Infrared refrigeration detector zero position testing method

Abstract

The application relates to an infrared refrigeration detector zero position testing method, and relates to the technical field of infrared detector testing, which comprises the following steps: presetting a reference optical axis with a target, and presetting the external interface reference of an infrared refrigeration detector to the reference optical axis; adjusting the position of the infrared refrigeration detector until the target in the output imaging of the infrared refrigeration detector reaches a set definition; and acquiring the zero position deviation value of the infrared refrigeration detector based on the output imaging of the infrared refrigeration detector. Through the design of the preset reference optical axis, the testing process is simplified into three intuitive steps. And the accurate measurement of the zero position parameter of the infrared refrigeration detector at the component level is realized. Different from the prior art which only measures the zero position at the production link of the whole machine thermal imager, the device can immediately test after the infrared refrigeration detector is manufactured, quality problems in the manufacturing process can be found in time, the problems are avoided from being continued to the whole machine assembly link, and the subsequent rework cost and period are greatly reduced.

Description

Technical Field

[0001] This invention relates to the field of infrared detector testing technology, and specifically to a zero-position testing method for an infrared cooled detector. Background Technology

[0002] As a core component of infrared thermal imaging systems, the performance of the infrared cooled detector directly affects the overall imaging quality of the infrared thermal imager. During the operation of the infrared detector, the alignment accuracy (i.e., "zero point") between the center of the detector's photosensitive surface and the system's optical axis is one of the key parameters determining the system's imaging quality. Zero-point deviation will cause the center of the infrared thermal imager's field of view to not coincide with the center of the optical system's field of view, resulting in optical problems such as image shift and edge blurring, severely affecting the thermal imager's temperature measurement accuracy and imaging quality. With the widespread application of infrared technology in military reconnaissance, security monitoring, industrial inspection, and medical diagnosis, the requirements for the accuracy and reliability of infrared thermal imagers are increasingly stringent. Especially in high-end applications such as precision guidance, aerospace, and precision temperature measurement, the requirements for the zero-point accuracy of the infrared detector are even more stringent, typically needing to be controlled within the micrometer or even sub-micrometer range.

[0003] In existing technologies, the whole-machine zero-position measurement method is commonly used. The basic principle of this method is to align the thermal imager under test with a standard target, calculate the zero-position deviation by analyzing the imaging results, and then adjust the detector attitude for correction. The specific implementation process of the whole-machine zero-position measurement method includes: mounting the infrared thermal imager on a test platform, aligning it with the standard image generated by the infrared collimator, acquiring the image data output by the thermal imager, analyzing the deviation between the image center and the optical system center using image processing algorithms, adjusting the detector installation position or attitude based on the deviation results, and repeating the test until the zero position meets the requirements.

[0004] However, the whole-machine zero-point measurement method can only be tested after the whole machine is assembled. It is difficult to detect quality problems in the detector manufacturing process in a timely manner, and it is difficult to distinguish whether the problem is with the detector itself or with the whole machine assembly, which affects production efficiency. Summary of the Invention

[0005] This application provides a zero-point testing method for an infrared cooled detector, which can solve the problem that the existing whole-machine zero-point measurement method can only be tested after the whole machine is assembled, making it difficult to detect quality problems in the detector manufacturing process in a timely manner, and it is difficult to distinguish whether the problem is with the detector itself or with the whole machine assembly, which affects production efficiency.

[0006] In a first aspect, embodiments of this application provide a method for zero-point testing of an infrared cooled detector, comprising: A reference optical axis with a target is preset, and the external interface reference of the infrared cooled detector is preset to the reference optical axis; Adjust the position of the infrared cooled detector until the target in the output image of the infrared cooled detector reaches the set clarity; Based on the output imaging of the infrared cooled detector, the zero-position deviation value of the infrared cooled detector is obtained.

[0007] In one embodiment, obtaining the zero-point deviation value of the infrared cooled detector based on the output imaging of the infrared cooled detector includes: Based on the output imaging of the infrared cooled detector, the position of the current image center design point is obtained; Based on the position of the current image center design point and the position of the target in the current image, the zero-position deviation value of the infrared cooled detector is obtained.

