current sensor

Abstract

A current sensor is provided, comprising a substrate having four layers and four measuring coils arranged across the four layers of the substrate. Arranging the four measuring coils across the four layers of the substrate increases the number of turns or loops, thereby improving sensor sensitivity. Each measuring coil may be arranged across two or all four layers of the substrate.

Description

Technical Field

[0001] This disclosure relates to a substrate for a current sensor, and more particularly to a current sensor comprising four measuring coils disposed on the substrate. Background Technology

[0002] Current sensors detect and measure the current flowing through a conductor. They are used in many different applications, such as providing accurate current measurements in electricity meters.

[0003] One type of current sensor uses a shunt resistor connected in series with the current-carrying conductor. The voltage drop across the resistor can be measured, and the current flowing through the resistor can be calculated by knowing the resistance of the shunt. However, at higher currents, the temperature of the shunt may rise, changing its resistance and thus providing inaccurate current measurements. Furthermore, since the shunt is directly in the path of the measured current, it may be necessary to have isolation circuitry between the shunt and the sensitive measurement and processing electronics.

[0004] Another type of current sensor uses an electromagnetic transducer to detect changes in the magnetic field generated by a current-carrying conductor. These rate-of-change current sensors (e.g., Rogowski coils) do not require any physical connection to the current-carrying conductor and therefore do not require any additional isolation components to isolate them from the conductor.

[0005] However, because magnetic field change rate sensors rely on magnetic field coupling, they are susceptible to interference from other changing magnetic fields generated near the sensor. For example, a second current-carrying conductor, not the target of the measurement operation, may pass near the Rogowski coil. The magnetic field generated by this second current-carrying conductor may couple into the Rogowski coil, thus affecting the coil's measurement accuracy.

[0006] A major challenge with Rogowski coils is their sensitivity to electrostatic or capacitive coupling from nearby AC conductors. Electrostatic coupling from nearby AC conductors is particularly problematic for sensors with potentially low gain, such as PCB-implemented current sensors. This causes very small erroneous signals picked up from nearby AC conductors to become significant and impact the sensor's signal-to-noise ratio (SNR).

[0007] For example, in electricity meters, electrostatic coupling can be common due to the location of the AC bus that carries the measured current but also the phase voltage, typically 240V. With electrostatic coupling, the voltage on the bus is coupled to the coil through stray capacitance, and even small stray capacitances can generate erroneous signals in the sensor due to the high voltage on the conductor.

[0008] Furthermore, due to the fewer turns or smaller turn area, the output of a Rogowski coil may have a smaller amplitude. This makes it particularly susceptible to external noise sources such as electrostatic coupling.

[0009] Increasing the number of turns also improves the minimum signal that can be practically measured, because there is finite noise in readout electronics (thermal noise, flicker noise, quantization noise), and for similar electronic costs (power, area, cost), a larger signal results in a better signal-to-noise ratio (SNR). This can be particularly important in size-constrained applications where the size of the coil, or the conductor, or the power consumption of the electronics may be limited.

[0010] There is a need for a current sensor implemented on a substrate that reduces noise in its signal output while maximizing the number of turns or loops in each coil of the current sensor to maximize the amplitude of the sensed signal. Summary of the Invention

[0011] According to a first aspect of this disclosure, a current sensor is provided, comprising: a substrate having four layers; a path for a conductor passing through the substrate; a first measuring coil disposed on two of the four layers of the substrate and arranged to extend at least partially around the path; a second measuring coil disposed on two of the four layers of the substrate and arranged to extend at least partially around the path; a third measuring coil coupled to the first measuring coil and extending at least partially around the path in a direction opposite to the first measuring coil, wherein the third measuring coil is disposed on two other layers of the four layers of the substrate different from the first measuring coil; and a fourth measuring coil coupled to the second measuring coil and extending at least partially around the path in a direction opposite to the second measuring coil, wherein the fourth measuring coil is disposed on two other layers of the four layers of the substrate different from the second measuring coil.

[0012] According to a second aspect of this disclosure, a current sensor is provided, comprising: a substrate having four layers; a path for a conductor passing through the substrate; a first measuring coil disposed on two of the four layers of the substrate and arranged to extend at least partially around the path; a second measuring coil disposed on two of the four layers of the substrate and arranged to extend at least partially around the path; a third measuring coil coupled to the first measuring coil, disposed on two of the four layers of the substrate and arranged to extend at least partially around the path; and a fourth measuring coil coupled to the second measuring coil, disposed on two of the four layers of the substrate and arranged to extend at least partially around the path.

[0013] According to a third aspect of this disclosure, a current sensor is provided, comprising: a substrate having four layers; a path for a conductor passing through the substrate; a first measuring coil disposed on two of the four layers of the substrate; a second measuring coil disposed on two of the four layers of the substrate; a third measuring coil coupled to the first measuring coil disposed on two of the four layers of the substrate; and a fourth measuring coil coupled to the second measuring coil disposed on two of the four layers of the substrate, wherein the first measuring coil, the second measuring coil, the third measuring coil, and the fourth measuring coil are disposed on the substrate such that they form a repeating pattern in a circumferential direction around the path.

[0014] According to a fourth aspect of this disclosure, a current sensor is provided, comprising: a substrate having four layers, the substrate including a plurality of measuring conductors, a plurality of inner circumferential vias, and a plurality of outer circumferential vias disposed on the four layers of the substrate, the plurality of measuring conductors, the plurality of inner circumferential vias, and the plurality of outer circumferential vias being arranged to form: a first measuring coil including measuring conductors on each of the four layers; a second measuring coil including measuring conductors on each of the four layers; a third measuring coil including measuring conductors on each of the four layers; and a fourth measuring coil including measuring conductors on each of the four layers; wherein each loop of each measuring coil includes a corresponding inner circumferential via among the plurality of inner circumferential vias, and wherein each via among the plurality of inner circumferential vias is located in a unique angular position relative to the other vias among the plurality of inner circumferential vias.

[0015] According to a fifth aspect of this disclosure, a current sensor is provided, comprising: a substrate having four layers; a first measuring coil disposed on the four layers of the substrate; a second measuring coil disposed on the four layers of the substrate; a third measuring coil disposed on the four layers of the substrate; and a fourth measuring coil disposed on the four layers of the substrate; wherein a majority of a corresponding loop of each measuring coil is located in a unique angular position relative to a majority of the loops of the first, second, third, and fourth measuring coils.

[0016] According to a sixth aspect of this disclosure, a current sensor is provided, comprising: a substrate having four layers; a first measuring coil disposed on the four layers of the substrate; a second measuring coil disposed on the four layers of the substrate; a third measuring coil disposed on the four layers of the substrate; and a fourth measuring coil disposed on the four layers of the substrate, wherein the first measuring coil, the second measuring coil, the third measuring coil, and the fourth measuring coil are disposed on the substrate such that they form a repeating pattern in a circumferential direction around a path. Attached Figure Description

[0017] Various aspects of this disclosure will now be described by way of example only and with reference to the accompanying drawings, wherein the same reference numerals denote the same parts, and wherein:

[0018] Figure 1 This is a schematic diagram of a Rogowski coil;

[0019] Figure 2a This is a schematic diagram of the first measuring coil and the first return coil according to the present invention;

[0020] Figure 2b This is a schematic diagram of the second measuring coil and the second return coil according to the present invention;

[0021] Figure 2c It is based on the present invention Figure 2a and Figure 2b A schematic diagram of the first measuring coil, the second measuring coil, and the return coil;

[0022] Figure 3a yes Figure 2a A simplified diagram of the coil;

[0023] Figure 3b yes Figure 2b A simplified diagram of the coil;

[0024] Figure 3c yes Figure 2c A simplified diagram of the coil;

[0025] Figure 4 It is a PCB layout for a current sensor implemented on two layers of a substrate;

[0026] Figure 5a It is a PCB layout of a current sensor with a repeating pattern of eight loops implemented on four layers of a substrate.

[0027] Figure 5b yes Figure 5a PCB layout of the first measuring coil and return coil;

[0028] Figure 5c yes Figure 5a PCB layout of the second measuring coil and return coil;

[0029] Figure 5d yes Figure 5a A 3D view of the PCB layout;

[0030] Figure 6a yes Figure 5a A simplified section of the PCB layout, indicating the portion of the first measuring coil;

[0031] Figure 6b yes Figure 5a A simplified section of the PCB layout, indicating the portion for the second measuring coil;

[0032] Figure 6c yes Figure 5a A simplified section of the PCB layout, indicating the portion for the first return coil;

[0033] Figure 6d yes Figure 5a A simplified section of the PCB layout, indicating the portion for the second return coil;

[0034] Figure 6e yes Figure 5a Simplified sections of the PCB layout;

[0035] Figure 7 yes Figure 5a A simplified section of the PCB layout, indicating the turns of all coils;

[0036] Figure 8a It is a PCB layout of a current sensor with a repeating pattern of four loops implemented on four layers of a substrate.

