Ion mass measurement system and ion mass measurement method

Abstract

The application provides an ion mass measurement system and an ion mass measurement method, and relates to the field of ion measurement. The system of the application comprises a first Schottky probe system, a second Schottky probe system and a data analysis device, the first Schottky probe system comprises a first Schottky probe, the second Schottky probe system comprises a second Schottky probe, and a first ion channel of the first Schottky probe is communicated with a second ion channel of the second Schottky probe; the first Schottky probe system is used for collecting frequency spectrum data of a first Schottky signal (the power of the signal monotonously changes with the transverse position of ions) generated by ions in the first ion channel; the second Schottky probe system is used for collecting frequency spectrum data of a second Schottky signal (the power of the signal does not change with the transverse position of ions) generated by ions in the second ion channel; and the data analysis device is used for determining the mass of the ions according to the two kinds of collected frequency spectrum data. The application can accurately measure the mass of the ions.

Description

Technical Field

[0001] This application relates to the field of ion measurement technology, and in particular to an ion mass measurement system and ion mass measurement method. Background Technology

[0002] Schottky noise theory was first discovered and proposed by German physicist Walter Schottky in 1918. In 1972, CERN (European Organization for Nuclear Research) first observed Schottky noise signals generated by proton beams. Since then, Schottky noise diagnostics has emerged as one of the most powerful methods for non-interceptor beam diagnostics, and has been widely used in beam diagnostics and monitoring of various accelerators. Schottky noise has multiple applications in beam diagnostics, including beam intensity information and energy monitoring, as well as obtaining beam cyclotron frequency, frequency distribution width, and even momentum distribution information. In 1985, the German Heavy Ion Research Center proposed using Schottky noise to measure atomic nuclei mass; to date, the mass of more than one hundred nuclei has been successfully measured, and combined with beam cooling technology, the relative frequency resolution of ions can reach [missing information]. Even higher, with the highest precision achieved by combining beam cooling technology. In 2011, Schottky probes based on resonant cavity theory were developed and applied in major research institutions, including the German Heavy Ion Research Center, RIKEN in Japan, and the Institute of Modern Physics of the Chinese Academy of Sciences. These cavity probes have been installed and have a higher quality factor (Q value).

[0003] Traditional Schottky probes require the use of random cooling and electronic cooling to reduce the momentum dispersion of the particle beam and achieve higher beam brightness and lifetime. However, since the entire cooling process takes at least one second, it is impossible to measure short-lived nuclei. While time-of-flight (TOF) detectors based on isochronous mass spectrometry also have high accuracy, their destructive measurement properties make them suitable only for measuring extremely short-lived nuclei. For nuclei in the millisecond to second range, a combination of the advantages of isochronous mass spectrometry and Schottky detectors is needed for measurement. Some research progress has been made in this area. For example, in 2019, the Institute of Modern Physics of the Chinese Academy of Sciences designed a feedback device to achieve adjustable Schottky probe quality factor. However, the ion power spectrum information obtained by Schottky probes operating in isochronous mode only shows that a very small number of ions meet the isochronous condition. The majority of non-isochronous ions (ions that do not meet the isochronous condition) will cause their own cyclotron spectrum broadening, resulting in a severe decrease in resolution and greatly limiting the resolution of ion mass measurement. Summary of the Invention

[0004] This application provides an ion mass measurement system and an ion mass measurement method to solve the problem in the prior art that the mass of ions (especially ions that do not meet the isochronism condition) cannot be accurately measured.

[0005] This application provides an ion mass measurement system, including a first Schottky probe system, a second Schottky probe system, and a data analysis device. The first Schottky probe system includes a first Schottky probe, which includes a first probe cavity and a first ion channel located within the first probe cavity. The geometric central axis of the first ion channel is parallel to but does not coincide with the geometric central axis of the first probe cavity. The second Schottky probe system includes a second Schottky probe, which includes a second ion channel. The second ion channel is interconnected with the first ion channel.

[0006] The first Schottky probe system is used to collect the spectral data of the first Schottky signal generated by the ions moving in the first ion channel. The power of the first Schottky signal changes monotonically with the lateral position of the ions. That is, the power of the Schottky signal generated by each ion in the first Schottky probe changes monotonically with its own lateral position. The lateral position represents the offset of the ion in the lateral direction relative to the geometric central axis of the first ion channel. The lateral direction is the direction perpendicular to the geometric central axis of the first ion channel and parallel to the upper surface of the first ion channel.

[0007] The second Schottky probe system is used to collect the spectral data of the second Schottky signal generated by the ions moving in the second ion channel. The power of the second Schottky signal does not change with the lateral position of the ions.

[0008] The data analysis device is used to determine the lateral position of the ion based on the spectral data of the first Schottky signal and the spectral data of the second Schottky signal, and to determine the mass of the ion based on the lateral position.

[0009] According to the ion mass measurement system provided in this application, the first ion channel includes a first rectangular channel and a second rectangular channel connected in sequence. The upper surfaces of the first rectangular channel and the second rectangular channel are parallel to each other, and the cross-sectional dimensions of the first rectangular channel are different from those of the second rectangular channel.

[0010] According to the ion mass measurement system provided in this application, the sidewall of the first ion channel away from the geometric central axis of the first probe cavity, and the lateral distance between the sidewall and the geometric central axis of the first probe cavity are less than the lateral width of the first ion channel.

[0011] According to the ion mass measurement system provided in this application, the first probe cavity is a cylindrical structure.

[0012] According to the ion mass measurement system provided in this application, the wall of the first probe cavity is provided with a first signal coupling port, and the first Schottky probe system further includes a first magnetic coupling antenna, which is installed at the first signal coupling port, and the sensing end of the first magnetic coupling antenna extends into the interior of the first probe cavity.

[0013] The first magnetically coupled antenna is used to output the first Schottky signal by sensing changes in the magnetic field within the first probe cavity.

[0014] According to the ion mass measurement system provided in this application, the wall of the first probe cavity is provided with a first tuning port, the first tuning port penetrates the wall of the first probe cavity, the first Schottky probe further includes a first tuning unit, the first tuning unit is installed in the first tuning port through a flange, and the tuning end of the first tuning unit extends into the interior of the first probe cavity.

[0015] The first tuning unit is used to change the depth of the probe cavity inserted into the first probe cavity under the drive of the stepper motor until the resonant frequency of the first Schottky probe matches the frequency of the first Schottky signal.

[0016] According to the ion mass measurement system provided in this application, the first Schottky probe system further includes a first signal processing unit and a first spectrum analysis unit. The input terminal of the first signal processing unit is electrically connected to the first magnetically coupled antenna, and the output terminal of the first signal processing unit is electrically connected to the first spectrum analysis unit. The second Schottky probe system further includes a second magnetically coupled antenna, a second signal processing unit, and a second spectrum analysis unit. The input terminal of the second signal processing unit is electrically connected to the second magnetically coupled antenna, and the output terminal of the second signal processing unit is electrically connected to the second spectrum analysis unit. The second magnetically coupled antenna is used to output the second Schottky signal.