[0008] In one implementation, obtaining the zero-point deviation value of the infrared cooled detector based on the position of the current image center design point and the position of the target in the current image includes: Based on the position of the current image center design point and the position of the target in the current image, the distance between the current image center design point and the target is obtained; Based on the distance between the current image center design point and the target, as well as the image specifications, the zero-point deviation value of the infrared cooled detector is obtained.

[0009] In one implementation, obtaining the zero-point deviation value of the infrared cooled detector based on the position of the current image center design point and the position of the target in the current image includes: Adjust the position of the infrared cooled detector in a direction perpendicular to the reference optical axis until the image center design point coincides with the target; The zero-point deviation value of the infrared cooled detector is obtained based on the adjustment parameters in the direction perpendicular to the reference optical axis.

[0010] In one embodiment, the adjustment of the position of the infrared cooled detector until the target in the output image of the infrared cooled detector reaches a set clarity is as follows: The position of the infrared cooled detector is adjusted along the direction of the reference optical axis.

[0011] In one embodiment, the preset reference optical axis with a target includes: An infrared transmission parallel light tube and an infrared lens are arranged at intervals, and the target is placed at the end of the infrared transmission parallel light tube that is away from the infrared lens. A crosshair reticle is set on the optical axis of the infrared lens, and the optical axes of the infrared lens and the infrared transmission collimator are aligned by the crosshair reticle and the target to determine the reference optical axis.

[0012] In one embodiment, when the preset reference optical axis with the target is: The placement platform is spaced apart from the infrared transmission collimator and the infrared lens, and a cross-shaped positioning fixture is set on the optical axis of the placement platform. The cross-shaped positioning fixture is used to align the optical axis of the infrared lens, the infrared transmission collimator and the placement platform, and to locate the external interface reference position of the infrared cooled detector.

[0013] In one embodiment, the placement platform is a three-dimensional displacement platform.

[0014] In one embodiment, when the preset reference optical axis with the target is: A first optical axis calibration optical flat is installed at a position parallel to the first lens mounting reference of the infrared transmission collimator, and a second optical axis calibration optical flat is installed at a position parallel to the first lens mounting reference of the infrared lens. The optical axes of the infrared lens and the infrared transmission collimator are checked for alignment using the first optical axis calibration optical flat and the second optical axis calibration optical flat. If they are not aligned, the optical axes are readjusted.

[0015] In one embodiment, during the process of obtaining the zero-point deviation value of the infrared cooled detector: Check the reference optical axis for deviation at set intervals. If deviation occurs, readjust the optical axis.

[0016] The beneficial effects of the technical solutions provided in this application include: When using this infrared cooled detector zero-point testing method, a preset reference optical axis with a target is first established, and the external interface reference of the infrared cooled detector is then preset onto the reference optical axis. The position of the infrared cooled detector is then adjusted until the target in the output image of the infrared cooled detector achieves the set clarity. Based on the output image of the infrared cooled detector, the zero-point deviation value of the infrared cooled detector is then obtained. The design of the preset reference optical axis simplifies the testing process into three intuitive steps. Operators do not need to possess complex optical theory knowledge; they can complete the test simply by following the preset-adjust-obtain process, significantly shortening the testing time for a single detector and achieving accurate measurement of the zero-point parameters of the infrared cooled detector at the component level. Unlike existing technologies that only perform zero-point measurements during the production of the entire thermal imager, this device can perform tests immediately after the infrared cooled detector is manufactured, promptly identifying quality problems in the manufacturing process and preventing problems from continuing to the overall assembly stage. This greatly reduces subsequent rework costs and time, solving the problem of existing zero-point measurement methods that can only be performed after the entire assembly is completed, making it difficult to promptly identify quality problems in the detector manufacturing process and distinguish between problems with the detector itself and problems with the overall assembly, thus affecting production efficiency. Attached Figure Description

[0017] To more clearly illustrate the technical solutions in the embodiments of this application, the accompanying drawings used in the description of the embodiments will be briefly introduced below. Obviously, the accompanying drawings described below are only some embodiments of this application. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0018] Figure 1 This is a schematic diagram of an embodiment of an infrared cooling detector zero-position testing device according to the present invention.

