一种集成电路语音芯片检测装置及检测方法
The integrated circuit voice chip testing device, which uses a flexible enclosure limiting part and a duplex testing part, solves the problems of clamping damage and environmental factors in the testing of integrated circuit voice chips, and achieves efficient, non-destructive, and accurate testing results.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- SHANGHAI YIXIANGTIANKAI NEW ENERGY TECHNOLOGY CO LTD
- Filing Date
- 2026-01-28
- Publication Date
- 2026-07-17
AI Technical Summary
In the existing technology, the detection of integrated circuit voice chips suffers from problems such as clamping damage, low detection efficiency, insufficient accuracy, and environmental factors affecting the detection results.
It adopts a flexible enclosure limiting part and a duplex detection part, including flexible clamping, LED linear light source matrix, photodetector, ultraviolet light source and fluorescence spectrometer, combined with temperature and humidity control to achieve non-destructive testing and environmental sealing.
It achieves non-destructive clamping, improves detection efficiency and accuracy, reduces the impact of environmental factors on detection results, and ensures high sensitivity and consistency of detection.
Smart Images
Figure CN121830653B_ABST