[0017] The first signal processing unit is used to filter and amplify the first Schottky signal;

[0018] The first spectrum analysis unit is used to perform spectrum analysis on the signal output by the first signal processing unit to obtain the spectrum data of the first Schottky signal;

[0019] The second signal processing unit is used to filter and amplify the second Schottky signal;

[0020] The second spectrum analysis unit is used to perform spectrum analysis on the signal output by the second signal processing unit to obtain the spectrum data of the second Schottky signal.

[0021] This application also provides an ion mass measurement method for an ion mass measurement system, including:

[0022] Based on the spectrum data of the first Schottky signal, determine the power value of the first Schottky signal; based on the spectrum data of the second Schottky signal, determine the power value of the second Schottky signal.

[0023] The lateral position of the ion is determined based on the ratio of the power value of the second Schottky signal to the power value of the first Schottky signal.

[0024] The mass of the ion is determined based on its lateral position.

[0025] According to the ion mass measurement method provided in this application, determining the mass of the ion based on its lateral position includes:

[0026] The mass of the ion is determined based on its lateral position using the following formula:

[0027] ;

[0028] η= - ;

[0029] in, Indicates the cyclotron frequency of an ion; Indicates the mass-to-charge ratio; η represents the phase slip factor; The relativistic Lorentz factor representing an ion; The gamma transition energy factor representing the transition of the ion storage ring; Indicates magnetic field strength; It represents the cyclotron radius of an ion (i.e., the lateral position of the ion). Indicates the amount of change.

[0030] According to the ion mass measurement method provided in this application, the power value of the first Schottky signal or the power value of the second Schottky signal is expressed by the following formula:

[0031] = N(

[0032] in, This represents the power value of the signal; N represents the number of ions with the same cyclotron frequency. Indicates the electric charge of an ion; Indicates the cyclotron frequency of an ion; This represents the effective shape factor of the Schottky probe; This represents the loaded quality factor of the Schottky probe.

[0033] In this application, the geometric center axis of the first ion channel is set to be parallel to but not coincident with the geometric center axis of the first probe cavity (i.e., an off-center state). This enables the first Schottky probe to become a position-sensitive Schottky probe, meaning that the power of the first Schottky signal acquired by the first Schottky probe monotonically changes with the lateral position of the ion (i.e., the power of the Schottky signal generated by each ion in the first Schottky probe monotonically changes with its own lateral position). Simultaneously, combined with the second Schottky signal whose power does not change with the lateral position of the ion, the data analysis device can accurately determine the lateral position of the ion based on the spectral data of the first and second Schottky signals, thereby accurately obtaining the ion's mass. Therefore, the ion mass measurement system of this application can effectively improve the accuracy of ion mass measurement results (especially for ions that do not meet the isochronism condition). Attached Figure Description

[0034] To more clearly illustrate the technical solutions in this application or the prior art, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are some embodiments of this application. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0035] Figure 1 This is a schematic diagram of the structure of an ion mass measurement system shown in an embodiment of this application;

[0036] Figure 2 This is a schematic diagram of the structure of a first ion channel shown in an embodiment of this application;

[0037] Figure 3 This is a schematic diagram of the structure of a position-sensitive Schottky probe shown in an embodiment of this application;

[0038] Figure 4 This is a front view of a position-sensitive Schottky probe shown in an embodiment of this application;

[0039] Figure 5 This is a side view of a position-sensitive Schottky probe shown in an embodiment of this application;

[0040] Figure 6 This is a flowchart illustrating an ion mass measurement method according to an embodiment of this application;

[0041] Figure 7This is a schematic diagram illustrating the correspondence between the ratio of effective shape factors and the lateral position of ions in embodiments of this application;

[0042] Figure label:

[0043] 101. First Schottky probe; 102. First main magnetically coupled antenna; 103. First low-noise amplifier; 104. First primary bandpass filter; 105. First intermediate power amplifier; 106. First secondary bandpass filter; 107. First spectrum analysis unit; 108. First magnetically coupled antenna; 201. Second Schottky probe; 202. Second main magnetically coupled antenna; 203. Second low-noise amplifier; 204. Second primary bandpass filter; 205. Second intermediate power amplifier; 206. Second secondary bandpass filter; 207. Second spectrum analysis unit; 208. Second magnetically coupled antenna; 1011. First probe cavity; 1012. First ion channel; 1013. First tuning port; 1014. First tuning unit; 1015. First signal coupling port. Detailed Implementation

[0044] To make the objectives, technical solutions, and advantages of this application clearer, the technical solutions of this application will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of this application, not all embodiments. Based on the embodiments of this application, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of this application.

[0045] Figure 1 This is a schematic diagram of the structure of an ion mass measurement system shown in an embodiment of this application. Figure 1 As shown, the ion mass measurement system of this application may include a first Schottky probe system, a second Schottky probe system, and a data analysis device.

[0046] The first Schottky probe system includes a first Schottky probe 101, which includes a first probe cavity 1011 and a first ion channel 1012 located within the first probe cavity 1011. The geometric central axis of the first ion channel 1012 is parallel to but does not coincide with the geometric central axis of the first probe cavity 1011.

[0047] The first probe cavity 1011 is a vacuum cavity. The first ion channel 1012 is the channel for the movement of the ion beam, which moves along the geometric central axis of the first ion channel 1012. The geometric central axis of the first ion channel 1012 and the geometric central axis of the first probe cavity 1011 are parallel to each other but do not coincide, that is, the first ion channel 1012 is eccentrically positioned relative to the first probe cavity 1011.

[0048] The first Schottky probe 101 is a position-sensitive Schottky probe improved in this application. The first Schottky probe system can acquire the spectral data of the first Schottky signal generated by moving ions in the first ion channel 1012 through the first Schottky probe 101. The power of the first Schottky signal monotonically changes with the lateral position of the ion. Lateral position refers to the offset of the ion in the lateral direction relative to the geometric central axis of the first ion channel 1012; the lateral direction is perpendicular to the geometric central axis of the first ion channel 1012 and parallel to the upper surface of the first ion channel 1012.

[0049] The second Schottky probe system includes a second Schottky probe 201, which includes a second ion channel.

[0050] The second Schottky probe 201 can be any intensity-sensitive Schottky probe in the prior art, and it usually operates in unipolar mode. The power of the Schottky signal it collects mainly depends on the intensity of the ion beam and is almost independent of the lateral position of the ion. That is, the power of the Schottky signal collected by the second Schottky probe 201 does not change significantly with the change of the lateral position of the ion. Therefore, in the process of reasoning to obtain the mass of the ion, this application regards the power of the Schottky signal collected by the second Schottky probe 201 as not changing with the change of the lateral position of the ion.

