Semiconductor device, manufacturing method thereof and electronic equipment

CN122073809APending Publication Date: 2026-05-22BEIJING SUPERSTRING ACAD OF MEMORY TECH
View PDF 0 Cites 0 Cited by

Patent Information

Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
BEIJING SUPERSTRING ACAD OF MEMORY TECH
Filing Date
2024-11-22
Publication Date
2026-05-22

Smart Images

  • Figure CN122073809A_ABST
    Figure CN122073809A_ABST
Patent Text Reader

Abstract

The invention provides a semiconductor device, a manufacturing method thereof and electronic equipment. The manufacturing method of the semiconductor device comprises the steps of forming a first source-drain electrode, a second source-drain electrode, a first catalyst layer, a second catalyst layer and a first through hole on a substrate, wherein the first source-drain electrode and the second source-drain electrode are stacked and insulated from each other; manufacturing an initial semiconductor layer which covers the first through hole, the second catalyst layer and the second source and drain electrode in a conformal manner; the part, making contact with the first catalyst layer, in the initial semiconductor layer is induced to crystallize into a first crystallization part, the part, making contact with the second catalyst layer, in the initial semiconductor layer is induced to crystallize into a second crystallization part, and a semiconductor layer is obtained; manufacturing a gate dielectric layer and a gate layer which sequentially cover the semiconductor layer in a conformal manner; and enabling the semiconductor layer, the gate dielectric layer and the gate layer to respectively form a semiconductor structure, a gate dielectric structure and a gate based on a patterning process. The performance of the semiconductor device can be effectively improved.
Need to check novelty before this filing date? Find Prior Art