Rapid defect evaluation method and system based on ultrasonic water jet penetration method
By attaching artificial defects to the surface of the part to be tested, and using ultrasonic water jet penetration method to scan and adjust the attenuation threshold, the problem of inaccurate signal attenuation analysis in the existing technology is solved, and the rapid and accurate assessment of part defects is achieved, thus improving the detection efficiency.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- SICHUAN XIN WAN XING CARBON FIBER COMPOSITES
- Filing Date
- 2026-02-25
- Publication Date
- 2026-05-29
AI Technical Summary
In existing ultrasonic water jet penetration method for defect detection, manual comparison blocks are difficult to fully meet the requirements of parts with various shapes, curvatures, and thicknesses, resulting in inaccurate signal attenuation analysis and affecting the accuracy of defect assessment.
By attaching artificial defects to the surface of the part to be tested, and scanning with ultrasonic water jet penetration method, the initial attenuation threshold is adjusted to match the measured area of the artificial defect with the actual area, and the target attenuation threshold is obtained to achieve rapid evaluation.
It overcomes the limitations of manual comparison test blocks, improves the accuracy and efficiency of defect assessment, is not affected by factors such as surface roughness, curvature and thickness of parts, and is easy to manufacture and use.
Smart Images
Figure CN121721150B_ABST
Abstract
Description
Technical Field
[0001] This application relates to the field of ultrasonic defect detection technology, specifically a rapid defect assessment method and system based on ultrasonic water jet penetration method. Background Technology
[0002] Automated ultrasonic water jet penetration testing involves using two ultrasonic probes mounted on either side of a robotic arm, with the probes aligned to their center lines. Following a pre-defined scanning path, the probes automatically scan both the part and a standard comparison block. A computer analyzes the attenuation of the received signals to obtain a visual map of abnormal signal distribution. This map is then compared to the signals from artificial defects in the standard comparison block to analyze the internal quality of the part.
[0003] In existing technologies, computers analyze the signal attenuation at the receiving end to obtain a scanned image, which is then compared with artificial defects in a standard comparison block to determine the internal quality of the part. Many factors affect signal attenuation, such as the surface cleanliness, roughness, thickness, and curvature of the part. In reality, the parts to be inspected are combinations of various shapes, curvatures, and thicknesses. It is difficult for artificial comparison blocks to completely satisfy the requirement that every structure with a specific thickness and curvature has corresponding defects. Summary of the Invention
[0004] In view of this, the purpose of this application is to provide a rapid defect assessment method and system based on ultrasonic water jet penetration method to solve the problems in the background art.
[0005] To achieve the above objectives, this application adopts the following technical solution:
[0006] The defect rapid assessment method based on ultrasonic water jet penetration method of this application includes the following steps:
[0007] Acquire a C-scan imaging image of a part under test with artificial defects, wherein the part under test is pre-divided into multiple regions, and each region has an artificial defect of a preset area.
[0008] The measured area of the artificial defect is extracted from the C-scan imaging image based on an initial attenuation threshold;
[0009] The measured area of the artificial defect is compared with the actual area of the artificial defect to obtain the comparison result;
[0010] When the measured area of the artificial defect is inconsistent with the actual area of the artificial defect, the initial attenuation threshold is adjusted based on the comparison result, and the measured area of the artificial defect and the comparison result are updated until the measured area of the artificial defect is consistent with the actual area of the artificial defect; when the measured area of the artificial defect is consistent with the actual area of the artificial defect, the target attenuation threshold and the target imaging image corresponding to the target attenuation threshold are obtained.
[0011] Defects in the part under test are quickly assessed based on the target imaging image and the target attenuation threshold.
[0012] In one embodiment of this application, the measured area of the artificial defect is compared with the actual area of the artificial defect to obtain a comparison result, including:
[0013] Calculate the deviation rate between the measured area of the artificial defect and the actual area of the artificial defect;
[0014] When the absolute value of the deviation rate is less than or equal to a preset deviation rate threshold, it is determined that the measured area of the artificial defect is consistent with the actual area of the artificial defect; when the absolute value of the deviation rate is greater than the preset deviation rate threshold, it is determined that the measured area of the artificial defect is inconsistent with the actual area of the artificial defect.
