Relative intensity noise detection device and method based on semiconductor optical amplifier
By combining semiconductor optical amplifiers and employing specific methods, the problem of insufficient accuracy in measuring relative intensity noise at low optical power in traditional methods has been solved. This has enabled high-precision measurement and research of relative intensity noise, providing a reference for the suppression of relative intensity noise.
CN121855683APending Publication Date: 2026-04-14XIAN FLIGHT SELF CONTROL INST OF AVIC
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Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2025-12-24
- Publication Date
- 2026-04-14
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Figure CN121855683A_ABST
Abstract
The invention provides a relative intensity noise detection device and method based on a semiconductor optical amplifier. The device comprises a broadband light source, a first optical switch, an adjustable attenuator, a second optical switch, the semiconductor optical amplifier, a third optical switch, a photoelectric detector, a spectrum analyzer and an oscilloscope. The wide-spectrum light source is used for outputting wide-spectrum light; the first optical switch is connected with the broadband light source; the adjustable attenuator and the second optical switch are respectively connected with the first optical switch; the first optical switch is used for switching between the adjustable attenuator and the second optical switch; the semiconductor optical amplifier and the third optical switch are respectively connected with the second optical switch; the second optical switch is used for switching between the semiconductor optical amplifier and the third optical switch; the semiconductor optical amplifier is used for linearly amplifying to-be-detected light; one path of the third optical switch is connected with the semiconductor optical amplifier, and the other path of the third optical switch is connected with the second optical switch.
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