Fluorescence probe testing device

Abstract

The present application relates to the field of ray detection, and discloses a kind of fluorescence detector testing device, including the test box with test space inside being openable and closeable, light source assembly being installed in test box and being externally connected X ray light source and detector assembly being installed in test box, first mounting structure is formed in test space, first connecting piece is detachably connected on first mounting structure on detector assembly;Second mounting structure is also formed in test space, second connecting piece is detachably connected on second mounting structure on light source assembly.The present application forms first mounting structure and second mounting structure in test space, so that the detector on detector assembly can be replaced as different forms and photoelectric characteristics of detector according to needs, while facilitating the replacement and selection of light source assembly, to increase the flexibility and adaptability of the entire testing device, conducive to the compatibility of product research and development stage and mass production test stage, improve comprehensive functionality.

Description

Technical Field

[0001] This invention relates to the field of radiation detection, and in particular to a fluorescence detector testing device. Background Technology

[0002] A fluorescence detector is a highly sensitive and selective optical detection device. It uses excitation light of a specific wavelength to irradiate a sample, causing the fluorescent substances within it to undergo energy level transitions and emit fluorescence with longer wavelengths. The detector collects this signal in a direction perpendicular to the excitation light to achieve qualitative or quantitative analysis. An example is an X-ray fluorescence detector. Fluorescence detector testing devices are rapid and non-destructive tools for elemental analysis. Their core principle is to use high-energy X-rays to bombard the sample, exciting the elements in the sample to emit stimulating X-ray fluorescence with characteristic wavelengths or energies. By detecting and analyzing the energy (or wavelength) and intensity of these characteristic spectral lines, the types and abundance of elements in the sample can be determined. Therefore, fluorescence detector testing devices are widely used in materials analysis, metal recovery, semiconductor manufacturing, space exploration, and nuclear technology.

[0003] Existing fluorescence detector testing devices typically house the detector and light source assembly (i.e., the testing assembly) within a single testing chamber. To ensure a tight seal, the chamber is designed as a solid structure with slots. The light source assembly, perfectly fitted to these slots, is then inserted into them. This approach guarantees both a sealed environment and precise positioning of the light source assembly. However, this method limits the fluorescence detector testing device to supporting only one type of X-ray light source, lacking the ability to flexibly switch between different sources for comparative testing, and thus failing to meet the needs of multi-scenario, multi-stage, and R&D / calibration requirements. Summary of the Invention

[0004] In view of the shortcomings of the prior art, the technical problem to be solved by the present invention is to provide a fluorescence detector testing device to solve the problem that the existing fluorescence detector testing devices cannot switch between different light source forms.

[0005] To solve the above-mentioned technical problems, one technical solution adopted by the present invention is: to provide a fluorescence detector testing device including a test box that can be opened and closed and has a test space inside, a light source assembly installed inside the test box and externally connected to an X-ray light source, and a detector assembly installed inside the test box. A first mounting structure is formed in the test space, and the detector assembly has a first connector that is detachably connected to the first mounting structure; a second mounting structure is also formed in the test space, and the light source assembly has a second connector that is detachably connected to the second mounting structure.

[0006] Furthermore, the test chamber includes a box body with the test space formed inside and a cover hinged to one side of the box body for sealing the box body. Both the box body and the cover are made of materials with electromagnetic shielding function. The test space is connected to a vacuum pumping source to form a vacuum test space therein.

[0007] Furthermore, a beryllium window is formed on the test chamber facing the light source assembly, and an external interface is formed on the outer wall of the test chamber surrounding the beryllium window. The external interface is provided with a connection structure for connecting the X-ray source. The connection structure includes multiple threaded holes evenly spaced around the external interface and studs for screwing into the threaded holes and for abutting against the outer wall of the X-ray source.

[0008] Furthermore, the light source assembly includes an isotope radiation source connected to the second connector and aligned with the detector assembly; or the light source assembly includes a bracket connected to the second connector and an element target mounted on the bracket and aligned with the detector assembly.

[0009] Furthermore, the detector assembly includes a bracket with a plug-in stand, a connector mounted on the plug-in stand, and a detector detachably mounted on the plug-in stand and electrically connected to the connector. The connector has multiple plug interfaces for adapting to different detectors, and the detector is located in the irradiation path of the light source assembly.

[0010] Furthermore, the fluorescence detector testing device of the present invention also includes a temperature control component, which includes an external temperature control unit disposed on the first connector for controlling the temperature within the test space and an internal temperature control unit disposed on the detector for controlling the temperature of the detector; the external temperature control unit includes a first temperature sensor mounted on the plug-in plate and a first cooler mounted on the bottom of the bracket; the external temperature control unit also includes a second temperature sensor mounted on the detector and a second cooler mounted on the detector.

[0011] Furthermore, it also includes a signal output module, which includes a signal amplification unit having a signal input terminal and a signal output terminal, a signal power supply unit connected to the signal output terminal, and a signal output bias unit connected to the signal power supply unit. The signal power supply unit has multiple connection terminals, and the signal output bias unit has multiple bias output terminals connected to the signal power supply unit.