[0037] Figure 8b yes Figure 8a PCB layout of the first measuring coil and return coil;

[0038] Figure 8c yes Figure 8a PCB layout of the second measuring coil and return coil;

[0039] Figure 8d yes Figure 8a A 3D view of the PCB layout;

[0040] Figure 9a yes Figure 8a A simplified section of the PCB layout, indicating the portion of the first measuring coil;

[0041] Figure 9b yes Figure 8a A simplified section of the PCB layout, indicating the portion for the second measuring coil;

[0042] Figure 9c yes Figure 8a A simplified section of the PCB layout, indicating the portion for the first return coil;

[0043] Figure 9d yes Figure 8a A simplified section of the PCB layout, indicating the portion for the second return coil;

[0044] Figure 9e yes Figure 8a Simplified sections of the PCB layout;

[0045] Figure 10 yes Figure 8a A simplified section of the PCB layout, indicating the turns of all coils;

[0046] Figure 11 It is a PCB layout for a current sensor with staggered vias;

[0047] Figure 12 This is a PCB layout showing the coupling between the start and end points of the coil;

[0048] Figure 13 This shows the PCB layout with 180-degree compensation from the start and end points of the coil;

[0049] Figure 14a This is the PCB layout indicating the coupling from the coil to the output terminal;

[0050] Figure 14b yes Figure 14a A 3D view of the PCB layout;

[0051] Figure 15a It refers to the PCB layout of the coil loop or turns;

[0052] Figure 15b yes Figure 15a A three-dimensional view of the loop or turn;

[0053] Figure 16 It is a schematic diagram of the stacked structure or layers of the substrate or PCB; Detailed Implementation

[0054] Rogowski coils are known to be susceptible to both electrostatic coupling noise and magnetic coupling noise. This noise can be magnetic coupling noise from current-carrying conductors near the Rogowski coil, or electrostatic coupling noise caused by AC voltage-carrying conductors near the Rogowski coil. Noise coupled to a Rogowski coil comprising multiple coils may differ in each differential coil, meaning it cannot be easily canceled or removed. If the noise coupled to multiple coils is identical, it can be easily canceled or removed via the differential connection of the coils, especially when the subsequent processing stage of the differential output coupled to the coils has a good common-mode rejection ratio (CMRR).

[0055] Solutions for removing magnetic coupling noise, such as using compensating conductors or return conductors, may be difficult to implement in the printed circuit board implementation of Rogowski coils.

[0056] To improve the operation of current sensors, four measuring coils or Rogowski coils can be implemented on a single printed circuit board or substrate. The measuring coils are used to wrap around the conductor being measured (also known as the current-carrying conductor). The output voltage of the Rogowski coil is proportional to the number of loops or turns of the measuring coil. Providing four coils increases the number of turns and therefore increases the sensitivity of the system. Throughout this specification, "loop" and "turn" are used interchangeably and should be understood to mean the same thing—a portion of an area enclosed by a coil.

[0057] Each measuring coil forms a loop coil around the conductor being measured, and is formed by multiple loops or turns wound from the first end or terminal of each coil to the second end or terminal of each coil to form a coil.

[0058] The measuring coils may include two measuring coils extending around the conductor under test in a first direction, and two measuring coils extending around the conductor in a second direction opposite to the first direction. The measuring coils may follow substantially the same path or adjacent paths around the conductor. By following the same path, the current sensor balances the electrostatic coupling of noise voltages from outside the coils. The same electrostatic coupling exists in all coils following substantially the same path, resulting in a common-mode signal that can be easily removed, thereby improving system performance when measuring small currents without the need for shielding.

[0059] Current sensors are used to suppress external longitudinal electromagnetic fields. These fields can be caused by external noise-generating conductors located outside the current sensor but in a direction substantially the same as the conductor being measured. Because the measuring coil is arranged in a roughly circular configuration around the conductor being measured, the closer portion of the coil (closer to the longitudinal electromagnetic field) may experience a larger electromagnetic field strength over a smaller area. The farther portion of the coil (around 180 degrees) may experience a lower electromagnetic field strength over a larger area. This results in coupling noise of equal magnitude but opposite sign in these two sections of the coil. Therefore, the noise caused by the longitudinal electromagnetic field is canceled out due to the shape of the coil.

[0060] The current sensor is also used to suppress external transverse electromagnetic fields. These fields may be caused by external noise-generating conductors perpendicular to the conductor being measured, such as across the surface of a substrate on which the measuring coils are formed. If two current measuring coils travel from 0 degrees to 360 degrees in the same direction, the same noise from the transverse noise source couples into both the first and second measuring coils. Furthermore, if two other measuring coils travel from 360 degrees to 0 degrees in opposite directions, the same noise from the transverse noise source couples into both the third and fourth measuring coils. This coupled noise can then be easily canceled out.

[0061] Suppressing both lateral and side external field sources reduces crosstalk from external field sources to the current measurement signal, thus enabling the current sensor to be easily integrated into harsh environments.

[0062] A PCB-based measurement coil comprising four measurement coils is difficult to implement without a large number of vias. For example, for each turn or loop of the measurement coil, the coil may require more than two vias coupling conductors on different layers. This increases manufacturing complexity and can lead to loop area mismatch and noise or signal mismatch coupled to each coil due to tolerances in manufacturing each via. By providing two vias per turn or per loop for the measurement coil, manufacturing complexity is reduced and coil performance is improved.

[0063] Each loop or turn of each measuring coil can be substantially arranged in a single plane (such as a radial plane). The measuring coil includes multiple circumferential extension elements and multiple radial extension elements. The circumferential extension elements extend circumferentially around the PCB, substrate, or conductor, while the radial extension elements extend radially from the center of the substrate or measuring coil. These conductors, together with vias, form the loops of the measuring coil.

[0064] By positioning each turn or loop in a unique plane, the radially extending elements of the coil do not interfere with each other. An interference can be defined as conductors of more than one coil on the same layer requiring the same location. The layer of each measuring coil, or each turn or loop of each measuring coil, can be selected such that the circumferentially extending conductors do not interfere with each other, while requiring only two vias per turn or loop.

[0065] Current sensors implemented on a PCB, including any number of measuring coils, require connection to processing or measurement circuitry on or outside the PCB. This connection or wiring area may alter or modify the coil's performance, act as an additional noise pickup area, and cause changes in loop area.

[0066] To ensure the measuring coils extend substantially around the substrate while providing improved suppression of longitudinal external fields, the start and end points of each measuring coil can be positioned as close to each other as possible—preferably at the same angular location. To achieve this, one of the vias can be offset radially from the radial position of the remaining vias. This can be described as an in-setting or offset setting of the vias. However, this results in the area enclosed by the loops at the start and end points of the coils differing from the average area enclosed by the loops of the measuring coils. To counteract this, the first and last loops can be coupled to vias at different locations such that the average loop area of ​​the first and last loops is substantially the same as the average loop area of ​​all other loops of the coil. Alternatively, the loops located 180 degrees around the coil from the first and last loops can include loop areas different from the average loop area, such that the first loop, the last loop, and the loop positioned substantially 180 degrees have the same loop area.

[0067] Furthermore, the wiring conductors can be placed on different layers of the substrate, essentially in the same plane. This causes noise pickup in the conductors to cancel each other out.

[0068] Figure 1 This is a schematic diagram of a known Rogowski coil. To measure the current I(t) flowing through the current-carrying conductor 100, a measuring coil 102 is arranged such that the current-carrying conductor 100 passes through the measuring coil. The measuring coil 102 is wound into a helical shape such that the helical loop or turns enclose a cross-sectional area 104, Å. The current-carrying conductor 100 can be, for example, a busbar.

[0069] When the current I(t) in the current-carrying conductor 100 changes, the field generated by the current also changes. The positioning of the measuring coil causes a voltage proportional to the rate of change of current dI / dt to be induced in the measuring coil 102. Therefore, integrating the output v(t) of the measuring coil provides a value proportional to the current. Each turn or loop of the coil forms a measuring area 104 in a plane perpendicular to the extension direction of the current-carrying conductor.

[0070] However, the voltage induced in the measuring coil may be affected by external conductors that the user does not intend to measure. In addition to forming loops of multiple coils with a measuring area of ​​104, the extension of the coil itself also effectively forms a single loop in the plane of the current-carrying conductor. To address the problem of magnetic field coupling into this single loop, a compensating conductor may be included.

[0071] Figure 1 The Rogowski coil is a single-ended Rogowski coil, comprising a measuring coil 102 extending around conductor 100. A current sensor may include more than one measuring coil and be arranged to provide a differential output.

[0072] For example, Figure 2a , Figure 2b and Figure 2c A diagram is shown of a differential current rate of change sensor 200 for measuring the current in a current-carrying conductor 100. The current rate of change sensor includes four current measuring coils, which may be referred to as two forward coils and two return coils. Figure 2c A complete current rate of change sensor is shown, including a first measuring coil, a second measuring coil, and their respective return coils. Figure 2a The first measuring coil 204 and its corresponding first return coil 206 are shown. Figure 2b The second measuring coil 208 and its corresponding second return coil 210 are shown.

[0073] The return coil is so named for clarity, but it should be understood that the return coil is used to measure the current in a current-carrying conductor in the same way as the forward measuring coil. Throughout this specification, the coil may be referred to as a measuring coil. A measuring coil may refer to a measuring coil extending in a first direction, and a return coil may refer to a measuring coil extending in a second direction, which is opposite to the first direction. Therefore, a return coil may also be considered a measuring coil, or may be considered part of its corresponding measuring coil. Furthermore, they may be described as a return coil or a reverse measuring coil.

[0074] The first measuring coil 204 and the second measuring coil 208 may be referred to as such, while the first return coil 206 may be referred to as the third measuring coil, and the second return coil 210 may be referred to as the fourth measuring coil. However, the coils may be distinguished by any suitable numbering.

[0075] The two return coils 206 and 210 are secondary measurement coils, which can be referred to as return coils or reverse coils.

[0076] The first end of the first measuring coil 204 begins at terminal or node 212 and extends or travels counterclockwise around the path of the current-carrying conductor 100 (or, in an alternative implementation, clockwise), terminating at a second end or node 214. The first return coil 206 extends or travels in the opposite direction to the first measuring coil 204 from node 214 to node 216, around the path of the current-carrying conductor 200 in a clockwise direction. The first end 214 of the first return coil 206 is coupled to the second end 214 of the first measuring coil 204. A rate of change current sensor including both the measuring coil and the return coil can be provided to offer an increased number of coil turns while still providing cancellation of external transverse magnetic fields.

