Method and device for testing reliability of key glass
CN121917866APending Publication Date: 2026-04-24CONHUI HUIZHOU SEMICON
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Patent Information
- Application Number
- CN202610017135.1
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2026-01-07
- Publication Date
- 2026-04-24
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Figure CN121917866A_ABST
Abstract
The invention provides a method and a device for testing the reliability of key glass. The method comprises the following steps of: setting a single standard click working condition parameter and a test click working condition parameter; under the single standard click working condition parameter, executing standard click on the key glass sample to obtain a standard characteristic parameter; under the test click working condition parameter, executing a cyclic click test on the key glass test piece according to a click standard to obtain a test feature parameter corresponding to the reference feature parameter; based on the test feature parameters, forming a current feature parameter sequence changing along with the number of clicks so as to construct a degradation trend model describing a function relationship between the feature parameters and the number of clicks; and determining the reliability life index of the key glass test piece by utilizing the degradation trend model and combining the reference characteristic parameters. By testing the characteristic parameters, a degradation trend model changing along with the number of clicks is constructed, and therefore predictable evaluation on the touch performance and touch decline of the key glass is achieved.
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