A test socket terminal and test socket

Abstract

This invention discloses a test socket terminal and a test socket, including a terminal body. A contact head is connected to the head end of the terminal body, and a soldering foot is connected to the tail end. The middle section of the terminal body bulges laterally, giving it a curved shape. When the contact head is pressed, it can compress the terminal body, causing it to deform. A first locking block is provided at the head end of the terminal body, which forms a limiting engagement with a step I of an insulating component. A second locking block is provided at the tail end of the terminal body, which forms a limiting engagement with a stop step II of the insulating component. This device improves the mechanical properties of the test socket terminal by modifying the test socket terminal and the insulating component, making it suitable for multi-pin test sockets. It also solves the problem of poor impedance and SI performance of existing contact terminals, improving the overall insulation withstand voltage of the contact assembly.

Description

Technical Field

[0001] This invention belongs to the field of chip testing technology, specifically relating to a test socket terminal and a test socket. Background Technology

[0002] A test socket is a common connector product used in the chip industry. It is used to connect the chip and the PCB motherboard for electrical connection during chip testing, transmitting signals and energy. Currently, the mainstream test socket contact is a Pogo-pin structure. However, existing technologies still have the following drawbacks: While current contact devices deform as a whole during testing to ensure good contact between the contact and the chip, existing contact designs have limitations. The test socket contact structure cannot be adapted to the testing of connectors with corresponding pin counts. For example, a large positive force on the contact during testing makes it difficult to achieve the required deformation of the test socket contact during testing of connectors with multiple pin counts. Furthermore, there are issues with the SI performance of the test socket contact components and insulation withstand voltage problems.

[0003] In addition, existing test holders have the following problems: 1. Cumbersome operation; tightening and rotating actions are not suitable for automated production and require a large operating space. 2. Pogo-pin structures often employ machining processes, resulting in high costs and making them unsuitable for mass production. 3. The welded legs are slender, relying on component dimensions to ensure positional accuracy, which is difficult and costly. Summary of the Invention

[0004] The purpose of this invention is to solve the problems existing in the prior art and provide a test socket terminal and a test socket. This device improves the mechanical properties of the test socket terminal by improving the test socket terminal and the insulating component, making it suitable for multi-pin test sockets. At the same time, it solves the problem of poor impedance and SI performance of existing contact terminals and can effectively improve the overall insulation withstand voltage of the contact components.

[0005] One objective of this invention is to provide a test socket terminal, comprising a terminal body, wherein a contact head is connected to the head end of the terminal body and a soldering foot is connected to the tail end of the terminal body; the middle section of the terminal body is laterally raised to make it curved, and when the contact head is pressed, the contact head can squeeze the terminal body to cause it to deform.

[0006] As a preferred embodiment, the terminal body has a first locking block at its head end, which is used to form a limiting engagement with the stop step I of the insulating component, and a second locking block at its tail end, which is used to form a limiting engagement with the stop step I of the insulating component.

[0007] As a preferred embodiment, the terminal body is flat and includes two oppositely arranged wide surfaces and two oppositely arranged narrow surfaces. The wide surfaces include a C-shaped structure, and the width of the wide surface of the terminal body is greater than the width of the narrow surface. One of the narrow surfaces is a raised surface, and the other narrow surface is a recessed surface.

[0008] As a preferred embodiment, the terminal body is bent and includes two oppositely arranged wide surfaces and two oppositely arranged narrow surfaces. The width of the wide surfaces of the terminal body is greater than the width of the narrow surfaces; one of the wide surfaces is a raised surface and the other wide surface is a recessed surface.

[0009] As a preferred embodiment, the terminal body includes an intermediate section and connecting sections I and II disposed at both ends of the intermediate section, wherein the other end of connecting section I is connected to a contact head, and the other end of connecting section II is connected to a welding foot.

[0010] As a preferred embodiment, a through-hole is formed at the bend connection on the wide surface.

[0011] A second objective of the present invention is to provide a contact component, comprising the test socket terminal and the insulating component described above, wherein the test socket terminal and the insulating component are stacked to form the contact component.

[0012] As a preferred embodiment, a connecting cavity for accommodating test socket terminals is formed between two adjacent insulating components, and the test socket terminals are arranged sequentially in the connecting cavity between the two insulating components, with an air gap formed between two adjacent test socket terminals.

[0013] A third objective of the present invention is to provide a contact component comprising a test socket terminal and an insulating element as described in any of the above claims, wherein the test socket terminal and the insulating element are stacked to form the contact component.

[0014] As a preferred embodiment, the insulating member has a convex surface that mates with the test socket terminal, and the adjacent insulating member has a concave surface that mates with the convex surface. The convex surface has a series of isolation protrusions, and the two adjacent insulating members are separated into independent sub-cavities by the isolation protrusions. The test socket terminal is installed in the sub-cavity to achieve mutual isolation.