[0077] The first end of the second measuring coil 208 begins at terminal 218 and extends or travels in a counterclockwise direction around the current-carrying conductor 100 (or, in an alternative implementation, in a clockwise direction), terminating at a second end or node 220. The second return coil 210 extends or travels in the opposite direction to the second measuring coil 208 from node 220 to node 222, in a clockwise direction around the current-carrying conductor 100. The first end 220 of the first return coil 206 is coupled to the second end 220 of the second measuring coil 208.

[0078] Although the first measuring coil 204 and the second measuring coil 208 are described as traveling or extending in a counterclockwise direction, they may alternatively extend in a clockwise direction. The first return coil 206 and the second return coil 210 extend in a direction substantially opposite to that of the first measuring coil 204 and the second measuring coil 208, and thus will extend in a counterclockwise direction when the measuring coils extend in a clockwise direction.

[0079] Therefore, the first measuring coil 204 and the second measuring coil 208 can be referred to as forward measuring coils, and the first return coil 206 and the second return coil 210 can be referred to as reverse, opposite, or inverse measuring coils. This is because the first measuring coil 204 and the first return coil 206 extend in opposite circumferential directions. The second measuring coil 208 and the second return coil 210 extend in opposite circumferential directions.

[0080] In this implementation, the measuring coils extend relative to each other in the same circumferential direction; however, the coils can alternatively extend relative to each other in opposite directions. However, if the measuring coils extend in opposite directions, the coils will be more susceptible to electrostatic coupling because the capacitive coupling from each coil to the interference source may be mismatched. This is undesirable. Figures 2a to 2c The schematic diagram shows that both the first measuring coil 204 and the second measuring coil 208 extend substantially around the path of the current-carrying conductor 100 to surround the path. Similarly, return coils 206 and 210 may extend substantially around the path of the current-carrying conductor 100 to surround the path.

[0081] In addition to the direction in which the measuring coil and return coil extend around conductor 100 or the substrate, each turn or loop of each coil can also be considered to extend in a certain direction. For example, when the coil is viewed from a certain angle through the toroidal surface formed by the coil, the turn or loop can be regarded as extending from the corresponding first end in a clockwise or counterclockwise direction.

[0082] Each measuring coil comprises multiple turns or loops. When viewed through the loop shape formed by the coils, the turns or loops of each measuring coil are arranged to extend from the first terminal or end of each measuring coil in a clockwise or counterclockwise direction.

[0083] The first measuring coil 204 has a turn or loop extending clockwise from its first end 212. Similarly, the first return coil 206 has a turn or loop extending clockwise from its first end. The second measuring coil 208 and the second return coil 210 have turns or loops extending from their respective first ends in a direction opposite to the direction of extension of the turns or loops of the first measuring coil and the return coil. Therefore, the second measuring coil 208 has a turn or loop extending counterclockwise from its first end 218. The second return coil 210 has a turn or loop extending counterclockwise from its first end 220. This is due to... Figures 3a to 3c The polarity markings on the coil indicate this. This results in the first measuring coil having the opposite polarity to the second measuring coil, and the first return coil having the opposite polarity to the second return coil. This opposite winding polarity is determined by... Figures 3a to 3c The polarity markings are shown.

[0084] For example, the first measuring coil 204 includes a loop 226. When viewed through the toroidal surface formed by the first measuring coil 204, the loop 226 extends clockwise from the first end 212 of the first measuring coil 204. Although only one loop is marked, all loops of the first measuring coil extend in the same clockwise direction.

[0085] The first return coil 206 includes a loop 228. When viewed through the toroidal surface formed by the first return coil 206, the loop 228 extends clockwise from the first end 214 of the first return coil 206. Although only one loop is marked, all loops of the first return coil 206 extend in the same clockwise direction.

[0086] Conversely, the second measuring coil 208 includes a loop 230. When viewed through the toroidal surface formed by the second measuring coil 208, the loop 230 extends counterclockwise from the first end 218 of the second measuring coil 208. Although only one loop is marked, all loops of the second measuring coil 208 extend in the same counterclockwise direction.

[0087] The second return coil 210 includes a loop 232. When viewed through the toroidal surface formed by the second return coil 210, the loop 232 extends counterclockwise from the first end 220 of the second return coil 210. Although only one loop is marked, all loops of the second return coil 210 extend in the same counterclockwise direction.

[0088] Alternatively, the loop of the first measuring coil 204 and the first return coil 206 may extend in a counterclockwise direction, and the loop of the second measuring coil 208 and the second return coil 210 may extend in a clockwise direction.

[0089] Winding the measuring coil and returning coil in this manner induces a positive voltage in the first measuring coil 204 and a negative voltage in the second measuring coil 208. These induced voltages are subtracted to produce a differential signal representing the changing magnetic field from a conductor passing through the center of the coil. The differential voltage is relative to the common-mode point of the first and second coils. This common-mode voltage can be at the electronic ground potential of the readout circuit attached to the coil, or at a voltage suitable for electronic devices.

[0090] Although the first measuring coil 204 and the first return coil 206 are described as having clockwise turn extensions, and the second measuring coil 208 and the second return coil 210 are described as having counterclockwise turn extensions, it should be understood that this implementation can also be interchanged. Therefore, the first measuring coil 204 and the first return coil 206 may have counterclockwise turn extensions, and the second measuring coil 208 and the second return coil 210 may have clockwise turn extensions.

[0091] Figures 2a to 2c Simplified circuit diagram as follows Figures 3a to 3cAs shown. It is worth noting that the second end 216 of the first return coil 206 can be coupled to the second end 222 of the second return coil 210. The sensor can be further coupled to signal processing circuitry. The first end 212 of the first measuring coil can be coupled to the first or positive output terminal 324. The first end 218 of the second measuring coil 208 can be coupled to the second or negative output terminal 326. The second end 216 of the first return coil 206 and the second end 222 of the second return coil 210 can be coupled to the reference voltage or ground terminal 328. The first output terminal 324 and the second output terminal 326 are differential output terminals, which can be coupled to signal processing circuitry or other processing circuitry.

[0092] Figures 2 and 3 can be considered as simplified diagrams of any of the substrate or PCB implementations of the current sensor described throughout this application.

[0093] Figure 4 This is a printed circuit board implementation 402 of a current sensor 200 implemented across two layers of a circuit board or substrate. The current sensor includes a plurality of external vias 404 arranged around three concentric circles. The current sensor also includes a plurality of internal vias 406 arranged around two concentric circles. The current sensor includes conductive traces 408 arranged across a first layer and a second layer of the substrate, these conductive traces being connected vias from both the external vias 404 and the internal vias 406. The traces on the first and second layers are aligned in a radial plane, and therefore the traces on the second layer are... Figure 4 It is not visible in the middle.

[0094] Each coil of the current sensor can be considered a helical coil or winding, comprising multiple turns or loops. The voltage signal, proportional to the rate of change of the induced current in the coil, is proportional to the number of turns or loops. To provide a large number of measurement coil turns or loops (which may be important for increasing the sensitivity of the measurement coil), inner vias 406 and outer vias 408 are arranged in multiple circles. Each turn of the measurement coil or return coil requires four vias, including one via from the inner via 406 and three vias from the outer via 404. Figure 4 In such systems, it is difficult to wire coils in a specific direction so that the loop or turns generate voltage of the correct polarity because, at some locations, the conductors block each other in the lead-in section of the coil. Therefore, Figure 4 The additional through-hole shown is used to overcome this obstruction.

[0095] It may be desirable to reduce the number of required vias to provide simpler wiring for the conductive traces 408 that constitute the current sensor. Reducing the number of vias reduces the overall error in the PCB implementation of the measuring and return coils caused by errors in drilling tolerances during the drilling process. Because each via involves a manufacturing operation, the number of vias per spoke can adversely affect manufacturing costs. Furthermore, reducing the number of vias increases coil sensitivity or output voltage because the additional vias can reduce the loop area of ​​the coil.

[0096] Four-layer eight-turn current sensor

[0097] A current sensor can be implemented on a four-layer substrate, wherein four current measuring coils are arranged to extend at least partially around a path for conductors passing through the substrate. Each measuring coil can be implemented across all four layers of the substrate, such that it includes a measuring conductor on each layer of the substrate. The measuring conductor of each loop of each measuring coil can be located in a unique radial plane different from the measuring conductor of each measuring coil in the other measuring coils. This prevents turns or loops from interfering with each other, and only two vias are required per turn.

[0098] Since each measuring coil is implemented across all four layers, an alternating arrangement of loops is provided for each measuring coil—for example, a first loop provided across two layers and a second loop provided across the other two layers. These loops can be provided in a repeating pattern, such that the pattern formed by the four measuring coils repeats once every eight turns or every eight loops. Alternatively, the pattern can be repeated in any multiple of eight loops.

[0099] Providing each coil across all four layers improves the matching of external field coupling to the four measurement coils—because each coil has the same average proportion of turns on each layer of the substrate. This means that the distance to the external conductor is the same on average for all four coils.

[0100] Figure 5a It shows Figures 2a to 2c The current sensor 200 shown is implemented on a printed circuit board (PCB) in a manner 500, wherein the current sensor measuring coil is implemented across four layers of the PCB. The current sensor 500 includes a substrate 502 having four layers.

[0101] The current sensor 500 includes a first measuring coil 204, a first return coil 206, a second current measuring coil 208, and a second return coil 210.

[0102] The substrate 502 includes a first plurality of vias 504 arranged around the inner circumference of the first measuring coil 204 and the second measuring coil 208. The substrate also includes a second plurality of vias 506 arranged around the inner circumference of the first return coil 206 and the second return coil 210. The first plurality of vias 504 are shown arranged around a different circumference than the second plurality of vias 506, such that the first and second plurality of vias are staggered or arranged around concentric circumferences or circles. Alternatively, the first plurality of vias 504 and the second plurality of vias 506 may be arranged around the same circumference.