[0015] In one embodiment of this application, adjusting the initial attenuation threshold based on the comparison result includes:
[0016] When the deviation rate is greater than a preset deviation rate threshold and the measured area is smaller than the actual area, the initial attenuation threshold is lowered by a preset value.
[0017] When the deviation rate is greater than a preset deviation rate threshold and the measured area is greater than the actual area, the initial attenuation threshold is increased by a preset value.
[0018] In one embodiment of this application, a rapid defect assessment of the part under test is performed based on the target imaging image and the target attenuation threshold, including:
[0019] Obtain the attenuation value corresponding to each pixel in the target imaging image;
[0020] Pixels whose attenuation value is greater than or equal to the target attenuation threshold are considered defective pixels;
[0021] Defect areas can be quickly located based on all defective pixels.
[0022] In one embodiment of this application, extracting the measurement area of the artificial defect from the C-scan imaging image based on an initial attenuation threshold includes:
[0023] Obtain the attenuation value corresponding to each pixel in the C-scan imaging image;
[0024] Pixels with attenuation values greater than or equal to the initial attenuation threshold are considered defective pixels;
[0025] Locate the defective pixels of the artificial defect, and filter the defective pixels of the artificial defect to remove isolated pixels, thus obtaining the artificial defect;
[0026] Extract the outer contour of the artificial defect and calculate the roundness of the outer contour;
[0027] When the roundness of the outer contour is less than a preset roundness threshold, the artificial defect shape is determined to be abnormal. After adjusting the position of the artificial defect, the process returns to acquiring a C-scan imaging image of the part under test with the artificial defect until the roundness of the outer contour is greater than or equal to the preset roundness threshold.
[0028] When the roundness of the outer contour is greater than or equal to a preset roundness threshold, the pixel area of the artificial defect is extracted, and the pixel area is converted into the actual area based on a preset conversion ratio.
[0029] In one embodiment of this application, before acquiring a C-scan imaging image of the part under test with artificial defects, the method further includes:
[0030] The part to be tested is divided into zones, and the actual area of artificial defects is determined based on the zones of the part to be tested;
[0031] The sound-impermeable film material is cut based on the actual area of the artificial defect to obtain a film of the preset area;
[0032] Apply a release agent to both sides of the film of the preset area, and then attach the film with the release agent dried to the corresponding partition.
[0033] In one embodiment of this application, the initial attenuation threshold is calculated as follows:
[0034]
[0035] In the formula, Indicates the initial attenuation threshold. Indicates the attenuation of signal strength. Indicates the strength of the reference signal.
[0036] This application also provides a rapid defect assessment system based on the ultrasonic water jet penetration method, including:
[0037] The acquisition module is used to acquire C-scan imaging images of a part under test with artificial defects, wherein the part under test is pre-divided into multiple regions, and each region has artificial defects of a preset area.
[0038] An initial measurement module is used to extract the measurement area of artificial defects from the C-scan imaging image based on an initial attenuation threshold;
[0039] The comparison module is used to compare the measured area of the artificial defect with the actual area of the artificial defect to obtain a comparison result;
[0040] An iterative correction module is used to adjust the initial attenuation threshold based on the comparison result when the measured area of the artificial defect is inconsistent with the actual area of the artificial defect, update the measured area of the artificial defect and the comparison result, until the measured area of the artificial defect is consistent with the actual area of the artificial defect; when the measured area of the artificial defect is consistent with the actual area of the artificial defect, a target attenuation threshold and the target imaging image corresponding to the target attenuation threshold are obtained.
[0041] The defect assessment module is used to quickly assess the defects of the part under test based on the target imaging image and the target attenuation threshold.
[0042] This application also provides an electronic device, including: a processor and a memory;
[0043] The memory is used to store computer programs, and the processor is used to execute the computer programs stored in the memory to cause the electronic device to perform the methods described above.
