Pinpoint inspection device and system

Abstract

The application discloses a needle point testing device and system, the needle point testing device comprises a connection module, which is used for connecting a needle point fixture, receiving a power supply voltage of the needle point fixture, and transmitting a test signal of the needle point fixture; a testing circuit connected with the connection module, the testing circuit is used for receiving the power supply voltage to work, receiving the test signal, and judging whether functions corresponding to a to-be-tested probe and a to-be-tested radio frequency antenna connected with the needle point fixture are normal according to the test signal. The application can reduce the time consumption of probe testing, thereby improving the testing efficiency.

Description

Technical Field

[0001] This application relates to the field of needle point detection technology, specifically to a needle point inspection device and system. Background Technology

[0002] The existing probe inspection process for circuit boards involves first manually applying a blue film to the probes to be tested on the circuit board, then using a fixture to attach the blue film, and finally visually inspecting the probes using a manual microscope. Therefore, the inspection process is time-consuming and inefficient. Summary of the Invention

[0003] In view of this, this application provides a needle point inspection device and system to reduce the time consumption of probe inspection, thereby improving inspection efficiency. The technical solution of this application is as follows: The first aspect of this application provides a pinpoint testing device, comprising: a connection module for connecting to a pinpoint fixture, receiving a power supply voltage from the pinpoint fixture, and transmitting a test signal from the pinpoint fixture; and a testing circuit connected to the connection module, wherein the testing circuit board is used to receive the power supply voltage to operate, and to receive the test signal, and to determine whether the functions of the probe to be tested and the radio frequency antenna to be tested connected to the pinpoint fixture are normal based on the test signal.

[0004] In one embodiment of this application, the test signal includes a probe test signal and a radio frequency power signal. The connection module includes: a probe connection module connected to the main control circuit board of the needle point fixture, used to receive the probe test signal and transmit it to the inspection circuit; and a radio frequency connection module connected to the main control circuit board of the needle point fixture, used to receive the radio frequency power signal, convert the radio frequency power signal into a preset type signal and transmit it to the inspection circuit.

[0005] In one embodiment of this application, the radio frequency connection module includes: a radio frequency connector for connecting to radio frequency test ports of various frequency bands of the main control circuit board; a high-frequency switching switch connected to the radio frequency connector for receiving the radio frequency power signal of the corresponding radio frequency test port in response to a switching command; and a power detector connected to the high-frequency switching switch for receiving the radio frequency power signal, converting the radio frequency power signal into a preset type signal, and transmitting it to the test circuit.

[0006] In one embodiment of this application, the testing circuit, the high-frequency switching switch, and the power detector constitute a main testing circuit board, and the probe connection module and the radio frequency connector constitute a secondary testing circuit board. The main testing circuit board and the secondary testing circuit board are detachably connected.

[0007] In one embodiment of this application, the preset type signal is a voltage signal or a current signal, and the testing circuit includes a controller; the controller is used to receive the voltage signal or the current signal, and when it determines that the voltage signal is within a preset voltage range or the current signal is within a preset current range, it determines that the radio frequency antenna under test is normal.

[0008] In one embodiment of this application, the probe test signal includes a power supply probe signal, and the testing circuit further includes a first pull-down resistor and a second pull-down resistor; the first end of the first pull-down resistor is connected to the probe connection module, the second end of the first pull-down resistor is connected to the controller, the first end of the second pull-down resistor is connected to the second end of the first pull-down resistor, and the second end of the second pull-down resistor is grounded; the controller is used to determine that the power supply probe connected to the needle point fixture is faulty when the power supply probe signal is low, and to determine that the power supply probe is normal when the power supply probe signal is high.

[0009] In one embodiment of this application, the probe test signal includes a grounding probe signal, and the testing circuit further includes a pull-up resistor; the first end of the pull-up resistor is connected to the probe connection module and the controller, and the second end of the pull-up resistor is used to receive a preset voltage; the controller is used to determine that the grounding probe connected to the pin point fixture is faulty when the grounding probe signal is high, and to determine that the grounding probe is normal when the grounding probe signal is low.