[0051] The second ion channel is interconnected with the first ion channel 1012, therefore, the ion beam can move within the ion channel formed by the first ion channel 1012 and the second ion channel. In one embodiment, the first ion channel 1012 and the second ion channel can be connected by a vacuum bellows (or vacuum drift tube) and a flange seal to form a continuous ultra-high vacuum beam environment. The second Schottky probe system serves as a reference system, acquiring the spectral data of the second Schottky signal generated by ions moving in the second ion channel through the second Schottky probe 201.

[0052] In this embodiment, the spectral data of the first Schottky signal represents the correspondence between the frequency and power of the first Schottky signal. Here, the frequency is the cyclotron frequency of the ion.

[0053] The spectral data of the second Schottky signal represents the correspondence between the frequency and power of the second Schottky signal.

[0054] The data analysis device is used to determine the lateral position of the ion based on the spectral data of the first Schottky signal and the spectral data of the second Schottky signal, and to determine the mass of the ion based on the lateral position. The specific data processing method will be described in detail later.

[0055] In this application, the geometric center axis of the first ion channel 1012 is set to be parallel to but not coincident with the geometric center axis of the first probe cavity 1011 (i.e., eccentric state). This enables the first Schottky probe 101 to become a position-sensitive Schottky probe, meaning that the power of the first Schottky signal acquired by the first Schottky probe 101 monotonically changes with the lateral position of the ion. In other words, the power of the Schottky signal generated by each ion in the first Schottky probe monotonically changes with its own lateral position. Simultaneously, combined with the second Schottky signal whose power does not change with the lateral position of the ion, the data analysis device can accurately determine the lateral position of the ion based on the spectral data of the first and second Schottky signals, thereby accurately obtaining the ion's mass. Therefore, using the ion mass measurement system of this application can effectively improve the accuracy of ion mass measurement results (especially for ions that do not meet the isochronism condition).

[0056] In conjunction with the above embodiments, in one implementation, the first ion channel 1012 includes a first rectangular channel and a second rectangular channel connected in sequence, the upper surfaces of the first rectangular channel and the second rectangular channel are parallel to each other, and the cross-sectional dimensions of the first rectangular channel are different from the cross-sectional dimensions of the second rectangular channel.

[0057] Figure 2 This is a schematic diagram of the structure of a first ion channel shown in an embodiment of this application. Figure 2 As shown, the first ion channel 1012 of this application includes a first rectangular channel and a second rectangular channel that are interconnected. The first rectangular channel and the second rectangular channel can be connected by welding or integral molding to ensure the sealing and electrical continuity of the vacuum pipeline.

[0058] exist Figure 2 In this system, a three-dimensional coordinate system is established with the center of the cross-section of the first ion channel 1012 as the origin. O is the origin of the coordinate system, the Z-axis is the geometric central axis of the first ion channel 1012, the positive direction of the Z-axis is the direction of motion of the ion beam, the X-axis is the horizontal axis, the X-axis is perpendicular to the geometric central axis of the first ion channel 1012 and parallel to the upper surface of the first ion channel 1012, and the Y-axis is perpendicular to the geometric central axis of the first ion channel 1012 and perpendicular to the upper surface of the first ion channel 1012.

[0059] In this embodiment, the cross-sectional dimensions of the first rectangular channel are different from those of the second rectangular channel, so that the first ion channel 1012 presents a stepped shape. For example, the cross-sectional dimensions (width × height) of the first rectangular channel can be 309mm × 180mm, and the cross-sectional dimensions (width × height) of the second rectangular channel can be 309mm × 90mm, thereby forming a step-like abrupt change in the Y-axis direction.

[0060] Secondly, the length of the first rectangular channel can also be different from the length of the second rectangular channel. For example, the length of the first rectangular channel can be 50 mm, and the length of the second rectangular channel can be between 100 mm and 150 mm. In this embodiment, the geometric center axis of the first ion channel 1012 is both the geometric center axis of the first rectangular channel and the geometric center axis of the second rectangular channel.

[0061] Furthermore, this application can also round the corners of the first rectangular channel and the second rectangular channel. For example, the four edges of the inner wall of the rectangular channel can be designed with 10mm rounded corners, so that ions can be stably transported while reducing interference from edge electric field effects.

[0062] In this embodiment, a stepped first ion channel 1012 is constructed by using a first rectangular channel and a second rectangular channel with different cross-sectional dimensions. The first Schottky probe 101 is placed eccentrically by utilizing the electric field distribution characteristics of the TM010 mode, making it a position-sensitive Schottky probe. This ensures that the power of the Schottky signal generated by each ion in the first Schottky probe changes monotonically with its own lateral position, providing a physical basis for the accurate determination of the ion's lateral position.

[0063] In conjunction with the above embodiments, in one implementation, the sidewall of the first ion channel 1012 away from the geometric central axis of the first probe cavity 1011, and the distance in the lateral direction from the geometric central axis of the first probe cavity 1011, is less than the width of the first ion channel 1012 in the lateral direction.

[0064] For example, the sidewall of the first ion channel 1012 away from the geometric center axis of the first probe cavity 1011 can be set to a lateral distance of 50 mm from the geometric center axis of the first probe cavity 1011. This distance is less than the lateral width of the first ion channel 1012, which is 309 mm.

[0065] In this embodiment, the first ion channel 1012 is set to a partially eccentric state, which allows the effective measurement area of ​​the first probe cavity 1011 to cover the trajectory range of ions with a wider charge range, thereby expanding the range of ion types that the system can identify (i.e., increasing the dynamic range of measurement), and thus enabling the measurement of the mass of various different types of ions.

[0066] In one embodiment, in conjunction with the above embodiments, the first probe cavity 1011 is a cylindrical structure, for example, the longitudinal axis length can be 100mm and the radius can be 380mm.

[0067] In this embodiment, the first probe cavity 1011 is designed as a cylindrical structure. On the one hand, in terms of physical performance, the cylindrical structure can achieve a higher quality factor and a stable electromagnetic resonance mode, thereby significantly improving the sensitivity to the acquisition of weak Schottky signals. At the same time, its excellent geometric symmetry facilitates the accurate calculation of the electromagnetic field distribution within the cavity. On the other hand, in terms of manufacturing process, compared with probe cavities of other shapes, the cylindrical structure is easier to implement the inner wall copper plating process while maintaining the same excellent performance, and it greatly reduces the processing and manufacturing difficulty, which can reduce the manufacturing cost by more than 40%, thus achieving a balance between high performance and low cost.

[0068] In conjunction with the above embodiments, in one implementation, the inner side of the first probe cavity 1011 may be copper-plated, or may not be copper-plated.