[0103] The substrate 502 also includes a third plurality of vias 508 arranged around the outer circumference of the first measuring coil 204 and the second measuring coil 208. The substrate also includes a fourth plurality of vias 510 arranged around the outer circumference of the first return coil 206 and the second return coil 210. The third plurality of vias 508 and the fourth plurality of vias 510 are located in... Figure 5a The vias are shown arranged around the same circumference. However, alternatively, the third plurality of vias 508 and the fourth plurality of vias 510 may be arranged around different circumferences, such that the third plurality of vias and the fourth plurality of vias are staggered or arranged around concentric circumferences or circles.

[0104] The current sensor 500 includes a conductor 100 for carrying a current to be measured by a first current measuring coil 204 and a second current measuring coil 206. The conductor 100 is implemented along a path 522 along a substrate 502. The path 522 may be an aperture for receiving the conductor 100. Alternatively, the conductor 100 may be a conductive trace through the substrate without an aperture. The conductor 100 or the path 522 for the conductor is centrally located such that the first measuring coil 204, the second measuring coil 208, the first return coil 206, and the second return coil 210 are formed as a circle around or centered on the conductor 100. The conductor 100 may be any conductor suitable for carrying the current to be measured by the current sensor.

[0105] Although the vias are described as being arranged in a circle around the coil, they can also be considered as being formed in a circle, or in a circle around a point centered on conductor 100 or the path 522 for the conductor. It will also be understood that the coils may not be perfect circles, or may be arranged in other shapes around the conductor, although if they are not provided in a circular arrangement, they will not benefit from the same suppression of lateral fields from adjacent external conductors.

[0106] The first current measuring coil 204, the second current measuring coil 208, the first return coil 206, and the second return coil 210 are implemented across four layers of the substrate, including conductors or conductive traces on different layers of the substrate. The conductors on different layers are coupled to each other using multiple vias. Illustrations are provided in the accompanying drawings, in which conductors on different layers of the substrate 502 are represented using different line types.

[0107] A first plurality of vias 504 and a third plurality of vias 508 are used to couple the conductors or conductive traces of the first measuring coil 204 and the second measuring coil 208. A second plurality of vias 506 and a fourth plurality of vias 510 are used to couple the conductors or conductive traces of the first return coil 206 and the second return coil 210. The vias enable the formation of multi-layered loops or turns across the substrate for the measuring coils and the return coils. The first plurality of vias 504 and the third plurality of vias 508 form turns or loops of the first measuring coil 204 and the second measuring coil 208. The second plurality of vias 506 and the fourth plurality of vias 510 form turns or loops of the first return coil 206 and the second return coil 210.

[0108] Each coil of the current sensor 500 includes conductors on all four layers of the substrate. Each layer of the substrate 502 includes a plurality of measuring conductors. A first plurality of measuring conductors 514 are located on the first layer of the substrate 502. A second plurality of measuring conductors 516 are located on the second layer of the substrate 502. A third plurality of measuring conductors 518 are located on the third layer of the substrate 502. A fourth plurality of measuring conductors 520 are located on the fourth layer of the substrate 502. The measuring conductors are located in a radial plane starting from the conductor 100 or the path for the conductor.

[0109] The third multiple measuring conductor 518 and the fourth multiple measuring conductor 520 are in Figure 5a They are not visible because the first plurality of measuring conductors 514 and the second plurality of measuring conductors 516 are located in the same plane as the third plurality of measuring conductors 518 and the fourth plurality of measuring conductors 520.

[0110] Figure 5d A three-dimensional side view of the current sensor 500 is shown, in which a third plurality of measuring conductors 518 and a fourth plurality of measuring conductors 520 can be seen.

[0111] The substrate 502 also includes a plurality of circumferentially extending conductors 512. The circumferentially extending conductors are arranged to provide a circumferential extension of the measuring coil and the return coil around the conductor 100 or for the path 522 of the conductor. The circumferentially extending conductors may be referred to as the advancing region of the substrate 502 because they allow the coil to extend or advance around the substrate 502, thereby surrounding the conductor 100.

[0112] Figure 5b It shows Figure 5aThe current sensor 500 contains only a first measuring coil 204 and a first return coil 206. Figure 5c It shows Figure 5a The current sensor 500 contains only a second measuring coil 208 and a second return coil 210.

[0113] Figures 6a to 6e It shows Figures 5a to 5d The simplified (as linear extension) sub-segments of the conductive traces and vias of the measuring coil and return coil. Figure 6a The reference numerals are associated with the components of the first measuring coil 204. Figure 6b The reference numerals are associated with the components of the second measuring coil 208. Figure 6c The reference numerals are associated with the components of the first return coil 206. Figure 6d The reference numerals are associated with the components of the second return coil 210.

[0114] consider Figure 6a The first measuring coil 204 includes multiple loops or turns.

[0115] The first turn or loop of the first current measuring coil 204 includes a circumferentially extending conductor 602 on the fourth layer of the substrate. A first end of the circumferentially extending conductor 602 is coupled to a second end of a measuring conductor 604 on the fourth layer of the substrate, one of a fourth plurality of measuring conductors 520. A first end of the measuring conductor 604 is coupled to a via 606 in a first plurality of vias 504. A first end of a measuring conductor 608 on the first layer of the substrate of the first plurality of measuring conductors 514 is coupled to the via 606. A second end of the measuring conductor 608 is coupled to a first end of a circumferentially extending conductor 610 on the first layer of the substrate. A second end of the circumferentially extending conductor 610 is coupled to a via 612 in a third plurality of vias 508. The first turn or loop begins at the outer circumference of the measuring coil, extends to the inner circumference of the measuring coil on the fourth layer, switches to the first layer, and then extends to the outer circumference of the measuring coil on the first layer. In this way, a turn or loop is formed across the fourth and first layers of the substrate.

[0116] The first end of the corresponding conductor is closer to the inner circumference of the coil, or closer to the current-carrying conductor 100 or the path 522 for the current-carrying conductor. Although the via is described as an inner circumference and an outer circumference, it is clear that the via can be provided in a variety of different shapes, wherein the inner via is closer to the conductor 100 or the path 522, and the outer via is further away from the conductor 100 or the path 522.

[0117] The second turn or loop of the first current measuring coil 204 includes a circumferentially extending conductor 614 on the third layer of the substrate. A first end of the circumferentially extending conductor 614 is coupled to a second end of a measuring conductor 616 on the third layer of the substrate, one of a third plurality of measuring conductors 518. A first end of the measuring conductor 616 is coupled to a via 618 in one of a first plurality of vias 504. A first end of the measuring conductor 620 on the second layer of the substrate, one of a second plurality of measuring conductors 516, is coupled to the via 618. A second end of the measuring conductor 620 is coupled to a first end of a circumferentially extending conductor 622 on the second layer of the substrate. A second end of the circumferentially extending conductor 622 is coupled to a via 624 in one of a third plurality of vias 508. The second turn or loop of the first measuring coil 204 begins at the outer circumference of the measuring coil, extends to the inner circumference of the measuring coil on the third layer, switches to the second layer, and then extends to the outer circumference of the measuring coil on the second layer. In this way, a turn or loop is formed across the third and second layers of the substrate.

[0118] The first turn or loop of the first measuring coil is coupled to the second turn or loop of the first measuring coil 204 using a via 612 in one of the third plurality of vias 508. The pattern of the first measuring coil 204 repeats every two turns or loops. The first measuring coil includes a plurality of loops, for example, n loops, numbered 1 to n. Therefore, the first measuring coil can be considered to include a plurality of even-numbered loops and a plurality of odd-numbered loops. Thus, the first loop of the first measuring coil 204 can be considered an even-numbered loop, and the second loop of the first measuring coil 204 can be considered an odd-numbered loop (and vice versa). All even-numbered turns of the first measuring coil are implemented on the fourth layer and the first layer, and all odd-numbered turns of the first measuring coil are implemented on the third layer and the second layer (and vice versa).

[0119] Although the extension of the loop of the first measuring coil is described as from Figure 6a Proceed to the left Figure 6a The right side, however, should be understood as merely for descriptive convenience and does not specifically describe the direction of travel around the circumference from the starting point of the coil. When considering all loops joined together, the cumulative voltage across the measuring coil is generated by the voltage induced in the loop of the first measuring coil 204 by the rate of change of current in conductor 100. Regarding Figures 6a to 6d The extension of the loop has been described in a single direction, but the extension of the loop can be clockwise or counterclockwise as previously described. Therefore, the loops of different coils can extend in different or opposite directions.

[0120] consider Figure 6b The second measuring coil 208 includes multiple loops or turns.

[0121] The first turn or loop of the second current measuring coil 208 includes a circumferentially extending conductor 626 on the second layer of the substrate. A first end of the circumferentially extending conductor 626 is coupled to a second end of a measuring conductor 628 on the second layer of the substrate, one of a second plurality of measuring conductors 516. A first end of the measuring conductor 628 is coupled to a via 630 in a first plurality of vias 504. A first end of a measuring conductor 632 on the fourth layer of the substrate, one of a fourth plurality of measuring conductors 520, is coupled to the via 630. A second end of the measuring conductor 632 is coupled to a first end of a circumferentially extending conductor 634 on the fourth layer of the substrate. A second end of the circumferentially extending conductor 634 is coupled to a via 636 in a third plurality of vias 508. The first turn or loop begins at the outer circumference of the measuring coil, extends to the inner circumference of the measuring coil on the second layer, switches to the fourth layer, and then extends to the outer circumference of the measuring coil on the fourth layer. In this way, a turn or loop is formed across the second and fourth layers of the substrate.

