一种抗CAF的电路板及其加工方法

By setting microporous isolation rings, interface reinforcement layers and sheet-like inorganic fillers on the circuit board, the problem of high CAF occurrence under high temperature and high humidity conditions is solved, and the insulation reliability and long-term stability of the circuit board are achieved.

CN121793233BActive Publication Date: 2026-07-17JIANGXI YIDONG ELECTRONIC TECH CO LTD

Patent Information

Authority / Receiving Office
CN · China
Patent Type
Patents(China)
Current Assignee / Owner
JIANGXI YIDONG ELECTRONIC TECH CO LTD
Filing Date
2026-01-23
Publication Date
2026-07-17

AI Technical Summary

Technical Problem

In the prior art, simply using high-performance substrates cannot completely suppress ion migration along the CAF (Conductivity, Energy, and Fragrance) pathway at the glass fiber bundle and resin interface under high temperature and humidity conditions.

Method used

By employing the synergistic effect of microporous isolation rings, interface reinforcement layers, and sheet-like inorganic fillers, a three-dimensional barrier network is formed by setting microporous isolation rings on the conductive layer, enhancing the interface reinforcement layer of the insulating layer, and dispersing sheet-like inorganic fillers in the resin matrix, thereby blocking the physical channels of CAF.

Benefits of technology

It effectively inhibits the occurrence and spread of CAF, improves the insulation reliability of circuit boards in high temperature and high humidity environments, enhances interfacial bonding and migration path resistance, and prevents ion migration.

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Abstract

本发明公开了一种抗CAF的电路板及其加工方法,通过微孔隔离环、界面强化层与片状无机填料三者的协同作用,从空间距离、界面状态与体相路径三个维度系统性地阻断了导电阳极丝可能形成与蔓延的物理通道。微孔隔离环直接增大铜导体间的爬电距离,有效抑制表面 / 近表面的离子迁移;界面强化层中,增强材料与树脂基体的界面结合力,封堵了沿该薄弱界面发生CAF的核心路径;而分散的片状无机填料则在树脂基体内部构造出曲折的物理屏障,极大延长了潜在的体内离子迁移路径。由此解决现有单纯使用高性能基材无法完全抑制在高温高湿环境下,沿玻璃纤维束与树脂界面CAF高发路径的离子迁移的技术问题。
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