[0069] Specifically, in scenarios requiring high-sensitivity acquisition of weak Schottky signals, the inner side of the first probe cavity 1011 can be copper-plated. Utilizing copper's excellent conductivity, the surface resistance of the cavity wall can be effectively reduced, decreasing ohmic losses of high-frequency electromagnetic waves, thereby significantly improving the quality factor and signal-to-noise ratio of the probe cavity. Although its bandwidth is relatively narrow, the ultra-high sensitivity it achieves is sufficient for the accurate acquisition of extremely weak single-particle Schottky signals.

[0070] In scenarios requiring simultaneous mass measurement of multiple ions, copper plating on the inner side of the first probe cavity 1011 is unnecessary. This approach simplifies the manufacturing process and reduces production costs while avoiding excessively narrow bandwidth due to a high quality factor. It ensures the probe has a wide frequency response range (bandwidth), thus covering the frequency distribution of different types of ions and better meeting the needs of simultaneous mass measurement of multiple ions.

[0071] In one embodiment, in conjunction with the above embodiments, the wall of the first probe cavity 1011 is provided with a first signal coupling port 1015, and the first Schottky probe system further includes a first magnetically coupled antenna, which is installed at the first signal coupling port 1015, and the sensing end of the first magnetically coupled antenna extends into the interior of the first probe cavity 1011, such as... Figure 3 As shown. Figure 3 This is a schematic diagram of the structure of a position-sensitive Schottky probe shown in an embodiment of this application.

[0072] The first magnetically coupled antenna is used to output a first Schottky signal by sensing changes in the magnetic field within the first probe cavity 1011.

[0073] The number of first signal coupling ports 1015 can be one or more, and the first magnetic coupling antenna corresponds one-to-one with the first signal coupling port 1015. One first signal coupling port 1015 is used to install one first magnetic coupling antenna.

[0074] In one embodiment, there are multiple first signal coupling ports 1015 (and first magnetic coupling antennas), which can realize multi-channel parallel acquisition of signals, auxiliary monitoring, or serve as redundant backups, thereby improving the measurement flexibility and operational reliability of the system. If there are multiple first magnetic coupling antennas, one of them is the first main magnetic coupling antenna 102, and the rest are first secondary magnetic coupling antennas 108.

[0075] To better illustrate the ion mass measurement system of this application, in various embodiments of this application, the number of the first signal coupling port 1015 (and the first magnetic coupling antenna) is two, including a first main magnetic coupling antenna 102 and a first magnetic coupling antenna 108. The first main magnetic coupling antenna 102 is used to output a first Schottky signal, and the first magnetic coupling antenna 108 is used for signal monitoring or as a backup.

[0076] In this embodiment, the first signal coupling port 1015 is a cylindrical extension tube structure protruding outward from the wall of the first probe cavity 1011. For example, the radius of the cylindrical extension tube structure can be 30 mm, and the outward extension length can be between 30 mm and 50 mm. The first main magnetic coupling antenna 102 is fastened to the end of the corresponding first signal coupling port 1015 through a vacuum flange, and its antenna probe passes through the cylindrical extension tube structure and extends into the interior of the first probe cavity 1011.

[0077] This embodiment enables a robust and highly airtight connection between the first magnetically coupled antenna and the first probe cavity 1011, ensuring an ultra-high vacuum environment inside the first probe cavity 1011. Simultaneously, the design of this cylindrical extension tube structure helps optimize the coupling coefficient of the first magnetically coupled antenna, reducing stray signal interference, thereby achieving efficient and low-loss extraction of magnetic field energy within the first probe cavity 1011.

[0078] In conjunction with the above embodiments, in one implementation, the second Schottky probe system further includes a second probe cavity and a second magnetically coupled antenna. The second Schottky probe 201 is located inside the second probe cavity. The wall of the second probe cavity is provided with a second signal coupling port. The second magnetically coupled antenna is installed at the second signal coupling port, and the sensing end of the second magnetically coupled antenna extends into the interior of the second probe cavity.

[0079] The second magnetically coupled antenna is used to output a second Schottky signal by sensing changes in the magnetic field within the second probe cavity.

[0080] The number of second signal coupling ports can be one or more, and the second magnetic coupling antenna corresponds one-to-one with the second signal coupling port. One second signal coupling port is used to install one second magnetic coupling antenna.

[0081] In one embodiment, there are multiple second signal coupling ports (and second magnetic coupling antennas), which can realize multi-channel parallel acquisition of signals, auxiliary monitoring, or serve as redundant backups, thereby improving the measurement flexibility and operational reliability of the system. If there are multiple second magnetic coupling antennas, one of them is the second main magnetic coupling antenna 202, and the rest are secondary magnetic coupling antennas 208.

[0082] To better illustrate the ion mass measurement system of this application, in various embodiments of this application, the number of second signal coupling ports (and second magnetic coupling antennas) is two, including a first second main magnetic coupling antenna 202 and a second magnetic coupling antenna 208. The second main magnetic coupling antenna 202 is used to output a second Schottky signal, and the second magnetic coupling antenna 208 is used for signal monitoring or as a backup.

[0083] In this embodiment, the structure of the second signal coupling port is exactly the same as that of the first signal coupling port 1015, and the connection principle between the second magnetic coupling antenna and the second signal coupling port is exactly the same as that between the first magnetic coupling antenna and the first signal coupling port 1015.

[0084] This embodiment enables a robust and highly airtight connection between the second magnetically coupled antenna and the second probe cavity, ensuring an ultra-high vacuum environment inside the second probe cavity. Simultaneously, the cylindrical extension tube structure optimizes the coupling coefficient of the second magnetically coupled antenna, reducing stray signal interference, thereby achieving efficient and low-loss extraction of magnetic field energy from the second probe cavity.

[0085] In one embodiment, in conjunction with the above embodiments, the wall of the first probe cavity 1011 is provided with a first tuning port 1013, the first tuning port 1013 penetrates the wall of the first probe cavity 1011, the first Schottky probe 101 also includes a first tuning unit 1014, the first tuning unit 1014 is installed in the first tuning port 1013 through a flange, and the tuning end (i.e. the insertion end) of the first tuning unit 1014 extends into the interior of the first probe cavity 1011.

[0086] The first tuning unit 1014, driven by a stepper motor, changes the depth of its insertion into the first probe cavity 1011 until the resonant frequency of the first Schottky probe 101 matches the frequency of the first Schottky signal. In other words, the first tuning unit 1014, driven by a stepper motor, changes the depth of its insertion into the first probe cavity 1011, thereby adjusting the electromagnetic parameters of the first probe cavity 1011 so that the resonant frequency of the first Schottky probe 101 matches the operating harmonic frequency of the first Schottky signal, thus achieving a resonant state.

[0087] The number of first tuning ports 1013 can be one or more, and the first tuning unit 1014 corresponds one-to-one with the first tuning port 1013. One first tuning port 1013 is used to install one first tuning unit 1014.

