基于X射线强度自适应调控的GIS缺陷检测方法及系统
The GIS defect detection method based on adaptive X-ray intensity control solves the problem of insufficient sensitivity in GIS equipment defect detection, realizes the active identification and precise location of latent defects, and provides an intelligent detection solution.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- NANCHANG POWER SUPPLY BRANCH OF STATE GRID JIANGXI ELECTRIC POWER CO LTD
- Filing Date
- 2026-04-13
- Publication Date
- 2026-07-17
AI Technical Summary
Existing GIS equipment defect detection methods lack sensitivity, are passive in defect identification, and have weak proactive control capabilities over defect characteristics, failing to meet the needs of intelligent operation and maintenance for accurate prediction of equipment status.
An X-ray intensity adaptive control method is adopted. By constructing a closed-loop adaptive control process, a multi-modal intelligent switching strategy integrating radiation safety priority control, enhanced excitation mode and optimized adjustment mode is integrated to dynamically adjust the X-ray intensity. Precise control is achieved by combining a proportional-integral controller, the fourth-order Runge-Kutta method and the Adams prediction-correction method, and the time difference method is used to identify the defect location.
This technology enables the proactive activation of latent defects while ensuring radiation safety, significantly improving the ability to identify early insulation defects in GIS equipment and providing an intelligent, highly sensitive, and highly safe detection solution.
Smart Images
Figure CN122017503B_ABST