[0012] Furthermore, a first base is formed on the inner side of the box cover facing the test space; the first mounting structure includes a pressure block connected to the first base, the pressure block having a first cavity, a second cavity, and a third cavity sequentially connected along the thickness direction, the second cavity having grooves recessed on opposite sides relative to the first cavity and the third cavity, the first cavity, the second cavity, the grooves, and the third cavity all penetrating one side of the pressure block in a direction perpendicular to the thickness direction of the pressure block to form an open side; the plug-in upright plate extends out of the pressure block from the first cavity, the bracket is located in the second cavity and its two sides are engaged in the grooves, the first cooler is located in the third cavity, the pressure block is screwed with a screw for blocking the bracket from approaching the open side, and the bracket is configured as the first connector.

[0013] Furthermore, a second base is formed on the inner side of the box cover facing the test space, and the box cover has a hinge side for hinged to the box body; the second mounting structure includes a base plate connected to the second base, two positioning parts distributed opposite to each other on the base plate, and two sets of limiting posts, the two positioning parts and the two sets of limiting posts are respectively arranged on the four sides and enclose a positioning space with an adjustable distance from the detector assembly, and the second connector includes a base plate for mounting in the positioning space.

[0014] Furthermore, both positioning units include a fixing block fixedly connected to the base plate, two connecting strips slidably mounted on the fixing block along the side near or away from the detector assembly, a spring piece connected to the base plate, and a push block connected to the two connecting strips. A first mounting cavity is formed in the fixing block for one side of the spring piece to abut against the connecting strip. A plurality of ratchet teeth are sequentially formed on both connecting strips along their length direction. The ratchet teeth are used to abut against the spring piece towards the side away from the positioning space and to slide and engage with the spring piece towards the side of the positioning space. Both push blocks have a pressing surface that presses against the substrate and a limiting surface that blocks the substrate towards the side away from the base plate. The positioning unit also includes an unlocking post slidably mounted on the fixing block along the length direction perpendicular to the connecting strip. The unlocking post has a pressing end located outside the fixing block and a pressing end that disengages the spring piece from the ratchet teeth by pressing.

[0015] The fluorescence detector testing device of the present invention has at least the following beneficial effects: by forming a first mounting structure and a second mounting structure in the testing space, the detector on the detector assembly can be replaced with detectors of different forms and photoelectric characteristics as needed, while facilitating the replacement and selection of the light source assembly, thereby increasing the flexibility and adaptability of the entire testing device, which is conducive to multi-type compatibility between the product development stage and the mass production testing stage, and improving the comprehensiveness of functions. Attached Figure Description

[0016] The accompanying drawings, which are included to provide a further understanding of this application and form part of this application, illustrate exemplary embodiments and are used to explain this application, but do not constitute an undue limitation of this application. In the drawings: Figure 1 This is a schematic diagram of the structure of an embodiment of the fluorescence detector testing device of the present invention; Figure 2 This is a bottom view of an embodiment of the fluorescence detector testing device of the present invention (after hiding the housing), showing that the light source component is an isotope radioactive source. Figure 3 This is a schematic diagram of the structure of the first base and detector assembly in one embodiment of the fluorescence detector testing device of the present invention; Figure 4 This is a side sectional view of the detector assembly and temperature control assembly in one embodiment of the fluorescence detector testing device of the present invention; Figure 5 This is a schematic diagram of the first mounting structure in one embodiment of the fluorescence detector testing device of the present invention; Figure 6 This is a front sectional view of the second mounting structure in one embodiment of the fluorescence detector testing device of the present invention; Figure 7 In this invention Figure 6 An enlarged view of part A shown; Figure 8 This is a schematic diagram of the second mounting structure in one embodiment of the fluorescence detector testing device of the present invention; Figure 9 This is a front view of the second connector, support, and element target in one embodiment of the fluorescence detector testing device of the present invention; Figure 10 This is a circuit diagram of the signal output module in one embodiment of the fluorescence detector testing device of the present invention. The meanings of the labels in the attached diagram are as follows: Test box 1, box body 11, box cover 12, vacuum interface 13, external interface 14, threaded hole 141, first base 151, second base 152, third base 153, first mounting structure 16, pressure block 161, top pressure block 1611, bottom pressure block 1612, first cavity 162, second cavity 163, slide groove 1631, third cavity 164, open side 165, screw 166, second mounting structure 17, base plate 171, positioning part 172, fixing block 1721, first mounting cavity 17211, connecting strip 1722, ratchet 17221, spring 1723, first arm section 17231, first bending section 17232, second arm section 17233, second bending section 17234, push block 1724, extrusion surface 17241, limiting surface 172 42. Unlocking post 1725, sliding section 17251, pressing end 17252, squeezing end 17253, limiting post 173, signal interface 181, circuit power supply interface 182, external temperature control unit signal interface 183, internal temperature control unit signal interface 184, detector assembly 2, bracket 21, plug-in plate 211, plug-in part 22, second cooler 3, light source assembly 4, bracket 41, element target 42, isotope radiation source 43, substrate 44, signal amplification unit 51, preamplifier 511, feedback capacitor 512, reset switch 513, signal power supply unit 52, signal bus 521, first resistor 522, first capacitor 523, signal output bias unit 53, sliding resistor 531, second resistor 532, third resistor 533, second capacitor 534. Detailed Implementation

[0017] The invention will now be further described with reference to the accompanying drawings.