[0015] As a preferred embodiment, the insulating component has a through-hole for positioning, and positioning pins pass through the positioning hole in sequence to achieve positioning and engagement between the insulating components.

[0016] The fourth objective of this invention is to provide a test holder, which includes an outer frame and a contact member as described in any of the above claims, wherein the contact member is disposed within the outer frame, and at least a portion of the end of the positioning pin extends out of the outer wall of the contact member and is fixed within the pin hole of the outer frame.

[0017] As a preferred embodiment, the system further includes a floating plate located on the contact head side of the contact member. The floating plate is capable of moving away from or towards the contact member. When the floating plate moves to a position away from the contact member, the contact head can be placed inside the perforation of the floating plate. When the floating plate moves to a position close to the contact member, the contact head can pass through and extend out of the perforation I of the floating plate.

[0018] As a preferred embodiment, a protective cover is also included, located on the welding foot side of the contact component, and the protective cover has a through hole II for the welding foot to pass through.

[0019] Beneficial effects Firstly, through structural improvements, this invention installs a wafer assembly consisting of rows of plastic sheets and elastic contact terminals stacked inside the outer frame. The contacts are either sheet-type contacts (after the sheet metal is cut, the middle section of which bulges towards a narrower side) or bent contacts (after the sheet metal is bent as a whole, the middle section of which bulges towards a wider side). One end of the test socket terminal is provided with a contact head, and the other end is provided with a soldering foot. There are locking points below the contact head and above the soldering area of ​​the contact terminal to position the test socket terminal. When the contact head is pressed, the test socket terminal can deform under the pressure to ensure reliable contact between the contact head and the chip.

[0020] Secondly, this invention also considers that the flat-cut sheet contact (test terminal) has a large positive force (along the pressure direction). In order to make the contact terminal suitable for products with multiple pins, its structure is further improved to make it into the bending and forming scheme of this invention. When processing the sheet metal, it is formed by bulging on one side of the sheet metal to facilitate the deformation of the terminal contact area after being pressed. At the same time, it can overcome the technical problem of poor SI performance of the sheet contact.

[0021] Thirdly, for this type of contact, the structure of the insulating component is adapted and improved. Since the contact is a sheet-like structure, its front and rear ends need to be suspended during design to create a deformation gap that bends along the width direction. However, with the improvement, the bent contact (test socket terminal) in this solution bends along the thickness direction. Therefore, the structure of the insulating block can be improved so that one side has a raised surface structure, thus matching the bending shape of the bent contact. Insulating protrusions are set between adjacent contacts. After the insulating components are stacked, the insulating protrusions isolate the space between two insulating components into independent receiving cavities. The bent contact can be compressed and deformed within these cavities without obstruction. Based on this bent contact, the SI performance of the contact can be further improved, while also enhancing the insulation withstand voltage performance of the insulating component. Attached Figure Description

[0022] To more clearly illustrate the technical solutions in the embodiments of the invention or the prior art, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the invention. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0023] Figure 1 This is a diagram showing the distribution of the test socket terminals on the insulating component in Embodiment 1 of the present invention; Figure 2 for Figure 1 Side view of the test socket terminal; Figure 3 for Figure 1 Front view of the test socket terminal; Figure 4 This is a perspective view of the test socket terminals in Example 2; Figure 5 This is a side view of the test terminal block in Example 2; Figure 6 This is a front view of the test terminal block in Example 2; Figure 7 This is a schematic diagram showing the distribution of the test socket terminals on the insulating component in Example 2; Figure 8 This is a schematic diagram of the back side of the insulating component in Example 2; Figure 9 This is a schematic diagram of the structure after the contact components are assembled in Example 2. Figure 1 ; Figure 10 This is a schematic diagram of the structure after the contact components are assembled in Example 2. Figure 2 ; Figure 11 The three-dimensional test stand of the present invention Figure 1 ; Figure 12 The three-dimensional test stand of the present invention Figure 2 ; Figure 13 This is a front view of the test fixture of the present invention; Figure 14 This is an exploded view of the test fixture of the present invention; Figure 15 This is a schematic diagram of the clamping component of the test seat clamping the chip in this invention; Figure 16 This is a schematic diagram of the clamping assembly of the test seat in the open state in this invention; Figure 17 This is a schematic diagram of the welding foot extending into the protective cover in this invention; Figure 18 This is a cross-sectional view of the test fixture of the present invention; Figure 19This is a structural diagram of the outer frame in this invention; Figure 20 This is a perspective view of the test stand in this invention; Figure 21 This is a cross-sectional view of the protective cover in this invention.