[0122] The second turn or loop of the second current measuring coil 208 includes a circumferentially extending conductor 638 on the first layer of the substrate. A first end of the circumferentially extending conductor 638 is coupled to a second end of a measuring conductor 640 on the first layer of the substrate, one of a first plurality of measuring conductors 514. A first end of the measuring conductor 640 is coupled to a via 642 in one of a first plurality of vias 504. A first end of the measuring conductor 644 on the third layer of the substrate, one of a third plurality of measuring conductors 518, is coupled to the via 642. A second end of the measuring conductor 644 is coupled to a first end of a circumferentially extending conductor 646 on the third layer of the substrate. A second end of the circumferentially extending conductor 646 is coupled to a via 648 in one of a third plurality of vias 508. The second turn or loop of the second measuring coil 208 begins at the outer circumference of the measuring coil, extends to the inner circumference of the measuring coil on the first layer, switches to the third layer, and then extends to the outer circumference of the measuring coil on the third layer. In this way, a turn or loop is formed across the first and third layers of the substrate.

[0123] The first turn or loop of the second measuring coil 208 is coupled to the second turn or loop of the second measuring coil 208 using a via 636 in one of the third plurality of vias 508. The pattern of the second measuring coil 208 repeats once every two turns or loops. The second measuring coil 208 includes a plurality of loops, for example, n loops, numbered from 1 to n. Therefore, the second measuring coil can be considered to include a plurality of even-numbered loops and a plurality of odd-numbered loops. Thus, the first loop of the second measuring coil 208 can be considered an even-numbered loop, and the second loop of the second measuring coil 208 can be considered an odd-numbered loop (and vice versa). All even-numbered turns of the second measuring coil are implemented on the second and fourth layers, and all odd-numbered turns of the second measuring coil are implemented on the first and third layers (and vice versa).

[0124] consider Figure 6c The first return coil 206 includes multiple loops or turns.

[0125] The first turn or loop of the first return coil 206 includes a circumferentially extending conductor 674 on the second layer of the substrate. A first end of the circumferentially extending conductor 674 is coupled to a second end of a measurement conductor 676 on the second layer of the substrate, one of a second plurality of measurement conductors 516. A first end of the measurement conductor 676 is coupled to a via 678 in a second plurality of vias 506. A first end of a measurement conductor 680 on the fourth layer of the substrate, one of a fourth plurality of measurement conductors 520, is coupled to the via 678. A second end of the measurement conductor 680 is coupled to a first end of a circumferentially extending conductor 682 on the fourth layer of the substrate. A second end of the circumferentially extending conductor 682 is coupled to a via 684 in a fourth plurality of vias 510. The first turn or loop begins at the outer circumference of the return coil, extends to the inner circumference of the return coil on the second layer, switches to the fourth layer, and then extends to the outer circumference of the return coil on the fourth layer. In this way, a turn or loop is formed across the second and fourth layers of the substrate.

[0126] The second turn or loop of the first return measurement coil 206 includes a circumferentially extending conductor 686 on the first layer of the substrate. A first end of the circumferentially extending conductor 686 is coupled to a second end of a measurement conductor 688 on the first layer of the substrate, one of a first plurality of measurement conductors 514. A first end of the measurement conductor 688 is coupled to a via 690 in a second plurality of vias 506. A first end of a measurement conductor 692 on the third layer of the substrate, one of a third plurality of measurement conductors 518, is coupled to the via 690. A second end of the measurement conductor 692 is coupled to a first end of a circumferentially extending conductor 694 on the third layer of the substrate. A second end of the circumferentially extending conductor 694 is coupled to a via 696 in a fourth plurality of vias 510. The second turn or loop of the first return coil 206 begins at the outer circumference of the return coil, extends to the inner circumference of the return coil on the first layer, switches to the third layer, and then extends to the outer circumference of the return coil on the third layer. In this way, a turn or loop is formed across the first and third layers of the substrate.

[0127] The first turn or loop of the first return coil 206 is coupled to the second turn or loop of the first return coil 206 using a via 684 in one of the fourth plurality of vias 510. The pattern of the first return coil 206 repeats every two turns or loops. The second return coil 210 includes a plurality of loops, for example, n loops, numbered 1-n. Therefore, the second return coil can be considered to include a plurality of even-numbered loops and a plurality of odd-numbered loops. Thus, the first loop of the first return coil 206 can be considered an even-numbered loop, and the second loop of the first return coil 206 can be considered an odd-numbered loop (and vice versa). All even-numbered turns of the first return coil are implemented on the second and fourth layers, and all odd-numbered turns of the first return coil are implemented on the first and third layers (and vice versa).

[0128] consider Figure 6d The second return coil 210 includes multiple loops or turns.

[0129] The first turn or loop of the second return coil 210 includes a circumferentially extending conductor 650 on the fourth layer of the substrate. A first end of the circumferentially extending conductor 650 is coupled to a second end of a measurement conductor 652 on the fourth layer of the substrate, one of a fourth plurality of measurement conductors 520. The first end of the measurement conductor 652 is coupled to a via 654 in a second plurality of vias 506. A first end of a measurement conductor 656 on the first layer of the substrate of a first plurality of measurement conductors 514 is coupled to the via 654. A second end of the measurement conductor 656 is coupled to a first end of a circumferentially extending conductor 658 on the first layer of the substrate. The second end of the circumferentially extending conductor 658 is coupled to a via 660 in a fourth plurality of vias 510. The first turn or loop begins at the outer circumference of the return coil, extends to the inner circumference of the return coil on the fourth layer, switches to the first layer, and then extends to the outer circumference of the return coil on the first layer. In this way, a turn or loop is formed across the fourth and first layers of the substrate.

[0130] The second turn or loop of the second return coil 210 includes a circumferentially extending conductor 662 on the third layer of the substrate. A first end of the circumferentially extending conductor 662 is coupled to a second end of a measurement conductor 664 on the third layer of the substrate, one of a third plurality of measurement conductors 518. A first end of the measurement conductor 664 is coupled to a via 666 in a second plurality of vias 506. A first end of a measurement conductor 668 on the second layer of the substrate, one of a second plurality of measurement conductors 516, is coupled to the via 666. A second end of the measurement conductor 668 is coupled to a first end of a circumferentially extending conductor 670 on the second layer of the substrate. A second end of the circumferentially extending conductor 670 is coupled to a via 672 in a fourth plurality of vias 510. The second turn or loop of the second return coil 210 begins at the outer circumference of the return coil, extends to the inner circumference of the return coil on the third layer, switches to the second layer, and then extends to the outer circumference of the return coil on the second layer. In this way, a turn or loop is formed across the third and second layers of the substrate.

[0131] The first turn or loop of the second return coil 210 is coupled to the second turn or loop of the second return coil 210 using a via 660 in one of the fourth plurality of vias 510. The pattern of the second return coil 210 repeats once every two turns or loops. The second return coil includes a plurality of loops, for example, n loops, numbered 1-n. Therefore, the second return coil can be considered to include a plurality of even-numbered loops and a plurality of odd-numbered loops. Thus, the first loop of the second return coil 210 can be considered an even-numbered loop, and the second loop of the second return coil 210 can be considered an odd-numbered loop (and vice versa). All even-numbered turns of the second return coil are implemented on the first and fourth layers, and all odd-numbered turns of the second return coil are implemented on the second and third layers (and vice versa).

[0132] Figures 6a to 6e The vias shown in the following figures are depicted as straight lines. This is for ease of understanding. The vias may alternatively follow a circumference, such as... Figure 5a As shown.

[0133] Figures 6a to 6e Several other external measuring conductors 698 are shown, in Figure 6e Referenced in [reference needed]. External measuring conductors can be coupled between corresponding circumferential extending conductors in the plurality of circumferential extending conductors 512 and vias in the third plurality of vias 508 and the fourth plurality of vias 510, respectively. For simplicity, they are not described. External measuring conductor 698 is optional, and conversely, the circumferential extending conductors can be directly coupled or connected to the vias in the third plurality of vias 508 and the fourth plurality of vias 510. Furthermore, the plurality of circumferential extending elements can be positioned at any location between the first plurality of vias 504 / the second plurality of vias 506 and the third plurality of vias 508 / the fourth plurality of vias 510.

[0134] The circumferential extension conductor can be positioned adjacent to or directly connected to the inner circumferential through-holes 504 and 506. The circumferential extension conductor can be positioned adjacent to or directly connected to the outer circumferential through-holes 508 and 510. The circumferential extension conductor can be positioned between the inner circumferential through-holes 504 and 506 and the outer circumferential through-holes 508 and 510, wherein both ends of the circumferential extension conductor 512 are coupled to the measuring conductor, and then the measuring conductor is coupled to the through-hole.

[0135] Therefore, the measuring conductors in the first to fourth plurality of measuring conductors can actually be coupled to the outer end or the second end of the plurality of circumferentially extending conductors 512.

[0136] Figure 7 It shows Figures 5a to 5d The simplified sub-segments of the conductive traces and vias of the measuring coil and return coil. Figure 7 It also shows Figures 6a to 6e A wider view of the simplified trace.

[0137] like Figure 7 As shown, the first measuring coil 204 includes a first turn 702. Adjacent to the first turn 702 of the first measuring coil are the first turn 704 of the second return coil 210, the first turn 706 of the second measuring coil 208, the first turn 708 of the first return coil 206, the second turn 710 of the first measuring coil, the second turn 712 of the second return coil 210, the second turn 714 of the second measuring coil 208, and the second turn 716 of the first return coil 206. The turns of the respective coils are provided in this order around the coil in the circumferential direction. Any other repeating order of measuring coil loops or turns can be provided on the substrate—for example, eight loops can be provided on the substrate in a different order.

[0138] The first measuring coil 204, the first return coil 206, the second measuring coil 208, and the second return coil 210 are arranged in a repeating pattern on the substrate, which repeats once every eight adjacent turns or loops. Therefore, section 718 of the current sensor includes eight turns (two turns of each of the measuring coil and the return coil). This section 718 repeats throughout the current sensor.

