Direct current cable defect detection method and device based on frequency band selection and medium
CN121933879AActive Publication Date: 2026-04-28STATE GRID SHANGHAI MUNICIPAL ELECTRIC POWER CO +1
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- STATE GRID SHANGHAI MUNICIPAL ELECTRIC POWER CO
- Filing Date
- 2026-03-30
- Publication Date
- 2026-04-28
AI Technical Summary
Technical Problem
[0005]本申请实施例提供了一种基于频带选取的直流电缆缺陷检测方法、设备及介质,用于解决如下技术问题:在直流电缆现场测试中,存在大量的宽频噪声干扰,而注入检测信号受信号源功率限制与长距离传输衰减效应影响,其能量与幅值有限,在高频下,衰减后的检测信号可能被噪声信号淹没,导致缺陷检测结果受到严重干扰
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Figure CN121933879A_ABST
Abstract
The embodiment of the invention discloses a direct-current cable defect detection method and device based on frequency band selection and a medium, belongs to the technical field of cable defect detection, and solves the problem that in a direct-current cable test, an attenuated detection signal may be submerged by a noise signal under high frequency, and consequently a defect detection result is seriously interfered. Comprising the following steps: determining a detection frequency upper limit through a minimum signal amplitude and an output signal amplitude obtained by an impedance analyzer arranged on a direct current cable to be detected; constructing a fitness function based on the corresponding attenuated amplitude of the detection signal at the candidate frequency point and the frequency domain amplitude spectrum of the background noise in the current cable detection environment; based on the detection frequency upper limit and the fitness function, searching an optimal test frequency band upper limit frequency through an optimization algorithm; and determining a sweep frequency range based on the upper limit frequency of the optimal test frequency band, injecting a sweep frequency excitation signal into the head end of the direct current cable to be tested in the sweep frequency range, and performing cable defect positioning based on a received reflection signal.
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Citation Information
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