Hardware-in-the-loop test bench and relay fault test method

By designing the voltage input and output components of the hardware-in-the-loop test bench, the problem of insufficient output channels of the high-voltage source was solved, and independent control of four voltage values ​​was achieved without increasing costs, thereby improving test coverage and software quality.

CN122193646APending Publication Date: 2026-06-12BEIJING AUTOMOBILE RES GENERAL INST
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Patent Information

Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
BEIJING AUTOMOBILE RES GENERAL INST
Filing Date
2026-03-31
Publication Date
2026-06-12

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Abstract

The application relates to a hardware-in-the-loop test bench and a relay fault test method, which comprises first to fifth voltage input ends, a comparison component, a first switch component, a second switch component and first to fifth voltage output ends, the first voltage input end is connected with the first voltage output end, and a first acquisition voltage is output; the input end of the first switch component is connected with the second to fourth voltage input ends and the output end of the comparison component, and the output end of the first switch component is connected with the second to fourth voltage output ends; the input end of the comparison component is connected with a power supply access node and the fourth voltage input end; the fifth voltage input end is connected with the fifth voltage output end to output a second acquisition voltage; and the input end of the second switch component is connected with the second to fourth voltage output ends respectively to output third and fourth acquisition voltages. Thus, the problem that the procurement cost and period are increased due to the lack of high-voltage sources in the related art is solved, and four voltage values can be modified under three high-voltage sources.
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