[0139] Figures 6a to 6eThe diagram illustrates a first loop for each measuring coil across two layers of a substrate, wherein the next, nearest, or adjacent loop of that measuring coil is implemented on two additional layers of the substrate. However, it should be understood that this pattern can be repeated with a different number of measuring coil loops, such that multiple (e.g., two, three, or five) loops for each measuring coil can be arranged across two layers of the substrate, wherein multiple next, nearest, or adjacent loops of that measuring coil are implemented on two additional layers of the substrate. This can alter the pattern's repetition pattern—allowing a pattern formed by four measuring coils to be repeated in any integer multiple of eight turns.

[0140] In other words, the current sensor 500 can be considered to include eight or more loops. The first measuring coil includes a first plurality of loops formed on the first and fourth layers of the substrate. The second measuring coil includes a second plurality of loops formed on the second and fourth layers of the substrate. The first return coil includes a third plurality of loops formed on the second and fourth layers of the substrate. The second return coil includes a fourth plurality of loops formed on the third and second layers of the substrate.

[0141] The first measuring coil includes a fifth plurality of loops formed on the second and fourth layers of the substrate. The second measuring coil includes a sixth plurality of loops formed on the first and third layers of the substrate. The first return coil includes a seventh plurality of loops formed on the first and third layers of the substrate. The second return coil includes an eighth plurality of loops formed on the fourth and first layers of the substrate.

[0142] The multiple loops are arranged in a sequence such that the turns of the first multiple loops are followed or adjacent to the turns of the fourth multiple loops in the circumferential direction. Then, the turns of the second multiple loops, the third multiple loops, the fifth multiple loops, the eighth multiple loops, the sixth multiple loops, and the seventh multiple loops are followed. Although the sequence has been described as starting with the first multiple loop, it should be understood that the beginning of the repeating pattern can be considered any loop in the multiple loops.

[0143] The first measuring coil, the second measuring coil, the first return coil, and the second return coil are arranged in a repeating interlaced pattern. The repeating interlaced pattern repeats once every eight loops, or it may repeat in every integer (N) multiple of eight loops. The eight-loop repeating portion of the repeating interlaced pattern includes two loops in each of the multiple loops. Alternatively, when the pattern repeats in every integer (N) multiple of eight loops, the repeating portion includes an integer multiple of eight loops, such as N*8 loops, and N*2 loops in each coil.

[0144] In other words, the first measuring coil, the second measuring coil, the first return coil, and the second return coil are disposed on the substrate such that they form a repeating pattern in the circumferential direction around the path.

[0145] A repeating pattern may include a "motif" or a portion of a pattern that is repeated multiple times. A repeating pattern includes multiple motifs arranged in a repeating manner, wherein each motif of the repeating pattern includes a loop in a first plurality of loops, a loop in a second plurality of loops, a loop in a third plurality of loops, a loop in a fourth plurality of loops, a loop in a fifth plurality of loops, a loop in a sixth plurality of loops, a loop in a seventh plurality of loops, and a loop in an eighth plurality of loops.

[0146] The loops of the coils are measured repeatedly in this manner, with each coil provided across four layers of the substrate, and each loop requiring a limited number of vias. (See also: [link to relevant documentation]). Figures 6a to 6e As described, due to the specific layers on which each loop is formed or disposed, each loop of the coil requires a via at the inner circumference (from a first plurality of vias 504 or a second plurality of vias 506) and a via at the outer circumference (from a third plurality of vias 508 or a fourth plurality of vias 510). This provides a current sensor that can include a larger number of loops or turns because a smaller portion of the PCB or substrate area is required to implement the vias. This improves the sensitivity of the current sensor.

[0147] Each loop or turn of the four measuring coils is provided with an inner circumferential through-hole, which is located in a unique angular position relative to the other through-holes among a plurality of inner circumferential through-holes. This ensures that the measuring conductors of different turns are located in different radial planes, thereby reducing the difficulty of manufacturing the current sensor. In other words, the loop is set in a unique radial plane.

[0148] In addition, each loop of each measuring coil includes a corresponding one of a plurality of outer circumferential through holes, wherein each of the plurality of outer circumferential through holes is located in a unique angular position relative to the other through holes in the plurality of outer circumferential through holes.

[0149] It should be noted that the above wiring results in all loops (or turns) of each coil in the coil being superimposed on the total differential voltage of the coil. In other words, all loops are configured to behave in a superposition manner in terms of sensed current. It should be noted that other combinations of layer selection are also possible and can yield the same result.

[0150] Because each coil is provided alternately across four layers of the substrate (such that the first turn of each coil is provided on two layers, and the second turn is provided on two different layers of the substrate), all coils occupy the same number of layers of the substrate on average. Furthermore, as the measuring and return coils extend around the substrate, the paths or routes they take are well-matched because the paths or routes of the coils are as close as possible to each other and in the same circumferential direction. This ensures that the coils pick up the same noise from external noise sources. Therefore, the noise is common-mode and can be canceled or suppressed by external signal processing circuitry, such as differential amplifiers.

[0151] The first measuring coil 204 and the second measuring coil 208 are formed using vias in a first plurality of vias 504 surrounding a single circumference. These first plurality of vias are closest to the conductor 100 carrying the current to be measured, or to the path 522 for the conductor. Therefore, the distances from the inner circumferential vias of both measuring coils to the conductor are equal. The same applies to the return coil, which is formed using a second plurality of vias 506 surrounding a single circumference. Furthermore, arranging the vias around a single circumference minimizes electrostatic coupling from external noise sources.

[0152] Four-layer four-turn current sensor

[0153] about Figures 5a to 7 The described current sensor 500 includes a measuring coil and a return coil disposed on four layers of a substrate, having a repeating pattern of eight turns per layer, and each coil comprising turns on alternating layer pairs. This provides good electrostatic coupling performance.

[0154] Figures 8a to 10 Another implementation is shown, in which the current sensor is disposed on four layers of a substrate, having a pattern that repeats every four turns or loops. Each coil is disposed on only two layers of the substrate, or comprises turns only on two layers of the substrate.

[0155] A current sensor can be implemented on a substrate having four layers, wherein four measuring coils are arranged to extend at least partially around a conductor path passing through the substrate. Each measuring coil is disposed on two of the four layers of the substrate. Distributing it on two of the four layers can mean that a majority of the conductor or conductive trace comprising the measuring coil is located on two of the four layers of the substrate. In other words, the measuring coil can include multiple loops, and these loops surround the area between two of the four layers of the substrate. A first measuring coil is disposed on two of the four layers. A second measuring coil is disposed on two of the four layers. A first return coil is disposed on two of the four layers, wherein the first return coil is disposed on two layers different from the two layers on which the first measuring coil is disposed. A second return coil is disposed on two of the four layers, wherein the second return coil is disposed on two layers different from the two layers on which the second measuring coil is disposed.

[0156] Providing measurement coils across four layers improves the matching of the external field coupling to all four measurement coils. While the matching degree is slightly lower than that achieved with each measurement coil across all four layers, it is still acceptable.

[0157] Furthermore, this allows the pattern to repeat every four loops (or integer multiples of four loops) instead of every eight turns—making it possible to provide a smaller total number of loops for current sensors, since multiples of four total loops are required instead of multiples of eight. This is particularly advantageous in space-constrained situations.

[0158] Figure 8a It shows Figures 2a to 2c The current sensor 200 shown is implemented on a printed circuit board (PCB) in a manner 800, wherein the current sensor measuring coil is implemented across four layers of the PCB. The current sensor 800 includes a substrate 802 having four layers.

[0159] The current sensor 800 includes a first measuring coil 204, a first return coil 206, a second current measuring coil 208, and a second return coil 210.

[0160] The substrate 802 includes a first plurality of vias 804 arranged around the inner circumference of the first measuring coil 204 and the second measuring coil 208. The substrate also includes a second plurality of vias 806 arranged around the inner circumference of the first return coil 206 and the second return coil 210. The first plurality of vias 804 are shown arranged around a different circumference than the second plurality of vias 806, such that the first and second plurality of vias are staggered or arranged around concentric circumferences or circles. Alternatively, the first plurality of vias 804 and the second plurality of vias 806 may be arranged around the same circumference.

[0161] The substrate 302 further includes a third plurality of vias 808 arranged around the outer circumference of the first measuring coil 204 and the second measuring coil 206. The substrate also includes a fourth plurality of vias 810 arranged around the outer circumference of the first return coil 206 and the second return coil 210. The third plurality of vias 808 and the fourth plurality of vias 810 are located in... Figure 8a The vias are shown arranged around the same circumference. However, alternatively, the third plurality of vias 808 and the fourth plurality of vias 810 may be arranged around different circumferences, such that the third plurality of vias and the fourth plurality of vias are staggered or arranged around concentric circumferences or circles.

[0162] The current sensor 800 includes a conductor 100 for carrying a current to be measured by a first current measuring coil 204 and a second current measuring coil 206. The conductor 100 is implemented along a path 822 on a substrate 802. The path 822 may be an aperture for receiving the conductor 100. Alternatively, the conductor 100 may be a conductive trace through the substrate without an aperture. The conductor 100 or the path 822 for the conductor is centrally located such that the first measuring coil 204, the second measuring coil 208, the first return coil 206, and the second return coil 210 are formed as a circle around or centered on the conductor 100. The conductor 100 may be any conductor suitable for carrying the current to be measured by the current sensor.

[0163] The first current measuring coil 204, the second current measuring coil 208, the first return coil 206, and the second return coil 210 are implemented across four layers of the substrate, including conductors or conductive traces on different layers of the substrate. Illustrations are provided in the accompanying drawings, in which conductors on different layers of the substrate 802 are represented using different line types.

[0164] A first plurality of vias 804 and a third plurality of vias 808 are used to couple the conductors or conductive traces of the first measuring coil 204 and the second measuring coil 208. A second plurality of vias 806 and a fourth plurality of vias 810 are used to couple the conductors or conductive traces of the first return coil 206 and the second return coil 210. The vias enable the formation of multi-layered loops or turns across the substrate for the measuring coils and the return coils. The first plurality of vias 804 and the third plurality of vias 808 form turns or loops of the first measuring coil 204 and the second measuring coil 208. The second plurality of vias 806 and the fourth plurality of vias 810 form turns or loops of the first return coil 206 and the second return coil 210.

