A test case generation method, device, electronic equipment and program product

Abstract

The application discloses a test case generation method and device, electronic equipment and program product, and belongs to the technical field of software testing. The method comprises the following steps: obtaining the development document and source code of a to-be-tested project, and establishing a mapping relationship; inputting the mapped data into a test case generation model to generate test cases, wherein the model is fine-tuned in a manner of adopting a balanced loss function for assigning higher loss weight to test cases capable of discovering defects, and dynamically adjusting the learning rate according to test feedback; executing the test cases to monitor the code coverage rate and the defect detection rate; and iteratively optimizing the model based on the monitoring result. The application generates test cases that are in line with actual business and code logic based on the development document and the source code, and realizes continuous self-optimization of the test case generation capability, thereby effectively improving the comprehensiveness and accuracy of test coverage.

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