[0010] In one embodiment of this application, the probe test signal includes a communication serial port probe signal; the main control circuit board is also connected to a host computer for receiving the communication serial port probe signal output by the host computer and forwarding it to the probe connection module; the controller is also used to determine that the communication serial port probe connected to the needle point fixture is faulty when the communication serial port probe signal is not received within a preset time, and to determine that the communication serial port probe is normal when the communication serial port probe signal is received.

[0011] A second aspect of this application provides a needle point inspection system, including a host computer, a needle point fixture, and a needle point inspection device as described in any one of claims 1 to 7; the host computer is connected to the needle point inspection device through the needle point fixture and is used to control the needle point inspection device and receive the inspection results of the needle point inspection device.

[0012] In one embodiment of this application, the pin point fixture includes a power adapter and a main control circuit board; the power adapter is used to receive mains power and convert the mains power into a supply voltage and transmit it to the main control circuit board; the main control circuit board is connected to the probe to be tested, the radio frequency antenna to be tested, and the host computer, and is used to transmit the test signals of the probe to be tested and the radio frequency antenna to be tested to the pin point inspection device, transmit the control signals of the host computer to the pin point inspection device, and transmit the inspection results of the pin point inspection device to the host computer.

[0013] In one embodiment of this application, the host computer includes a display interface for displaying the test results.

[0014] The pinpoint testing device of this application includes a connection module and a testing circuit. The connection module connects to the pinpoint fixture and receives test signals from the probes and RF antennas to be tested on the pinpoint fixture. The test signals are then transmitted to the testing circuit, which determines whether the functions of the probes and RF antennas to be tested are normal. This enables automatic testing of the probes and RF antennas to be tested, thereby improving the testing efficiency of probes and RF antennas to be tested in various devices. Attached Figure Description

[0015] Figure 1 This is a schematic block diagram of a needle point inspection device provided in an embodiment of this application.

[0016] Figure 2 This is a schematic block diagram of a connection module provided in an embodiment of this application.

[0017] Figure 3 This is a schematic block diagram of a radio frequency connection module provided in an embodiment of this application.

[0018] Figure 4 This is a schematic diagram of a circuit board for a pinpoint inspection device provided in an embodiment of this application.

[0019] Figure 5 This is a schematic block diagram of a testing circuit provided in an embodiment of this application.

[0020] Figure 6 This is a schematic block diagram of another verification circuit provided in an embodiment of this application.

[0021] Figure 7 This is a schematic block diagram of a needle point inspection system provided in an embodiment of this application.

[0022] Explanation of main component symbols 100-Pin point inspection device; 110-Connection module; 120-Inspection circuit; 111-Probe connection module; 112-RF connection module; 1121-RF connector; 1122-High frequency switching switch; 1123-Power detector; A-Main inspection circuit board; B-Auxiliary inspection circuit board; 121-Controller; R1-First resistor; R2-Second resistor; R3-Third resistor; 101-Pin point fixture; 102-Host computer; 1011-Power adapter; 1012-Main control circuit board. Detailed Implementation

[0023] It should be noted that in the embodiments of this application, "at least one" refers to one or more, and "more than one" refers to two or more. "And / or" describes the relationship between related objects, indicating that three relationships can exist. For example, A and / or B can represent: A existing alone, A and B existing simultaneously, or B existing alone, where A and B can be singular or plural. The terms "first," "second," "third," "fourth," etc. (if present) in the specification, claims, and drawings of this application are used to distinguish similar objects, not to describe a specific order or sequence.

[0024] It should also be noted that the methods disclosed in the embodiments of this application or the methods shown in the flowcharts include one or more steps for implementing the method. Without departing from the scope of the claims, the execution order of multiple steps can be interchanged, and some steps can also be deleted.