[0165] Each coil includes conductors on two layers of the substrate. Each layer of substrate 802 includes a plurality of measuring conductors. A first plurality of measuring conductors 814 are located on the first layer of substrate 802. A second plurality of measuring conductors 816 are located on the second layer of substrate 802. A third plurality of measuring conductors 818 are located on the third layer of substrate 802. A fourth plurality of measuring conductors 820 are located on the fourth layer of substrate 802. The measuring conductors are located in a radial plane starting from conductor 100 or the path for the conductor.

[0166] The third multiple measuring conductor 818 and the fourth multiple measuring conductor 820 are in Figure 8a They are not visible because the first plurality of measuring conductors 814 and the second plurality of measuring conductors 816 are located in the same plane as the third plurality of measuring conductors 818 and the fourth plurality of measuring conductors 820.

[0167] The measuring coil consists of measuring conductors on two of the four layers of the substrate.

[0168] Figure 8d A three-dimensional side view of the current sensor 800 is shown, in which a third plurality of measuring conductors 818 and a fourth plurality of measuring conductors 820 can be seen.

[0169] The substrate 802 also includes a plurality of circumferentially extending conductors 812. The circumferentially extending conductors are arranged to provide circumferential extension of the measuring coil and the return coil around the conductor 100 or the path 822 for the conductor. The circumferentially extending conductors may be referred to as the advancing region of the substrate 802 because they enable the coil to extend or advance around the substrate 802 and around the conductor 100 or the path 822 for the conductor.

[0170] Figure 8b It shows Figure 8a The current sensor 800 contains only a first measuring coil 204 and a first return coil 206.

[0171] Figure 8c It shows Figure 8a The current sensor 800 contains only a second measuring coil 208 and a second return coil 210.

[0172] Figures 9a to 9e It shows Figures 8a to 8d The simplified sub-segments of the conductive traces and vias of the measuring coil and return coil. Figure 9a The reference numerals are associated with the components of the first measuring coil 204. Figure 9b The reference numerals are associated with the components of the second measuring coil 208. Figure 9c The reference numerals are associated with the components of the first return coil 206. Figure 9d The reference numerals are associated with the components of the second return coil 210.

[0173] consider Figure 9a The first measuring coil 204 includes multiple loops or turns.

[0174] The first turn or loop of the first current measuring coil 204 includes a circumferentially extending conductor 902 on the third layer of the substrate. A first end of the circumferentially extending conductor 902 is coupled to a second end of a measuring conductor 904 on the third layer of the substrate, one of a third plurality of measuring conductors 818. A first end of the measuring conductor 904 is coupled to a via 906 in a first plurality of vias 804. A first end of a measuring conductor 908 on the first layer of the substrate of the first plurality of measuring conductors 814 is coupled to the via 906. A second end of the measuring conductor 908 is coupled to a first end of a circumferentially extending conductor 910 on the first layer of the substrate. A second end of the circumferentially extending conductor 910 is coupled to a via 912 in a third plurality of vias 808. The first turn or loop begins at the outer circumference of the measuring coil, extends to the inner circumference of the measuring coil on the third layer, switches to the first layer, and then extends to the outer circumference of the measuring coil on the first layer. In this way, a turn or loop is formed across the third and first layers of the substrate.

[0175] In other words, the loop of the first measuring coil is formed by a measuring conductor on one of the four layers of the substrate and a measuring conductor on another of the four layers of the substrate. The measuring conductors are coupled to each other through corresponding vias in the first plurality of vias, and the loop of the first measuring coil is coupled to another loop of the first measuring coil through corresponding vias in the third plurality of vias.

[0176] The first end of the corresponding conductor is closer to the inner circumference of the coil, or closer to the current-carrying conductor 100 or the path 822 for the current-carrying conductor. Although the via is described as an inner circumference and an outer circumference, it is clear that the via can be provided in a variety of different shapes, wherein the inner via is closer to the conductor 100 or the path 822, and the outer via is further away from the conductor 100 or the path 822.

[0177] The first measuring coil 204 includes multiple turns or loops. All turns or loops of the first measuring coil 204 are formed on the third and first layers of the substrate 802. Therefore, the second turns or loops of the first measuring coil are also formed on the first and third layers of the substrate and coupled to the first turn at the via 912.

[0178] Although the extension of the loop of the first measuring coil 204 is described as from Figure 9a Proceed to the left Figure 9a The right side, however, should be understood as merely for descriptive convenience and does not specifically describe the direction of travel around the circumference from the starting point of the coil. When considering all loops joined together, the voltage induced in the first loop of the measuring coil by the rate of change of current in conductor 100 produces the cumulative voltage across the measuring coil. Regarding Figures 9a to 9dThe extension of the loop has been described in a single direction, but the extension of the loop can be clockwise or counterclockwise as previously described. Therefore, the loops of different coils can extend in different or opposite directions.

[0179] consider Figure 9b The second measuring coil 208 includes multiple loops or turns.

[0180] The first turn or loop of the second current measuring coil 208 includes a circumferentially extending conductor 914 on the second layer of the substrate. A first end of the circumferentially extending conductor 914 is coupled to a second end of a second plurality of measuring conductors 816 on the second layer of the substrate. A first end of the measuring conductor 916 is coupled to a via 918 in a first plurality of vias 804. A first end of a fourth plurality of measuring conductors 820 on the fourth layer of the substrate is coupled to the via 918. A second end of the measuring conductor 920 is coupled to a first end of a circumferentially extending conductor 922 on the fourth layer of the substrate. A second end of the circumferentially extending conductor 922 is coupled to a via 924 in a third plurality of vias 808. The first turn or loop begins at the outer circumference of the measuring coil, extends to the inner circumference of the measuring coil on the second layer, switches to the fourth layer, and then extends to the outer circumference of the measuring coil on the fourth layer. In this way, a turn or loop of the second measuring coil is formed across the second and fourth layers of the substrate.

[0181] In other words, the loop of the second measuring coil is formed by a measuring conductor on one of the four layers of the substrate and a measuring conductor on another of the four layers of the substrate. The measuring conductors are coupled to each other through corresponding vias in the first plurality of vias, and the loop of the second measuring coil is coupled to another loop of the second measuring coil through corresponding vias in the third plurality of vias.

[0182] The second measuring coil 208 includes multiple turns or loops. All turns or loops of the second measuring coil 208 are formed on the second and fourth layers of the substrate 802. Therefore, the second turn or loop of the second measuring coil is also formed on the second and fourth layers of the substrate and coupled to the first turn at the via 924.

[0183] consider Figure 9c The first return coil 206 includes multiple loops or turns.

[0184] The first turn or loop of the first return coil 206 includes a circumferentially extending conductor 938 on the second layer of the substrate. A first end of the circumferentially extending conductor 938 is coupled to a second end of a measuring conductor 940 on the second layer of the substrate, one of a second plurality of measuring conductors 816. A first end of the measuring conductor 940 is coupled to a via 942 in a second plurality of vias 806. A first end of a measuring conductor 944 on the fourth layer of the substrate, one of a fourth plurality of measuring conductors 820, is coupled to the via 942. A second end of the measuring conductor 944 is coupled to a first end of a circumferentially extending conductor 946 on the fourth layer of the substrate. A second end of the circumferentially extending conductor 946 is coupled to a via 948 in a fourth plurality of vias 810. The first turn or loop begins at the outer circumference of the return coil, extends to the inner circumference of the return coil on the second layer, switches to the fourth layer, and then extends to the outer circumference of the return coil on the fourth layer. In this way, a turn or loop of the first return coil is formed across the second and fourth layers of the substrate.

[0185] In other words, the loop of the first return coil is formed by a measuring conductor on one of the four layers of the substrate and a measuring conductor on another of the four layers of the substrate. The measuring conductors are coupled to each other through corresponding vias in the second plurality of vias, and the loop of the first return coil is coupled to another loop of the first return coil through corresponding vias in the fourth plurality of vias.

[0186] The first return coil 206 includes multiple turns or loops. All turns or loops of the first return coil 206 are formed on the second and fourth layers of the substrate 802. Therefore, the second turn or loop of the first return coil is also formed on the second and fourth layers of the substrate and coupled to the first turn at the via 948.

[0187] consider Figure 9d The second return coil 210 includes multiple loops or turns.

[0188] The first turn or loop of the second return measurement coil 210 includes a circumferentially extending conductor 926 on the third layer of the substrate. A first end of the circumferentially extending conductor 926 is coupled to a second end of a measurement conductor 928 on the third layer of the substrate, one of a third plurality of measurement conductors 818. A first end of the measurement conductor 928 is coupled to a via 930 in a second plurality of vias 806. A first end of a measurement conductor 932 on the first layer of the substrate of a first plurality of measurement conductors 814 is coupled to the via 930. A second end of the measurement conductor 932 is coupled to a first end of a circumferentially extending conductor 934 on the first layer of the substrate. A second end of the circumferentially extending conductor 934 is coupled to a via 936 in a fourth plurality of vias 810. The first turn or loop begins at the outer circumference of the return coil, extends to the inner circumference of the return coil on the third layer, switches to the first layer, and then extends to the outer circumference of the return coil on the first layer. In this way, a turn or loop of the second return coil is formed across the third and first layers of the substrate.

[0189] In other words, the loop of the second return coil is formed by a measuring conductor on one of the four layers of the substrate and a measuring conductor on another of the four layers of the substrate. The measuring conductors are coupled to each other through corresponding vias in the second plurality of vias, and the loop of the second return coil is coupled to another loop of the second return coil through corresponding vias in the fourth plurality of vias.

