Optoelectronic integrated package structure based on core particle stacking and method of manufacturing the same

The metal interconnect bumps formed by the chip stacking structure and selective chemical plating process solve the problems of complex structure, long interconnect path and high thermal resistance in optoelectronic co-packaging, realize compact high-density optoelectronic integrated packaging, reduce signal delay and power consumption, and improve process reliability.

CN122249041APending Publication Date: 2026-06-19上海曜感科技有限公司

Patent Information

Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
上海曜感科技有限公司
Filing Date
2026-02-03
Publication Date
2026-06-19

Smart Images

  • Figure CN122249041A_ABST
    Figure CN122249041A_ABST
Patent Text Reader

Abstract

This invention discloses a photonic integrated packaging structure based on chip stacking and its fabrication method. The structure includes: a photonic integrated circuit chip with at least one vertically penetrating through-silicon via (TSV) electrically connected to the packaging substrate; the photonic integrated circuit chip has a first main surface, which includes an optical functional region and multiple first main surface electrode pads located around the optical functional region; at least one electrical functional chip directly disposed on the first main surface of the photonic integrated circuit chip; and the electrical functional chip has multiple back electrode pads corresponding vertically to the first main surface electrode pads. This invention achieves ultra-short-pitch electrical interconnection through a direct stacking architecture, eliminating the need for traditional silicon substrates, and offers advantages such as compact structure, excellent performance, and good process compatibility, making it suitable for high-speed optoelectronic co-packaging.
Need to check novelty before this filing date? Find Prior Art