Method and device for detecting rotor winding inter-turn short circuit

Abstract

The application relates to the technical field of electrical equipment fault diagnosis, in particular to a rotor winding inter-turn short circuit identification method and device, wherein the method comprises the following steps: obtaining test data of a to-be-tested unit under a test voltage application state; based on the test data, impedance data of the to-be-tested unit under the action of different working frequencies is calculated; feature parameters in the impedance data are extracted, and the inductance variation coefficient, impedance feature ratio and inductance frequency variation coefficient of the to-be-tested unit are calculated according to the feature parameters, so as to determine the inter-turn short circuit probability of the to-be-tested unit based on the inductance variation coefficient, impedance feature ratio and inductance frequency variation coefficient. Therefore, the problems in the prior art, such as low sensitivity, difficulty in finding early or slight short circuit faults, heavy equipment, poor portability, low field test efficiency, single diagnosis dimension, influence of test conditions, low fault tolerance and possible misjudgment or omission, are solved.

Description

Technical Field

[0001] This application relates to the field of electrical equipment fault diagnosis technology, and in particular to a method and apparatus for identifying inter-turn short circuits in rotor windings. Background Technology

[0002] In related technologies, the process of implementing the power frequency AC impedance test for inter-turn short circuit of synchronous generator rotor winding is as follows: According to industry standards, in the state of rotor stationary or rotating, power frequency (50Hz) AC voltage is applied to the winding using equipment such as voltage regulator and rotor AC impedance tester. The voltage, current and active power are measured and the AC impedance and power loss are calculated. By comparing with historical data or data of the same type of unit, if the impedance value drops significantly (usually >3-10%), it is judged that there may be an inter-turn short circuit.

[0003] However, the related technologies have drawbacks such as low sensitivity, difficulty in detecting early or minor short-circuit faults, bulky equipment, poor portability and low efficiency in field testing, single diagnostic dimensions, susceptibility to test conditions, low fault tolerance and potential for misjudgment or missed judgment, which urgently need to be improved. Summary of the Invention

[0004] This application provides a method and apparatus for identifying inter-turn short circuits in rotor windings, in order to solve the problems of low sensitivity, difficulty in detecting early or minor short circuit faults, bulky equipment, poor portability and low on-site testing efficiency, single diagnostic dimension, susceptibility to test conditions, low fault tolerance and possible misjudgment or missed judgment in related technologies.

[0005] The first aspect of this application provides a method for identifying inter-turn short circuits in rotor windings, comprising the following steps: acquiring test data of the unit under test under a test voltage applied state; calculating impedance data of the unit under test at different operating frequencies based on the test data; extracting characteristic parameters from the impedance data, and calculating the inductance variation coefficient, impedance characteristic ratio, and inductance frequency variation coefficient of the unit under test based on the characteristic parameters, so as to determine the inter-turn short circuit probability of the unit under test based on the inductance variation coefficient, the impedance characteristic ratio, and the inductance frequency variation coefficient.

[0006] The above technical solution allows for the calculation of impedance data of the unit under test (TUD) at different operating frequencies based on the acquired test data under the applied test voltage. Characteristic parameters are then extracted from the impedance data, and the corresponding inductance variation coefficient, impedance characteristic ratio, and inductance frequency variation coefficient are calculated to determine the inter-turn short-circuit probability of the TUD. By directly collecting test data, calculating impedance at different frequencies, and extracting multiple characteristic parameters to comprehensively determine the inter-turn short-circuit probability, the reliable identification and probability assessment of inter-turn short-circuit faults in the TUD can be achieved accurately, quantitatively, and efficiently.

[0007] Optionally, in one embodiment of this application, determining the inter-turn short-circuit probability of the unit under test based on the inductance variation coefficient, the impedance characteristic ratio, and the inductance frequency variation coefficient includes: if the inductance variation coefficient is greater than a first preset threshold, then determining the abnormal result of the unit under test as an inductance consistency abnormality based on the inductance variation coefficient; if the impedance characteristic ratio is less than a second preset threshold, then determining the abnormal result as a high-frequency sensitivity characteristic abnormality based on the impedance characteristic ratio; if the inductance frequency variation coefficient is greater than a third preset threshold, then determining the abnormal result as an inductance frequency variation characteristic abnormality based on the inductance frequency variation coefficient; and determining the inter-turn short-circuit probability based on the inductance consistency abnormality, the high-frequency sensitivity characteristic abnormality, and / or the inductance frequency variation characteristic abnormality.

[0008] The above technical solution allows for the identification of an abnormal result as an inductor consistency anomaly when the inductor coefficient of variation is greater than a first preset threshold; an abnormal result as a high-frequency sensitivity anomaly when the impedance characteristic ratio is less than a second preset threshold; and an abnormal result as an inductor frequency variation anomaly when the inductor frequency variation coefficient is greater than a third preset threshold. Based on these three anomalies, the corresponding inter-turn short-circuit probabilities are calculated. By comparing the inductor coefficient of variation, impedance characteristic ratio, and inductor frequency variation coefficient with the corresponding preset thresholds, different types of anomalies can be accurately located, and the inter-turn short-circuit probabilities can be comprehensively determined. This approach enables detailed fault type classification, clear judgment criteria, and more accurate and reliable evaluation results.

[0009] Optionally, in one embodiment of this application, before acquiring test data of the unit under test under a test voltage applied state, the method further includes: acquiring the operating frequency of the initial test voltage; if the operating frequency is greater than a preset threshold, determining the test voltage based on the initial test voltage; if the operating frequency is less than or equal to the preset threshold, adjusting the operating frequency according to a preset strategy until the operating frequency is greater than the preset threshold, obtaining an adjusted test voltage, and determining the test voltage based on the adjusted test voltage.

[0010] The above technical solution allows for the determination of whether the operating frequency of the initial test voltage is greater than a preset threshold before acquiring test data. If it is, the initial test voltage is used as the test voltage. Otherwise, the operating frequency is adjusted according to a preset strategy until it exceeds the preset threshold, and the adjusted test voltage is used as the test voltage. By first determining and dynamically adjusting the operating frequency to above the threshold before determining the test voltage, the test conditions can be effectively guaranteed to meet the requirements, thereby improving the validity and reliability of subsequent test data.

