一种Timepix3探测器的空间分辨验证方法及装置
By using a pinhole imaging geometric model and multiple noise removal techniques, a spatial resolution verification device suitable for the Timepix3 detector was constructed, which solved the problem that existing technologies could not accurately verify the spatial resolution of the detector and achieved quantitative and reliable test results.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- HEFEI INSTITUTE OF PHYSICAL SCIENCE CHINESE ACADEMY OF SCIENCES
- Filing Date
- 2026-05-13
- Publication Date
- 2026-07-17
AI Technical Summary
Existing technologies cannot accurately and quantitatively verify the spatial resolution of the Timepix3 detector under actual working conditions, and lack objective judgment criteria, resulting in poor repeatability and accuracy of test results.
Using a pinhole imaging geometric model, an equivalent strip light source is formed by a grid module and a moving X-ray tube. Combining the centroid method and multiple noise removal techniques, and using a resolution contrast parameter value of less than 0.7 as a quantitative criterion, a spatial resolution verification device suitable for the Timepix3 detector is constructed.
It achieves accurate and quantitative verification of the spatial resolution of the Timepix3 detector, overcomes the shortcomings of theoretical calculation, improves the objectivity and reliability of test results, and simplifies the operation process.
Smart Images
Figure CN122194232B_ABST