一种电动汽车充电接口插拔寿命预测方法及系统

By constructing a 3D model of the charging interface and combining user plug-in/plug-out data with the Archard wear model, the problem of the disconnect between charging interface life prediction and actual usage scenarios was solved, achieving accurate prediction of charging interface life and a true reflection of wear status.

CN122221612BActive Publication Date: 2026-07-17CHONGQING VEHICLE TEST & RES INST CO LTD

Patent Information

Authority / Receiving Office
CN · China
Patent Type
Patents(China)
Current Assignee / Owner
CHONGQING VEHICLE TEST & RES INST CO LTD
Filing Date
2026-05-21
Publication Date
2026-07-17

AI Technical Summary

Technical Problem

In existing technologies, the lifespan prediction of electric vehicle charging interfaces is out of touch with actual usage scenarios, the accuracy of the prediction results is insufficient, and it is impossible to quantify the non-uniform contact pressure distribution and micro-wear differences of the interface contact surface under different operating conditions.

Method used

By acquiring the geometric posture deviation and contact pressure distribution during the plugging and unplugging process of the charging gun and charging interface, a three-dimensional model is constructed using the finite element static simulation method. Typical working conditions are extracted using the user's historical plugging and unplugging operation dataset. The micro wear amount is calculated based on the Archard wear model, and the wear amount is accumulated to generate a wear accumulation distribution map, thereby achieving accurate prediction of the charging interface life.

Benefits of technology

It accurately characterizes the interface stress under different gun tip postures, improves the accuracy and reliability of charging interface life prediction, fully restores the wear and tear during actual use, and significantly improves the accuracy and reliability of prediction.

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Abstract

本申请涉及电动汽车技术领域,具体为一种电动汽车充电接口插拔寿命预测方法及系统。该方法包括:获取充电枪与充电接口插拔过程中的枪端几何姿态偏差、接口端接触压力分布;构建充电接口三维模型;获取典型工况模式,通过充电接口三维模型对各典型工况模式进行仿真,得到其对应的全域接触压力分布数据,并确定各典型工况模式的集中压力区。对于单次插拔操作,匹配其对应的典型工况模式,基于Archard磨损模型计算其集中压力区的微观磨损量;累加多次插拔操作的微观磨损量,生成磨损累积分布图并预测充电接口的剩余插拔寿命。本申请的方案能够全面、真实地还原充电接口在实际使用过程中的磨损情况,显著提升充电接口寿命预测的准确性和可靠性。
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