[0024] Marked in the image: 1. Terminal body; 11. Contact head; 12. Welding foot; 13. First locking block; 14. Second locking block; 15. Wide face; 16. Narrow face; 17. Middle section; 18. Connecting section I; 19. Connecting section II; 110. Drop hole; 2. Insulating component; 20. Communicating cavity; 21. Stop step I; 22. Stop step II; 23. Isolation protrusion; 24. Sub-cavity; 25. Convex surface; 26. Concave surface; 27. Positioning hole; 28. Positioning pin. 3. Test socket terminals; 4. Contact components; 5. Outer frame; 51. Pin hole; 52. Slot; 521. Stop plate I; 522. Stop plate II; 53. Slide groove; 54. Buckle III; 541. Stop head III; 55. Cavity; 56. Lower hole I; 57. Connecting hole; 58. Positioning pin; 59. Lower hole II; 510. Mating groove. 6. Floating plate; 61. Perforation I; 62. Elastic element I; 63. Support arm; 64. Upper hole II; 65. Stop platform III; 7. Protective cover; 71. Cover body; 72. Perforation II; 721. Guide hole section; 722. Closing section; 73. Buckle II; 731. Locking platform II. 8. Pressure cap; 81. Elastic element II; 82. Upper hole I; 83. Guide post; 84. Corner post; 85. Sliding block; 86. Snap fastener I; 861. Locking platform I. 9. Clamping assembly; 91. Rotating component; 911. Shaft hole; 912. Floating cavity; 92. Rotating shaft; 93. Floating shaft; 10. PCB board; 101. Positioning hole; 102. Soldering hole; 100. Chip under test; Detailed Implementation

[0025] The present invention will now be described in detail through exemplary embodiments. However, it should be understood that, without further description, elements, structures, and features in one embodiment may be advantageously incorporated into other embodiments.

[0026] It should be noted that, unless otherwise defined, the technical or scientific terms used herein should have the ordinary meaning understood by one of ordinary skill in the art to which this invention pertains. The terms "a," "an," or "the," and similar words used in the specification and claims of this patent application do not express a limitation of quantity, but rather indicate the presence of at least one. Terms such as "comprising" or "including" indicate that the elements or objects preceding "comprising" encompass the elements or objects listed following "comprising" or "including" and their equivalents, but do not exclude other elements or objects having the same function.

[0027] Example 1 like Figure 1-3 As shown, this embodiment provides a test socket terminal 3, including a terminal body 1, a contact head 11 connected to the head end of the terminal body 1, and a welding foot 12 connected to the tail end of the terminal body 1; the middle section of the terminal body 1 is laterally raised to make it curved, and when the contact head 11 is pressed, the contact head 11 can squeeze the middle position of the terminal body 1 to deform.

[0028] In this design, the test socket terminal 3 is a sheet-like terminal contact. It is entirely flat, and the middle section of the terminal body 1 has a C-shaped sheet structure. The C-shape is formed by bending the middle section of the terminal body 1 to one side. The terminal body 1 is a flat sheet, comprising two opposing wide surfaces 15 and two opposing narrow surfaces 16. The wide surfaces 15 have a C-shaped structure. The width of the wide surface 15 of the terminal body 1 (along as shown in the figure) is... Figure 3 The width shown in section A) is greater than the width of the narrow face 16 (as shown in section A). Figure 2 (The width shown in B); one narrow surface 16 is a raised surface, and the other narrow surface 16 is a recessed surface. After the contact head 11 is pressed, the C-shaped structure of the terminal body 1 will deform to a certain extent.

[0029] To achieve proper engagement with the insulating component 2, a first locking block 13 is provided at the head end of the terminal body 1. The first locking block 13 forms a limiting engagement with the stop step I 21 of the insulating component 2, thereby stopping and limiting one end of the contact head 11 of the terminal body 1. A second locking block 14 is provided at the tail end of the terminal body 1. The second locking block 14 forms a limiting engagement with the stop step II 22 of the insulating component 2, thereby stopping and limiting one end of the welding leg 12 of the terminal body 11. Through the first locking block 13 and the second locking block 14, the terminal body 1 is positioned and limited within the installation gap between two adjacent insulating components 2.

[0030] This solution, based on its manufacturing process using a planar blanking method, has a blanking width (the width of the wide surface 15 along direction A in the figure) that is greater than the material thickness (the width of the narrow surface 16 along direction B in the figure, i.e., the thickness of the terminal body 1). Due to the high structural rigidity of this type of test socket terminal 3, the positive force (along the compression direction) of this type of test socket terminal 3 is relatively large. After the contact head 11 of the test socket terminal 3 is compressed, the terminal body 1 is not easily deformed. Therefore, when designing the contact component of this structure, due to the problem of its large positive force, the blanking width (the width along direction A in the figure) should not be too large (the blanking width should be appropriately reduced and restricted). However, the restricted blanking width will cause the transmission link of the test socket terminal 3 to become narrower, which will further lead to the problem of poor SI performance of the test socket terminal 3.

