A positioning method for a planar laser engraving machine
By establishing a combined mapping relationship and partitioning to summarize residual statistics, the problem of deviation aggregation after parameter updates of planar laser engraving machines was solved, achieving efficient parameter maintenance and improved equipment stability.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- SHENZHEN ACT IND
- Filing Date
- 2026-04-02
- Publication Date
- 2026-07-14
AI Technical Summary
Existing planar laser engraving machines lack a unified verification mechanism after parameter updates, leading to the accumulation of deviations in local areas of the scanning field, resulting in long maintenance times and the risk of batch engraving errors.
A combined mapping relationship is established from the reference image coordinates output by the vision unit to the landing point coordinates. A validation dataset is formed by sampling point set. The residual between the expected landing point coordinates and the measured landing point coordinates is calculated. The residual statistics are summarized by partition. Controlled perturbations are applied to the distortion compensation parameters and vision calibration parameters. The parameters are iteratively updated to reduce the deviation.
It enables unified quantitative verification of the effect of parameter combination, reduces the number of repeated trial and error on site, improves the success rate of parameter updates, reduces the risk of increased deviation in local areas, and promptly detects parameter drift during operation, thereby improving the stability of equipment and the availability of production lines.
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Figure CN121945966B_ABST