一种机械损耗测量装置
By designing clamping components and laser interference structures with frequencies higher than those of the test substrate, the problem of existing technologies being unable to measure the mechanical loss of optical thin films at low frequencies of 100Hz and below and at extremely low temperatures of 4K has been solved, achieving high-precision mechanical loss measurement and supporting the low-noise environment of optical atomic clocks and gravitational wave detection systems.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- UNIV OF SCI & TECH OF CHINA
- Filing Date
- 2026-05-06
- Publication Date
- 2026-07-17
AI Technical Summary
Existing technologies cannot meet the requirements for measuring the mechanical loss of optical thin films at low frequencies of 100Hz and below and at extremely low temperatures of 4K. This results in the inability to meet the key noise frequency band requirements of precision measurement systems such as optical atomic clocks and gravitational wave detectors, thus limiting the research progress in the field of thin film mechanical loss.
A mechanical loss measurement device was designed, comprising a vacuum chamber, a clamping assembly, and a driving assembly. The intrinsic frequency of the clamping assembly is higher than the frequency of the test substrate. A laser interferometry structure is used to measure vibration noise, and mechanical loss information is obtained by using laser reflection. The device ensures that there is no air damping or resonant coupling in the test environment, and achieves stable measurement at low frequency and extremely low temperature.
It achieves stable mechanical loss measurement in the low frequency band of 100Hz and below, provides accurate mechanical loss data, ensures the accuracy and reliability of measurement results, supports the measurement of mechanical loss of optical thin films in extreme low temperature environments of 4K, and meets the needs of precision measurement systems.
Smart Images
Figure CN122150195B_ABST