一种固态硬盘数据纠错方法及固态硬盘

By acquiring error bit statistics, performing soft-decision iterative decoding, and correcting voltage drift, a bad block prediction table and an error correction feature knowledge base are established. This solves the problems of flexibility and multi-dimensional evaluation in solid-state drive error correction methods, and improves data integrity and system real-time performance.

CN122177194BActive Publication Date: 2026-07-17LINGRUI TECH (SHENZHEN) CO LTD

Patent Information

Authority / Receiving Office
CN · China
Patent Type
Patents(China)
Current Assignee / Owner
LINGRUI TECH (SHENZHEN) CO LTD
Filing Date
2026-05-07
Publication Date
2026-07-17

AI Technical Summary

Technical Problem

Existing SSD error correction methods lack flexibility, cannot dynamically adjust error correction strategies, cannot effectively cope with voltage drift, lack prediction and management of bad blocks, leading to an increased risk of data loss, and lack of multi-dimensional analysis when evaluating error correction performance, affecting system real-time performance.

Method used

By acquiring error bit statistics of data blocks, an error correction strength level is generated, soft-decision iterative decoding is performed, voltage drift is calculated and reference voltage is corrected, a bad block prediction table is established, an error correction feature knowledge base is constructed, and data matching and repair are carried out.

Benefits of technology

It improves data integrity and reliability, reduces the risk of data loss, enhances error correction efficiency and data recovery success rate, ensures data reading accuracy, and provides multi-dimensional error correction performance evaluation and preventive maintenance.

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Abstract

本发明涉及固态硬盘技术领域,具体为一种固态硬盘数据纠错方法及固态硬盘,包括:基于原始读取数据和第一校验结果计算该数据块的错误位统计信息;根据错误位统计信息生成纠错强度等级;基于纠错强度等级对原始读取数据进行软判决迭代解码,得到解码数据和对应的置信度序列;在解码数据通过第二校验的情况下,将解码数据作为初始重构数据输出;基于置信度序列计算存储单元的电压漂移量;基于电压漂移量对闪存参考电压进行修正,得到目标参考电压值。本发明通过根据错误位统计信息生成纠错强度等级,使得系统可以动态调整纠错策略,针对不同程度的数据损坏采用相应的解码技术,从而提升纠错效率。
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