[0031] The present invention also provides an insulating member 2 adapted to the above-mentioned test socket terminals. A stop step I 21 and a stop step II 22 are integrally formed on the end face of the insulating member 2 near the upper and lower ends. The stop step I 21 and the stop step II 22 are respectively used to form a limiting engagement with the first locking block 13 and the second locking block 14 at both ends of the terminal body 1. A communicating cavity 20 is formed between two adjacent insulating members 2. Preferably, the inner side of the communicating cavity 20 is a planar structure. The test socket terminals 3 are arranged in the communicating cavity 20 as shown in the figure, such that the raised surface of one test socket terminal 3... Corresponding to the recessed surface of the adjacent test socket terminal 3, an air gap is formed between the two adjacent test socket terminals 3 to achieve air insulation. Based on the shape of the test socket terminal 3 of this structure, the test socket terminal 3 needs to be installed between the insulating components 2 in the arrangement shown in the figure to ensure that it can deform along the pressure direction. The gap structure between the two insulating components 2 will result in both sides of the test socket terminal 3 being suspended, resulting in poor impedance and SI performance and insulation withstand voltage problems. Due to the poor air insulation effect, it is easy to be broken down by current, leading to insulation withstand voltage failure.

[0032] In this embodiment, a contact component 4 is also provided, including the test socket terminal 3 and the insulating component 2 mentioned above. The test socket terminal 3 and the insulating component 2 are stacked to form the contact component 4. A positioning hole 27 is formed at a corresponding position on the insulating component 2. Positioning pins 28 pass through the positioning hole 27 in sequence to realize the assembly positioning and cooperation between the insulating components 2.

[0033] Example 2 like Figure 4-10 As shown, this embodiment provides a test socket terminal 3, including a terminal body 1. A contact head 11 is connected to the head end of the terminal body 1, and a welding foot 12 is connected to the tail end of the terminal body 1. The middle section of the terminal body 1 is laterally raised to make it curved. When the contact head 11 is pressed, the contact head 11 can squeeze the terminal body 1 to deform.

[0034] In this design, the middle section of the test terminal 3 is bent to one side along the thickness direction, thereby extending its width along the narrow surface 16 on the bent side (along...). Figure 5 The width indicated at point C is less than the width of the wide surface of terminal body 1 (along...). Figure 6 The indicated width at point D (shown) further optimizes the technical problem of high structural rigidity of terminal body 1 in Embodiment 1. The structure of test socket terminal 3 in this embodiment is more conducive to deformation after being subjected to force compared with the structure of Embodiment 1, so it can be applied to test sockets with multiple pins. In addition, in order to further reduce the positive force, a material dropping hole 10 is punched at the bending position of terminal body 1, which can further reduce the positive force and achieve the purpose of designing minimal positive force, which is particularly suitable for products with multiple pins.

[0035] One structure of the test socket terminal 3 in this scheme is as follows: The terminal body 1 includes an intermediate section 17 and connecting sections I 18 and II 19, which are bent and inclined to the same side at both ends of the intermediate section 17. Connecting sections I 18 and II 19 are respectively bent at a certain angle to the intermediate section 17. Connecting sections I 18 and II 19 form a spring arm structure at both ends of the intermediate section 17. The other end of connecting section I 18 is connected to the contact head 11, and connecting section I 18 is bent at a certain angle to the contact head 11. The other end of connecting section II 19 is connected to the welding foot 12, and connecting section II 19 is bent at a certain angle to the welding foot 12. More preferably, a material drop hole 10 is provided near the connection point of connecting sections I 18 and II 19. The purpose of this design is to further reduce the positive force of the test socket terminal 3 through the material drop hole 10, so as to facilitate the deformation of the test socket terminal 3 under pressure.

[0036] In this design, a first locking block 13 is provided at one end of the terminal body 1 near the contact head 11. The first locking block 13 forms a limiting engagement with the stop step I 21 of the insulating component 2, thereby stopping and positioning one end of the contact head 11 of the terminal body 1. A second locking block 14 is provided at the tail end of the terminal body 1. The second locking block 14 forms a limiting engagement with the stop step II 22 of the insulating component 2, thereby stopping and limiting one end of the welding leg 12 of the terminal body 11. Through the first locking block 13 and the second locking block 14, the terminal body 1 is positioned and restricted within the gap between two adjacent insulating components 2.

[0037] In this design, to accommodate the bending structure of the test socket terminal 3, one side of each of the two adjacent insulating members 2 is configured as a convex surface 25, which mates with one side of the concave surface of the test socket terminal 3. The other insulating member 2 is configured as a concave surface 26, which mates with one side of the raised surface of the test socket terminal 3. The convex surfaces 25 and concave surfaces 26 of the two adjacent insulating members 2 are arranged opposite to each other, forming a gap between them for mounting the test socket terminal 3, and allowing the test socket terminal 3 to deform within the gap.