[0088] In one embodiment, if there are multiple first tuning ports 1013 (and first tuning units 1014), the frequency adjustment range can be expanded or the adjustment accuracy can be optimized. For example, one can be used for coarse adjustment over a large range and another for fine adjustment over a small range, thereby facilitating the measurement of ion mass.

[0089] In one embodiment, the first tuning port 1013 is specifically constructed as a cylindrical conduit extending outward from the wall of the first probe cavity 1011, with an extension length between 50mm and 100mm and a radius of 50mm. The first tuning unit 1014 adopts a rectangular stainless steel plunger structure with a square cross-section, the side length of which can be between 60mm and 65mm, and the length between 300mm and 400mm. The first tuning unit 1014 is sealed to the first tuning port 1013 via a vacuum flange, and its axial movement is controlled by a stepper motor, thereby changing the length inserted into the first probe cavity 1011 to achieve precise adjustment of the resonant frequency of the first Schottky probe 101.

[0090] This embodiment enables automated and high-precision adjustment of the resonant frequency of the first Schottky probe 101, effectively compensating for frequency drift caused by processing errors, vacuum environment or temperature changes, and ensuring that the ion mass measurement system always maintains the resonance point with optimal sensitivity.

[0091] In one embodiment, in conjunction with the above embodiments, the wall of the second probe cavity is provided with a second tuning port, the second tuning port penetrates the wall of the second probe cavity, the second Schottky probe 201 also includes a second tuning unit, the second tuning unit is installed in the second tuning port through a flange, and the tuning end (i.e. the insertion end) of the second tuning unit extends into the interior of the second probe cavity.

[0092] The second tuning unit, driven by a stepper motor, changes the depth of insertion into the second probe cavity until the resonant frequency of the second Schottky probe 201 matches the frequency of the first Schottky signal. In other words, the second tuning unit, driven by a stepper motor, changes the depth of insertion into the second probe cavity, thereby adjusting the electromagnetic parameters of the second probe cavity to match the resonant frequency of the second Schottky probe 201 with the operating harmonic frequency of the second Schottky signal, thus achieving resonance.

[0093] The number of second tuning ports can be one or more, and there is a one-to-one correspondence between the second tuning unit and the second tuning port. One second tuning port is used to install one second tuning unit.

[0094] In one embodiment, if there are multiple second tuning ports (and second tuning units), the frequency adjustment range can be expanded or the adjustment accuracy can be optimized. For example, one can be used for coarse adjustment over a large range and another for fine adjustment over a small range, thereby facilitating the measurement of ion mass.

[0095] The specific structure of the second tuning port is exactly the same as that of the first tuning port 1013, and the connection principle between the second tuning unit and the second tuning port is exactly the same as that between the first tuning unit 1014 and the first tuning port 1013.

[0096] This embodiment enables automated and high-precision adjustment of the resonant frequency of the second Schottky probe 201, effectively compensating for frequency drift caused by processing errors, vacuum environment or temperature changes, and ensuring that the ion mass measurement system always maintains the resonance point with optimal sensitivity.

[0097] In one embodiment, in conjunction with the above embodiments, the first Schottky probe system further includes a first signal processing unit and a first spectrum analysis unit 107. The input terminal of the first signal processing unit is electrically connected to the first magnetically coupled antenna, and the output terminal of the first signal processing unit is electrically connected to the first spectrum analysis unit 107. The second Schottky probe system further includes a second magnetically coupled antenna, a second signal processing unit, and a second spectrum analysis unit 207. The input terminal of the second signal processing unit is electrically connected to the second magnetically coupled antenna, and the output terminal of the second signal processing unit is electrically connected to the second spectrum analysis unit 207. The second magnetically coupled antenna is used to output a second Schottky signal.

[0098] The first signal processing unit is used to filter and amplify the first Schottky signal.

[0099] In this embodiment, the first signal processing unit includes a first low-noise amplifier 103, a first primary bandpass filter 104, a first medium-power amplifier 105, and a first secondary bandpass filter 106 connected in sequence.

[0100] The input of the first low-noise amplifier 103 is connected to the first magnetically coupled antenna and is used to pre-amplify the weak first Schottky signal output by the first magnetically coupled antenna to establish the system noise figure of the receiving link.

[0101] The first primary bandpass filter 104 is connected to the output of the first low-noise amplifier 103 and is used to perform preliminary frequency selection on the amplified signal output by the first low-noise amplifier 103, effectively filtering out out-of-band noise interference.

[0102] The first intermediate power amplifier 105 is connected to the output of the first primary bandpass filter 104 and is used to perform secondary power gain amplification on the signal output by the first primary bandpass filter 104 so as to increase the signal strength to meet the input level requirements of the first spectrum analysis unit 107.

[0103] The first and second stage bandpass filters 106 are connected to the output of the first intermediate power amplifier 105 and are used to perform final spectrum purification on the signal output by the first intermediate power amplifier 105 to further suppress the background noise.

[0104] The first spectrum analysis unit 107 is used to perform spectrum analysis on the signal output by the first signal processing unit to obtain the spectrum data of the first Schottky signal. Specifically, the first spectrum analysis unit 107 is connected to the output terminal of the first secondary bandpass filter 106 and is used to perform spectrum analysis on the signal output by the first secondary bandpass filter 106 to obtain the spectrum data of the first Schottky signal.

[0105] In this embodiment, the output port of the first magnetic coupling antenna 108 is in a floating state. In the standby state, it is retracted and hidden inside the first signal coupling port 1015 to avoid disturbing the electromagnetic field distribution inside the first probe cavity 1011.

[0106] The second signal processing unit is used to filter and amplify the second Schottky signal.

[0107] In this embodiment, the second signal processing unit adopts the same architecture as the first signal processing unit, including a second low-noise amplifier 203, a second primary bandpass filter 204, a second intermediate power amplifier 205, and a second secondary bandpass filter 206 connected in sequence.

[0108] The second low-noise amplifier 203 is connected to the second main magnetic coupling antenna 202 and is used to pre-amplify the weak second Schottky signal output by the second main magnetic coupling antenna 202.

[0109] The second primary bandpass filter 204 is connected to the output of the second low-noise amplifier 203 and is used to perform preliminary frequency selection on the amplified signal output by the second low-noise amplifier 203 to filter out out-of-band noise interference.

[0110] The second power amplifier 205 is connected to the output of the second primary bandpass filter 204 and is used to perform secondary power gain amplification on the signal output by the second primary bandpass filter 204 to meet the input level requirements of the second spectrum analysis unit 207.