[0011] Optionally, in one embodiment of this application, the formula for calculating the inductance variation coefficient may be, but is not limited to, the following: , in, This indicates the number of test frequency points. Indicates the serial number of the test frequency point. This indicates the frequency of the test frequency point. Indicates the equivalent inductance. Indicates the standard deviation of inductance; The formula for calculating the impedance characteristic ratio can be, but is not limited to, the following: , in, This represents the modulus of the measured high-frequency impedance. This represents the modulus of the measured low-frequency test impedance. This represents a reference value for the high-frequency test impedance mode under healthy winding conditions. This indicates the reference value for the low-frequency test impedance mode under the healthy condition of the winding; The formula for calculating the inductor frequency conversion coefficient can be, but is not limited to, the following: , in, This represents the fitted parameters and has no specific meaning.

[0012] The above technical solutions clearly define the specific calculation methods for inductance variation coefficient, impedance characteristic ratio, and inductance frequency variation coefficient. Through multi-parameter quantitative calculations, standardized and quantifiable data support is provided for inter-turn short-circuit probability assessment, enabling multi-dimensional, quantitative, and highly discriminative accurate assessment of the unit's inter-turn short-circuit status, and significantly improving the reliability and accuracy of fault identification.

[0013] Optionally, in one embodiment of this application, the method further includes: identifying the actual probability interval of the inter-turn short circuit probability; determining that the unit under test has an inter-turn short circuit fault when the actual probability interval is a first interval; determining that the unit under test has a potential inter-turn short circuit hazard when the actual probability interval is a second interval; and determining that the unit under test has no inter-turn short circuit fault when the actual probability interval is a third interval.

[0014] The above technical solution can determine that the unit under test has an inter-turn short circuit fault when the actual probability interval of the inter-turn short circuit probability is in the first interval; determine that the unit under test has a potential inter-turn short circuit hazard when the actual probability interval is in the second interval; and determine that the unit under test has no inter-turn short circuit fault when the actual probability interval is in the third interval. By dividing the inter-turn short circuit probability into intervals, the system can achieve graded, clear, and quantitative judgment of the three states of fault, hazard, and normal, thereby improving the accuracy and practicality of fault identification.

[0015] A second aspect of this application provides a device for identifying inter-turn short circuits in rotor windings, comprising: a first acquisition module for acquiring test data of a unit under test under a test voltage applied state; a calculation module for calculating impedance data of the unit under test at different operating frequencies based on the test data; and a first determination module for extracting characteristic parameters from the impedance data and calculating the inductance variation coefficient, impedance characteristic ratio, and inductance frequency variation coefficient of the unit under test based on the characteristic parameters, so as to determine the inter-turn short circuit probability of the unit under test based on the inductance variation coefficient, the impedance characteristic ratio, and the inductance frequency variation coefficient.

[0016] The above technical solution allows for the calculation of impedance data of the unit under test (TUD) at different operating frequencies based on the acquired test data under the applied test voltage. Characteristic parameters are then extracted from the impedance data, and the corresponding inductance variation coefficient, impedance characteristic ratio, and inductance frequency variation coefficient are calculated to determine the inter-turn short-circuit probability of the TUD. By directly collecting test data, calculating impedance at different frequencies, and extracting multiple characteristic parameters to comprehensively determine the inter-turn short-circuit probability, the reliable identification and probability assessment of inter-turn short-circuit faults in the TUD can be achieved accurately, quantitatively, and efficiently.

[0017] Optionally, in one embodiment of this application, the first determining module includes: a first determining unit, configured to determine, based on the inductance variation coefficient, that the abnormal result of the unit under test is an inductance consistency abnormality when the inductance variation coefficient is greater than a first preset threshold; a second determining unit, configured to determine, based on the impedance characteristic ratio, that the abnormal result is a high-frequency sensitivity characteristic abnormality when the impedance characteristic ratio is less than a second preset threshold; a third determining unit, configured to determine, based on the inductance frequency variation coefficient, that the abnormal result is an inductance frequency variation characteristic abnormality when the inductance frequency variation coefficient is greater than a third preset threshold; and a fourth determining unit, configured to determine the inter-turn short circuit probability based on the inductance consistency abnormality, the high-frequency sensitivity characteristic abnormality, and / or the inductance frequency variation characteristic abnormality.

[0018] The above technical solution allows for the identification of an abnormal result as an inductor consistency anomaly when the inductor coefficient of variation is greater than a first preset threshold; an abnormal result as a high-frequency sensitivity anomaly when the impedance characteristic ratio is less than a second preset threshold; and an abnormal result as an inductor frequency variation anomaly when the inductor frequency variation coefficient is greater than a third preset threshold. Based on these three anomalies, the corresponding inter-turn short-circuit probabilities are calculated. By comparing the inductor coefficient of variation, impedance characteristic ratio, and inductor frequency variation coefficient with the corresponding preset thresholds, different types of anomalies can be accurately located, and the inter-turn short-circuit probabilities can be comprehensively determined. This approach enables detailed fault type classification, clear judgment criteria, and more accurate and reliable evaluation results.

[0019] Optionally, in one embodiment of this application, it further includes: a second acquisition module, configured to acquire the operating frequency of the initial test voltage before acquiring test data of the unit under test in the test voltage application state; a second determination module, configured to determine the test voltage based on the initial test voltage when the operating frequency is greater than a preset threshold; and a third determination module, configured to adjust the operating frequency according to a preset strategy until the operating frequency is greater than the preset threshold when the operating frequency is less than or equal to the preset threshold, to obtain an adjusted test voltage, and to determine the test voltage based on the adjusted test voltage.

[0020] The above technical solution allows for the determination of whether the operating frequency of the initial test voltage is greater than a preset threshold before acquiring test data. If it is, the initial test voltage is used as the test voltage. Otherwise, the operating frequency is adjusted according to a preset strategy until it exceeds the preset threshold, and the adjusted test voltage is used as the test voltage. By first determining and dynamically adjusting the operating frequency to above the threshold before determining the test voltage, the test conditions can be effectively guaranteed to meet the requirements, thereby improving the validity and reliability of subsequent test data.

[0021] Optionally, in one embodiment of this application, the formula for calculating the inductance variation coefficient may be, but is not limited to, the following: , in, This indicates the number of test frequency points. Indicates the serial number of the test frequency point. This indicates the frequency of the test frequency point. Indicates the equivalent inductance. Indicates the standard deviation of inductance; The formula for calculating the impedance characteristic ratio can be, but is not limited to, the following: , in, This represents the modulus of the measured high-frequency impedance. This represents the modulus of the measured low-frequency test impedance. This represents a reference value for the high-frequency test impedance mode under healthy winding conditions. This indicates the reference value for the low-frequency test impedance mode under the healthy condition of the winding; The formula for calculating the inductor frequency conversion coefficient can be, but is not limited to, the following: , in, This represents the fitted parameters and has no specific meaning.