[0018] Please see Figures 1 to 2 The fluorescence detector testing device of the present invention includes a test chamber 1 that can be opened and closed and has an internal testing space, a detector assembly 2 installed inside the test chamber 1, a temperature control assembly installed inside the test chamber 1, a light source assembly 4 installed inside the test chamber 1 and externally connected to an X-ray source, and a signal output module disposed on the test chamber 1. The test chamber 1 is used to provide a fully enclosed testing environment for the other components, thereby isolating external interference and ensuring the stability and effectiveness of the testing structure; the light source assembly 4 is used to emit X-rays to the detector assembly 2, and the detector assembly 2 is used to receive the X-rays and convert them into electrical pulses, thereby analyzing the energy and intensity of photons to determine the type and content of elements; the signal output module is used to supply power to the components and provide electrical control, thereby processing and analyzing the equipment signals, extracting relevant energy spectrum data and feeding it back to the control platform, and then performing further processing or storage to ensure the progress of the entire testing operation.

[0019] Please see Figure 1 and Figure 2The test chamber 1 is made of a material with electromagnetic shielding function, such as aluminum alloy, to protect the internal circuitry of the test chamber 1 and isolate it from external interference. The test chamber 1 includes a hollow chamber 11 forming a test space and a cover 12 hinged to one side of the chamber 11 for sealing. The top of the chamber 11 is open, and the cover 12 is hinged to one side of the top of the chamber 11 for easy opening and closing. The side of the cover 12 that is hinged to the chamber 11 is defined as the hinge side. To ensure the airtightness of the test space, a sealing ring is embedded around the top surface of the chamber 11. When the cover 12 is placed on top of the chamber 11, the sealing ring seals the test space. The side of the cover 12 facing the test space after it is placed on the chamber 11 is defined as the inner side, which blocks the top of the test space, thus sealing it. To ensure a vacuum in the test space, a vacuum interface 13 is provided on both sides of the outer wall of the housing 11. One vacuum interface 13 is connected to an external vacuum pumping source (i.e., a vacuum extraction pipe), and the other vacuum interface 13 is connected to a vacuum reading meter (not shown in the figure). By activating the vacuum pumping source, such as a vacuum pump, the gas in the test space is extracted through the vacuum interface 13. The vacuum reading meter displays the gas pressure in the test space until it reaches a vacuum, thus ensuring that the test space is in a vacuum state. This not only shields the test space from external noise interference to a certain extent, but also ensures a stable vacuum state through continuous vacuum monitoring, thereby guaranteeing the accuracy of the test results. In this way, different vacuum environments can be simulated to evaluate the performance characteristics of the detector component 2 under different packaging qualities or special environments.

[0020] To ensure the X-ray source penetrates the test space, a beryllium window is formed on the outer wall of the test chamber 11. The beryllium window is positioned corresponding to the light source assembly 4, allowing external rays to pass through and enter the test space while maintaining its seal. An external interface 14 is also formed on the outer wall of the chamber 11, surrounding the beryllium window, so that the beryllium window is located inside the interface 14. The interface 14 has a connection structure for connecting the X-ray source (i.e., the light tube), facilitating the positioning of the corresponding X-ray source at the interface 14 as needed, allowing the X-ray source to pass through the beryllium window and reach the light source assembly 4. The connection structure includes multiple threaded holes 141 evenly spaced axially around the external interface 14, and studs for screwing into each threaded hole 141. The threaded holes 141 extend radially inward and outward from the external interface 14, and the studs are screwed into the threaded holes 141 from the outside. An X-ray source passes through the external interface 14. By rotating the studs inward, each screw is pressed against the X-ray source and aligned with the beryllium window, thus enabling high-energy or high-throughput testing. The external interface 14 is made of brass to shield against radiation damage and ensure safety during use.

[0021] To facilitate overall setup and assembly / disassembly of each component, detector component 2 and light source component 4 are both mounted on the cover 12, as are signal output modules, thereby concentrating the components and reducing space requirements.

[0022] Please see Figures 2 to 5 In this embodiment, to facilitate the installation and replacement of the detector assembly 2, a first base 151 is formed on the inner side of the cover 12. The first base 151 is located on the inner side of the cover 12 facing the test space, so that after the cover 12 is placed on the housing 11, the first base 151 is positioned at the top of the test space. The first base 151 is made of a material with electromagnetic shielding function, the same material as the housing 11. A first mounting structure 16 is formed on the first base 151, and the detector assembly 2 is mounted on and detachable from the first mounting structure 16. This facilitates the replacement of different detector assemblies 2, enabling support for various models of detector assemblies 2, thereby improving the adaptability of the detector assembly 2 to a certain extent and benefiting compatibility between the product development stage and the mass production testing stage.

