不完善麦粒检测装置及检测方法
By designing a transparent rotating support platform and an involute structure, combined with servo motor control and a deep learning model, the problems of stacking and poor imaging quality in wheat grain detection equipment have been solved, achieving efficient and accurate wheat grain detection.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- SHANDONG UNIV
- Filing Date
- 2026-03-26
- Publication Date
- 2026-07-17
AI Technical Summary
Existing wheat grain detection equipment suffers from problems such as wheat grain stacking, poor image quality, large equipment size, low detection efficiency, and low recognition accuracy, making it difficult to meet the requirements for high-precision and high-efficiency detection.
By employing a transparent rotating support platform and an involute structure design, combined with multi-parameter coupled speed control of a servo motor, uniform distribution of wheat grains and non-stacking imaging are achieved. Detection is performed using a pre-trained deep learning model, and an anti-reflective supplementary lighting structure is designed to improve imaging quality.
It achieves uniform delivery and stack-free imaging of wheat grains, improving detection accuracy and efficiency, adapting to small-scale scenarios, reducing equipment size, and improving the recognition accuracy of imperfect wheat grains.
Smart Images
Figure CN121917567B_ABST