test chamber has a built-in programmable temperature control module to simulate the working environment of rubber under different climatic conditions. A material testing machine, installed in the constant temperature test chamber, is used to meet the puncture test requirements under different speed conditions; The puncture probe kit includes standardized puncture probes with various biomimetic geometric shapes. The puncture probes are installed on the material testing machine and driven by the material testing machine to puncture rubber samples located in the constant temperature test chamber. The data acquisition and control unit is communicatively connected to the programmable temperature control module and the material testing machine. It is used to control the temperature of the constant temperature test chamber and the operating parameters of the material testing machine, and to collect force, displacement and time data in real time during the test.

7. The puncture resistance testing device for road surface simulation rubber materials according to claim 6, characterized in that, The puncture probe kit includes: A multi-faceted pyramidal probe, used to simulate the morphology of ore fracture surfaces, including: The first base is square or round; The first main body is in the shape of an irregular multi-faceted frustum, with multiple edges and hypotenuses of unequal length; The first probe has an irregular flat surface or short edge at its top; Thin-blade probe, simulating the sharp edge shape of a metal plate, including: The second base is square or round; The second main body is a long, thin strip with a rectangular cross-section; The second probe has a wedge-shaped cutting edge with an acute angle at the front end; A beveled needle-shaped probe, simulating the morphology of metal drill chips, including: The third base is square or round; The third main body is a metal cylindrical needle-like structure with an acute-angled conical beveled cutting edge at the tip.

8. The puncture resistance testing device for road surface simulation rubber materials according to claim 6 or 7, characterized in that, include: The material testing machine includes: A drive motor is installed on the outer wall of the constant temperature test chamber; The puncture module is connected to the drive motor via a transmission pulley, and part of it is located inside the constant temperature test chamber. The puncture probe is located inside the constant temperature test chamber and installed at the bottom of the puncture module. The test bench includes: The base has a locking hole at the bottom, and the rubber sample is placed on the base and has a through hole corresponding to the locking hole; The top cover has an opening at the top for the puncture probe to pass through, and a locking post is provided inside, which passes through the perforation and is fastened into the locking hole.

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