[0044] This application also provides a computer-readable storage medium having a computer program stored thereon, which, when executed by a processor, implements the method described above.
[0045] The beneficial effects of this application are as follows: This application presents a rapid defect assessment method and system based on ultrasonic water jet penetration method. It utilizes artificial defects attached to the surface of the part to be tested, and uses these artificial defects to perform ultrasonic water jet penetration scanning. In the scanned image, the artificial defect is located using an initial attenuation threshold. The initial attenuation threshold is adjusted by comparing the measured area of the artificial defect with the actual area until the measured area of the artificial defect matches the actual area, thus obtaining an accurate target attenuation threshold for rapid assessment of the actual defects in the part to be tested. This application can be used to compare abnormal signal displays at any part of the part in penetration testing, unaffected by factors such as surface roughness, curvature, and thickness. It overcomes the limitations of manual comparison blocks, is easy to manufacture and use, and greatly improves work efficiency in practical applications. Attached Figure Description
[0046] The present application will be further described below with reference to the accompanying drawings and embodiments:
[0047] Figure 1This is a flowchart illustrating a rapid defect assessment method based on ultrasonic water jet penetration method in one embodiment of this application.
[0048] Figure 2 This is a schematic diagram of the structure of the part to be tested in one embodiment of this application;
[0049] Figure 3 This is a schematic diagram of an artificial defect in one embodiment of this application;
[0050] Figure 4 This is a structural diagram of a rapid defect assessment system based on ultrasonic water jet penetration method, as shown in one embodiment of this application. Detailed Implementation
[0051] The following specific examples illustrate the implementation of this application. Those skilled in the art can easily understand other advantages and effects of this application from the content disclosed in this specification. This application can also be implemented or applied through other different specific embodiments, and various details in this specification can also be modified or changed based on different viewpoints and applications without departing from the spirit of this application. It should be noted that, unless otherwise specified, the following embodiments and features in the embodiments can be combined with each other.
[0052] It should be noted that the illustrations provided in the following embodiments are only schematic representations of the basic concept of this application. Therefore, the drawings only show the layers related to this application and are not drawn according to the actual number, shape and size of the layers in the actual implementation. In the actual implementation, the form, number and proportion of each layer can be arbitrarily changed, and the layer layout may also be more complex.
[0053] Numerous details are explored in the following description to provide a more thorough explanation of embodiments of this application; however, it will be apparent to those skilled in the art that embodiments of this application may be practiced without these specific details.
[0054] Figure 1 This is a flowchart illustrating a rapid defect assessment method based on ultrasonic water jet penetration method in one embodiment of this application, as shown below. Figure 1 As shown, the rapid defect assessment method based on ultrasonic water jet penetration method in this embodiment includes the following steps:
[0055] S100, Prepare for artificial defects:
[0056] S101, firstly, the parts to be tested are divided into zones based on the acceptance requirements, and then the actual area of artificial defects is determined based on the zones of the parts to be tested.
[0057] First, the parts to be inspected are identified and divided into zones, such as a 10 mm foam core area, a 20 mm foam core area, and a 20 mm foam core with curvature zone. Figure 2 This is a schematic diagram of the structure of the part to be tested in one embodiment of this application, as shown below. Figure 2 As shown, the part to be tested is divided into three areas: “1#”, “2#” and “3#”. The acceptance documents confirm that the acceptance requirements for these three areas are that the maximum allowable defects are 10 mm, 10 mm and 6 mm, respectively.
[0058] S102, based on the actual area of the artificial defect, the sound-impermeable film material is cut to obtain a film of a preset area;
[0059] Prepare soundproof material (commonly polytetrafluoroethylene film), and cut the film into different sizes, such as 3 mm, 5 mm, 6 mm, 8 mm, 10 mm, 13 mm, 15 mm, etc.
