一种基于图像处理的叠层对位偏移检测方法及系统
By calculating parameters such as the global turbidity rate, local grayscale dispersion, and radial deformation deviation rate of the medium, an optical scattering and refraction penalty model is constructed, and edge point reliability scores are dynamically assigned. This solves the problem of optical artifact interference in the lamination of multilayer ceramic components, realizes the extraction of high-precision alignment marks, and improves the product yield.
CN122176059BActive Publication Date: 2026-07-17XIAN XINYI ELECTRONIC TECH CO LTD
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- XIAN XINYI ELECTRONIC TECH CO LTD
- Filing Date
- 2026-05-12
- Publication Date
- 2026-07-17
Smart Images
Figure CN122176059B_ABST
Abstract
本发明属于陶瓷产品叠层检测技术领域，涉及一种基于图像处理的叠层对位偏移检测方法及系统，方法包括：获取多层陶瓷元器件的平滑图像，多层陶瓷元器件包含依次层叠的顶层生瓷带与多层底层生瓷带，顶层生瓷带与底层生瓷带之间具有半透明介质层；提取平滑图像中底层生瓷带对位标记的多个候选边缘点；计算多个候选边缘点各自的边缘可靠度得分，将边缘可靠度得分作为动态加权系数，对候选边缘点集中的候选边缘点进行拟合得到底层生瓷带对位标记的中心坐标，实现对叠层对位偏移的检测，提高了层间纠偏的准确性。
Need to check novelty before this filing date? Find Prior Art