[0022] The above technical solutions clearly define the specific calculation methods for inductance variation coefficient, impedance characteristic ratio, and inductance frequency variation coefficient. Through multi-parameter quantitative calculations, standardized and quantifiable data support is provided for inter-turn short-circuit probability assessment, enabling multi-dimensional, quantitative, and highly discriminative accurate assessment of the unit's inter-turn short-circuit status, and significantly improving the reliability and accuracy of fault identification.

[0023] Optionally, in one embodiment of this application, it further includes: an identification module, used to identify the actual probability interval of the inter-turn short circuit probability; a fourth determination module, used to determine that the unit under test has an inter-turn short circuit fault when the actual probability interval is a first interval; a fifth determination module, used to determine that the unit under test has a potential inter-turn short circuit hazard when the actual probability interval is a second interval; and a sixth determination module, used to determine that the unit under test has no inter-turn short circuit fault when the actual probability interval is a third interval.

[0024] The above technical solution can determine that the unit under test has an inter-turn short circuit fault when the actual probability interval of the inter-turn short circuit probability is in the first interval; determine that the unit under test has a potential inter-turn short circuit hazard when the actual probability interval is in the second interval; and determine that the unit under test has no inter-turn short circuit fault when the actual probability interval is in the third interval. By dividing the inter-turn short circuit probability into intervals, the system can achieve graded, clear, and quantitative judgment of the three states of fault, hazard, and normal, thereby improving the accuracy and practicality of fault identification.

[0025] A third aspect of this application provides an electronic device, including: a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein the processor executes the program to implement the rotor winding inter-turn short circuit identification method as described in the above embodiments.

[0026] A fourth aspect of this application provides a computer-readable storage medium storing a computer program that, when executed by a processor, implements the above-described method for identifying inter-turn short circuits in rotor windings.

[0027] A fifth aspect of this application provides a computer program product, including a computer program that, when executed, implements the above-described method for identifying inter-turn short circuits in rotor windings.

[0028] This application embodiment can calculate the impedance data of the unit under test (UDT) at different operating frequencies based on the obtained test data of the UDT under the applied test voltage, and extract the characteristic parameters from the impedance data. Then, it calculates the corresponding inductance coefficient of variation, impedance characteristic ratio, and inductance frequency coefficient to determine the inter-turn short-circuit probability of the UDT. By directly collecting test data, calculating the impedance at different frequencies, and extracting multiple characteristic parameters to comprehensively determine the inter-turn short-circuit probability, it can accurately, quantitatively, and efficiently achieve reliable identification and probability assessment of inter-turn short-circuit faults in the UDT. Therefore, it solves the problems of low sensitivity, difficulty in detecting early or minor short-circuit faults, bulky equipment, poor portability and low on-site testing efficiency, single diagnostic dimensions, susceptibility to test conditions, low fault tolerance, and potential for misjudgment or missed judgment in related technologies.

[0029] Additional aspects and advantages of this application will be set forth in part in the description which follows, and in part will be obvious from the description, or may be learned by practice of this application. Attached Figure Description

[0030] The above and / or additional aspects and advantages of this application will become apparent and readily understood from the following description of the embodiments taken in conjunction with the accompanying drawings, wherein: Figure 1 This is a flowchart illustrating a method for identifying inter-turn short circuits in rotor windings according to an embodiment of this application; Figure 2 This is a flowchart illustrating the working principle of a rotor winding inter-turn short circuit identification method according to an embodiment of this application; Figure 3 This is a block diagram of a rotor winding inter-turn short circuit identification device provided according to an embodiment of this application; Figure 4 This is a schematic diagram of the structure of an electronic device provided according to an embodiment of this application. Detailed Implementation

[0031] The embodiments of this application are described in detail below. Examples of these embodiments are shown in the accompanying drawings, wherein the same or similar reference numerals denote the same or similar elements or elements having the same or similar functions throughout. The embodiments described below with reference to the accompanying drawings are exemplary and intended to explain this application, and should not be construed as limiting this application.

[0032] In related technologies, inter-turn short-circuit testing of synchronous generator rotor windings mainly relies on power frequency (50Hz) AC impedance testing. However, in these technologies, the detection sensitivity at power frequency is low, and the impedance change is not obvious due to the small inductive reactance of the winding inter-turn short circuit, making it difficult to detect early or minor short-circuit faults. Furthermore, power frequency test transformers are bulky, have poor portability, and low on-site testing efficiency due to the need for large iron cores and numerous coils. In addition, relying solely on the absolute value of impedance at a single frequency for judgment also has problems such as limited diagnostic dimensions, susceptibility to test conditions, low fault tolerance, and the possibility of misjudgment or missed judgment.

[0033] To address the aforementioned issues, this application's embodiments increase the test frequency to the 150-500Hz high-frequency range, enabling the main component of inductive reactance to amplify impedance changes caused by inductance variations, thereby detecting weak fault signals and achieving predictive maintenance. Furthermore, the fundamental frequency of the test signal is shifted to a high-frequency region with less power frequency interference, and pure, stable data is obtained through hardware filtering and digital signal processing, improving test reliability and accuracy. Multi-frequency testing and relational diagnostic logic are introduced to analyze the intrinsic relationships between impedance data at multiple high-frequency points, enhancing diagnostic certainty and reliability. Moreover, the high-frequency testing reduces the required magnetic flux and core size, and the use of high-frequency switching power supply technology enables device miniaturization, thereby improving the flexibility and efficiency of on-site testing.

[0034] The following description, with reference to the accompanying drawings, describes a method and apparatus for identifying inter-turn short circuits in rotor windings according to embodiments of this application. Addressing the shortcomings mentioned in the background art, such as low sensitivity, difficulty in detecting early or minor short circuit faults, bulky and inconvenient equipment with low on-site testing efficiency, limited diagnostic dimensions, susceptibility to test conditions, low fault tolerance, and potential for misjudgment or missed detection, this application provides a method for identifying inter-turn short circuits in rotor windings. In this method, based on the test data of the unit under test (UTD) under the applied test voltage, the impedance data of the UTD under different operating frequencies is calculated, and characteristic parameters are extracted from the impedance data. Then, the corresponding inductance variation coefficient, impedance characteristic ratio, and inductance frequency variation coefficient are calculated to determine the inter-turn short circuit probability of the UTD. By directly collecting test data, calculating impedance at different frequencies, and extracting multiple characteristic parameters to comprehensively determine the inter-turn short circuit probability, this method can accurately, quantitatively, and efficiently achieve reliable identification and probability assessment of inter-turn short circuit faults in the UTD. This solves the problems of low sensitivity, difficulty in detecting early or minor short-circuit faults, bulky equipment, poor portability and low on-site testing efficiency, single diagnostic dimensions, susceptibility to test conditions, low fault tolerance and potential for misjudgment or missed judgment in related technologies.