[0060] In practical applications, external defects are typically used to simulate delamination and debonding defects, which are most common in composite laminate, honeycomb core, and foam core components. When these two types of defects have a large area (larger than the area of the ultrasonic probe), they can effectively block the propagation of ultrasonic energy. Therefore, theoretically, any material with good sound insulation properties can be used to simulate artificial defects. Polytetrafluoroethylene (PTFE) film is commonly used to simulate artificial defects.
[0061] S103, apply release agent to both sides of the film of the preset area, and attach the film with the release agent dried to the corresponding partition.
[0062] Applying a layer of release agent to both sides of the film can increase the sound insulation effect when applying it externally. After the release agent dries completely, it can be used for later use.
[0063] The acceptance documents confirm that the maximum allowable defects for these three areas are 10 mm, 10 mm, and 6 mm, respectively. Prepare artificial defects #1 (10 mm), #2 (10 mm), and #3 (6 mm) and affix them to the corresponding areas. Use transparent tape slightly larger than the artificial defect size to attach the defects to the parts (e.g.,...). Figure 2 Ensure the adhesive is firmly attached and that no water seeps in, affecting the results. Once prepared, adjust the equipment parameters and begin automatic scanning.
[0064] S200, acquires C-scan imaging images of the part under test with artificial defects;
[0065] In a C-scan imaging image, the pixel value of each pixel represents the ultrasonic signal intensity value. The signal intensity value can be converted into an attenuation value using the following formula.
[0066]
[0067] In the formula, Represents pixels The signal attenuation value (attenuation relative to the reference value). Represents pixels The signal strength value, Indicates the signal reference strength.
[0068] S300, extract the measurement area of the artificial defect from the C-scan imaging image based on the initial attenuation threshold;
[0069] First, this application calculates an initial attenuation threshold using an empirical formula. The empirical formula is:
[0070]
[0071] In the formula, Indicates the initial decay threshold. This indicates the attenuation of the signal strength.
[0072] In practical work, since the internal quality of parts cannot be directly observed, the attenuation of ultrasonic waves is used to judge the internal quality. Generally, when the height of the received waveform decreases to 1 / 4 or less of the reference value, it is considered that there is a significant internal defect (delamination, debonding, etc.). According to the conversion formula above, when the received dB value decreases by ≥12dB, a defect exists. The initial attenuation threshold can be directly set to -12dB.
[0073] In this application, pixels with attenuation values greater than the initial attenuation threshold are marked by threshold comparison. However, in some cases, inherent defects inside the part under test can affect the measurement area of artificial defects. Therefore, the following process is needed to adjust and determine the measurement area of artificial defects to obtain an accurate measurement area:
[0074] S301, obtain the attenuation value corresponding to each pixel in the C-scan imaging image; the calculation of the attenuation value is as described above, and will not be repeated here.
[0075] S302, pixels with attenuation values greater than or equal to the initial attenuation threshold are identified as defective pixels;
[0076] First, flaw detection is performed using an initial attenuation threshold, and pixels with attenuation values greater than or equal to the initial attenuation threshold are identified as defective pixels.
[0077] S303: Locate the defect pixels of the artificial defect, and filter the defect pixels of the artificial defect to remove isolated pixels, thus obtaining the artificial defect.
[0078] Since the location of the artificial defects is known, their relative positions on the part can be visually observed or measured. The location of the corresponding externally attached defect is found on the C# scan, where the abnormal area (distinct in color) can be clearly seen. Therefore, it is necessary to filter out the defect pixels of the artificial defects to shield against interference from internal defects in the part itself. Then, filtering is performed to eliminate interference from isolated pixels.
[0079] S304, Extract the outer contour of the artificial defect and calculate the roundness of the outer contour;
[0080] Since the artificial defect in this application is circular, its shape will change if it is interfered with by internal defects in the part under test. To determine whether it has been interfered with, this application performs shape verification by extracting the roundness of the outer contour of the artificial defect.
[0081] S305, when the roundness of the outer contour is less than the preset roundness threshold, the artificial defect shape is determined to be abnormal, and the position of the artificial defect is adjusted before returning to acquiring the C-scan imaging image of the part under test with the artificial defect, until the roundness of the outer contour is greater than or equal to the preset roundness threshold.