[0019] Figure 2 This is a schematic diagram of the platform structure in an embodiment of an infrared cooled detector zero-position testing device of the present invention.

[0020] Figure 3 This is a schematic diagram of the structure of an infrared cooling detector placed in an embodiment of an infrared cooling detector zero-position testing device according to the present invention.

[0021] In the diagram: 1. Infrared transmission collimator; 2. Infrared lens; 3. Cross-shaped reticle fixture; 4. Target; 5. Infrared cooled detector; 6. Placement platform; 61. X-axis adjustment knob; 62. Y-axis adjustment knob; 63. Z-axis adjustment knob; 64. Reference positioning pin; 7. Cross-shaped reticle positioning fixture; 8. First optical axis calibration optical flat; 9. Second optical axis calibration optical flat; 10. Mounting bracket. Detailed Implementation

[0022] To enable those skilled in the art to better understand the present application, the technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of the present application, and not all embodiments. Based on the embodiments in the present application, all other embodiments obtained by those of ordinary skill in the art without creative effort are within the scope of protection of the present application.

[0023] This application provides a zero-point testing method for an infrared cooled detector, which solves the problem that the existing whole-machine zero-point measurement method can only be tested after the whole machine is assembled, making it difficult to detect quality problems in the detector manufacturing process in a timely manner, and it is difficult to distinguish whether the problem is with the detector itself or with the whole machine assembly, which affects production efficiency.

[0024] like Figure 1 and Figure 3 As shown, this application provides a method for zero-point testing of an infrared cooled detector, which includes: A reference optical axis with target 4 is preset, and the external interface reference of infrared cooled detector 5 is preset to the reference optical axis; Adjust the position of the infrared cooled detector 5 until the target 4 in the output image of the infrared cooled detector 5 reaches the set clarity; Based on the output imaging of the infrared cooled detector 5, the zero-position deviation value of the infrared cooled detector 5 is obtained.

[0025] When using this infrared cooled detector zero-position testing method, a preset reference optical axis with target 4 is first established, and the external interface reference of the infrared cooled detector 5 is preset to the reference optical axis. Then, the position of the infrared cooled detector 5 is adjusted until target 4 in the output image of the infrared cooled detector 5 achieves the set clarity. Based on the output image of the infrared cooled detector 5, the zero-position deviation value of the infrared cooled detector 5 is obtained. By designing a preset reference optical axis, the testing process is simplified to three intuitive steps. Operators do not need to master complex optical theory knowledge; they can complete the test simply by following the preset-adjust-obtain process. This significantly shortens the testing time for a single detector and enables precise measurement of the zero-position parameters of the infrared cooled detector 5 at the component level. Unlike existing technologies that only perform zero-point measurements during the production of the entire thermal imager, this device can perform testing immediately after the infrared cooled detector is manufactured. This allows for the timely detection of quality issues during the manufacturing process, preventing problems from persisting to the final assembly stage. This significantly reduces subsequent rework costs and timelines. It also solves the problem that existing zero-point measurement methods can only be tested after the entire assembly is completed, making it difficult to detect quality issues during the detector manufacturing process in a timely manner. Furthermore, it is difficult to distinguish whether the problem lies with the detector itself or with the overall assembly, which can negatively impact production efficiency.

[0026] In some optional embodiments, the acquisition of the zero-point deviation value of the infrared cooled detector 5 based on the output imaging of the infrared cooled detector 5 includes: Based on the output imaging of the infrared cooled detector 5, the position of the current image center design point is obtained; Based on the position of the current image center design point and the position of target 4 in the current image, the zero-position deviation value of infrared cooled detector 5 is obtained.

[0027] In this embodiment, the zero-position deviation value of the infrared cooled detector 5 is obtained based on the output imaging of the infrared cooled detector 5. Specifically, this includes: obtaining the position of the current image center design point based on the output imaging of the infrared cooled detector 5; and obtaining the zero-position deviation value of the infrared cooled detector 5 based on the position of the current image center design point and the position of the target 4 in the current image. By simplifying the complex zero-position deviation measurement to the analysis of the relative relationship between the image center design point and the target position, this method makes the testing principle more intuitive and easier to understand. Operators do not need to master complex optical theories and coordinate transformation knowledge; they only need to understand the basic image positional relationships to perform the test, greatly reducing the technical threshold. Furthermore, by analyzing the actual imaging results, the relative positional relationship between the detector's photosensitive surface and the optical system is directly reflected, completely eliminating the systematic errors introduced by intermediate links such as mechanical displacement measurement and coordinate transformation. This direct measurement method makes the acquisition of zero-position deviation more realistic and accurate.