[0035] Specifically, Figure 1 This is a flowchart of a method for identifying inter-turn short circuits in a rotor winding according to an embodiment of this application.

[0036] like Figure 1As shown, the method for identifying inter-turn short circuits in the rotor winding includes the following steps: In step S101, test data of the unit under test under test when the test voltage is applied is obtained.

[0037] It is understood that, in the embodiments of this application, the unit under test can be understood as an integral unit of a rotating electric motor that includes core components such as stator, rotor, and rotor winding, and is capable of electromagnetic energy conversion or power output under voltage excitation. It may include, but is not limited to, generators, electric motors, synchronous units, asynchronous units, etc., and this application does not impose specific limitations.

[0038] Test voltage can be understood as the specified voltage applied to the unit under test to achieve the test purpose. It can be rated voltage, test voltage, AC / DC voltage, etc. This application does not impose specific limitations.

[0039] Test data can be understood as electrical parameters, operating parameters, measurement results, etc. generated and collected by the unit under test under test conditions, such as the voltage value at both ends of the rotor winding, the current value flowing through the winding, and the active power consumed, etc. This application does not impose specific limitations.

[0040] As one possible implementation method, embodiments of this application can obtain the corresponding test data of the unit under test after applying a test voltage to the unit under test.

[0041] Optionally, in one embodiment of this application, before acquiring test data of the unit under test under the test voltage applied state, the method further includes: acquiring the operating frequency of the initial test voltage; if the operating frequency is greater than a preset threshold, determining the test voltage based on the initial test voltage; if the operating frequency is less than or equal to the preset threshold, adjusting the operating frequency according to a preset strategy until the operating frequency is greater than the preset threshold, obtaining the adjusted test voltage, and determining the test voltage based on the adjusted test voltage.

[0042] It is understood that the embodiments of this application are based on the impedance formula. It can be seen that, To test the operating frequency of the voltage, For the resistance item, For winding resistance, For impedance, For winding inductance, when Improve to make Much larger At times (for example, At this point, the impedance can be approximated as... If an inter-turn short circuit occurs in the unit under test, then Decrease impedance change .because The same change in inductance is multiplied (e.g., from 50Hz to 300Hz, amplified 6 times). The amount of impedance change caused at high frequencies The signal is magnified proportionally. Therefore, weak fault signals that would otherwise be drowned out by noise at power frequency become clearly distinguishable at high frequency, fundamentally improving the detection sensitivity of early faults.

[0043] Therefore, in this embodiment of the application, before obtaining the test data of the unit under test, the operating frequency of the initial test voltage can be obtained first. If the operating frequency is greater than a preset threshold, the initial test voltage is used as the test voltage; otherwise, the operating frequency is adjusted to be greater than the preset threshold according to a preset strategy to obtain the adjusted test voltage, and the adjusted test voltage is used as the test voltage. The preset threshold and preset strategy can be set by those skilled in the art according to actual conditions, and this application does not impose specific limitations.

[0044] For example, in this application embodiment, the preset threshold can be set to 50Hz. That is, this application embodiment can apply a series of AC test voltages with operating frequencies higher than 50Hz to the generator rotor winding in a stationary or rotating state. The test voltage includes at least two different frequency points, and preferably the frequency range is between 300Hz and 500Hz, such as 300Hz, 350Hz, 400Hz, 450Hz, 500Hz, etc., without specific limitations in this application.

[0045] Furthermore, in embodiments of this application, when the operating frequency of the test voltage is 30Hz or less than 50Hz, the operating frequency can be adjusted according to a preset strategy until the operating frequency is greater than 50Hz, thereby determining the corresponding test voltage.

[0046] It should be noted that, according to the law of electromagnetic induction To generate sufficient test magnetic flux (thus generating a measurable induced voltage or current), in voltage and number of turns Under certain conditions, the required magnetic flux With frequency Inversely proportional: If To increase, for example, from 50Hz to 300Hz, the required magnetic flux When the value is reduced to 50 / 300 = 1 / 6 of its original value, magnetic flux is generated. The required excitation ampere-turns (A·N) and core cross-sectional area are correspondingly reduced. Therefore, the high-frequency power source in this embodiment can adopt a small-volume ferrite core or a solid-state transformer based on a wide bandgap semiconductor, etc. Theoretically, the weight and volume of the entire excitation power supply module can be reduced by 80% compared to the power frequency test transformer (taking a 400Hz solid-state transformer as an example, the volume can be reduced to 1 / 3), thereby achieving portable integration of the entire system.

[0047] In step S102, based on the test data, the impedance data of the unit under test under different operating frequencies are calculated.

[0048] It is understood that, in the embodiments of this application, impedance data may include, but is not limited to, the AC impedance value, resistance, inductive reactance or equivalent inductance of the rotor winding at each operating frequency, and this application does not impose specific limitations.

[0049] For example, embodiments of this application can obtain a set of impedance data at different operating frequencies. Different influencing factors have varying degrees of frequency dependence: changes in winding inductance affect impedance values ​​at all frequency points, and the degree of influence at high frequencies is significantly positively correlated with the operating frequency. Winding resistance is mainly affected by non-electrical quantities such as temperature, and changes in winding resistance have a similar impact on impedance values ​​at all frequency points, with a weak correlation to the operating frequency.

[0050] In step S103, characteristic parameters are extracted from the impedance data, and the inductance variation coefficient, impedance characteristic ratio, and inductance frequency variation coefficient of the unit under test are calculated based on these parameters. The inter-turn short-circuit probability of the unit under test is then determined based on these parameters. The formula for calculating the inductance variation coefficient may be, but is not limited to, the following: , in, This indicates the number of test frequency points. Indicates the serial number of the test frequency point. This indicates the frequency of the test frequency point. Indicates the equivalent inductance. Indicates the standard deviation of inductance; The formula for calculating the impedance characteristic ratio can be, but is not limited to, the following: , in, This represents the modulus of the measured high-frequency impedance. This represents the modulus of the measured low-frequency test impedance. This represents a reference value for the high-frequency test impedance mode under healthy winding conditions. This indicates the reference value for the low-frequency test impedance mode under the healthy condition of the winding; The formula for calculating the inductance frequency conversion coefficient can be, but is not limited to, the following: , in, This represents the fitted parameters and has no specific meaning.