[0023] In this embodiment, the first mounting structure 16 includes a pressure block 161 connected to the first base 151. The pressure block 161 is fixed to the first base 151 by bolts or other connection methods. The pressure block 161 includes a top pressure block 1611 fixed to the first base 151 and a bottom pressure block 1612 connected to the top pressure block 1611. Both the top pressure block 1611 and the bottom pressure block 1612 are rectangular in shape, and first screw holes can be opened at the four corners of both the top pressure block 1611 and the bottom pressure block 1612, so that the bottom pressure block 1612 is fixed to the top pressure block 1611 by bolts. Both the top pressure block 1611 and the bottom pressure block 1612 are U-shaped and each has three segments, so that the three segments of the top pressure block 1611 are all connected to the first base 151, and the three segments of the bottom pressure block 1612 are all connected to the top pressure block 1611 and are stacked thereon. Therefore, a first cavity 162 is provided inside the bottom pressure block 1612, and a third cavity 164 is provided inside the top pressure block 1611. The first cavity 162 and the third cavity 164 are connected. The length and width of the first cavity 162 and the third cavity 164 can be kept consistent. The two ends of the top pressure block 1611 and the two ends of the bottom pressure block 1612 are flush with each other, so that the first cavity 162 and the third cavity 164 extend through one side of the pressure block 161 along the extension direction of the two ends of the pressure block 161. The dimensions of the first cavity 162 and the third cavity 164 are set according to the dimensions of the test assembly. To position the test component, a second cavity 163 is formed between the top pressure block 1611 and the bottom pressure block 1612. The second cavity 163 is wider than the first cavity 162 and the third cavity 164, so that both sides of the second cavity 163 are recessed relative to the first cavity 162 and the third cavity 164. Both recessed sides of the second cavity 163 relative to the first cavity 162 and the third cavity 164 are configured as sliding grooves 1631. Both the second cavity 163 and the sliding grooves 1631... The first cavity 162, the second cavity 163 (including the sliding groove 1631), and the third cavity 164 extend through one side of the pressure block 161, forming an open side 165 on one side of the pressure block 161. The first cavity 162, the second cavity 163, and the third cavity 164 are sequentially connected along the thickness direction of the pressure block 161 and extend towards the side away from the first base 151. The extending directions of the two ends of the pressure block 161 are perpendicular to the thickness direction of the pressure block 161. When it is necessary to install the detector assembly 2, the corresponding structure of the detector assembly 2 can be inserted into the cavity inside the pressure block 161 from the open side 165. In particular, the detector assembly 2 can be inserted into the second cavity 163 and its two sides can be slid into the sliding grooves 1631 on both sides to restrict the detector assembly 2 in the thickness direction of the pressure block 161.

[0024] After the detector assembly 2 is installed on the pressure block 161, in order to prevent the detector assembly 2 from detaching from the open side 165 when it is not necessary to disassemble it, a screw 166 is screwed onto the pressure block 161 to block the detector assembly 2 from approaching the open side 165. In one embodiment, a second screw hole is formed on the top pressure block 1611 and the bottom pressure block 1612 along the thickness direction of the pressure block 161, intersecting and communicating with the slide groove 1631. Similarly, the screw 166 can be screwed into the two second screw holes to block it in the slide groove 1631, and the screw hole is formed on the side close to the open side 165. It should be noted that the pressure block 161 is positioned aligned with the light source assembly 4 so that the detector assembly 2 can be located on the irradiation path of the light source assembly 4.

[0025] In another embodiment, the pressing block 161 is a single piece and has the same first cavity 162, second cavity 163 and third cavity 164 as in the previous embodiment.

[0026] Please see Figures 6 to 8 To facilitate the installation of the light source assembly 4, a second base 152 is formed on the inner side of the cover 12. The second base 152 is arranged along the detection direction of the detector and can correspond to it. A second mounting structure 17 is formed on the second base 152. The second mounting structure 17 is located in the test space after the cover 12 is placed on the housing 11.

[0027] The second mounting structure 17 includes a base plate 171 connected to the second base 152, two positioning parts 172 oppositely distributed on the base plate 171, and two sets of limiting posts 173. The base plate 171 is fixedly connected to the second base 152. For ease of understanding, the distribution direction of the first base 151 and the second base 152 is defined as the irradiation direction, and the two positioning parts 172 are distributed at intervals on both sides of the base plate 171 along the irradiation direction; the other direction of the base plate 171 perpendicular to the irradiation direction is defined as the auxiliary direction, and the two sets of limiting posts 173 are distributed on both sides of the base plate 171 along the auxiliary direction, so that the two positioning parts 172 and the two sets of limiting posts 173 are respectively arranged on the four sides of the base plate 171 and spaced apart from each other, so that a positioning space with an adjustable distance from the detector assembly 2 is formed between the two positioning parts 172 and the two sets of limiting posts 173. The light source assembly 4 is installed in the positioning space, and the distance between it and the detector can be adjusted to change the irradiation distance.

[0028] In this embodiment, each of the two positioning parts 172 includes a fixing block 1721 fixedly connected to the base plate 171, two connecting strips 1722 slidably mounted on the fixing block 1721 along the side close to or far from the detector assembly 2, a spring piece 1723 connected to the base plate 171, a push block 1724 connected to the two connecting strips 1722, and an unlocking post 1725 slidably mounted on the fixing block 1721 along the length direction perpendicular to the connecting strips 1722.