[0111] The second-stage bandpass filter 206 is connected to the output of the second power amplifier 205 and is used to perform final spectral purification on the signal output by the second power amplifier 205. The second spectrum analysis unit 207 is used to perform spectral analysis on the signal output by the second signal processing unit to obtain the spectral data of the second Schottky signal. Specifically, the second spectrum analysis unit 207 is connected to the output of the second-stage bandpass filter 206 and is used to perform spectral analysis on the signal output by the second-stage bandpass filter 206 to obtain the spectral data of the second Schottky signal.

[0112] In this embodiment, the output port of the second magnetic coupling antenna 208 is in a floating state. In the standby state, it is retracted and hidden inside the second signal coupling port to avoid disturbing the electromagnetic field distribution inside the second probe cavity.

[0113] In this embodiment, regarding device selection, both the first low-noise amplifier 103 and the second low-noise amplifier 203 are broadband low-noise amplifiers to ensure low-loss pickup of wideband signals. Both the first primary bandpass filter 104 and the second primary bandpass filter 204 are narrowband bandpass filters to accurately lock onto the harmonic frequency range of the analyte ion. Both the first intermediate power amplifier 105 and the second intermediate power amplifier 205 are broadband power amplifiers to provide a flat gain response. Both the first secondary bandpass filter 106 and the second secondary bandpass filter 206 are narrowband bandpass filters to further suppress noise floor and improve the signal-to-noise ratio.

[0114] This embodiment enables high signal-to-noise ratio extraction and conditioning of weak Schottky signals at the nanowatt level. Through a multi-stage cascaded architecture combining low-noise amplifiers and narrowband filters, environmental noise and spurious signals can be effectively suppressed. Simultaneously, the scalable backup antenna design provides system redundancy and reliability, preventing the negative impact of non-operating antennas on the cavity resonance quality factor.

[0115] For details regarding the structure of the ion mass measurement system of this application, please refer to [reference needed]. Figure 1 For details regarding the structure of the position-sensitive Schottky probe of this application, please refer to [link / reference needed]. Figures 3-5 .in, Figure 4 This is a front view of a position-sensitive Schottky probe shown in an embodiment of this application. Figure 5 This is a side view of a position-sensitive Schottky probe shown in an embodiment of this application. Figures 3-5The functions of each component have been described above; please refer to the previous text for details. This application will not repeat them here.

[0116] Next, this application will describe in detail the ion mass measurement method based on the ion mass measurement system described above. Figure 6 This is a flowchart illustrating an ion mass measurement method according to an embodiment of this application. (Refer to...) Figure 6 The ion mass measurement method of this application may include the following steps:

[0117] Step S101: Determine the power value of the first Schottky signal based on the spectrum data of the first Schottky signal, and determine the power value of the second Schottky signal based on the spectrum data of the second Schottky signal.

[0118] In this embodiment, the position-sensitive Schottky probe is an auxiliary probe and needs to be used in conjunction with the intensity-sensitive Schottky probe. Regardless of the type of Schottky probe, the power value of its coupled output Schottky signal is theoretically as shown in the following formula (1):

[0119] = N( (1)

[0120] in, This represents the power value of the signal; N represents the number of ions with the same cyclotron frequency (generally, ions with the same cyclotron frequency are of the same type). Indicates the electric charge of ions; Indicates the cyclotron frequency of an ion; This represents the effective shape factor of the Schottky probe; This represents the loaded quality factor of the Schottky probe.

[0121] Among them, the effective shape factor Essentially, the sensitivity characteristics of the Schottky probe's acquisition signal are mainly determined by the following three physical dimensions: (1) spatial location dependence, i.e. The value of the ion varies with the specific position of the ion on the cross-section of the ion channel, which shows a specific distribution pattern. This is the physical basis for this application to infer the lateral position of the ion; (2) Geometric dependence, in the relative velocity of the ion ( Under the premise that the ratio of the ion velocity to the speed of light is constant, The value depends only on the geometry of the probe cavity and is independent of its specific size; (3) velocity dependence, Closely related to the velocity of ions, when targeting different When measuring the value of ions, The value will change accordingly, so the impact of speed differences needs to be calculated and corrected during data processing.

[0122] In practical implementation, the power value of the first Schottky signal can be expressed by the above formula (1) as follows: The power value of the second Schottky signal can be expressed by the above formula (1) as follows: .

[0123] Step S102: Determine the lateral position of the ion based on the ratio of the power value of the first Schottky signal to the power value of the second Schottky signal.

[0124] In this embodiment, the ratio of the power value of the second Schottky signal to the power value of the first Schottky signal can be expressed as the following formula (2):

[0125] (2)

[0126] in, This indicates the effective form factor of the second Schottky probe 201. This represents the effective form factor of the first Schottky probe 101. This indicates the loaded quality factor of the second Schottky probe 201. This represents the loaded quality factor of the first Schottky probe 101.

[0127] Step S102 may specifically include: determining the ratio of the effective shape factor of the second Schottky signal to the effective shape factor of the first Schottky signal (referred to as the R / Q ratio) based on the ratio of the power value of the second Schottky signal to the power value of the first Schottky signal, and the ratio of the loaded quality factor of the second Schottky probe 201 to the loaded quality factor of the first Schottky probe 101; and determining the lateral position of the ion based on the ratio of the effective shape factors and the pre-calibrated correspondence between the ratio of the effective shape factors and the lateral position of the ion.

[0128] In this embodiment, and It can be directly measured using a vector network analyzer, and and It can be read directly from the spectrum data. Therefore, the ratio of the effective shape factor of the second Schottky signal to that of the first Schottky signal can be determined using formula (2). That is, the R / Q ratio. Next, based on the pre-defined correspondence between the R / Q ratio and the lateral position of the ions (e.g., ... Figure 7As shown, to determine the lateral position of an ion, one implementation method is to: determine a set of X values ​​based on the R / Q ratio (i.e., one R / Q ratio corresponds to multiple X values, and the X range formed by multiple sets of X values ​​is relatively small in practice), and then determine the lateral position among the multiple X values. One method for determining the lateral position among multiple X values ​​is that the lateral position is determined by the operator based on experience, or the average of the multiple X values ​​is used as the lateral position. Figure 7 This is a schematic diagram illustrating the correspondence between the ratio of effective shape factors and the lateral positions of ions, as shown in embodiments of this application. Figure 7 In the diagram, the X-axis and Y-axis are... Figure 2 The X and Y axes in the diagram. Of course, in actual implementation, besides... Figure 7 The correspondence between the R / Q ratio and the lateral position can also be designed using other methods. This application does not impose specific restrictions on the design method of the correspondence between the R / Q ratio and the lateral position or on the method of determining the lateral position based on the correspondence.

[0129] In this embodiment, the effective shape factors corresponding to the first and second ion channels differ in their spatial distribution characteristics. This application employs specific structural optimization design to ensure that the ratio of the effective shape factors of the two Schottky probes exhibits strict monotonicity as the ion's lateral position changes. Based on this monotonic characteristic, this application can establish a one-to-one mapping relationship between the ratio of their effective shape factors (R / Q ratio) and the lateral position of the ion within the ion channel. Therefore, in actual measurements, by calculating the ratio of the effective shape factors of the two Schottky probes, the precise lateral position of the ion as it passes through the ion channel can be deduced using this mapping relationship.

