功率器件开关序列可调的功率循环电力变换系统及方法
By using a branch topology architecture that independently controls current and voltage stress, the problem of binding device switching actions with test system control logic in existing technologies is solved. This enables high-precision, low-cost power cycle testing, adapts to diverse operating conditions, and reduces test power supply capacity requirements and platform construction costs.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- NORTH CHINA ELECTRIC POWER UNIV
- Filing Date
- 2026-04-17
- Publication Date
- 2026-07-17
AI Technical Summary
In existing AC power cyclic testing solutions, the switching action of devices is deeply bound to the waveform generation and closed-loop control logic of the test system. This makes it difficult to adapt to the diverse switching sequences in the actual operation of power electronic equipment, resulting in insufficient reference value and reliability of the test results. Furthermore, the test power supply capacity requirements are high and the platform construction costs are large, making it difficult to meet the reliability testing needs of large batches of devices under multiple operating conditions.
It adopts a topology architecture of current stress branch, voltage stress branch and energy circulation branch, and controls the power semiconductor device under test and the controllable switching devices of each branch through independent drive signals. This enables independent regulation of voltage stress and current stress, decouples the device switching action from the test system control logic, and adapts to diverse actual working conditions.
It improves the accuracy and flexibility of power cycle testing, reduces the capacity requirements of the test power supply and the system setup cost, and enhances the accuracy and applicability of the test results.
Smart Images
Figure CN122043025B_ABST