[0051] In some embodiments, the present application can extract characteristic parameters from impedance data and calculate the inductance variation coefficient, impedance characteristic ratio and inductance frequency variation coefficient of the unit under test based on the characteristic parameters, thereby determining the inter-turn short circuit probability of the unit under test.

[0052] For example, embodiments of this application can analyze impedance data. The overall relationship in the above-mentioned mechanisms is used to construct a multi-dimensional quantitative feature vector that can explicitly characterize the differences in the above-mentioned mechanisms. This vector may include, but is not limited to, inductance variation coefficient, impedance characteristic ratio, and inductance frequency variation coefficient. This application does not impose any specific limitations.

[0053] The inductance variation coefficient can be calculated from the equivalent inductance and the inductance standard deviation. It is used to characterize the dispersion and consistency level of the rotor winding inductance parameters of the unit under test. Specifically, it can be described as follows: First, calculate the equivalent inductance. The formula for this calculation can be, but is not limited to, the following: , Then calculate the standard deviation of the inductance. The formula for this calculation can be, but is not limited to, the following: , The coefficient of variation of inductance can then be obtained, and its calculation formula can be, but is not limited to, the following: , The impedance characteristic ratio reflects the impedance variation characteristics of the winding at high frequencies, characterizing the high-frequency sensitivity of the winding. It can be obtained from the ratio of low-frequency impedance to high-frequency impedance characteristic. Resistance changes have a similar impact on impedance at all frequencies, while inductance changes have a greater impact at high frequencies. A lower frequency is chosen. (200Hz) and higher frequencies The impedance modulus (500Hz) is used to obtain the impedance characteristic ratio, which can be calculated using, but is not limited to, the following formula: , Furthermore, the embodiments of this application provide for and Perform linear regression. This leads to the inductance frequency coefficient, which characterizes the degree of inductance variation with the test frequency. Its calculation formula can be, but is not limited to, the following: , Furthermore, in embodiments of this application, the inductance variation coefficient, impedance characteristic ratio, and inductance frequency variation coefficient can be combined to form a multidimensional quantized feature vector. It can generate a unique response to the specific fault mode of "inter-turn short circuit". Based on multi-frequency impedance testing, it constructs a fault-sensitive feature set and distinguishes between inductance-related faults and impedance changes caused by non-fault factors such as temperature through quantitative indicators. This enables a diagnostic mechanism based on multi-dimensional pattern recognition, which can significantly improve the fault tolerance and determinism of fault judgment.

[0054] Furthermore, the embodiments of this application perform comprehensive diagnostic analysis, which does not rely on a simple comparison of a single absolute value threshold, but determines the inter-turn short circuit probability by analyzing the inductance variation coefficient, impedance characteristic ratio and inductance frequency variation coefficient among impedance data at multiple frequency points.

[0055] Optionally, in one embodiment of this application, determining the inter-turn short-circuit probability of the unit under test based on the inductance coefficient of variation, impedance characteristic ratio, and inductance frequency variation coefficient includes: if the inductance coefficient of variation is greater than a first preset threshold, then determining the abnormal result of the unit under test as an inductance consistency abnormality based on the inductance coefficient of variation; if the impedance characteristic ratio is less than a second preset threshold, then determining the abnormal result as a high-frequency sensitivity characteristic abnormality based on the impedance characteristic ratio; if the inductance frequency variation coefficient is greater than a third preset threshold, then determining the abnormal result as an inductance frequency variation characteristic abnormality based on the inductance frequency variation coefficient; and determining the inter-turn short-circuit probability based on the inductance consistency abnormality, high-frequency sensitivity characteristic abnormality, and / or inductance frequency variation characteristic abnormality.

[0056] In some embodiments, this application can determine that an abnormal result of the unit under test is an inductance consistency abnormality when the inductance variation coefficient is greater than a first preset threshold. The first preset threshold can be set by those skilled in the art according to actual conditions, and this application does not impose specific limitations.

[0057] It should be noted that, under normal circumstances, the coefficient of variation of inductance... Less than If an inter-turn short circuit occurs, Generally greater than 15%, that is, when At that time, the abnormal result of the unit under test is marked as an abnormal inductance consistency.

[0058] Furthermore, if only the embodiments of this application are available... If the trend analysis is combined with the historical test data of the rotor winding of the unit under test, and the increase of the inductance variation coefficient is greater than 5% in three consecutive tests, an inter-turn short circuit warning will be issued; otherwise, an inter-turn short circuit warning will not be issued for the time being.

[0059] In some embodiments, this application can determine that the abnormal result of the unit under test is an abnormality of high-frequency sensitive characteristics based on the impedance characteristic ratio when the impedance characteristic ratio is less than a second preset threshold. The second preset threshold can be set by those skilled in the art according to actual conditions, and this application does not impose specific limitations.

[0060] In this embodiment of the application, the impedance characteristic ratio can be... In such cases, if the high-frequency impedance change is significant, the abnormal result is determined to be an abnormality in high-frequency sensitive characteristics, and an inter-turn short circuit warning is issued.

[0061] Furthermore, if only the embodiments of this application are available... If the effect of temperature change is excluded, the probability of inter-turn short circuit should be determined by combining the temperature rise rate of the rotor winding of the unit under test.

[0062] In some embodiments, this application can determine an abnormal result as an abnormal inductor frequency characteristic based on the inductor frequency coefficient when the inductor frequency coefficient is greater than a third preset threshold. The third preset threshold can be set by those skilled in the art according to actual conditions, and this application does not impose specific limitations.

[0063] In this embodiment, the inductor frequency variation coefficient does not change significantly with frequency under normal circumstances. Approaching 0; during inter-turn short circuit, Typically increases significantly, for example This application does not impose specific limitations, but determines that the abnormal result is an abnormal inductor frequency conversion characteristic.

[0064] Furthermore, if only the embodiments of this application are available... If so, it is necessary to verify the operating frequency of the test voltage and increase the test frequency near the abnormal frequency point.

[0065] Furthermore, embodiments of this application can determine the inter-turn short circuit probability based on inductor consistency anomalies, high-frequency sensitivity anomalies, and inductor frequency variation anomalies.

[0066] For example, embodiments of this application can be implemented in... and In the case of an inter-turn short circuit probability > 85%, it is determined that the probability is greater than 85%. and In the case where the probability of an inter-turn short circuit is determined to be >80%; and In this case, the probability of an inter-turn short circuit is determined to be >75%.

