一种工业平板外壳生产控制方法
By acquiring images and performing contour geometry analysis under multiple lighting conditions, combined with spatial clustering risk indicators, the problem of distinguishing between real defects and structural interference on the surface of industrial flat panel shells was solved, enabling high-precision intelligent production control and quality diagnosis.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- ANHUI NUODAJIA INTELLIGENT MFG TECH CO LTD
- Filing Date
- 2025-12-19
- Publication Date
- 2026-07-17
AI Technical Summary
Existing technologies cannot effectively distinguish between real defects and structural interference on the surface of industrial flat panel shells, resulting in a high false alarm rate in automated control systems and making it difficult to achieve intelligent production control and quality diagnosis.
Multi-angle images of the surface of the shell to be inspected under at least three different lighting conditions are acquired. Transient interference and stable features are separated by pixel-level statistical analysis. The true defects are screened using the contour geometric regularity index, and a spatial clustering risk index is constructed for graded diagnosis and closed-loop control.
It achieves high-precision identification of real defects, reduces false alarm rate, improves the intelligence level and fault response speed of automated production lines, and can handle process drift and equipment failure in a differentiated manner.
Smart Images
Figure CN121767310B_ABST