[0038] In this design, to further improve the insulation performance between test socket terminals 3, an isolation protrusion 23 is provided on one side of adjacent insulating components 2. One embodiment is as follows: for example, an isolation protrusion 23 is provided on the convex surface 25 side of the insulating component 2. The isolation protrusion 23 is used to isolate the gap between two adjacent insulating components 2 into independent sub-cavities 24. The sub-cavities 24 form a contoured structure with the test socket terminals 23. Each sub-cavity 24 is used to accommodate one test socket terminal 3, realizing the mutual isolation between different test socket terminals 3. Based on the structure of the test socket terminals 3, this design makes the plastic body of the insulating component 2 form a contact-like structure. At the same time, by increasing the amount of plastic, the characteristic impedance of the product can be reduced, thereby optimizing the high-frequency performance of the product. Specifically, the isolation protrusion 23 of the plastic isolates adjacent test socket terminals 3, and at the same time improves the withstand voltage performance of the product. In addition, in an embodiment without drawings, the isolation protrusion 23 can also be provided on the concave surface 26 of the insulating component 2. The isolation protrusion 23 cooperates with the corresponding end face to form independent sub-cavities 24.

[0039] In this embodiment, a contact component 4 is also provided, including the test socket terminal 3 and the insulating component 2 described above. The test socket terminal 3 and the insulating component 2 are stacked to form the contact component 4. Positioning holes 27 are formed at corresponding positions on the insulating component 2, and positioning pins 28 pass through the positioning holes 27 in sequence to achieve assembly positioning and engagement between the insulating components 2. At least two positioning pins 28 in the positioning holes 27 extend outward, and the ends of the positioning pins 28 can be fixed in the pin holes 51 of the outer frame 5 to form a fixed connection.

[0040] It should be noted that the structure of the insulating component 2 can be adjusted according to the setting position. For example, the concave surfaces 26 of the two insulating components 2 closest to the middle position can be set opposite each other, and the two insulating components 2 closest to the outermost position can only have their inner surfaces set as concave surfaces 26. Since the outer surface does not need to cooperate with the test socket terminal 3, it can adopt the planar structure shown in the figure.

[0041] Example 3 This embodiment also provides a test stand, including the contact component 4, outer frame 5, pressure cover 8, clamping assembly 9 and floating plate 6 as in embodiment 1 or embodiment 2, wherein the contact component 4 is disposed inside the outer frame 5, and the end of the positioning pin 28 extends into the pin hole 51 of the outer frame 5 for fixed installation.

[0042] In this embodiment, the floating plate 6 is disposed inside the cavity 55 of the outer frame 5 and located on the top side of the contact member 4. The floating plate 6 can move away from or towards the contact member 4. The floating plate 6 is provided with a through hole I 61 corresponding to the position of the contact head 11. When the floating plate 6 moves to a position away from the contact member 4, the contact head 11 can be placed inside the through hole I 61 of the floating plate 6. When the floating plate 6 moves to a position close to the contact member 4, the contact head 11 can pass through the through hole I 61 of the floating plate 6 and extend out, thereby being used to contact the chip under test 100.

[0043] In this embodiment, the pressure cover 8 is located above the outer frame 5 and can move relative to the outer frame 5; the floating plate 6 is located between the contact member 4 and the pressure cover 8 and can move relative to the contact member 4; the floating plate 6 is mounted on the outer frame 5 through the elastic member I 62; after the floating plate 6 is pressed towards the contact member 4, the head end of the contact head 11 can pass through the through hole I 61 of the floating plate 6 and be exposed, so as to realize the electrical contact between the contact head 11 and the chip under test 100; the clamping assembly 9 is used to lock the chip under test 100 for testing by rotating and closing or to take out and put in the chip under test 100 by rotating and opening. The clamping assembly 9 drives the pressure cover 8 to rotate and open relative to the outer frame 5.

[0044] In this embodiment, the clamping assembly 9 includes a rotating member 91, a rotating shaft 92, and a floating shaft 93 arranged opposite to each other. The rotating member 91 has a shaft hole 911 and a floating cavity 912. The rotating shaft 92 passes through the shaft hole 911, and both ends of the rotating shaft 92 are connected to the connecting holes 57 of the outer frame 5. After the floating shaft 93 passes through the floating cavity 912, both ends of the floating shaft 93 are connected to the connecting holes of the pressure cover 7. There are two rotating members 91, which are respectively located on both sides of the floating plate 6. The floating shaft 93 can move radially along the floating cavity 912 between at least one locked position and one open position. When the pressure cover 7 moves and presses down towards the outer frame 5 to a predetermined position, the floating shaft 93 moves to the unlocked position of the floating cavity 912. At this time, the rotating member 91 rotates around the rotating shaft 92 to open, which is used for unlocking and removing the chip under test 100 for replacement. When the pressure cap 7 rises and resets away from the outer frame 5, the floating shaft 93 moves to the locking position of the floating cavity 912. At this time, the rotating component 91 rotates around the rotating shaft 92 to achieve closure, which can be used to lock and fix the chip under test 100. In this solution, the clamping assembly 9 achieves the rotation of the rotating component 91 around the rotating shaft 92 by switching the floating shaft 93 to different positions in the floating cavity 912, thereby realizing the opening and closing of the rotating component 91.