[0082] If the roundness of the outer contour is less than the preset roundness threshold, it means that when applying the artificial defect, it is possible that the artificial defect is applied to a place where there is a defect in the part. At this time, the artificial defect and the natural defect overlap. In this case, the attenuation value of the artificial defect at that position cannot be used to judge the natural defect in the part. The artificial defect needs to be applied to a normal area outside the natural defect area before it can be used for judgment.
[0083] S306, when the roundness of the outer contour is greater than or equal to a preset roundness threshold, extract the pixel area of the artificial defect, and convert the pixel area into the actual area based on a preset conversion ratio.
[0084] When the position is adjusted until the roundness of the outer contour is greater than or equal to the preset roundness threshold, it indicates that the interference of natural defects has been eliminated. At this point, all extracted outer contours are valid contours of artificial defects. The pixel size is constructed by extracting the number of pixels within the valid contours, and the pixel size is converted into the actual size (measured area) based on the conversion ratio.
[0085] S400, compare the measured area of the artificial defect with the actual area of the artificial defect to obtain a comparison result;
[0086] The significance of this step is to deduce the threshold of the damage assessment software based on the actual size of the artificial defect. If the measured area of the artificial defect matches the actual area, the damage assessment threshold is considered accurate. If they do not match, it indicates that the damage assessment threshold is inaccurate and needs adjustment. The specific consistency judgment process includes:
[0087] S401, calculate the deviation rate between the measured area of the artificial defect and the actual area of the artificial defect;
[0088] Specifically,
[0089] S402, when the absolute value of the deviation rate is less than or equal to a preset deviation rate threshold, it is determined that the measured area of the artificial defect is consistent with the actual area of the artificial defect; when the absolute value of the deviation rate is greater than the preset deviation rate threshold, it is determined that the measured area of the artificial defect is inconsistent with the actual area of the artificial defect.
[0090] In this application, if the deviation rate is within ±10%, it indicates that the areas of the two are consistent; otherwise, it indicates that the areas of the two are inconsistent.
[0091] S500, Verification and adjustment of the flaw detection threshold: When the measured area of the artificial defect is inconsistent with the actual area of the artificial defect, the initial attenuation threshold is adjusted based on the comparison result, and the measured area of the artificial defect and the comparison result are updated until the measured area of the artificial defect is consistent with the actual area of the artificial defect; when the measured area of the artificial defect is consistent with the actual area of the artificial defect, the target attenuation threshold and the target imaging image corresponding to the target attenuation threshold are obtained.
[0092] Figure 3 This is a schematic diagram of an artificial defect in one embodiment of this application, such as... Figure 3 As shown, defect #1 is a circular defect with a diameter of 10mm. The white and blue area in the image is also a circular defect. Based on the defect size identification threshold of -12dB, if the absolute value of the deviation rate between the identified defect area and the actual area of the externally attached defect is greater than 10%, it indicates that the defect area extracted by the current defect assessment threshold deviates significantly from the actual area and needs adjustment. The adjustment process includes:
[0093] S501, when the deviation rate is greater than a preset deviation rate threshold and the measured area is smaller than the actual area, the initial attenuation threshold is lowered by a preset value (e.g., 0.1dB).
[0094] S502, when the deviation rate is greater than a preset deviation rate threshold and the measured area is greater than the actual area, the initial attenuation threshold is increased by a preset value (e.g., 0.1dB).
[0095] After adjusting the threshold, the defect area is re-extracted, and this process is repeated until the absolute value of the deviation rate between the identified defect area and the actual area of the externally attached defect is no greater than 10%. This indicates that the defect area extracted by the current defect assessment threshold has a small deviation from the actual area. It is then assumed that the abnormal area in the C-scan image at this point is formed by the externally attached defect and is not affected by internal defects in the part itself. Furthermore, the artificial defect area extracted using this threshold matches the actual area of the artificial defect. This new threshold is then used to compare and evaluate abnormal display areas within the part.