[0028] In some optional embodiments, obtaining the zero-point deviation value of the infrared cooled detector 5 based on the position of the current image center design point and the position of the target 4 in the current image includes: Based on the position of the current image center design point and the position of target 4 in the current image, obtain the distance between the current image center design point and target 4; Based on the distance between the current image center design point and target 4, and the image specifications, the zero-position deviation value of the infrared cooled detector 5 is obtained.

[0029] In this embodiment, the zero-point deviation value of the infrared cooled detector 5 is obtained based on the position of the current image center design point and the position of the target 4 in the current image. Specifically, this includes: obtaining the distance between the current image center design point and the target 4 based on the position of the current image center design point and the position of the target 4 in the current image; and obtaining the zero-point deviation value of the infrared cooled detector 5 based on the distance between the current image center design point and the target 4, and the image specification parameters. This method transforms the abstract concept of zero-point deviation into a specific image positional relationship. By accurately measuring the distance between the image center design point and the target 4, and then converting it using image specification parameters, precise quantification of the zero-point deviation is achieved. This quantification method avoids the shortcomings of traditional methods that rely on the subjective judgment of operators, making the zero-point deviation measurement more objective and accurate. In particular, by introducing image specification parameters as a conversion benchmark, the measurement deviation caused by the difference in detector resolution is eliminated, making the zero-point test results of detectors of different specifications comparable, and significantly improving the accuracy and reliability of the measurement.

[0030] In some optional embodiments, obtaining the zero-point deviation value of the infrared cooled detector 5 based on the position of the current image center design point and the position of the target 4 in the current image includes: Adjust the position of the infrared cooled detector 5 in a direction perpendicular to the reference optical axis until the design point at the center of the image coincides with the target 4; The zero-position deviation value of the infrared cooled detector 5 is obtained based on the adjustment parameters in the direction perpendicular to the reference optical axis.

[0031] In this embodiment, the zero-position deviation value of the infrared cooled detector 5 is obtained based on the position of the current image center design point and the position of the target 4 in the current image. Specifically, this includes: adjusting the position of the infrared cooled detector 5 in a direction perpendicular to the reference optical axis until the image center design point coincides with the target 4; and obtaining the zero-position deviation value of the infrared cooled detector 5 based on the adjustment parameters in the direction perpendicular to the reference optical axis. By transforming the abstract concept of zero-position deviation into an intuitive physical position adjustment process, this method simplifies the measurement principle. Operators do not need to master complex image processing algorithms and coordinate transformation theories; they only need to understand the basic operation of adjusting to coincidence to perform testing, greatly reducing the difficulty of technical understanding. Furthermore, by simplifying the acquisition of zero-position deviation into an intuitive physical adjustment process, this method significantly optimizes the testing process. Operators do not need to perform complex image analysis and intermediate calculations; they only need to complete the position adjustment and read the adjustment parameters to obtain the test results, significantly shortening the testing time for a single detector. This efficient testing process is particularly suitable for the mass production environment of infrared cooled detectors, enabling comprehensive quality monitoring of production batches and truly incorporating the zero-position parameter into the manufacturing quality control system, rather than just using it as a post-production inspection method.

[0032] In some alternative embodiments, the position of the infrared cooled detector 5 is adjusted until the target 4 in the output image of the infrared cooled detector 5 reaches a set sharpness: Adjust the position of the infrared cooled detector 5 along the direction of the reference optical axis.