[0029] Each fixing block 1721 has two sliding holes adapted to the connecting strips 1722, and both sliding holes penetrate the fixing block 1721 along the irradiation direction, so that the two connecting strips 1722 can slide through the sliding holes and move along the irradiation direction. A first mounting cavity 17211 is also provided in the fixing block 1721 for one side of the spring piece 1723 to abut against the connecting strip 1722. Specifically, the first mounting cavity 17211 is formed in the fixing block 1721 along the thickness direction of the base plate 171, and intersects with and communicates with the two sliding holes. To facilitate the installation of the spring piece 1723 and the unlocking pin 1725, the fixing block 1721 can be formed by connecting two block structures. A spring piece 1723 is disposed within the first mounting cavity 17211 and fixedly connected on one side to the fixing block 1721 or the base plate 171, while the other side of the spring piece 1723 abuts against the connecting strip 1722 that passes through the sliding hole. The side of the spring piece 1723 that abuts against the connecting strip 1722 is the elastic side, which includes at least a first arm segment 17231 inclined towards the first base 151, a first bent segment 17232 bent from the first arm segment 17231, and a second arm segment 17233 inclined from the bent segment towards the sliding hole. In one embodiment, the second arm segment 17233 of the two positioning portions 172 is inclined towards both the side away from the first base 151 and the side closer to the sliding hole. The first bent segment 17232 provides deformation space for the second arm segment 17233 after being compressed by the elastic side. Both connecting bars 1722 have a number of ratchet teeth 17221 sequentially formed along their length. Each ratchet tooth 17221 gradually narrows towards the side away from the first base 151, and each ratchet tooth 17221 forms a stop surface at a right angle or acute angle to the connecting bar 1722 on the side close to the first base 151. When the connecting bar 1722 slides towards the side away from the first base 151 and the detector assembly 2, each ratchet tooth 17221 presses against the elastic side of the spring piece 1723, causing the elastic side to deform. When the connecting bar 1722 is no longer sliding, the elastic side abuts against the stop surface and abuts against the spring piece 1723, preventing the connecting bar 1722 from sliding towards the detector assembly 2 and locking it in place. A push plate is connected to the end of the two connecting bars 1722 away from the push block 1724.

[0030] In another embodiment, the second arm segment 17233 of one positioning portion 172 near the detector assembly 2 is inclined towards the side away from the first base 151 and also towards the side near the sliding hole, while the second arm segment 17233 of the other positioning portion 172 away from the detector assembly 2 is inclined towards the side near the first base 151 and also towards the side near the sliding hole. Both connecting strips 1722 are also provided with a plurality of ratchet teeth 17221. The ratchet teeth 17221 on the positioning portion 172 near the detector assembly 2 gradually narrow towards the side away from the first base 151, while the ratchet teeth 17221 on the positioning portion 172 away from the detector assembly 2 gradually narrow towards the side near the first base 151. Therefore, in this embodiment, the orientations of the spring pieces 1723 and the ratchet teeth 17221 of the two positioning portions 172 are mirror-image arranged.

[0031] When installing the light source assembly 4, one side of the light source assembly 4 is held against a positioning part 172 located away from the detector assembly 2. The positioning part 172 close to the detector assembly 2 is pushed so that the connecting strip 1722 of the positioning part 172 moves toward the light source assembly 4 until the two push blocks 1724 hold the light source assembly 4 against the positioning space and fix the light source assembly 4. At the same time, the position of the connecting blocks of the two positioning parts 172 is adjustable so that the distance between the light source assembly 4 and the detector is adjustable.

[0032] Both push blocks 1724 are L-shaped and each has a vertical section perpendicular to the base plate 171 and a horizontal section perpendicular to the vertical section and parallel to the base plate 171. The horizontal section is located on the side of the vertical section away from the base plate 171, so that both push blocks 1724 have a pressing surface 17241 for pressing the light source assembly 4 towards each other and a limiting surface 17242 for blocking the substrate 44 on the side away from the base plate 171. The distance between the limiting surface 17242 and the base plate 171 should be adapted to the thickness of the light source assembly 4, such as being 2-4 mm greater than the thickness of the light source assembly 4, so that the light source assembly 4 can be installed therein without being too loose. A guide slope is formed on the side of the limiting surface 17242 away from the pressing surface 17241.

[0033] Due to the constraint of the stop face on the spring piece 1723, an unlocking post 1725 is provided to allow the connecting bar 1722 to move in the irradiation direction toward the side opposite to the sliding direction of the spring piece 1723 and the ratchet 17221. A T-shaped second mounting cavity, communicating with the first cavity 162, is formed on the fixing block 1721 corresponding to the unlocking post 1725. The narrow side of the second mounting cavity faces away from the base plate 171 and passes through the fixing block 1721. The unlocking post 1725 includes a sliding section 17251 that slides through the narrow side of the second mounting cavity, a pressing end 17252 located outside the fixing block 1721, and a squeezing end 17253 that disengages the spring piece 1723 from the ratchet 17221 after pressing the pressing section. When it is necessary to restrict the ratchet 17221 by contacting the spring 1723, the pressing end 17252 is pushed inward to compress the elastic side of the spring 1723 until the elastic side moves away from the ratchet 17221. Then the connecting strip 1722 can move along the irradiation direction toward the side closer to the detector and toward the side farther from the detector. In order to prevent or reduce interference with the stop surface when the pressing end 17253 pushes the elastic side, the spring 1723 may also have a second bent section 17234 connected to the first arm segment 17231 away from the first bent section 17232. The second bent section 17234 allows the pressing end 17253 to compress the second arm segment 17233, so that the second arm segment 17233 moves to a certain extent toward the side closer to the base plate 171 and the detector through the deformation cooperation between the second bent section 17234 and the first arm segment 17231.

[0034] Each set of limiting posts 173 can be configured as two limiting posts 173, with the two limiting posts 173 arranged at intervals and the spacing between the two sets of limiting posts 173 being adapted to the light source assembly 4.