[0096] S600, based on the target imaging image and the target attenuation threshold, a rapid defect assessment is performed on the part under test. Specifically, the rapid assessment process includes:
[0097] S601, Obtain the attenuation value corresponding to each pixel in the target imaging image;
[0098] The calculation of the attenuation value for each pixel is as described above and will not be repeated here.
[0099] S602, pixels whose attenuation value is greater than or equal to the target attenuation threshold are identified as defective pixels;
[0100] S603 can quickly locate defective areas based on all defective pixels.
[0101] The process of constructing a defect region based on defective pixels includes filtering, outer contour extraction, area extraction, and location extraction. The extraction process can be referred to the previous section. Finally, the precise location and size of the defect region can be extracted using an accurate flaw detection threshold.
[0102] Figure 4 This is a schematic diagram of the rapid defect assessment results in one embodiment of this application, as shown below. Figure 4 As shown, the abnormal area is finally selected by using the target attenuation threshold A, and the defect size and location are automatically identified when the value is below the threshold.
[0103] This application discloses a rapid defect assessment method based on ultrasonic water jet penetration testing. The method utilizes artificial defects attached to the surface of the part under test, employing these artificial defects to perform ultrasonic water jet penetration scanning. In the scanned image, the artificial defect is located using an initial attenuation threshold. The initial attenuation threshold is adjusted by comparing the measured area of the artificial defect with the actual area until they match, thus obtaining an accurate target attenuation threshold for rapid assessment of actual defects in the part under test. This method can be used to compare abnormal signals at any location on a part during penetration testing, unaffected by factors such as surface roughness, curvature, or thickness. It overcomes the limitations of manual comparison blocks, is easy to manufacture and use, and significantly improves work efficiency in practical applications.
[0104] like Figure 4 As shown, this application also provides a rapid defect assessment system based on the ultrasonic water jet penetration method, including:
[0105] The acquisition module is used to acquire C-scan imaging images of a part under test with artificial defects, wherein the part under test is pre-divided into multiple regions, and each region has artificial defects of a preset area.
[0106] An initial measurement module is used to extract the measurement area of artificial defects from the C-scan imaging image based on an initial attenuation threshold;
[0107] The comparison module is used to compare the measured area of the artificial defect with the actual area of the artificial defect to obtain a comparison result;
[0108] An iterative correction module is used to adjust the initial attenuation threshold based on the comparison result when the measured area of the artificial defect is inconsistent with the actual area of the artificial defect, update the measured area of the artificial defect and the comparison result, until the measured area of the artificial defect is consistent with the actual area of the artificial defect; when the measured area of the artificial defect is consistent with the actual area of the artificial defect, a target attenuation threshold and the target imaging image corresponding to the target attenuation threshold are obtained.
[0109] The defect assessment module is used to quickly assess the defects of the part under test based on the target imaging image and the target attenuation threshold.
[0110] This application discloses a rapid defect assessment system based on ultrasonic water jet penetration testing. The system utilizes artificial defects attached to the surface of the part under test, employing these artificial defects to perform ultrasonic water jet penetration scanning. In the scanned image, the artificial defect is located using an initial attenuation threshold. The initial attenuation threshold is adjusted by comparing the measured area of the artificial defect with the actual area until they match, thus obtaining an accurate target attenuation threshold for rapid assessment of the actual defects in the part under test. This system can be used to compare abnormal signals at any location on a part during penetration testing, unaffected by factors such as surface roughness, curvature, or thickness. It overcomes the limitations of manual comparison blocks, is easy to manufacture and use, and significantly improves work efficiency in practical applications.
[0111] This embodiment also provides an electronic terminal, including: a processor and a memory;
[0112] The memory is used to store computer programs, and the processor is used to execute the computer programs stored in the memory so that the terminal performs any of the methods in this embodiment.
[0113] As will be understood by those skilled in the art, the computer-readable storage medium described in this embodiment allows for the implementation of all or part of the steps in the above method embodiments by computer program-related hardware. The aforementioned computer program can be stored in a computer-readable storage medium. When executed, the program performs the steps of the above method embodiments; and the aforementioned storage medium includes various media capable of storing program code, such as ROM, RAM, magnetic disks, or optical disks.
