A lighting test system and method for oxide display module

CN122245203APending Publication Date: 2026-06-19SHENZHEN K&D TECHONOLOGY
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Patent Information

Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
SHENZHEN K&D TECHONOLOGY
Filing Date
2026-03-12
Publication Date
2026-06-19

AI Technical Summary

Technical Problem

Oxide thin-film transistors are prone to problems such as screen flickering after abnormal power loss, flickering, and screen burn-in after hot-plugging during module lighting tests, which affect the reliability and efficiency of the test.

Method used

It adopts an integrated hardware and software design, prevents hot-swapping through cylinder lock and pressure head structure, performs VCOM voltage calibration by combining median value search algorithm, and forcibly releases residual charge in case of abnormal power failure. It also integrates an automated test platform to achieve fully automated testing.

Benefits of technology

It effectively prevents screen flickering and burn-in, improves the reliability and consistency of testing, reduces the flicker defect rate, shortens testing time, and is suitable for mass production.

✦ Generated by Eureka AI based on patent content.

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Abstract

This invention discloses a lamp-lighting testing system and method for oxide display modules. The testing system includes a test frame, a pressure head, a cylinder lock, and a power cord. A test circuit is installed inside the test frame, and the power cord is connected to the test frame and electrically connected to the test circuit. A first test point is set on the test frame, and the pressure head is positioned above the first test point on the test frame. The cylinder lock is fixedly connected to the pressure head, and an air tube is connected to the cylinder lock. This invention avoids screen flickering after abnormal power loss through active charge release, solving the flickering problem. It achieves fast and accurate VCOM calibration through a median search algorithm, reducing flicker defect rate and improving image consistency. This invention employs dual hardware and software protection, significantly reducing the risk of screen burn-in caused by hot-swapping and effectively preventing hardware damage. Automated processes reduce manual intervention, shorten overall testing time, and are suitable for mass production, improving testing efficiency.
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