[0025] The existing probe inspection process for circuit boards involves first manually applying a blue film to the probes to be tested on the circuit board, then using a fixture to attach the blue film, and finally visually inspecting the probes using a manual microscope. Therefore, the inspection process is time-consuming and inefficient.

[0026] This application provides a needle point inspection device and system for reducing the time consumption of probe inspection, thereby improving inspection efficiency.

[0027] Please refer to Figure 1 , Figure 1 This is a schematic block diagram of a pinpoint inspection device provided in an embodiment of this application. The pinpoint inspection device 100 includes a connection module 110 and an inspection circuit 120.

[0028] In this embodiment, the connection module 110 is used to connect to the pin point fixture 101, receive the power supply voltage of the pin point fixture 101, and transmit the test signal of the pin point fixture 101. The verification circuit 120 is connected to the connection module 110. The verification circuit 120 is used to receive the power supply voltage and the test signal, and determines whether the functions of the probe to be tested and the RF antenna to be tested connected to the pin point fixture 101 are normal based on the test signal.

[0029] It is understood that the pin point inspection device 100 of this application is provided with a connection module 110 and an inspection circuit 120. The connection module 110 is connected to the pin point fixture 101 and receives the test signals of the probe to be tested and the radio frequency antenna to be tested on the pin point fixture 101. The test signals are transmitted to the inspection circuit 120 so that the inspection circuit 120 can determine whether the corresponding functions of the probe to be tested and the radio frequency antenna to be tested are normal, thereby realizing the automatic inspection of the probe to be tested and the radio frequency antenna to be tested, and thus improving the inspection efficiency of the probe to be tested and the radio frequency antenna to be tested of various devices.

[0030] In some embodiments, the test signals described above include probe test signals and radio frequency power signals. Please refer to [reference needed]. Figure 2 This is a schematic block diagram of a connection module 110, wherein the connection module 110 includes a probe connection module 111 and an RF connection module 112.

[0031] The probe connection module 111 is connected to the main control circuit board of the needle point fixture 101, and is used to receive the probe test signal and transmit it to the inspection circuit 120. The radio frequency connection module 112 is connected to the main control circuit board of the needle point fixture 101, and is used to receive the radio frequency power signal, convert the radio frequency power signal into a preset type signal, and transmit it to the inspection circuit 120.

[0032] In some embodiments, such as Figure 3 As shown, the radio frequency connection module 112 includes a radio frequency connector 1121, a high-frequency switching switch 1122, and a power detector 1123.

[0033] The RF connector 1121 is used to connect to the RF test ports of each frequency band of the main control circuit board. A high-frequency switching switch 1122 is connected to the RF connector 1121 and is used to receive the RF power signal from the corresponding RF test port in response to a switching command. The high-frequency switching switch 1122 can be a high-frequency multi-select switch. A power detector 1123 is connected to the high-frequency switching switch 1122 and is used to receive the RF power signal, convert the RF power signal into a preset type signal, and transmit it to the testing circuit 120.

[0034] In some embodiments, such as Figure 4 and Figure 5 As shown, the above-mentioned test circuit 120, the high-frequency switching switch 1122 and the power detector 1123 constitute the main test circuit board A, and the probe connection module 111 and the radio frequency connector 1121 constitute the auxiliary test circuit board B. The main test circuit board A and the auxiliary test circuit board B are detachably connected.

[0035] It is understood that in this embodiment, the pin point inspection device 100 is designed as a main inspection circuit board A and an auxiliary inspection circuit board B that can be set separately. The probe connection module 111 and the radio frequency connector 1121 are set on the auxiliary inspection circuit board B. When changing the probe to be tested and the radio frequency antenna to be tested with different structures, only the auxiliary inspection circuit board B needs to be replaced, thereby reducing the testing cost.

[0036] In some embodiments, the preset type signal converted by the power detector 1123 is a voltage signal or a current signal. The test circuit 120 includes a controller 121, which is used to receive the voltage signal or the current signal, and determine that the radio frequency antenna under test is normal when it determines that the voltage signal is within a preset voltage range or the current signal is within a preset current range.

