Fault rapid troubleshooting method, device, equipment, storage medium and product

CN122243475APending Publication Date: 2026-06-19NAVAL UNIV OF ENG PLA
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Patent Information

Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
NAVAL UNIV OF ENG PLA
Filing Date
2026-05-21
Publication Date
2026-06-19

AI Technical Summary

Technical Problem

Existing technologies struggle to quickly pinpoint the cause of faults during troubleshooting. Multi-branch tree searches are inefficient, especially in complex equipment where the quantitative values ​​of the inspection results vary greatly, making it difficult to pinpoint the exact cause of the fault.

Method used

By establishing a fault feature matrix and an inspection result matrix, an intermediate feature matrix and an intermediate inspection matrix are generated, the troubleshooting order is optimized, the complete inspection results are described using arrays, and multiple intermediate matrices are used for fault troubleshooting.

Benefits of technology

It improves troubleshooting efficiency, enables quick identification of fault causes, reduces the need for maintenance personnel to be familiar with the equipment, and has better versatility and efficiency.

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Abstract

This application belongs to the field of data processing technology, specifically disclosing a method, apparatus, device, storage medium, and product for rapid fault diagnosis. This application establishes a fault feature matrix based on the cause of the fault and the inspection items required to diagnose it. When elements in the array of candidate inspection item numbers meet preset conditions, an intermediate feature matrix is ​​generated based on the row number and the fault feature matrix, and an intermediate inspection matrix is ​​generated based on the row number and the inspection result matrix. The initial inspection order is optimized based on the intermediate feature matrix and the intermediate inspection matrix, and fault diagnosis is performed according to the optimized inspection order. Through this method, it is not necessary to know the pattern of each inspection result beforehand. An array is used to describe a complete inspection result, and multiple intermediate matrices are used to optimize the inspection order for fault diagnosis, thereby effectively improving fault diagnosis efficiency and enabling rapid fault location.
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