[0033] In this embodiment, the position of the infrared cooled detector 5 is adjusted until the target 4 in the output image of the infrared cooled detector 5 reaches the set sharpness: the position of the infrared cooled detector 5 is adjusted along the direction of the reference optical axis. Adjusting the position of the infrared cooled detector 5 along the reference optical axis ensures that the photosensitive surface of the detector is precisely located on the focal plane of the optical system, ensuring that the target 4 is clearly and sharply imaged. This precise focusing is a prerequisite for subsequent zero-position deviation measurement; only when the image is clear can the judgment of the position of the image center design point and the target 4 be reliable. This method completely eliminates the position judgment error caused by image blurring, providing a high-quality image foundation for accurate zero-position deviation measurement and solving the key problem of unreliable measurement results due to inaccurate focusing in existing technologies. It simplifies the complex optical focusing process to an adjustment along a single direction, eliminating the complex process of multi-dimensional adjustment required in traditional testing. Operators only need to focus on the adjustment of one degree of freedom, greatly reducing the difficulty and complexity of focusing operations.

[0034] like Figure 1 and Figure 3 As shown, in some optional embodiments, the preset reference optical axis with target 4 includes: An infrared transmission parallel light tube 1 and an infrared lens 2 are arranged at intervals, and the target 4 is placed at the end of the infrared transmission parallel light tube 1 that is away from the infrared lens 2. A cross-shaped reticle plate 3 is set on the optical axis of the infrared lens 2, and the optical axes of the infrared lens 2 and the infrared transmission collimator 1 are aligned by the cross-shaped reticle plate 3 and the target 4 to determine the reference optical axis.

[0035] In this embodiment, a reference optical axis with a target 4 is preset, specifically including: an infrared transmission collimator 1 and an infrared lens 2 are spaced apart, and the target 4 is placed at the end of the infrared transmission collimator 1 away from the infrared lens 2; a crosshair fixture 3 is set on the optical axis of the infrared lens 2, and the optical axes of the infrared lens 2 and the infrared transmission collimator 1 are aligned by the crosshair fixture 3 and the target 4 to determine the reference optical axis. The crosshair fixture 3, as a precise optical reference point, is directly located on the optical axis of the infrared lens 2, providing an intuitive and accurate visual reference for optical axis calibration. When used in conjunction with the target 4, the operator can clearly observe and adjust the relative position of the infrared lens 2 and the infrared transmission collimator 1 to ensure that their optical axes are precisely coincident. This direct visual alignment method avoids the complex instrument measurement and calculation process in traditional methods, greatly improving the accuracy and reliability of optical axis calibration, and laying a solid foundation for subsequent zero-position testing.

[0036] like Figure 1 and Figure 3 As shown, in some optional embodiments, when the preset reference optical axis with target 4 is: The placement platform 6 is spaced apart from the infrared transmission collimator 1 and the infrared lens 2. A cross-shaped positioning fixture 7 is set on the optical axis of the placement platform 6. The cross-shaped positioning fixture 7 is used to align the optical axis of the infrared lens 2, the infrared transmission collimator 1 and the placement platform 6. The cross-shaped positioning fixture 7 is used to position the external interface reference position of the infrared cooled detector 5.

[0037] In this embodiment, when a reference optical axis with target 4 is preset: the placement platform 6 is spaced apart from the infrared transmission collimator 1 and the infrared lens 2, and a crosshair positioning fixture 7 is set on the optical axis of the placement platform 6. The crosshair positioning fixture 7 is used to align the optical axes of the infrared lens 2, the infrared transmission collimator 1, and the placement platform 6, and to position the external interface reference position of the infrared cooled detector 5. The cooperation between the crosshair positioning fixture 7 and the crosshair fixture plate 3 forms a complete optical axis reference chain among the infrared transmission collimator 1, the infrared lens 2, and the placement platform 6. Through the step-by-step alignment of target 4, crosshair fixture plate 3, and crosshair positioning fixture 7, the optical axis height of the entire test system is ensured to be consistent, eliminating the system error caused by inconsistent references in traditional methods. This complete reference chain design makes the test results more reliable and provides a solid foundation for high-precision zero-point measurement.

[0038] In this example, a target 4 is provided at the small-diameter end of the infrared transmission collimator 1. The infrared lens 2 is spaced apart from the infrared transmission collimator 1 and located on the side away from the small-diameter end of the infrared transmission collimator 1. The optical axes of the infrared lens 2 and the infrared transmission collimator 1 are coincident. The placement platform 6 is located on the side of the infrared lens 2 away from the infrared transmission collimator 1, and the placement platform 6 is used to place the infrared cooled detector 5. A mounting bracket 10 is also included, which is used to mount the infrared transmission collimator 1 and the infrared lens 2. The mounting bracket 10 ensures that the relative position between the infrared transmission collimator 1 and the infrared lens 2 remains stable during long-term use.