[0045] In this design, the pressure cap 8 is mounted on the outer frame 5 via an elastic element II 81, which enables the pressure cap 8 to automatically return to its original position after being compressed. Specifically, the elastic element II 81 is a spring, and upper holes I 82 for mounting the elastic element II 81 are formed at the four corners of the pressure cap 8. Guide posts 83 for passing through and guiding the spring are provided at corresponding positions on the outer frame 5. The lower end of the guide post 83 is located in the lower hole I 56. The lower end of the elastic element II 81 passes through the guide post 83 and is placed in the lower hole I 56. The upper holes I 82 and the lower holes I 56 fix the two ends of the elastic element II 81 respectively. The function of the guide post 83 is to prevent non-axial contractile deformation during spring compression. After the pressure cap 8 is pressed down by an external force, the pressure cap 8 can move closer to the outer frame 5. At this time, the elastic element II 81 stores force after being pressed, and the two rotating parts 91 are in the open state. After the external force on the pressure cap 8 is released, the pressure cap 8 can be pushed up under the action of the reset elastic force of the elastic element II 81. As the pressure cap 8 rises, the relative position of the floating shaft 93 in the floating cavity 912 changes. The floating shaft 93 slides along the radial direction of the floating cavity 912 to realize the switching of the rotating parts 91 from the open to the closed state. The locking force of the chip after the rotating parts 91 are closed is provided by the elastic element II 81.

[0046] In this embodiment, corner posts 84 are formed at the four corners of the pressure cap 8, and upper holes I 82 are formed on the lower end surface of the corner posts 84. Matching grooves 510 are formed at the four corresponding corners of the outer frame 5 to match the corner posts 84. Lower holes I 56 are formed on the end surfaces of the matching grooves 510 opposite to the corner posts 84. A guide post 83 is installed in the lower hole I 56, with the upper end of the guide post 83 penetrating into the upper hole I 82 and the lower end of the guide post 83 penetrating into the lower hole I 56. A slider 85 is provided at the edge of one opposite side of the pressure cap 8, and a sliding groove 53 is formed on the outer side wall of the outer frame 5 to cooperate with the slider 85. The slider 85 is slidably disposed inside the sliding groove 53, thereby ensuring the relative movement direction of the pressure cap 8 and the outer frame 5. The slider 85 is provided with buckles I 86 on both sides, and the outer wall of the outer frame 5 is provided with a slot 52. The slot 52 is provided on both sides of the slide groove 53. The upper and lower ends of the slot 52 form a stop platform I 521 and a stop platform II 522 respectively. The end of the buckle I 86 is provided with a locking platform I 861. The locking platform I 861 and the stop platform I 521 form a stop engagement to prevent the pressure cover 8 from separating from the outer frame 5.

[0047] In this embodiment, the floating plate 6 is located inside the cavity 55 of the outer frame 1 and is placed between the contact member 4 and the pressure cover 8. An elastic member I 62 is provided between the floating plate 6 and the outer frame 5. One end of the elastic member I 62 abuts against the outer frame 1 and the other end abuts against the floating plate 6. After the chip under test 100 above the floating plate 6 is locked by the clamping component 9, the elastic member I 62 is in a compressed state. The upper contact head 11 of the contact member 4 inside the floating plate 6 can be exposed outward from the floating plate 6, thereby making electrical contact with the chip under test 100. Specifically, the floating plate 6 includes a floating plate body. When the floating plate 6 is not subjected to the downward pressure of the clamping component 9 and is lifted upward, the contact head 11 of the contact member 4 can be retracted into the through hole I 61 of the floating plate 6. When the floating plate 6 is subjected to the downward pressure of the clamping component 9 and moves downward, the contact head 41 of the contact member 4 can pass through the through hole II 61 of the floating plate 6 and be exposed upward to make electrical contact with the chip under test 100. A support arm 63 extends outward from the edge of the floating plate body. The support arm 63 is used to abut against the end of the elastic member I 62. Preferably, the support arm 63 is provided with an upper hole II 64 for accommodating the end of the elastic member I 62, and the outer frame 5 is provided with a lower hole II 59 for accommodating the other end of the elastic member I 62. The upper hole II 64 and the lower hole II 59 realize the accommodating and fixing of the two ends of the elastic member I 62. In addition, in order to limit the upward movement of the floating plate 6 towards the pressure cover 8 and prevent the contact head 11 from coming out of the through hole I 61 of the floating plate 6, a buckle III 54 is provided on the outer frame 5. The buckle III 54 is located at the edge of the cavity 55 and extends from the outer frame 5 towards the floating plate 6. The end of the buckle III 54 is provided with a stop head III 541. The floating plate 6 is provided with a stop platform III 65 that cooperates with the stop head III 541, thereby limiting the upward floating position of the floating plate 6.