[0067] Optionally, in one embodiment of this application, the method further includes: identifying the actual probability interval of the inter-turn short circuit probability; determining that the unit under test has an inter-turn short circuit fault when the actual probability interval is a first interval; determining that the unit under test has a potential inter-turn short circuit hazard when the actual probability interval is a second interval; and determining that the unit under test has no inter-turn short circuit fault when the actual probability interval is a third interval.

[0068] It is understood that the actual probability interval in this application can be divided into a first interval, such as greater than 85%; a second interval, such as greater than 80% and less than or equal to 85%; and a third interval, such as greater than 75% and less than or equal to 80%. This application does not impose specific limitations.

[0069] Furthermore, in the embodiments of this application, when the actual probability interval is the first interval, it is determined that the unit under test has an inter-turn short circuit fault; when the actual probability interval is the second interval, it is determined that the unit under test has a potential inter-turn short circuit hazard; and when the actual probability interval is the third interval, it is determined that the unit under test has no inter-turn short circuit fault.

[0070] The following describes the method for identifying inter-turn short circuits in rotor windings proposed in this application, using a specific embodiment as an example.

[0071] in, Figure 2 This is a flowchart illustrating the working principle of a rotor winding inter-turn short circuit identification method according to an embodiment of this application.

[0072] Step S201: Generate the operating frequency using a high-frequency programmable power source.

[0073] In this embodiment, the high-frequency programmable power source can be used to generate a sinusoidal AC test voltage with precisely settable frequency and amplitude. Its frequency output range needs to cover multiple required high-frequency points, that is, to ensure that the operating frequency of the test voltage is greater than a preset threshold. For example, if the operating frequency is higher than 50Hz, 300-500Hz is preferred.

[0074] Step S202: Obtain test data using a precision measurement unit.

[0075] In this embodiment, the precision measurement unit consists of a voltage sensor, a current sensor, and a power measurement circuit, which can then synchronously collect test data such as the voltage value at both ends of the rotor winding, the current value flowing through the winding, and the active power consumed.

[0076] Step S203: Calculate impedance data using the main control and processing unit and determine the inter-turn short circuit probability.

[0077] In this application embodiment, the main control and processing unit is usually an embedded computer or an industrial control computer. It is mainly responsible for controlling the power source to output signals of different working frequencies according to a preset sequence, receiving and processing data from the measurement unit, calculating impedance data, storing historical reference data, and running built-in intelligent diagnostic algorithms (performing multi-frequency consistency analysis, curve morphology analysis, etc., which are not specifically limited in this application) to determine the inter-turn short circuit probability and generate a diagnostic report.

[0078] Step S204: Display the results using a human-computer interaction interface.

[0079] In this application embodiment, a human-computer interaction interface can be used for parameter setting, test process monitoring, result display and report output, etc., and this application embodiment does not impose specific limitations.

[0080] The rotor winding inter-turn short circuit identification method proposed in this application can calculate the impedance data of the unit under test under different operating frequencies based on the test data obtained under the test voltage application state, and extract the characteristic parameters in the impedance data. Then, the corresponding inductance variation coefficient, impedance characteristic ratio, and inductance frequency variation coefficient are calculated to determine the inter-turn short circuit probability of the unit under test. By directly collecting test data, calculating the impedance at different frequencies, and extracting multiple characteristic parameters to comprehensively determine the inter-turn short circuit probability, the method can accurately, quantitatively, and efficiently achieve reliable identification and probability assessment of inter-turn short circuit faults in the unit under test. This solves the problems of low sensitivity, difficulty in detecting early or minor short circuit faults, bulky equipment, poor portability and low on-site testing efficiency, single diagnostic dimensions, susceptibility to test conditions, low fault tolerance, and potential for misjudgment or missed judgment in related technologies.

[0081] Next, referring to the accompanying drawings, a rotor winding inter-turn short circuit identification device according to an embodiment of this application is described.

[0082] Figure 3 This is a block diagram of a rotor winding inter-turn short circuit identification device provided according to an embodiment of this application.

[0083] like Figure 3 As shown, the rotor winding inter-turn short circuit identification device 10 includes: a first acquisition module 100, a calculation module 200, and a first determination module 300.

[0084] The first acquisition module 100 is used to acquire test data of the unit under test when the test voltage is applied.

[0085] The calculation module 200 is used to calculate the impedance data of the unit under test under different operating frequencies based on the test data.

[0086] The first determining module 300 is used to extract characteristic parameters from the impedance data and calculate the inductance variation coefficient, impedance characteristic ratio and inductance frequency variation coefficient of the unit under test based on the characteristic parameters, so as to determine the inter-turn short circuit probability of the unit under test based on the inductance variation coefficient, impedance characteristic ratio and inductance frequency variation coefficient.

[0087] Optionally, in one embodiment of this application, the first determining module 300 includes: a first determining unit, a second determining unit, a third determining unit, and a fourth determining unit.

[0088] The first determining unit is used to determine, based on the inductance variation coefficient, that the abnormal result of the unit under test is an inductance consistency abnormality when the inductance variation coefficient is greater than a first preset threshold.

[0089] The second determining unit is used to determine the abnormal result as a high-frequency sensitive characteristic abnormality based on the impedance characteristic ratio when the impedance characteristic ratio is less than the second preset threshold.

[0090] The third determining unit is used to determine the abnormal result as an abnormal inductor frequency characteristic based on the inductor frequency coefficient when the inductor frequency coefficient is greater than the third preset threshold.

[0091] The fourth determining unit is used to determine the inter-turn short circuit probability based on inductor consistency anomalies, high-frequency sensitivity anomalies, and / or inductor frequency variation anomalies.

[0092] Optionally, in one embodiment of this application, it further includes: a second acquisition module, a second determination module, and a third determination module.

[0093] The second acquisition module is used to acquire the operating frequency of the initial test voltage before acquiring the test data of the unit under test when the test voltage is applied.

[0094] The second determining module is used to determine the test voltage based on the initial test voltage when the operating frequency is greater than a preset threshold.

[0095] The third determining module is used to adjust the working frequency according to a preset strategy when the working frequency is less than or equal to a preset threshold, until the working frequency is greater than the preset threshold, to obtain the adjusted test voltage, and to determine the test voltage based on the adjusted test voltage.

[0096] Optionally, in one embodiment of this application, the formula for calculating the coefficient of variation of inductance may be, but is not limited to, the following: , in, This indicates the number of test frequency points. Indicates the serial number of the test frequency point. This indicates the frequency of the test frequency point. Indicates the equivalent inductance. This represents the standard deviation of inductance.