[0039] like Figure 2 As shown, in some optional embodiments, the placement platform 6 is a three-dimensional displacement platform.

[0040] In this embodiment, the placement platform 6 is a three-dimensional displacement platform. The design of the three-dimensional displacement platform allows the infrared cooled detector 5 to be precisely adjusted in three mutually perpendicular directions (X, Y, and Z), fully covering all possible directions of zero-point deviation. This omnidirectional adjustment capability ensures accurate measurement of the actual deviation between the center of the detector's photosensitive surface and the mounting reference in all directions, avoiding measurement blind spots caused by limitations in adjustment direction in traditional testing methods. Especially for high-performance infrared cooled detectors with complex zero-point deviation characteristics, the three-dimensional displacement platform can provide comprehensive and accurate zero-point parameter data, providing a complete technical basis for optimizing the manufacturing process.

[0041] In this example, the platform 6 is equipped with an X-axis adjustment knob 61, a Y-axis adjustment knob 62, and a Z-axis adjustment knob 63, which are used to adjust the position of the infrared cooled detector 5. The design of these three independent adjustment knobs allows the operator to intuitively understand and control the position adjustment of the infrared cooled detector 5 in three dimensions. The X-axis adjustment knob 61 and the Z-axis adjustment knob 63 directly correspond to the zero-position deviation adjustment in the horizontal and vertical directions, respectively. The Y-axis adjustment knob 62 is used to adjust the distance between the infrared cooled detector 5 and the infrared lens 2 to obtain a clear image. The X-axis adjustment knob 61 and the Z-axis adjustment knob 63 face the same direction, while the Y-axis adjustment knob 62 faces a direction perpendicular to the direction of the X-axis adjustment knob 61.

[0042] like Figure 1 , Figure 2 and Figure 3As shown, in this example, the placement platform 6 is equipped with a reference positioning pin 64, which is used to install the crosshair positioning fixture 7 or the infrared cooled detector 5. The reference positioning pin 64 serves as a unified mechanical mounting reference, ensuring that the optical center of the crosshair positioning fixture 7 precisely coincides with the external interface reference of the infrared cooled detector 5. The design of the reference positioning pin 64 makes switching between system calibration and actual testing extremely simple. Operators can directly install the infrared cooled detector 5 simply by removing the crosshair positioning fixture 7 from the reference positioning pin 64, without needing to readjust its position or perform complex reference alignment.

[0043] In some optional embodiments, when the preset reference optical axis with target 4 is: A first optical axis calibration optical flat 8 is installed at a position parallel to the first lens mounting reference of the infrared transmission collimator 1, and a second optical axis calibration optical flat 9 is installed at a position parallel to the first lens mounting reference of the infrared lens 2. The optical axes of the infrared lens 2 and the infrared transmission collimator 1 are checked by the first optical axis calibration optical flat 8 and the second optical axis calibration optical flat 9. If they are not aligned, the optical axes are readjusted.

[0044] In this embodiment, when a reference optical axis with target 4 is preset: a first optical axis calibration optical flat 8 is installed at the reference parallel position of the first lens mounting of the infrared transmission collimator 1, and a second optical axis calibration optical flat 9 is installed at the reference parallel position of the first lens mounting of the infrared lens 2; the alignment of the optical axes of the infrared lens 2 and the infrared transmission collimator 1 is checked by the first optical axis calibration optical flat 8 and the second optical axis calibration optical flat 9. If they are not aligned, the optical axes are readjusted. The first optical axis calibration optical flat 8 and the second optical axis calibration optical flat 9 serve as high-precision optical reference surfaces, with flatness reaching the nanometer level, providing an ultra-high precision measurement reference for optical axis alignment. By detecting the reflected beam of the optical flat using equipment such as a laser interferometer, the optical axis position deviation can be accurately determined, achieving sub-micrometer level optical axis alignment accuracy. This accuracy far exceeds the micrometer level of traditional mechanical alignment methods, laying a solid foundation for high-precision measurement of the zero position of infrared cooled detectors and solving the measurement error problem caused by insufficient optical axis alignment accuracy in the prior art.