[0130] Step S103: Determine the mass of the ion based on its lateral position. Specifically, the mass of the ion can be determined using the following formulas (4)-(5):

[0131] (4)

[0132] η= - (5)

[0133] in, Indicates the cyclotron frequency of an ion; Indicates the mass-to-charge ratio; η represents the phase slip factor; The relativistic Lorentz factor representing an ion; The gamma transition energy factor representing the transition of the ion storage ring; Indicates magnetic field strength; It represents the cyclotron radius of an ion, that is, the lateral position of the ion; Indicates the amount of change; Indicates magnetic stiffness.

[0134] In formula (4), the second term on the right-hand side (η) The momentum dispersion term constitutes the momentum dispersion error term in mass spectrometry. To obtain high-precision mass data, its influence must be eliminated. An ideal isochronous mode is achieved by setting operating parameters to make the ion... and The ions are equal, thus making η zero and eliminating the error term. However, in actual storage ring experiments, the beam typically contains a variety of ions, and only a very small number of ions perfectly satisfy the strict isochronous condition described above. For the vast majority of ions that do not satisfy the isochronous condition, their cyclotron frequency is modulated by momentum dispersion, resulting in broadening of the cyclotron spectrum and a significant decrease in mass resolution.

[0135] In this embodiment, the storage ring includes a straight segment and a ring segment, the ring segment being a semicircle. The ion channel formed by the connection of the first ion channel and the second ion channel belongs to a segment of the semicircle, and its radius of rotation (i.e., its lateral position) is the radius of the semicircle.

[0136] In this embodiment, when performing a single measurement using an ion mass measurement system, the lateral positions of multiple ions of the same type can be obtained. Next, the cyclotron frequency of each ion of the same type is obtained from the target spectral data. Based on the corresponding lateral position, each cyclotron frequency is transformed into the target coordinate system according to a preset transformation formula. In the target coordinate system, the vertical axis represents the power of the Schottky signal generated by the ion, and the horizontal axis represents the transformed cyclotron frequency of the ion. After the transformation is completed, spectral data with momentum dispersion error term eliminated is obtained. Finally, based on this spectral data with momentum dispersion error term eliminated, the [missing information - likely a typo, should be incomplete]. ,Will Substitute = (Since the momentum dispersion error term has been eliminated during the cyclotron frequency conversion, it is not included in formula (4)). Solving this formula will yield the mass m of the ion. The specific solution can be obtained based on existing technologies. This application does not impose any restrictions on this.

[0137] The target spectrum data can be either first spectrum data or second spectrum data. When determining the target spectrum data, the first spectrum data and the second spectrum data can be evaluated separately according to preset rules to obtain the most suitable target spectrum data.

[0138] In this embodiment, when transforming each cyclotron frequency to the target coordinate system based on the corresponding lateral position and according to a preset transformation formula, a reference lateral position is first selected. Then, the conversion is performed using the following formulas (6)-(9):

[0139] (6)

[0140] (7)

[0141] (8)

[0142] (9)

[0143] in, Represents the first among multiple ions of the same kind. One ion; Horizontal position The cyclotron time of the corresponding ion; For the first Cyclotron time of each ion; Indicates the first The relativistic Lorentz factor of an ion; Indicates horizontal position The corresponding ion velocity; Indicates the first The rate of each ion; Indicates the first The lateral position of each ion; Indicates horizontal position The relativistic Lorentz factor of the corresponding ion; Indicated by The circumference of a circle with radius . Indicated by The circumference of a circle with radius . Indicates the first after the turn The cyclotron frequency of each ion.

[0144] In this application, a position-sensitive Schottky probe (i.e., the first Schottky probe 101) and an intensity-sensitive Schottky probe (i.e., the second Schottky probe 201) are configured to operate in the same operating mode. Since the power of the Schottky signal output by the probes contains information about the effective form factor, the power value in the spectral data corresponding to the position-sensitive Schottky probe can be compared with the power value in the corresponding spectral data of the intensity-sensitive Schottky probe, and the ratio of their effective form factors (R / Q ratio) can be obtained. Based on the special structural design of the two probes, their effective form factor distributions exhibit significant differences: the ion channel of the position-sensitive Schottky probe is specially designed, and the magnitude of the implicit effective form factor exhibits strict monotonicity with the change in the lateral position of the ion within the ion channel; while the effective form factor distribution of the intensity-sensitive Schottky probe shows a relatively constant value or a gentle parabolic distribution (specifically depending on the size of the beam envelope; when the beam is closer to the center of the ion channel and the beam envelope is smaller, the effective form factor can be considered a constant value). Therefore, by calculating the ratio of the two, the influence of common factors such as beam intensity can be eliminated, resulting in an effective form factor ratio (R / Q ratio) curve that changes strictly monotonically with respect to the lateral position. This curve establishes a one-to-one mapping relationship between the effective form factor ratio and the lateral position of the ion. Based on this mapping relationship, the lateral position of the ion can be accurately deduced, and the lateral position can be further used to perform non-isochronous correction of the ion's cyclotron frequency, thereby significantly improving the system's frequency resolution and mass measurement accuracy.

[0145] In this application, the first ion channel 1012 of the position-sensitive Schottky probe adopts a stepped structure design. This stepped structure can effectively control the lateral gradient distribution characteristics of the effective shape factor within the first probe cavity 1011. Specifically, this special geometric design can significantly increase the slope of the calibration mapping curve (i.e., the curve corresponding to the R / Q ratio and lateral position) of the position-sensitive probe in the high R / Q ratio response region. Since an increased curve slope means that a unit change in lateral position can cause a larger change in the R / Q ratio, this design, by improving the sensitivity of the R / Q ratio to changes in lateral position, can to some extent enhance the system's ability to resolve the lateral position of ions in this specific region, thereby improving the accuracy of ion mass measurement.

[0146] In summary, the solution proposed in this application has at least the following beneficial effects:

[0147] First, this application constructs a position-sensitive Schottky probe using a first ion channel 1012 with an incompletely eccentric structure, resulting in a significant difference in the effective shape factor distribution between the position-sensitive and intensity-sensitive Schottky probes. This difference causes the power ratio of the two probes to form a strictly monotonic function with respect to the lateral position of the channel, establishing a one-to-one mapping relationship and providing a technical basis for inferring the lateral position of ions. Therefore, this application can assist the intensity-sensitive Schottky probe in effectively correcting the cyclotron spectrum of non-isochronous ions in isochronous mass spectrometry, thereby significantly improving the accuracy of mass measurement results.