[0097] The formula for calculating the impedance characteristic ratio can be, but is not limited to, the following: , in, This represents the modulus of the measured high-frequency impedance. This represents the modulus of the measured low-frequency test impedance. This represents a reference value for the high-frequency test impedance mode under healthy winding conditions. This represents the reference value for the low-frequency test impedance mode under healthy winding conditions.

[0098] The formula for calculating the inductance frequency conversion coefficient can be, but is not limited to, the following: , in, This represents the fitted parameters and has no specific meaning.

[0099] Optionally, in one embodiment of this application, it further includes: an identification module, a fourth determination module, a fifth determination module, and a sixth determination module.

[0100] The identification module is used to identify the actual probability range of the inter-turn short circuit probability.

[0101] The fourth determination module is used to determine whether the unit under test has an inter-turn short circuit fault when the actual probability interval is the first interval.

[0102] The fifth determination module is used to determine whether the unit under test has a potential inter-turn short circuit hazard when the actual probability interval is the second interval.

[0103] The sixth determination module is used to determine whether the unit under test has no inter-turn short circuit fault when the actual probability interval is the third interval.

[0104] It should be noted that the explanation of the aforementioned method for identifying short circuits between rotor winding turns also applies to the identification device for short circuits between rotor winding turns in this embodiment, and will not be repeated here.

[0105] The rotor winding inter-turn short circuit identification device proposed in this application can calculate the impedance data of the unit under test under different operating frequencies based on the test data obtained under the test voltage application state, and extract the characteristic parameters in the impedance data. Then, it calculates the corresponding inductance variation coefficient, impedance characteristic ratio, and inductance frequency variation coefficient to determine the inter-turn short circuit probability of the unit under test. By directly collecting test data, calculating the impedance at different frequencies, and extracting multiple characteristic parameters to comprehensively determine the inter-turn short circuit probability, it can accurately, quantitatively, and efficiently achieve reliable identification and probability assessment of inter-turn short circuit faults in the unit under test. This solves the problems of low sensitivity, difficulty in detecting early or minor short circuit faults, bulky equipment, poor portability and low on-site testing efficiency, single diagnostic dimensions, susceptibility to test conditions, low fault tolerance, and potential for misjudgment or missed judgment in related technologies.

[0106] Figure 4 This is a schematic diagram of the structure of an electronic device provided according to an embodiment of this application. The electronic device may include: The memory 401, the processor 402, and the computer program stored on the memory 401 and capable of running on the processor 402.

[0107] When the processor 402 executes the program, it implements the rotor winding inter-turn short circuit identification method provided in the above embodiments.

[0108] Furthermore, electronic devices also include: Communication interface 403 is used for communication between memory 401 and processor 402.

[0109] The memory 401 is used to store computer programs that can run on the processor 402.

[0110] Memory 401 may include high-speed RAM memory, and may also include non-volatile memory, such as at least one disk storage device.

[0111] If the memory 401, processor 402, and communication interface 403 are implemented independently, then the communication interface 403, memory 401, and processor 402 can be interconnected via a bus to complete communication between them. The bus can be an Industry Standard Architecture (ISA) bus, a Peripheral Component Interconnect (PCI) bus, or an Extended Industry Standard Architecture (EISA) bus, etc. Buses can be categorized into address buses, data buses, control buses, etc. For ease of representation, Figure 4 The bus is represented by a single thick line, but this does not mean that there is only one bus or one type of bus.

[0112] Optionally, in a specific implementation, if the memory 401, processor 402, and communication interface 403 are integrated on a single chip, then the memory 401, processor 402, and communication interface 403 can communicate with each other through an internal interface.

[0113] Processor 402 may be a central processing unit (CPU), an application specific integrated circuit (ASIC), or one or more integrated circuits configured to implement the embodiments of this application.

[0114] This application also provides a computer-readable storage medium storing a computer program thereon, which, when executed by a processor, implements the above-described method for identifying inter-turn short circuits in rotor windings.

[0115] This application also provides a computer program product, including a computer program that, when executed, implements the above-described method for identifying inter-turn short circuits in rotor windings.

[0116] In the description of this specification, the references to terms such as "one embodiment," "some embodiments," "example," "specific example," or "some examples," etc., indicate that a specific feature, structure, material, or characteristic described in connection with that embodiment or example is included in at least one embodiment or example of this application. In this specification, the illustrative expressions of the above terms do not necessarily refer to the same embodiment or example. Furthermore, the specific features, structures, materials, or characteristics described may be combined in any suitable manner in one or more embodiments or examples. Moreover, without contradiction, those skilled in the art can combine and integrate the different embodiments or examples described in this specification, as well as the features of different embodiments or examples.

[0117] Furthermore, the terms "first" and "second" are used for descriptive purposes only and should not be construed as indicating or implying relative importance or implicitly specifying the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include at least one of that feature. In the description of this application, "N" means at least two, such as two, three, etc., unless otherwise explicitly specified.

[0118] Any process or method described in the flowchart or otherwise herein can be understood as representing a module, segment, or portion of code comprising one or N executable instructions for implementing custom logic functions or processes, and the scope of the preferred embodiments of this application includes additional implementations in which functions may be performed not in the order shown or discussed, including substantially simultaneously or in reverse order depending on the functions involved, as should be understood by those skilled in the art to which embodiments of this application pertain.

[0119] The logic and / or steps represented in the flowchart or otherwise described herein, for example, can be considered as a sequenced list of executable instructions for implementing logical functions, and can be embodied in any computer-readable medium for use by, or in conjunction with, an instruction execution system, apparatus, or device (such as a computer-based system, a processor-included system, or other system that can fetch and execute instructions from, an instruction execution system, apparatus, or device). For the purposes of this specification, "computer-readable medium" can be any means that can contain, store, communicate, propagate, or transmit programs for use by, or in conjunction with, an instruction execution system, apparatus, or device. More specific examples (a non-exhaustive list) of computer-readable media include: an electrical connection having one or more wires (electronic device), a portable computer disk drive (magnetic device), random access memory (RAM), read-only memory (ROM), erasable and editable read-only memory (EPROM or flash memory), fiber optic devices, and portable optical disc read-only memory (CDROM). In addition, computer-readable media can even be paper or other suitable media on which programs can be printed, because programs can be obtained electronically by optically scanning paper or other media, then editing, interpreting or otherwise processing them as necessary, and then storing them in computer memory.