[0114] The electronic terminal provided in this embodiment includes a processor, a memory, a transceiver, and a communication interface. The memory and the communication interface are connected to the processor and the transceiver and complete communication between them. The memory is used to store computer programs, the communication interface is used to perform communication, and the processor and the transceiver are used to run the computer programs, so that the electronic terminal performs the various steps of the above method.
[0115] In this embodiment, the memory may include random access memory (RAM) and may also include non-volatile memory, such as at least one disk storage device.
[0116] The processors mentioned above can be general-purpose processors, including central processing units (CPUs), network processors (NPs), etc.; they can also be digital signal processors (DSPs), application-specific integrated circuits (ASICs), field-programmable gate arrays (FPGAs), or other programmable logic devices, discrete gate or transistor logic devices, or discrete hardware components.
[0117] In the above embodiments, although the present application has been described in conjunction with specific embodiments thereof, many substitutions, modifications, and variations of these embodiments will be apparent to those skilled in the art based on the foregoing description. The embodiments of the present application are intended to cover all such substitutions, modifications, and variations falling within the broad scope of the appended claims.
[0118] The above embodiments are merely illustrative of the principles and effects of this application and are not intended to limit this application. Any person skilled in the art can modify or alter the above embodiments without departing from the spirit and scope of this application. Therefore, all equivalent modifications or alterations made by those skilled in the art without departing from the spirit and technical concept disclosed in this application should still be covered by the claims of this application.
Claims
1. A rapid defect assessment method based on ultrasonic water jet penetration method, characterized in that, Including the following steps: Acquire a C-scan imaging image of a part under test with artificial defects, wherein the part under test is pre-divided into multiple regions, and each region has an artificial defect of a preset area. Extracting the measurement area of artificial defects from the C-scan imaging image based on an initial attenuation threshold; extracting the measurement area of artificial defects from the C-scan imaging image based on an initial attenuation threshold includes: obtaining the attenuation value corresponding to each pixel in the C-scan imaging image; identifying pixels with attenuation values greater than or equal to the initial attenuation threshold as defect pixels; locating the defect pixels of the artificial defects and filtering them to remove isolated pixels to obtain the artificial defects; extracting the outer contour of the artificial defects and calculating the roundness of the outer contour; when the roundness of the outer contour is less than a preset roundness threshold, determining that the shape of the artificial defect is abnormal, adjusting the position of the artificial defect, and returning to acquiring the C-scan imaging image of the part under test with the artificial defects until the roundness of the outer contour is greater than or equal to the preset roundness threshold; when the roundness of the outer contour is greater than or equal to the preset roundness threshold, extracting the pixel area of the artificial defects, and converting the pixel area into an actual area based on a preset conversion ratio. The measured area of the artificial defect is compared with the actual area of the artificial defect to obtain the comparison result; When the measured area of the artificial defect is inconsistent with the actual area of the artificial defect, the initial attenuation threshold is adjusted based on the comparison result, and the measured area of the artificial defect and the comparison result are updated until the measured area of the artificial defect is consistent with the actual area of the artificial defect; when the measured area of the artificial defect is consistent with the actual area of the artificial defect, the target attenuation threshold and the target imaging image corresponding to the target attenuation threshold are obtained. Defects in the part under test are quickly assessed based on the target imaging image and the target attenuation threshold.
2. The rapid defect assessment method based on ultrasonic water jet penetration method according to claim 1, characterized in that, The measured area of the artificial defect is compared with the actual area of the artificial defect to obtain a comparison result, including: Calculate the deviation rate between the measured area of the artificial defect and the actual area of the artificial defect; When the absolute value of the deviation rate is less than or equal to a preset deviation rate threshold, it is determined that the measured area of the artificial defect is consistent with the actual area of the artificial defect; when the absolute value of the deviation rate is greater than the preset deviation rate threshold, it is determined that the measured area of the artificial defect is inconsistent with the actual area of the artificial defect.
