基于全斯托克斯偏振超表面的透明物体应力检测装置及方法

By using a transparent object stress detection device based on a fully Stokes polarized metasurface, the device separates polarized light using a metasurface polarizer designed with matrix Fourier optics and calculates stress distribution using the phase-shifting method. This solves the problems of systematic error and poor dynamic response in existing methods and enables real-time online stress monitoring of transparent components.

CN122016107BActive Publication Date: 2026-07-17XIAN INST OF OPTICS & PRECISION MECHANICS CHINESE ACAD OF SCI

Patent Information

Authority / Receiving Office
CN · China
Patent Type
Patents(China)
Current Assignee / Owner
XIAN INST OF OPTICS & PRECISION MECHANICS CHINESE ACAD OF SCI
Filing Date
2026-04-13
Publication Date
2026-07-17

AI Technical Summary

Technical Problem

Existing methods for stress detection of transparent components are prone to introducing systematic errors, inaccurate measurement results, and poor dynamic response, making it difficult to achieve real-time online monitoring.

Method used

A stress detection device for transparent objects based on a fully Stokes-polarized metasurface is used, including a light source, a polarizer, a metasurface polarization analyzer, a detector, and a processing module. The metasurface polarization analyzer, designed with matrix Fourier optics, separates linearly polarized light into four diffracted beams with different polarization states, and the stress distribution is calculated by combining the phase shift method.

Benefits of technology

It enables full-field, real-time, and visualized imaging of stress in transparent objects, improving detection accuracy and speed, adapting to the trend of miniaturization and integration of optical platforms, and meeting the needs of online real-time monitoring.

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Abstract

本发明公开了一种基于全斯托克斯偏振超表面的透明物体应力检测装置及方法,主要解决现有检测方法易引入系统误差、测量结果不准确、动态响应差等问题。该装置包括光源、起偏器、超表面检偏元件、探测器及处理模块,其中,起偏器、超表面检偏元件及探测器沿光源的出射光路依次设置;起偏器为线偏振片,且偏振方向与光源出射光光轴的夹角为0度;超表面检偏元件具有周期性结构,线偏振光经待测透明物体后被超表面检偏元件分离为四束偏振态各异的衍射光;探测器用于接收四束衍射光并生成对应的光强图;处理模块与探测器连接,用于接收光强图,计算并输出待测透明物体的应力分布情况,该装置在检测精度、效率与集成度上均有大幅提升。
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