[0035] Please continue reading. Figures 2 to 4 The detector assembly 2 includes a bracket 21 with a plug-in plate 211, a connector 22 mounted on the plug-in plate 211, and a detector detachably mounted on the plug-in plate 211 and electrically connected to the connector 22. The bracket 21 is adapted to the second cavity 163 and can be installed in the second cavity 163 from the open side 165, with both sides of the bracket 21 engaging in the sliding grooves 1631. A screw 166 is then screwed into a second screw hole to block the bracket 21 and restrict the entire bracket 21 onto the pressure block 161. The size of the plug-in plate 211 is smaller than that of the first cavity 162 and can protrude from the first cavity 162 out of the pressure block 161. When the detector assembly 2 is installed on the pressure block 161 and the cover 12 is placed on the housing 11, the plug-in plate 211 extends vertically downward out of the pressure block 161 and into the middle of the test space.

[0036] The connector 22 includes a connector board with multiple connectors. The connector board may include a circuit board and connectors soldered onto the circuit board, with the connectors formed on the connectors. To ensure the continuity of electrical signals, the wiring required for the detector assembly 2 is provided within the first base 151, and the wiring is electrically connected to the connector board. The multiple connectors are used to adapt to different types of detectors and / or temperature control components, enabling the detectors to be disassembled and replaced. In actual testing, the detector can be selected based on its structural form and photoelectric characteristics to match the X-ray fluorescence detector according to actual needs.

[0037] The detector is plugged into and electrically connected to the connector plate via a connector, and is located in the irradiation path of the light source assembly 4. The detector can be a packaged detector or an unpackaged bare-core detector, and after being installed on the connector 22, the detector is located at the center of the entire test space. In this embodiment, the bracket 21 is configured as the first connector, and the detector is mounted on the first connector.

[0038] Please see Figure 3 and Figure 4 The temperature control component is mounted on the first connector of the detector assembly 2, i.e., on the bracket 21. In this embodiment, the temperature control component includes an external temperature control unit mounted on the first connector for controlling the temperature within the test space, and an internal temperature control unit mounted on the detector for controlling the temperature of the detector. The external temperature control unit ensures the ambient temperature within the test space, i.e., the area surrounding the detector, and can be used to simulate different working environmental conditions; the internal temperature control unit controls the temperature of the core chip inside the detector, ensuring that the detector operates within its optimal operating temperature range. The external temperature control unit includes a first temperature sensor mounted on the plug-in stand 211 and a first cooler mounted on the bottom of the bracket 21; the internal temperature control unit includes a second temperature sensor mounted on the detector and a second cooler 3 mounted on the detector.

[0039] The first temperature sensor is fixed to the plug-in plate 211 and electrically connected to the plug-in interface. The first cooler is mounted at the bottom of the bracket 21 and, after the bracket 21 is installed in the second cavity 163, is located in the third cavity 164. Therefore, the size of the first cooler is adapted to the third cavity 164 so that it can be inserted into the third cavity 164 along the open side 165. The first cooler can be directly inserted into the third cavity 164 and magnetically attached to the bracket 21. Magnets can be provided on both the bracket 21 and the first cooler to allow the first cooler to continue to be used when the detector assembly 2 is replaced. In another embodiment, the first cooler can be fixedly connected to the bracket 21, but when the detector assembly 2 is replaced, the first cooler must be replaced along with it, or only the detector can be replaced without replacing the first cooler. Thus, the first cooler is installed together with the detector assembly 2 on the first mounting structure 16, that is, together on the cover 12. The second temperature sensor is directly connected to the detector to directly detect its temperature. The second cooler 3 is also directly connected to the detector; when the second temperature sensor detects that the detector temperature is too high, the second cooler 3 can cool it down. Both the first and second coolers 3 are small TEC thermoelectric cooling modules. Combined with the first and second temperature sensors, they are used to control the operating temperature inside and outside the detector (i.e., within the test space), ensuring that the ambient temperature within the test space is constantly controlled.

[0040] It should be noted that the temperature control component also includes a PID control device, which can be installed inside the first base 151 and electrically connected to the plug-in board. The PID control device is also electrically connected to the first temperature sensor, the second temperature sensor, the first cooler, and the second cooler 3, so that the PID control device controls the operation of each device, thereby simulating changes in ambient temperature and enabling the internal and external temperature control units to operate independently without interference, while also allowing them to work together. Through the PID control algorithm, high-precision temperature regulation is achieved, thereby forming a controllable internal and external temperature difference and temperature gradient during the test. This can be used to study the performance changes and stability of the detector under complex thermal environments, especially the performance of the detector under extreme environments.