3. The rapid defect assessment method based on ultrasonic water jet penetration method according to claim 2, characterized in that, Adjusting the initial attenuation threshold based on the comparison results includes: When the deviation rate is greater than a preset deviation rate threshold and the measured area is smaller than the actual area, the initial attenuation threshold is lowered by a preset value. When the deviation rate is greater than a preset deviation rate threshold and the measured area is greater than the actual area, the initial attenuation threshold is increased by a preset value.
4. The rapid defect assessment method based on ultrasonic water jet penetration method according to claim 1, characterized in that, Based on the target imaging image and the target attenuation threshold, a rapid defect assessment of the part under test is performed, including: Obtain the attenuation value corresponding to each pixel in the target imaging image; Pixels whose attenuation value is greater than or equal to the target attenuation threshold are considered defective pixels; Defect areas can be quickly located based on all defective pixels.
5. The rapid defect assessment method based on ultrasonic water jet penetration method according to claim 1, characterized in that, Before acquiring C-scan imaging images of the part under test with artificial defects, the following steps are also included: The part to be tested is divided into zones, and the actual area of artificial defects is determined based on the zones of the part to be tested; The sound-impermeable film material is cut based on the actual area of the artificial defect to obtain a film of the preset area; Apply a release agent to both sides of the film of the preset area, and then attach the film with the release agent dried to the corresponding partition.
6. The rapid defect assessment method based on ultrasonic water jet penetration method according to claim 1, characterized in that, The formula for calculating the initial attenuation threshold is: In the formula, Indicates the initial decay threshold. Indicates the attenuation of signal strength. Indicates the strength of the reference signal.
7. A rapid defect assessment system based on ultrasonic water jet penetration method, characterized in that, include: The acquisition module is used to acquire C-scan imaging images of a part under test with artificial defects, wherein the part under test is pre-divided into multiple regions, and each region has artificial defects of a preset area. An initial measurement module is used to extract the measurement area of artificial defects from the C-scan imaging image based on an initial attenuation threshold. Extracting the measurement area of artificial defects from the C-scan imaging image based on the initial attenuation threshold includes: acquiring the attenuation value corresponding to each pixel in the C-scan imaging image; identifying pixels with attenuation values greater than or equal to the initial attenuation threshold as defect pixels; locating the defect pixels of the artificial defect and filtering them to remove isolated pixels to obtain the artificial defect; extracting the outer contour of the artificial defect and calculating the roundness of the outer contour; when the roundness of the outer contour is less than a preset roundness threshold, determining that the artificial defect shape is abnormal, adjusting the position of the artificial defect, and returning to acquiring the C-scan imaging image of the part under test with the artificial defect until the roundness of the outer contour is greater than or equal to the preset roundness threshold; when the roundness of the outer contour is greater than or equal to the preset roundness threshold, extracting the pixel area of the artificial defect, and converting the pixel area into an actual area based on a preset conversion ratio. The comparison module is used to compare the measured area of the artificial defect with the actual area of the artificial defect to obtain a comparison result; An iterative correction module is used to adjust the initial attenuation threshold based on the comparison result when the measured area of the artificial defect is inconsistent with the actual area of the artificial defect, update the measured area of the artificial defect and the comparison result, until the measured area of the artificial defect is consistent with the actual area of the artificial defect; when the measured area of the artificial defect is consistent with the actual area of the artificial defect, a target attenuation threshold and the target imaging image corresponding to the target attenuation threshold are obtained. The defect assessment module is used to quickly assess the defects of the part under test based on the target imaging image and the target attenuation threshold.
8. An electronic device, characterized in that, include: Processor and memory; The memory is used to store a computer program, and the processor is used to execute the computer program stored in the memory to cause the electronic device to perform the method as described in any one of claims 1 to 6.
9. A computer-readable storage medium having a computer program stored thereon, characterized in that: When the computer program is executed by a processor, it implements the method as described in any one of claims 1 to 6.