TFT / OLED (Thin Film Transistor / Organic Light Emitting Diode) panel defect detection method and system and medium

Abstract

The invention relates to the technical field of TFT / OLED detection, and discloses a TFT / OLED panel defect detection method and system and a medium, and the system comprises a light source irradiation module which irradiates a to-be-detected TFT / OLED panel; the first acquisition module acquires an initial image; an irradiation optimization module positions a bubble defect candidate area, extracts scattering intensity distribution data and polarization response characteristics under each wavelength channel, determines an optimal light intensity parameter and an optimal polarization angle parameter of each wavelength channel, and generates an illumination optimization instruction; the second acquisition module adjusts an adjustable light source of a multi-wavelength channel and acquires a multi-spectral multi-polarization image; the image processing module performs cross-polarization filtering processing, identifies a candidate area and generates bubble feature data; and the defect judgment module judges the existence state of the bubble defect in the TFT / OLED panel to be detected. Light energy is reasonably distributed according to actual requirements of defects, invalid strong light irradiation is avoided, and the detection efficiency of the whole process is improved.

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