[0041] Please see Figure 9In one embodiment, the light source assembly 4 includes a substrate 44 for mounting in a positioning space, a bracket 41 connected to the substrate 44, and an element target 42 mounted on the bracket 41 and aligned with the detector assembly 2. The substrate 44 is rectangular and adapted to the positioning space, defining the substrate 44 as a second connector connected to the second mounting structure 17. The bracket 41 is a U-shaped or portal frame fixedly connected to the substrate 44. Bolts can be screwed onto the bracket 41 or the substrate 44, so that the bolt heads hold the element target 42 against the bracket 41 to complete the fixation of the element target 42. In use, an external X-ray source emits X-rays to the element target 42 through the external interface 14 and the beryllium window, causing the X-rays to hit the element target 42. After the element target 42 is excited by the X-rays, it emits its own unique X-rays, which then excite the X-ray camera detector, ultimately exciting the sample to produce fluorescence. This light source assembly 4 is composed of a mixture of solidified elements and is used for calibration and testing in different wavelength and energy ranges. It can obtain near-monochromatic excitation light to a certain extent, has a high signal-to-noise ratio, and can reduce background interference. This method is suitable for high-power, high-count, wide-energy-range, or comparative calibration tests. It should be noted that the setting angle of the element target 42 should correspond to the detector and the beryllium window, so that the X-rays can reach the element target 42 before heading towards the detector.

[0042] Please see Figure 2 In another embodiment, the light source assembly 4 includes a substrate 44 for mounting in a positioning space and an isotope radiation source 43 mounted on the substrate 44. In use, the isotope radiation source 43 directly emits X-rays to the detector for irradiation, stabilizing the X-ray output and making it suitable for routine testing in a standard environment. The irradiation incident intensity is simulated by controlling the distance between the light source and the detector.

[0043] Based on this, with the cooperation of the second mounting structure 17 and the second connector, the light source assembly 4 can be equipped with different types of light source devices according to usage requirements. The substrate 44 allows the isotope radiation source 43 or the element target 42 to be located in the same position and used in conjunction with the detector, thus making the light source more versatile. At the same time, both the light source assembly 4 and the external X-ray source at the external interface 14 can be manually switched according to different scientific research testing needs, thereby improving testing flexibility and expandability and avoiding limitations on the testing range. It should be noted that the substrate 44 should be made of aluminum to avoid adverse effects on energy calibration and performance testing.

[0044] Please see Figure 1 and Figure 10To ensure power supply and signal transmission for all components, the enclosure cover 12 is equipped with a signal interface 181, a circuit power supply interface 182, an external temperature control unit signal interface 183, and an internal temperature control unit signal interface 184. Each interface includes multiple airtight connectors for power supply control of each circuit and component. The signal interface 181 outputs through an independent signal interface, allowing direct connection to an external oscilloscope or digital pulse processing device to achieve high-precision energy spectrum processing and analysis, enhancing the platform's versatility and expandability. A third base 153 is also provided on the inner side of the enclosure cover 12. The third base 153 houses the controllers corresponding to each component and various circuits, with corresponding shielding meshes installed on the surface of each circuit.

[0045] The signal output module includes a signal amplification unit 51 with signal input and signal output terminals, a signal power supply unit 52 connected to the signal output terminal, and a signal output bias unit 53 connected to the signal power supply unit 52. The power supply line is connected to the circuit power supply interface 182, and the signal is output through the signal interface 181, enabling precise bias supply to different types of detectors under safe and stable conditions. This provides good compatibility and suitability for various scientific research needs.

[0046] The signal amplification unit 51 includes a preamplifier 511 connected to the detector. The first end of the preamplifier 511 is connected to the signal output end of the detector. A feedback capacitor 512 and a reset switch 513 are connected in parallel on the preamplifier 511.

[0047] The signal power supply unit 52 includes a signal bus 521 that is grounded. The signal bus 521 is connected to the second terminal of the preamplifier 511. The signal bus 521 is connected to positive and negative power signals and has multiple connection terminals. The signal bus 521 is also connected to the positive terminal of the second cooler 3, the negative terminal of the second cooler 3, and the second temperature sensor to provide power to the internal temperature control unit. One output terminal of the signal bus 521 is connected to the signal output bias unit 53, and a first resistor 522 and a grounded first capacitor 523 are connected to the output terminal of the signal bus 521 to ensure circuit stability and suppress noise charges.

[0048] The signal output bias unit 53 includes multiple bias output terminals (i.e., bias circuits) connected to the output terminals of the signal power supply unit 52. Each bias output terminal includes a sliding resistor 531, a second resistor 532, a third resistor 533, and a second capacitor 534. The first end of the second resistor 532 is connected between the sliding resistor 531 and the second resistor 532, and the second end of the second resistor 532 is grounded. The two ends of the third resistor 533 are respectively connected to the first ends of the sliding resistor 531 and the second capacitor 534, and the second end of the second capacitor 534 is grounded. The sliding resistor 531 provides the detector with multiple adjustable output voltages, allowing the detector to adapt to different requirements and receive the corresponding detector bias voltage, thus realizing a multi-level adjustable bias output circuit. Correspondingly, each bias circuit is externally shielded to partially cover and shield the detector bias supply, reducing noise coupling from high bias lines to adjacent lines and effectively suppressing the influence of environmental noise on X-ray signal testing.

[0049] In use, the detector's output charge is collected by the feedback capacitor 512 and transmitted to the detector signal output, which corresponds to the data processing module. This signal is transmitted to an external digital pulse processor through a standardized signal output interface. The external device processes and analyzes the signal, extracts relevant energy spectrum data, and feeds it back to the control platform for further processing or storage.

