一种应用于卧式炉管的碳化硅桨

By designing a convergent fluid acceleration channel and a high-purity silicon carbide coating on the silicon carbide propeller, the problem of metal impurities contaminating silicon wafers in the high-temperature diffusion process was solved, achieving efficient impurity removal and improved electrical performance.

CN122161390BActive Publication Date: 2026-07-17SHANGHAI FENGZHENG CHUANGZHAN SEMICONDUCTOR CO LTD

Patent Information

Authority / Receiving Office
CN · China
Patent Type
Patents(China)
Current Assignee / Owner
SHANGHAI FENGZHENG CHUANGZHAN SEMICONDUCTOR CO LTD
Filing Date
2026-05-09
Publication Date
2026-07-17

AI Technical Summary

Technical Problem

In existing silicon carbide substrates, metallic impurities are easily precipitated and contaminate the silicon wafer during high-temperature diffusion processes. Furthermore, the closed structure restricts airflow circulation, preventing impurities from being carried away and affecting the electrical performance of semiconductor chips.

Method used

Design a silicon carbide propeller, including a square support rod, a bowl-shaped substrate area and a transition area. The substrate area is provided with a convergent fluid acceleration guide groove and a high-purity silicon carbide coating. By improving the fluid dynamics, the diffusion channel of metal ions is cut off, and the diffusion of impurities is prevented by high-speed jet and physical barrier.

Benefits of technology

It effectively reduces the diffusion of metal ions into the silicon wafer, improves process yield and device reliability, and reduces the impact of impurities on electrical performance.

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Abstract

本发明公开了一种应用于卧式炉管的碳化硅桨。该应用于卧式炉管的碳化硅桨包括:剖面呈方形的碳化硅支撑杆;剖面呈碗形的碳化硅载片区;连接于碳化硅支撑杆与碳化硅载片区之间且呈从方形向碗形平滑过渡的碳化硅支撑杆与碳化硅载片过渡区;开设于碳化硅载片区内的至少一个长条形开孔区;以及覆盖在碳化硅桨整体外表面的高纯碳化硅涂层。本发明实现了将大面积面接触改进为加速导槽结构以进行游离杂质的流体剥离,并配合高纯碳化硅涂层作为物理屏障消减高温工艺下金属离子析出对半导体晶圆电性能造成的负面影响,提升工艺良率与器件可靠性。
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