单比特数据延迟仿真处理系统

By setting delay simulation modules in the input, metastability detection, and output transmission paths of single-bit data, the problem of not introducing delay information in front-end simulation is solved, enabling the discovery of design defects at the front end and improving chip development efficiency.

CN122133576BActive Publication Date: 2026-07-17METAX INTEGRATED CIRCUITS (SHANGHAI) CO LTD

Patent Information

Authority / Receiving Office
CN · China
Patent Type
Patents(China)
Current Assignee / Owner
METAX INTEGRATED CIRCUITS (SHANGHAI) CO LTD
Filing Date
2026-05-08
Publication Date
2026-07-17

AI Technical Summary

Technical Problem

In the chip development process, existing technologies have failed to effectively incorporate latency information during front-end simulation, which affects development efficiency when problems are discovered in the back-end design and makes it difficult to detect design defects as early as possible.

Method used

Delay simulation modules are set up in the input, metastability detection and output transmission paths of single-bit data respectively. By randomly generating delay values ​​for simulation, delay information is introduced in the front-end simulation stage to discover potential problems.

Benefits of technology

By introducing latency information during the front-end simulation stage, problems in chip design can be detected as early as possible, improving chip development efficiency and ensuring the consistency and accuracy of back-end design.

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Abstract

本发明涉及芯片技术领域,尤其涉及一种单比特数据延迟仿真处理系统,包括设置在输入传输路径的第一延迟仿真模块、设置在亚稳态检测路径的第二延迟仿真模块和设置在输出传输路径的第三延迟仿真模块;第一延迟仿真模块生成第一延迟值;输入传输路径将数据延迟第一延迟值延迟后传输至亚稳态检测路径;第二延迟仿真模块判断延迟第一延迟值延迟后的数据的翻转点是否落入预设的亚稳态检测范围之内,若落入,则生成第二延迟值,否则,将第二延迟值设置为0;亚稳态检测路径将数据延迟第二延迟值延迟后传输至输出传输路径;第三延迟仿真模块包括M级寄存器;输出传输路径将数据通过第三延迟仿真模块延迟M个T之后输出。本发明提高了芯片开发效率。
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