[0148] Second, this application employs a stepped first ion channel 1012. This design enhances the sensitivity of the R / Q ratio to changes in lateral position, strengthens the system's ability to resolve the lateral position of ions within this specific region, and significantly improves the accuracy of ion mass measurement. Simultaneously, this design reduces the negative impact of the sharp right-angle structure at the connection between the cavity and the channel on the effective shape factor distribution, improves the perpendicularity and distribution quality of the effective shape factor, and thus reduces the resolution error in ion mass measurement.

[0149] Third, this application adopts a cylindrical structure as the structure of the first probe cavity 1011, which has the advantages of simple structure, convenient processing, and low manufacturing cost, facilitating the rapid realization of engineering objectives. This system can be widely used in the field of particle measurement in accelerators such as heavy ion beams, and has high practical value and promising prospects for promotion.

[0150] Through the above description of the embodiments, those skilled in the art can clearly understand that each embodiment can be implemented by means of software plus necessary general-purpose hardware platforms, and of course, it can also be implemented by hardware. Based on this understanding, the above technical solutions, in essence or the part that contributes to the prior art, can be embodied in the form of a software product. This computer software product can be stored in a computer-readable storage medium, such as ROM / RAM, magnetic disk, optical disk, etc., and includes several instructions to cause a computer device (which may be a personal computer, server, or network device, etc.) to execute the methods described in the various embodiments or some parts of the embodiments.

[0151] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of this application, and are not intended to limit them. Although this application has been described in detail with reference to the foregoing embodiments, those skilled in the art should understand that modifications can still be made to the technical solutions described in the foregoing embodiments, or equivalent substitutions can be made to some of the technical features. Such modifications or substitutions do not cause the essence of the corresponding technical solutions to deviate from the spirit and scope of the technical solutions of the embodiments of this application.

Claims

1. An ion mass measurement system, characterized in that, The system includes a first Schottky probe system, a second Schottky probe system, and a data analysis device. The first Schottky probe system includes a first Schottky probe, which includes a first probe cavity and a first ion channel located within the first probe cavity. The geometric central axis of the first ion channel is parallel to but does not coincide with the geometric central axis of the first probe cavity. The second Schottky probe system includes a second Schottky probe, which includes a second ion channel. The second ion channel is interconnected with the first ion channel. The first ion channel includes a first rectangular channel and a second rectangular channel connected in sequence. The upper surfaces of the first rectangular channel and the second rectangular channel are parallel to each other. The cross-sectional dimensions of the first rectangular channel are different from those of the second rectangular channel. The first Schottky probe system is used to collect the spectral data of the first Schottky signal generated by ions moving in the first ion channel. The power of the first Schottky signal changes monotonically with the lateral position of the ion. The lateral position represents the offset of the ion in the lateral direction relative to the geometric central axis of the first ion channel. The lateral direction is a direction that is perpendicular to the geometric central axis of the first ion channel and parallel to the upper surface of the first ion channel. The second Schottky probe system is used to collect the spectral data of the second Schottky signal generated by the ions moving in the second ion channel. The power of the second Schottky signal does not change with the lateral position of the ions. The data analysis device is used to determine the lateral position of the ion based on the spectral data of the first Schottky signal and the spectral data of the second Schottky signal, and to determine the mass of the ion based on the lateral position.

2. The ion mass measurement system according to claim 1, characterized in that, The sidewall of the first ion channel, which is away from the geometric center axis of the first probe cavity, is laterally less than the lateral width of the first ion channel.

3. The ion mass measurement system according to claim 1, characterized in that, The first probe cavity has a cylindrical structure.

4. The ion mass measurement system according to claim 1, characterized in that, The first probe cavity has a first signal coupling port on its wall surface. The first Schottky probe system also includes a first magnetic coupling antenna, which is installed at the first signal coupling port and extends into the interior of the first probe cavity. The first magnetically coupled antenna is used to output the first Schottky signal by sensing changes in the magnetic field within the first probe cavity.

5. The ion mass measurement system according to claim 1, characterized in that, The first probe cavity has a first tuning port on its wall, which penetrates the wall of the first probe cavity. The first Schottky probe also includes a first tuning unit, which is mounted on the first tuning port via a flange, and the tuning end of the first tuning unit extends into the interior of the first probe cavity. The first tuning unit is used to change the depth of the probe cavity inserted into the first probe cavity under the drive of the stepper motor until the resonant frequency of the first Schottky probe matches the frequency of the first Schottky signal.

6. The ion mass measurement system according to claim 4, characterized in that, The first Schottky probe system further includes a first signal processing unit and a first spectrum analysis unit. The input terminal of the first signal processing unit is electrically connected to the first magnetically coupled antenna, and the output terminal of the first signal processing unit is electrically connected to the first spectrum analysis unit. The second Schottky probe system further includes a second magnetically coupled antenna, a second signal processing unit, and a second spectrum analysis unit. The input terminal of the second signal processing unit is electrically connected to the second magnetically coupled antenna, and the output terminal of the second signal processing unit is electrically connected to the second spectrum analysis unit. The second magnetically coupled antenna is used to output the second Schottky signal. The first signal processing unit is used to filter and amplify the first Schottky signal; The first spectrum analysis unit is used to perform spectrum analysis on the signal output by the first signal processing unit to obtain the spectrum data of the first Schottky signal; The second signal processing unit is used to filter and amplify the second Schottky signal; The second spectrum analysis unit is used to perform spectrum analysis on the signal output by the second signal processing unit to obtain the spectrum data of the second Schottky signal.

7. An ion mass measurement method based on the ion mass measurement system according to any one of claims 1-6, characterized in that, include: Based on the spectrum data of the first Schottky signal, determine the power value of the first Schottky signal; based on the spectrum data of the second Schottky signal, determine the power value of the second Schottky signal. The lateral position of the ion is determined based on the ratio of the power value of the second Schottky signal to the power value of the first Schottky signal. The mass of the ion is determined based on its lateral position.

8. The ion mass measurement method according to claim 7, characterized in that, Determining the mass of the ion based on its lateral position includes: The mass of the ion is determined based on its lateral position using the following formula: = - + the ; n= - ; in, Indicates the cyclotron frequency of an ion; Indicates the mass-to-charge ratio; η represents the phase slip factor; The relativistic Lorentz factor representing an ion; The gamma transition energy factor representing the transition of the ion storage ring; Indicates magnetic field strength; Indicates the lateral position of the ion; Indicates the amount of change.

9. The ion mass measurement method according to claim 8, characterized in that, The power value of the first Schottky signal or the power value of the second Schottky signal is expressed by the following formula: = ( ) ； in, This represents the power value of the signal; N represents the number of ions with the same cyclotron frequency. Indicates the electric charge of an ion; Indicates the cyclotron frequency of an ion; This represents the effective shape factor of the Schottky probe; This represents the loaded quality factor of the Schottky probe.

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