[0037] In some embodiments, the probe test signals described above include power supply probe signals, such as... Figure 5 As shown, the test circuit 120 also includes a first pull-down resistor R1 and a second pull-down resistor R2.

[0038] In this configuration, the first end of the first pull-down resistor R1 is connected to the probe connection module 111, the second end of the first pull-down resistor R1 is connected to the controller 121, the first end of the second pull-down resistor R2 is connected to the second end of the first pull-down resistor R1, and the second end of the second pull-down resistor R2 is grounded. The controller 121 is used to determine that the power supply probe connected to the needle point fixture 101 is faulty when the power supply probe signal is low, and to determine that the power supply probe is normal when the power supply probe signal is high.

[0039] In some embodiments, the probe test signals described above include grounding probe signals, such as... Figure 6 As shown, the test circuit 120 also includes a pull-up resistor R3.

[0040] The first end of the pull-up resistor R3 is connected to the probe connection module 111 and the controller 121, and the second end of the pull-up resistor R3 is used to receive a preset voltage V. The controller 121 is used to determine that the grounding probe connected to the pin point fixture 101 is faulty when the grounding probe signal is high, and to determine that the grounding probe is normal when the grounding probe signal is low.

[0041] Please refer to Figure 7 , Figure 7 This is a schematic block diagram of a needle point inspection system provided in an embodiment of this application. The needle point inspection system 10 includes a host computer 102, a needle point fixture 101, and a needle point inspection device 100 of any of the above embodiments.

[0042] In this embodiment of the application, the host computer 102 is connected to the needle point inspection device 100 through the needle point fixture 101, and is used to control the needle point inspection device 100 and receive the inspection results of the needle point inspection device 100.

[0043] The pinpoint inspection device 100 includes a connection module 110 and an inspection circuit 120. The connection module 110 includes a probe connection module 111 and an RF connection module 112. The RF connection module 112 includes an RF connector 1121, a high-frequency switching switch 1122, and a power detector 1123. Detailed functional descriptions of each of the above modules can be found in the corresponding sections of the foregoing embodiments, and will not be repeated here.

[0044] In some embodiments, the pinpoint fixture 101 includes a power adapter 1011 and a main control circuit board 1012. The power adapter 1011 receives mains power and converts it into a supply voltage, which is then transmitted to the main control circuit board 1012. The main control circuit board 1012 is connected to the probe under test, the RF antenna under test, and the host computer 102, and is used to transmit the test signals of the probe under test and the RF antenna under test to the pinpoint inspection device 100, transmit the control signals of the host computer 102 to the pinpoint inspection device 100, and transmit the inspection results of the pinpoint inspection device 100 to the host computer 102.

[0045] In some embodiments, the host computer 102 includes a display interface for displaying the test results.

[0046] In this embodiment, the probe test signal also includes a communication serial port probe signal. The main control circuit board 1012 is also used to receive the communication serial port probe signal output by the host computer 102 and forward it to the probe connection module 111. The controller of the inspection circuit 120 is also used to determine that the communication serial port probe connected to the needle point fixture 101 is faulty when no communication serial port probe signal is received within a preset time, and to determine that the communication serial port probe is normal when the communication serial port probe signal is received.

[0047] It is understood that the beneficial effects of the needle point inspection system 10 described above can be referred to the beneficial effects of the needle point inspection device in the foregoing embodiments, and will not be repeated here.

[0048] The embodiments described above are merely preferred embodiments of this application and are not intended to limit the scope of this application. Any modifications and improvements made by those skilled in the art to the technical solutions of this application without departing from the spirit of this application should fall within the protection scope defined by the claims of this application.

Claims

1. A needle point inspection device characterized by, include: A connection module is used to connect to a needle point fixture, receive the power supply voltage of the needle point fixture, and transmit the test signal of the needle point fixture. A testing circuit is connected to the connection module. The testing circuit is used to receive the power supply voltage to operate and to receive the test signal. Based on the test signal, it determines whether the functions of the probe to be tested and the radio frequency antenna to be tested connected to the pin point fixture are normal.

