用于自由电子激光装置的波荡器校正和轨道准直方法
By observing the spectral characteristics of the spontaneous emission of the undulator on a spectrometer, the undulator unit was decoupled and corrected, solving the problems of undulator parameters and orbit collimation in the soft X-ray band, and improving the dimming efficiency and radiation performance of the free electron laser device.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- SHANGHAI ADVANCED RES INST CHINESE ACADEMY OF SCI
- Filing Date
- 2026-05-15
- Publication Date
- 2026-07-17
AI Technical Summary
Existing technologies struggle to achieve efficient undulator parameter correction and orbit collimation in the soft X-ray band, especially under conditions that do not rely on complete spot imaging, leading to a decrease in the dimming efficiency and radiation performance of free-electron laser devices.
By observing the spectral characteristics of the spontaneous emission of the undulator on a spectrometer, and using parameters such as the radiation center wavelength, radiation intensity, and spot morphology, decoupling correction is performed. The undulator units are corrected one by one to find the optimal operating point, which is suitable for low- and medium-energy free electron laser devices.
This technology improves undulator utilization and free-electron laser radiation performance without relying on complete spot imaging, thereby enhancing dimming efficiency and device operating efficiency.
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Figure CN122203027B_ABST
Abstract
Citation Information
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