[0048] This solution also includes a protective cover 7, which is located on the side of the outer frame 5 away from the pressure cover 10. The protective cover 7 can move towards or away from the outer frame 5. The protective cover 7 includes a cover body 71. Preferably, a through hole II 72 is formed on the cover body 71 for the welding foot 12 to pass through. A buckle II 73 is provided on the circumferential edge of the cover body 71. A locking platform II 731 is formed on the buckle II 73. A stop platform II 522 that cooperates with the buckle II 73 is provided at the end of the slot 52 away from the pressure cover 7. The locking platform II 731 and the stop platform II 522 cooperate to form a stop and limit on the protective cover 7 along its direction of movement, so as to prevent the protective cover 7 from detaching when it moves relative to the outer frame 5.

[0049] In this embodiment, the through hole II 72 includes at least one guide hole section 721. The guide hole section 721 has a frustum-shaped hole structure, with a large-diameter end and a small-diameter end. The large-diameter end of the guide hole section 721 is the entrance end of the through hole II 72. The welding lead 12 passes through the large-diameter end of the guide hole section 721. Because the large-diameter end of the guide hole section 721 has a large-diameter opening, and its diameter gradually decreases from the large-diameter end to the small-diameter end, the welding lead 12 has a large positional tolerance. That is, all welding feet 12 within the large diameter range can be guided by the through hole II 72. Preferably, a constriction section 722 is provided at the outlet end of the guide hole section 721. Preferably, the constriction section 722 can be a cylindrical hole. The diameter of the constriction section 722 is equal to the diameter of the small diameter end of the guide hole 721. The constriction section 722 restricts the welding feet 12. After the guide hole section 721 performs a certain positional correction on the welding feet 12 extending into it, it restricts them inside the constriction section 722. The guide hole 721 extends outward from the constriction section 722. The purpose of this design is that, as a DIP type product, the soldering pin 12 of the test socket terminal 3 is thin and long, and the position accuracy of the soldering pin 12 is difficult to guarantee. Therefore, when the user solders and assembles the PCB board, there is a risk of the soldering pin 12 kneeling. Through the above setting, the diameter of the guide hole section 721 gradually decreases from the large diameter end to the small diameter end. Preferably, a frustum-shaped hole with a larger taper can be used, so that the entrance range of the frustum-shaped hole is larger, and its inner wall forms a larger chamfer, thereby giving the soldering pin 12 a larger position accuracy. As long as it is within the coverage area of ​​the large diameter end of the frustum-shaped hole, the soldering pin 12 can be guided and the position accuracy of the soldering pin 12 can be corrected.

[0050] In addition, before welding, the protective cover 7 can be positioned low under its own weight, so that the protective cover 7 is as close as possible to the end of the welding foot 12, thus the end of the welding foot 12 is hidden inside the protective cover 7, with only a small part of the head end of the welding foot 12 exposed. Since most of the welding foot 12 is hidden inside the protective cover 7, the head position of the welding foot 12 is limited, thereby providing protection.

[0051] When using the device, the user installs the aforementioned test socket onto the PCB board 10. Since the protective cover 7 is located in the preferred position at the bottom, the soldering pin 12 is corrected and confined within the round hole of the closing section 722. At this time, the position of the soldering pin 12 is positioned, making it easier to align with the soldering hole 102 of the PCB board 10. When the pin tip of the soldering pin 12 enters the soldering hole 102 of the PCB board 10, as it continues to be inserted, the PCB board 10 and the protective cover 7 move together toward the outer frame 5, thereby making it flush with the Standoff position, and then soldering it in place.

[0052] Preferably, the bottom surface of the outer frame 5 is also provided with a positioning post 58 that mates with the PCB board 10. The protective cover 7 has a clearance notch 74 for mates with the positioning post 58. Preferably, the clearance notch 74 is located at the corner of the protective cover 7. The positioning post 58 passes through the clearance notch 74 and extends into the positioning hole 101 of the PCB board 10 for mates, which can ensure the movement direction of the PCB board 10 relative to the test seat 3, and at the same time achieve relative fixation of the two after installation.