2. The needle point inspection device as described in claim 1, characterized in that, The test signals include probe test signals and radio frequency power signals, and the connection module includes: The probe connection module is connected to the main control circuit board of the needle point fixture and is used to receive the probe test signal and transmit it to the inspection circuit. The radio frequency connection module is connected to the main control circuit board of the needle point fixture, and is used to receive the radio frequency power signal, convert the radio frequency power signal into a preset type signal and transmit it to the inspection circuit.

3. The needle point inspection device as described in claim 2, characterized in that, The radio frequency connection module includes: RF connectors are used to connect to the RF test ports of various frequency bands on the main control circuit board. A high-frequency switching switch, connected to the RF connector, is used to receive the RF power signal of the corresponding RF test port in response to a switching command; A power detector, connected to the high-frequency switching switch, is used to receive the radio frequency power signal, convert the radio frequency power signal into the preset type signal, and transmit it to the testing circuit.

4. The needle point inspection device as described in claim 3, characterized in that, The testing circuit, the high-frequency switching switch, and the power detector constitute the main testing circuit board, and the probe connection module and the radio frequency connector constitute the auxiliary testing circuit board. The main testing circuit board and the auxiliary testing circuit board are detachably connected.

5. The needle point inspection device as described in claim 2, characterized in that, The preset type signal is a voltage signal or a current signal, and the testing circuit includes a controller; The controller is used to receive the voltage signal or the current signal, and when it determines that the voltage signal is within a preset voltage range or the current signal is within a preset current range, it determines that the radio frequency antenna under test is normal.

6. The needle point inspection device as described in claim 5, characterized in that, The probe test signal includes a power supply probe signal, and the test circuit further includes a first pull-down resistor and a second pull-down resistor; The first end of the first pull-down resistor is connected to the probe connection module, the second end of the first pull-down resistor is connected to the controller, the first end of the second pull-down resistor is connected to the second end of the first pull-down resistor, and the second end of the second pull-down resistor is grounded. The controller is used to determine that the power supply probe connected to the needle point fixture is faulty when the power supply probe signal is low, and to determine that the power supply probe is normal when the power supply probe signal is high.

7. The needle point inspection device as described in claim 5, characterized in that, The probe test signal includes a grounding probe signal, and the test circuit also includes a pull-up resistor; The first end of the pull-up resistor is connected to the probe connection module and the controller, and the second end of the pull-up resistor is used to receive a preset voltage; The controller is used to determine that the grounding probe connected to the pin point fixture is faulty when the grounding probe signal is high, and to determine that the grounding probe is normal when the grounding probe signal is low.

8. The needle point inspection device as described in claim 5, characterized in that, The probe test signal includes a communication serial port probe signal; the main control circuit board is also connected to the host computer to receive the communication serial port probe signal output by the host computer and forward it to the probe connection module. The controller is also used to determine that the communication serial port probe connected to the needle point fixture is faulty when the communication serial port probe signal is not received within a preset time, and to determine that the communication serial port probe is normal when the communication serial port probe signal is received.

9. A needle point inspection system, characterized in that, Includes a host computer, a needle point fixture, and a needle point inspection device as described in any one of claims 1 to 8; The host computer is connected to the needle point inspection device through the needle point fixture, and is used to control the needle point inspection device and receive the inspection results of the needle point inspection device.

10. The needle point inspection system as described in claim 9, characterized in that, The needle point fixture includes a power adapter and a main control circuit board; The power adapter is used to receive AC power and convert the AC power into a power supply voltage to be transmitted to the main control circuit board; The main control circuit board is connected to the probe under test, the RF antenna under test, and the host computer, and is used to transmit the test signals of the probe under test and the RF antenna under test to the pin point inspection device, transmit the control signals of the host computer to the pin point inspection device, and transmit the inspection results of the pin point inspection device to the host computer.

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