集成电路高温老化台温度漂移自愈控制方法及装置
By identifying and correcting faulty sensors in the high-temperature aging test bench, the problem of decreased temperature control accuracy was solved, and the self-healing control of the test bench was realized, ensuring the stability and accuracy of the test.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- HANGZHOU INTERNATIONAL INNOVATION INSTITUTE OF BEIHANG UNIVERSITY
- Filing Date
- 2026-04-23
- Publication Date
- 2026-07-17
AI Technical Summary
Existing high-temperature aging test benches for integrated circuits lack active protection technology, which leads to a decrease in temperature control accuracy, affects the accuracy and repeatability of test results, and is prone to test interruption or waste of resources due to machine failure.
By acquiring the current and historical output results of multiple temperature sensors, calculating the distance and weight between the sensors, identifying and correcting faulty temperature sensors, self-healing control is achieved.
This improves the stability and accuracy of temperature control in the high-temperature test chamber, reduces instability in the temperature control system caused by sensor failure, and ensures the continuity and reliability of the test.
Smart Images
Figure CN122085650B_ABST