Wafer processing apparatus, liquid supply assembly, and wafer processing method
By employing parallel branch channels and a back-suction structure in the wafer processing equipment, the problem of fluid dripping after wafer processing is solved by using airflow to form a negative pressure to back-suction residual fluid. This achieves efficient cleaning and cost reduction, and meets the needs of equipment miniaturization.
CN121925072BActive Publication Date: 2026-07-21HWATSING (BEIJING) TECH CO LTD
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- HWATSING (BEIJING) TECH CO LTD
- Filing Date
- 2026-03-23
- Publication Date
- 2026-07-21
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Figure CN121925072B_ABST
Abstract
The application provides a wafer processing device, a liquid supply assembly and a wafer processing method, and belongs to the technical field of wafer processing. The device comprises a bearing disc, a swing arm and a liquid supply assembly. The bearing disc is used to drive the wafer to rotate. The swing arm is swingly arranged above the bearing disc. The liquid supply assembly is arranged at the swing end of the swing arm. The liquid supply assembly comprises a liquid supply nozzle used to release fluid onto the wafer. The liquid supply nozzle has a first channel and a second channel. The first channel comprises at least two branch channels which are in parallel communication with each other. The second channel has a suction structure which is in communication with the outlet end of each branch channel. After the wafer processing is completed, the fluid is stopped from being delivered to the first channel, and the airflow is input into the second channel, so that the negative pressure is formed at the suction structure, the fluid remaining at the outlet end of the first channel is sucked back into the second channel, the suction and discharge of the fluid remaining in the liquid supply nozzle are realized, and the fluid dripping is avoided to affect the processing quality of the wafer.
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Citation Information
Patent Citations
Wafer processing apparatus and wafer processing method
JP2017183568A
Apparatus for absorbing residual solution for semiconductor process-chemical spray nozzle
KR1020030053302A