[0053] The above description is merely a preferred embodiment of the present invention and is not intended to limit the present invention in any way. Although the present invention has been disclosed above with reference to preferred embodiments, it is not intended to limit the present invention. Any person skilled in the art can make some modifications or alterations to the above-disclosed technical content to create equivalent embodiments without departing from the scope of the present invention. Any simple modifications, equivalent changes, and alterations made to the above embodiments based on the technical essence of the present invention without departing from the scope of the present invention shall still fall within the scope of the present invention.

Claims

1. A test socket terminal, characterized in that: The terminal body (1) includes a terminal body (1), a contact head (11) is connected to the head end of the terminal body (1), and a welding foot (12) is connected to the tail end of the terminal body (1). The middle section of the terminal body (1) is raised laterally to make it bend. When the contact head (11) is pressed, the contact head (11) can squeeze the terminal body (1) to deform it.

2. The test socket terminal according to claim 1, characterized in that: The terminal body (1) is provided with a first locking block (13) at the head end, which is used to form a limiting engagement with the stop step I (21) of the insulating component (2). The terminal body (1) is provided with a second locking block (14) at the tail end, which is used to form a limiting engagement with the stop step I (22) of the insulating component (2).

3. The test socket terminal according to claim 1 or 2, characterized in that: The terminal body (1) is flat and includes two oppositely arranged wide surfaces (15) and two oppositely arranged narrow surfaces (16). The wide surfaces (15) include a C-shaped structure. The width of the wide surface (15) of the terminal body (1) is greater than the width of the narrow surface (16). One narrow face (16) is a raised surface, and the other narrow face (16) is a concave surface.

4. The test socket terminal according to claim 1 or 2, characterized in that: The terminal body (1) is bent and includes two oppositely arranged wide surfaces (15) and two oppositely arranged narrow surfaces (16). The width of the wide surface (15) of the terminal body (1) is greater than the width of the narrow surface (16). One of the wide surfaces (15) is a raised surface and the other wide surface (15) is a recessed surface.

5. The test socket terminal according to claim 4, characterized in that: The terminal body (1) includes an intermediate section (17) and connecting sections I (18) and II (19) disposed at both ends of the intermediate section (17), wherein the other end of connecting section I (18) is connected to the contact head (11) and the other end of connecting section II (19) is connected to the welding foot (12).

6. The test socket terminal according to claim 4, characterized in that: A through-hole (110) is formed at the bend connection on the wide surface (15).

7. A contact component, characterized in that: It includes the test socket terminal (3) as described in claim 3 and the insulating member (2), wherein the test socket terminal (3) and the insulating member (2) are stacked to form a contact member (4).

8. The contact component according to claim 7, characterized in that: A connecting cavity (20) for accommodating test socket terminals (3) is formed between two adjacent insulating members (2). The test socket terminals (3) are arranged sequentially in the connecting cavity (20) between the two insulating members (2), and an air gap is formed between two adjacent test socket terminals (3).

9. A contact component, characterized in that: Includes the test socket terminal (3) and the insulating member (2) as described in any one of claims 4-6, wherein the test socket terminal (3) and the insulating member (2) are stacked to form a contact member (4).

10. The contact component according to claim 9, characterized in that: The insulating member (2) has a convex surface (25) that mates with the test socket terminal (3), and the adjacent insulating member (2) has a concave surface (26) that mates with the convex surface (25). Isolation protrusions (23) are arranged on the convex surface (25). The two adjacent insulating members (2) are separated into independent sub-cavities (24) by the isolation protrusions (23). The test socket terminal (3) is installed in the sub-cavity (24) to achieve mutual isolation.

11. The contact member according to any one of claims 7-10, characterized in that: The insulating component (2) has a through-hole (27) through which positioning pins (8) pass in sequence to achieve positioning and engagement between the insulating components (2).

12. A test socket, characterized in that: It includes an outer frame (5) and a contact member (4) as described in any one of claims 7-11, wherein the contact member (4) is disposed within the outer frame (5), and at least part of the end of the positioning pin (8) extends out of the outer wall of the contact member (4) and is fixed in the pin hole (51) of the outer frame (5).

13. The test fixture according to claim 12, characterized in that: It also includes a floating plate (6) located on the side of the contact head (11) of the contact member (4). The floating plate (6) can move away from or towards the contact member (4). When the floating plate (6) moves to a position away from the contact member (4), the contact head (11) can be placed inside the perforation (61) of the floating plate (6). When the floating plate (6) moves to a position close to the contact member (4), the contact head (11) can pass through and protrude from the perforation I (61) of the floating plate (6).

14. The test fixture according to claim 13, characterized in that: It also includes a protective cover (7) located on the side of the welding foot (12) of the contact member (4), and a through hole (71) is formed on the protective cover (7) for the welding foot (12) to pass through.

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