[0045] In some optional embodiments, during the process of obtaining the zero-point deviation value of the infrared cooled detector 5: Check the reference optical axis for deviation at set intervals. If deviation occurs, readjust the optical axis.

[0046] In this embodiment, during the acquisition of the zero-point deviation value of the infrared cooled detector 5: the reference optical axis is checked at set intervals to see if it has deflected; if deflection occurs, the optical axis is readjusted. During the zero-point test of the infrared cooled detector, environmental factors may cause slight shifts in the reference optical axis over time. This method checks the status of the reference optical axis at set intervals to promptly detect and correct these shifts, ensuring the stability of the entire testing process. This dynamic monitoring mechanism significantly improves the data consistency of long-term continuous testing, solving the key problem of unreliable test results caused by optical axis drift in existing technologies, and providing a stable and reliable measurement benchmark for batch testing. This enables the testing system to maintain high-precision measurement capabilities under a wider range of environmental conditions.

[0047] In summary, when using this infrared cooled detector zero-position testing method, a reference optical axis with target 4 is first preset, and the external interface reference of the infrared cooled detector 5 is preset to the reference optical axis. Then, the position of the infrared cooled detector 5 is adjusted until target 4 in the output image of the infrared cooled detector 5 reaches the set clarity. Based on the output image of the infrared cooled detector 5, the zero-position deviation value of the infrared cooled detector 5 is obtained. By designing a preset reference optical axis, the testing process is simplified to three intuitive steps. Operators do not need to master complex optical theory knowledge; they can complete the test simply by following the preset-adjust-obtain process. This significantly shortens the testing time for a single detector and achieves accurate measurement of the zero-position parameters of the infrared cooled detector 5 at the component level. Unlike existing technologies that only perform zero-point measurements during the production of the entire thermal imager, this device can perform testing immediately after the infrared cooled detector is manufactured. This allows for the timely detection of quality issues during the manufacturing process, preventing problems from persisting to the final assembly stage. This significantly reduces subsequent rework costs and timelines. It also solves the problem that existing zero-point measurement methods can only be tested after the entire assembly is completed, making it difficult to detect quality issues during the detector manufacturing process in a timely manner. Furthermore, it is difficult to distinguish whether the problem lies with the detector itself or with the overall assembly, which can negatively impact production efficiency.

[0048] In the description of this application, it should be noted that the terms "upper," "lower," etc., indicating the orientation or positional relationship are based on the orientation or positional relationship shown in the accompanying drawings, and are only for the convenience of describing this application and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation, and therefore should not be construed as a limitation of this application. Unless otherwise expressly specified and limited, the terms "installed," "connected," and "linked" should be interpreted broadly. For example, they can refer to a fixed connection, a detachable connection, or an integral connection; they can refer to a mechanical connection or an electrical connection; they can refer to a direct connection or an indirect connection through an intermediate medium; they can refer to the internal communication between two elements. For those skilled in the art, the specific meaning of the above terms in this application can be understood according to the specific circumstances.

[0049] It should be noted that in this application, relational terms such as "first" and "second" are used merely to distinguish one entity or operation from another, and do not necessarily require or imply any such actual relationship or order between these entities or operations. Furthermore, the terms "comprising," "including," or any other variations thereof are intended to cover non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements includes not only those elements but also other elements not expressly listed, or elements inherent to such a process, method, article, or apparatus. Without further limitations, an element defined by the phrase "comprising one..." does not exclude the presence of other identical elements in the process, method, article, or apparatus that includes said element.

[0050] The above description is merely a specific embodiment of this application, enabling those skilled in the art to understand or implement this application. Various modifications to these embodiments will be readily apparent to those skilled in the art, and the general principles defined herein may be implemented in other embodiments without departing from the spirit or scope of this application. Therefore, this application is not to be limited to the embodiments shown herein, but is to be accorded the widest scope consistent with the principles and novel features claimed herein.