[0120] It should be understood that the various parts of this application can be implemented using hardware, software, firmware, or a combination thereof. In the above embodiments, the N steps or methods can be implemented using software or firmware stored in memory and executed by a suitable instruction execution system. If implemented in hardware, as in another embodiment, it can be implemented using any one or more of the following techniques known in the art: discrete logic circuits having logic gates for implementing logical functions on data signals, application-specific integrated circuits (ASICs) having suitable combinational logic gates, programmable gate arrays (PGAs), field-programmable gate arrays (FPGAs), etc.

[0121] Those skilled in the art will understand that all or part of the steps of the methods in the above embodiments can be implemented by a program instructing related hardware. The program can be stored in a computer-readable storage medium, and when executed, the program includes one or a combination of the steps of the method embodiments.

[0122] Furthermore, the functional units in the various embodiments of this application can be integrated into a processing module, or each unit can exist physically separately, or two or more units can be integrated into a module. The integrated module can be implemented in hardware or as a software functional module. If the integrated module is implemented as a software functional module and sold or used as an independent product, it can also be stored in a computer-readable storage medium.

[0123] The storage medium mentioned above can be a read-only memory, a disk, or an optical disk, etc. Although embodiments of this application have been shown and described above, it is understood that the above embodiments are exemplary and should not be construed as limiting this application. Those skilled in the art can make changes, modifications, substitutions, and variations to the above embodiments within the scope of this application.

Claims

1. A method for identifying inter-turn short circuits in rotor windings, characterized in that, Includes the following steps: Acquire test data of the unit under test when the test voltage is applied; Based on the test data, the impedance data of the unit under test under different operating frequencies are calculated; The characteristic parameters in the impedance data are extracted, and the inductance variation coefficient, impedance characteristic ratio and inductance frequency variation coefficient of the unit under test are calculated based on the characteristic parameters, so as to determine the inter-turn short circuit probability of the unit under test based on the inductance variation coefficient, the impedance characteristic ratio and the inductance frequency variation coefficient.

2. The method according to claim 1, characterized in that, The determination of the inter-turn short-circuit probability of the unit under test based on the inductance variation coefficient, the impedance characteristic ratio, and the inductance frequency variation coefficient includes: If the inductance variation coefficient is greater than the first preset threshold, then the abnormal result of the unit under test is determined to be an inductance consistency abnormality based on the inductance variation coefficient. If the impedance characteristic ratio is less than the second preset threshold, then the abnormal result is determined to be an abnormal high-frequency sensitive characteristic based on the impedance characteristic ratio. If the inductor frequency variation coefficient is greater than the third preset threshold, then the abnormal result is determined to be an abnormal inductor frequency variation characteristic based on the inductor frequency variation coefficient. The inter-turn short circuit probability is determined based on the inductor consistency anomaly, the high-frequency sensitivity characteristic anomaly, and / or the inductor frequency variation characteristic anomaly.

3. The method according to claim 1, characterized in that, Before acquiring test data for the unit under test when the test voltage is applied, the following steps are also included: The operating frequency for obtaining the initial test voltage; If the operating frequency is greater than a preset threshold, the test voltage is determined based on the initial test voltage; If the operating frequency is less than or equal to the preset threshold, the operating frequency is adjusted according to the preset strategy until the operating frequency is greater than the preset threshold to obtain the adjusted test voltage, and the test voltage is determined based on the adjusted test voltage.

4. The method according to claim 1, characterized in that, in, The formula for calculating the coefficient of variation of the inductance is: ， in, This indicates the number of test frequency points. Indicates the serial number of the test frequency point. This indicates the frequency of the test frequency point. Indicates the equivalent inductance. Indicates the standard deviation of inductance; The formula for calculating the impedance characteristic ratio is: ， in, This represents the modulus of the measured high-frequency impedance. This represents the modulus of the measured low-frequency test impedance. This represents a reference value for the high-frequency test impedance mode under healthy winding conditions. This indicates the reference value for the low-frequency test impedance mode under the healthy condition of the winding; The formula for calculating the inductor frequency conversion coefficient is as follows: ， in, This represents the fitted parameters and has no specific meaning.

5. The method according to claim 1, characterized in that, Also includes: Identify the actual probability interval of the inter-turn short circuit probability; If the actual probability interval is the first interval, it is determined that the unit under test has an inter-turn short circuit fault; When the actual probability interval is the second interval, it is determined that the unit under test has a potential inter-turn short circuit hazard; If the actual probability interval is the third interval, it is determined that the unit under test has no inter-turn short circuit fault.

6. A device for identifying inter-turn short circuits in rotor windings, characterized in that, include: The acquisition module is used to acquire test data of the unit under test when the test voltage is applied; The calculation module is used to calculate the impedance data of the unit under test under different operating frequencies based on the test data. The determination module is used to extract characteristic parameters from the impedance data and calculate the inductance variation coefficient, impedance characteristic ratio, and inductance frequency variation coefficient of the unit under test based on the characteristic parameters, so as to determine the inter-turn short circuit probability of the unit under test based on the inductance variation coefficient, the impedance characteristic ratio, and the inductance frequency variation coefficient.

7. The apparatus according to claim 6, characterized in that, The determining module includes: The first determining unit is configured to determine, based on the inductance variation coefficient, that the abnormal result of the unit under test is an inductance consistency abnormality when the inductance variation coefficient is greater than a first preset threshold. The second determining unit is used to determine, based on the impedance characteristic ratio, that the abnormal result is an abnormal high-frequency sensitive characteristic when the impedance characteristic ratio is less than the second preset threshold. The third determining unit is used to determine, based on the inductor frequency conversion coefficient, that the abnormal result is an abnormal inductor frequency conversion characteristic when the inductor frequency conversion coefficient is greater than the third preset threshold. The fourth determining unit is used to determine the inter-turn short circuit probability based on the inductor consistency abnormality, the high-frequency sensitivity characteristic abnormality, and / or the inductor frequency variation characteristic abnormality.

8. An electronic device, characterized in that, include: A memory, a processor, and a computer program stored in the memory and executable on the processor, the processor executing the program to implement the method for identifying inter-turn short circuits in rotor windings as described in any one of claims 1-5.

9. A computer-readable storage medium having a computer program stored thereon, characterized in that, The program is executed by the processor to implement the method for identifying inter-turn short circuits in rotor windings as described in any one of claims 1-5.

10. A computer program product, characterized in that, Includes a computer program, which, when executed, is used to implement the method for identifying inter-turn short circuits in rotor windings as described in any one of claims 1-5.

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