[0050] Compared with existing technologies, the fluorescence detector testing device of this invention constructs a comprehensive testing platform for scientific research and industrial engineering applications. It features compatibility with multiple types of X-ray sources within the same device, can be applied to the same test structure for both packaged and unpackaged detectors, has wide-range adjustable bias control and dual temperature control for the detector's internal and external environments, and can achieve the required vacuum environment. Multiple electromagnetic noise shielding structures are implemented using the test chamber 1 and a circuit shielding mesh. Ultimately, this enables the X-ray fluorescence detector testing device to perform highly consistent, highly repeatable, and highly reliable tests under different radiation conditions, thermal environments, electrical biases, and vacuum environments, providing a unified and standardized technical platform for detector performance evaluation, comparative verification, and long-term stability studies.

Claims

1. A fluorescence detector testing device, comprising an openable test chamber with an internal testing space, a light source assembly installed inside the test chamber and externally connected to an X-ray source, and a detector assembly installed inside the test chamber, characterized in that: A first mounting structure is formed within the test space, and the detector assembly has a first connector that is detachably connected to the first mounting structure; a second mounting structure is also formed within the test space, and the light source assembly has a second connector that is detachably connected to the second mounting structure.

2. The fluorescence detector testing device as described in claim 1, characterized in that: The test chamber includes a box body with the test space inside and a lid hinged to one side of the box body for sealing the box body. Both the box body and the lid are made of materials with electromagnetic shielding function. The test space is connected to a vacuum pump to form a vacuum test space therein.

3. The fluorescence detector testing device as described in claim 1, characterized in that: The test chamber has a light-transmitting beryllium window facing the light source assembly. The outer wall of the test chamber also has an external interface surrounding the light-transmitting beryllium window. The external interface is provided with a connection structure for connecting the X-ray source. The connection structure includes multiple threaded holes evenly spaced around the external interface and studs for screwing into the threaded holes and for abutting against the outer wall of the X-ray source.

4. The fluorescence detector testing device as described in claim 3, characterized in that: The light source assembly includes an isotope radiation source connected to the second connector and aligned with the detector assembly; or The light source assembly includes a bracket connected to a second connector and an element target mounted on the bracket and aligned with the detector assembly.

5. The fluorescence detector testing device as described in claim 1, characterized in that: The detector assembly includes a bracket with a plug-in plate, a connector mounted on the plug-in plate, and a detector detachably mounted on the plug-in plate and electrically connected to the connector. The connector has multiple interfaces for adapting to different detectors, and the detector is located in the irradiation path of the light source assembly.

6. The fluorescence detector testing device as described in claim 5, characterized in that: It also includes a temperature control assembly, which includes an external temperature control unit disposed on the first connector for controlling the temperature within the test space and an internal temperature control unit disposed on the detector for controlling the temperature of the detector; the external temperature control unit includes a first temperature sensor mounted on the plug-in plate and a first cooler mounted on the bottom of the bracket; the external temperature control unit includes a second temperature sensor mounted on the detector and a second cooler mounted on the detector.

7. The fluorescence detector testing device as described in claim 6, characterized in that: It also includes a signal output module, which includes a signal amplification unit having a signal input terminal and a signal output terminal, a signal power supply unit connected to the signal output terminal, and a signal output bias unit connected to the signal power supply unit. The signal power supply unit has multiple connection terminals, and the signal output bias unit has multiple bias output terminals connected to the signal power supply unit.

8. The fluorescence detector testing device as described in claim 6, characterized in that: A first base is formed on the inner side of the box cover facing the test space; the first mounting structure includes a pressure block connected to the first base, the pressure block having a first cavity, a second cavity, and a third cavity sequentially connected along the thickness direction, the second cavity having grooves recessed on opposite sides relative to the first cavity and the third cavity, the first cavity, the second cavity, the grooves, and the third cavity all penetrating one side of the pressure block in a direction perpendicular to the thickness direction of the pressure block to form an open side; the plug-in upright plate extends out of the pressure block from the first cavity, the bracket is located in the second cavity and its two sides are engaged in the grooves, the first cooler is located in the third cavity, the pressure block is screwed with a screw for blocking the bracket from approaching the open side, and the bracket is configured as the first connector.

9. The fluorescence detector testing device as described in claim 2 or 4, characterized in that: A second base is formed on the inner side of the box cover facing the test space. The box cover has a hinge side for hinged to the box body. The second mounting structure includes a base plate connected to the second base, two positioning parts distributed opposite to each other on the base plate, and two sets of limiting posts. The two positioning parts and the two sets of limiting posts are respectively arranged on the four sides and enclose a positioning space with an adjustable distance from the detector assembly. The second connector includes a base plate for mounting in the positioning space.

10. The fluorescence detector testing device as described in claim 9, characterized in that: Both positioning units include a fixing block fixedly connected to a base plate, two connecting strips slidably mounted on the fixing block along the side near or away from the detector assembly, a spring piece connected to the base plate, and a push block connected to the two connecting strips. A first mounting cavity is formed in the fixing block for one side of the spring piece to abut against the connecting strip. Both connecting strips have a plurality of ratchet teeth formed sequentially along their length. The ratchet teeth are used to abut against the spring piece towards the side away from the positioning space and to slide and engage with the spring piece towards the positioning space. Both push blocks have a pressing surface that presses against the substrate and a limiting surface that blocks the substrate towards the side away from the base plate. The positioning unit also includes an unlocking post slidably mounted on the fixing block along the length direction perpendicular to the connecting strip. The unlocking post has a pressing end located outside the fixing block and a pressing end that disengages the spring piece from the ratchet teeth by pressing.

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