Claims

1. A method for zero-point testing of an infrared cooled detector, characterized in that, include: A reference optical axis with a target (4) is preset, and the external interface reference of the infrared cooled detector (5) is preset to the reference optical axis; Adjust the position of the infrared cooled detector (5) until the target (4) in the output image of the infrared cooled detector (5) reaches the set clarity; Based on the output imaging of the infrared cooled detector (5), the zero-position deviation value of the infrared cooled detector (5) is obtained.

2. The method for zero-position testing of an infrared cooled detector as described in claim 1, characterized in that, The method of obtaining the zero-position deviation value of the infrared cooled detector (5) based on the output imaging of the infrared cooled detector (5) includes: Based on the output imaging of the infrared cooled detector (5), the position of the current image center design point is obtained; Based on the position of the current image center design point and the position of the target (4) in the current image, the zero-position deviation value of the infrared cooled detector (5) is obtained.

3. The method for zero-position testing of an infrared cooled detector as described in claim 2, characterized in that, The method of obtaining the zero-position deviation value of the infrared cooled detector (5) based on the position of the current image center design point and the position of the target (4) in the current image includes: Based on the position of the current image center design point and the position of the target (4) in the current image, the distance between the current image center design point and the target (4) is obtained; Based on the distance between the current image center design point and the target (4), and the image specifications, the zero-position deviation value of the infrared cooled detector (5) is obtained.

4. The method for zero-position testing of an infrared cooled detector as described in claim 2, characterized in that, The method of obtaining the zero-position deviation value of the infrared cooled detector (5) based on the position of the current image center design point and the position of the target (4) in the current image includes: Adjust the position of the infrared cooled detector (5) in a direction perpendicular to the reference optical axis until the image center design point coincides with the target (4); The zero-position deviation value of the infrared cooled detector (5) is obtained based on the adjustment parameters in the direction perpendicular to the reference optical axis.

5. The method for zero-position testing of an infrared cooled detector as described in claim 1, characterized in that, The position of the infrared cooled detector (5) is adjusted until the target (4) in the output image of the infrared cooled detector (5) reaches the set clarity: Adjust the position of the infrared cooled detector (5) along the direction of the reference optical axis.

6. The method for zero-position testing of an infrared cooled detector as described in claim 1, characterized in that, The preset reference optical axis with target (4) includes: An infrared transmission parallel light tube (1) and an infrared lens (2) are arranged at intervals, and the target (4) is placed at the end of the infrared transmission parallel light tube (1) away from the infrared lens (2); A cross-shaped reticle (3) is set on the optical axis of the infrared lens (2), and the optical axes of the infrared lens (2) and the infrared transmission collimator (1) are aligned by the cross-shaped reticle (3) and the target (4) to determine the reference optical axis.

7. The method for zero-position testing of an infrared cooled detector as described in claim 6, characterized in that, When the preset reference optical axis with target (4) is: The placement platform (6) is spaced apart from the infrared transmission parallel light tube (1) and the infrared lens (2), and a cross-shaped positioning fixture (7) is set on the optical axis of the placement platform (6). The optical axes of the infrared lens (2), the infrared transmission parallel light tube (1) and the placement platform (6) are aligned by the cross-shaped positioning fixture (7). The external interface reference position of the infrared cooled detector (5) is located by the cross-shaped positioning fixture (7).

8. The method for zero-position testing of an infrared cooled detector as described in claim 7, characterized in that, The placement platform (6) is a three-dimensional displacement platform.

9. The method for zero-position testing of an infrared cooled detector as described in claim 6, characterized in that, When the preset reference optical axis with target (4) is: A first optical axis calibration optical flat (8) is installed at the first lens mounting reference parallel position of the infrared transmission collimator (1), and a second optical axis calibration optical flat (9) is installed at the first lens mounting reference parallel position of the infrared lens (2). The first optical axis calibration optical flat (8) and the second optical axis calibration optical flat (9) are used to check whether the optical axes of the infrared lens (2) and the infrared transmission collimator (1) are aligned. If they are not aligned, the optical axes are readjusted.

10. The method for zero-position testing of an infrared cooled detector as described in claim 1, characterized in that, During the process of obtaining the zero-point deviation value of the infrared cooled detector (5): Check the reference optical axis for deviation at set intervals. If deviation occurs, readjust the optical axis.

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