[0190] The second return coil 210 includes multiple turns or loops. All turns or loops of the second return coil 210 are formed on the third and first layers of the substrate 802. Therefore, the second turn or loop of the second return coil is also formed on the third and first layers of the substrate and coupled to the first turn at the via 936.

[0191] Figures 9a to 9d Several other external measuring conductors 950 are shown, in Figure 9eReferenced in [reference]. External measuring conductors can be coupled between corresponding circumferential extending conductors in the plurality of circumferential extending conductors 812 and vias in the third plurality of vias 808 and the fourth plurality of vias 810, respectively. For simplicity, they are not described. External measuring conductors 950 are optional, and conversely, circumferential extending conductors can be directly coupled or connected to vias in the third plurality of vias 808 and the fourth plurality of vias 810. Furthermore, the plurality of circumferential extending elements can be positioned anywhere between the first plurality of vias 804 / second plurality of vias 806 and the third plurality of vias 808 / fourth plurality of vias 810. Circumferential extending conductors can be positioned adjacent to or directly connected to the inner circumferential vias 804, 806. Circumferential extending conductors can be positioned adjacent to or directly connected to the outer circumferential vias 808, 810. The circumferential extension conductor can be positioned between the inner circumferential through holes 804 and 806 and the outer circumferential through holes 808 and 810, wherein the two ends of the circumferential extension conductor 812 are coupled to the measuring conductor, and then the measuring conductor is coupled to the through hole.

[0192] Therefore, the measuring conductors in the first to fourth plurality of measuring conductors can actually be coupled to the outer end or the second end of the plurality of circumferentially extending conductors 812.

[0193] Figure 10 It shows Figures 8a to 8d The simplified sub-segments of the conductive traces and vias of the measuring coil and return coil. Figure 10 It also shows Figures 9a to 9e A wider view of the simplified trace.

[0194] like Figure 10 As shown, the first measuring coil 204 includes a first turn 1002. Adjacent to the first turn 1002 of the first measuring coil are the first turn 1004 of the second return coil 210, the first turn 1006 of the second measuring coil 208, and the first turn 1008 of the first return coil 206.

[0195] The first measuring coil 204, the first return coil 206, the second measuring coil 208, and the second return coil 210 are arranged in a repeating pattern on the substrate, which repeats once every four adjacent turns or loops. Therefore, section 1018 of the current sensor comprises four turns (one turn for each of the measuring coil and the return coil). This section 1018 repeats throughout the current sensor. Any other repeating order of the measuring coil loops or turns can be provided on the substrate—for example, four loops can be provided on the substrate in a different order.

[0196] Figures 9a to 9e and Figure 10 The diagram illustrates a two-layer arrangement across a substrate for each measuring coil. It should be understood that the specific layer across which the measuring coil is positioned is an example of the layers that the measuring coil can be positioned across.

[0197] More generally, the first measuring coil may be disposed on two different layers of the substrate than the second measuring coil. Alternatively, the first measuring coil and the second measuring coil may be disposed on the same two layers of the substrate.

[0198] like Figures 9a to 9e and Figure 10 As shown, the first measuring coil is disposed on the first and third layers of the substrate, the second measuring coil is disposed on the second and fourth layers of the substrate, the first return coil is disposed on the second and fourth layers of the substrate, and the second return coil is disposed on the first and third layers of the substrate.

[0199] In other words, the current sensor 500 can be considered to include four or more loops. A first measuring coil includes a first plurality of loops formed on a first and third layer of the substrate. A second measuring coil includes a second plurality of loops formed on a second and fourth layer of the substrate. A first return coil includes a third plurality of loops formed on a second and fourth layer of the substrate. A second return coil includes a fourth plurality of loops formed on a first and third layer of the substrate. Each loop of the measuring coil includes a conductive trace providing radial advancement between the inner and outer circumferences of the measuring coil, and a conductive trace providing circumferential advancement around the path.

[0200] The multiple loops are arranged in a sequence such that the turns of the first multiple loops are followed or adjacent to the turns of the fourth multiple loops in the circumferential direction. Then, the turns of the second multiple loops and the turns of the third multiple loops are followed.

[0201] Therefore, the first turn 1008 of the first return coil 206 is directly adjacent to the second turn 1010 of the first measuring coil in the circumferential direction around the substrate, which in turn is adjacent to or follows the following turns in the circumferential direction around the substrate: the second turn 1012 of the second return coil 210, the second turn 1014 of the second measuring coil 208, and the second turn 1016 of the first return coil 206. The turns of the respective coils are provided in this order around the coil in the circumferential direction.

[0202] The loops of the coils are measured repeatedly in this manner, with each coil provided across two layers of the substrate, and each loop requires a limited number of vias. (See also: Regarding...) Figures 9a to 9e As described, due to the specific layers on which each loop is formed or disposed, each loop of the coil requires a via at the inner circumference (from a first plurality of vias 504 or a second plurality of vias 506) and a via at the outer circumference (from a third plurality of vias 508 or a fourth plurality of vias 510). This provides a current sensor that can include a larger number of loops or turns because a smaller portion of the PCB or substrate area is required to implement the vias.

[0203] The corresponding loops in the first, second, third, and fourth loops are located in adjacent radial planes. The radial planes are arranged around the path.

[0204] In other words, the first measuring coil, the second measuring coil, the first return coil, and the second return coil are arranged in a repeating interlaced pattern. The repeating interlaced pattern may repeat once every four loops. However, it should be understood that the repeating pattern may include more than one loop per coil (an integer number of loops per coil), and repeat once every integer multiple of four loops.

[0205] A first measuring coil, a second measuring coil, a first return coil, and a second return coil are disposed on a substrate such that they form a repeating pattern in a circumferential direction around a path. The repeating pattern includes a plurality of pattern units, which are portions of coils arranged in a repeating manner, wherein each pattern unit of the repeating pattern includes a loop in a first plurality of loops, a loop in a second plurality of loops, a loop in a third plurality of loops, and a loop in a fourth plurality of loops.

[0206] It should be noted that the above wiring results in all loops (or turns) of each coil in the coil being superimposed on the total differential voltage of the coil. In other words, all loops are configured to behave in a superposition manner in terms of sensed current. It should be noted that other combinations of layer selection are also possible and can yield the same result.

[0207] Each coil is positioned across two of the four layers of the substrate (such that the first measuring coil 204 and the second return coil 210 are positioned on the first and third layers of the substrate, and the second measuring coil 208 and the first return coil 206 are positioned on the second and fourth layers of the substrate). As the measuring and return coils extend around the substrate, the paths or routes they take are well-matched because the coil paths or routes are as close as possible to each other and in the same circumferential direction. This ensures that the coils pick up the same noise from external noise sources. Therefore, the noise is common-mode and can be easily canceled or suppressed by external signal processing circuitry, such as differential amplifiers.

[0208] Although Figure 9 and Figure 10 One layer implementation is shown, but other implementations are possible.

[0209] For example, a first measuring coil is disposed on the first and third layers of the substrate, a second measuring coil is disposed on the first and third layers of the substrate, a first return coil is disposed on the second and fourth layers of the substrate, and a second return coil is disposed on the second and fourth layers of the substrate.

[0210] Alternatively, a first measuring coil is disposed on the first and fourth layers of the substrate, a second measuring coil is disposed on the second and third layers of the substrate, a first return coil is disposed on the second and third layers of the substrate, and a second return coil is disposed on the first and fourth layers of the substrate.

[0211] Alternatively, a first measuring coil is disposed on the first and fourth layers of the substrate, a second measuring coil is disposed on the first and fourth layers of the substrate, a first return coil is disposed on the second and third layers of the substrate, and a second return coil is disposed on the second and third layers of the substrate.

[0212] The first measuring coil 204 and the second measuring coil 208 are formed using vias in a first plurality of vias 804 surrounding a single circumference. These first plurality of vias 804 are closest to the conductor 100 carrying the current to be measured, or to the path 822 for the conductor. The inner circumferential vias of both measuring coils are equidistant from the conductor. The same applies to the return coil, which is formed using a second plurality of vias 806 surrounding a single circumference. Arranging the vias in this manner around a single circumference minimizes electrostatic coupling.

[0213] staggered vias

[0214] about Figures 5a to 10 The described current sensor includes through-holes at the outer circumference of the measuring coil and the return coil, these through-holes comprising a single circle or circumference. Therefore, according to... Figures 5a to 7 The third plurality of vias 508 and the fourth plurality of vias 510 of the current sensor are located around a single circumference, at the same distance from the path 522 for the current-carrying conductor or the center of the conductor 100. Similarly, according to Figures 8a to 10 The third plurality of vias 808 and the fourth plurality of vias 810 of the current sensor are located around a single circumference, at the same distance from the path 822 for the current-carrying conductor or the center of the conductor 100. However, these vias can be staggered, such that alternating vias are arranged on different circumferences, or at different radii or distances from the center of the paths 522, 822 for the conductor.

[0215] like Figure 11 As shown, the first plurality of vias 1104 and the second plurality of vias 1106 are arranged such that they have different circumferences, or different radii or distances from the center of the path 1122 for the conductor. This is the same as the first plurality of vias 504, 804 and the second plurality of vias 506, 806 described with respect to the previous current sensor.

[0216] The outer circumferential through holes (including the third and fourth through holes 1108 and the fourth through holes 1110) are in Figure 11The vias are arranged such that they have different circumferences, or different radii or distances from the center of the path 1122 for the conductor. The fourth plurality of vias 1110 is provided with a shorter radius, or is closer to the center of the path 1122 for the conductor than the third plurality of vias 1108. This staggering of the outer circumferential vias can also be applied to the third plurality of vias 508, 808 and the fourth plurality of vias 510, 810 described with respect to the previously described current sensors.

[0217] This method of interleaving the outer circumferential vias allows for a larger number of turns in the current sensor. Furthermore, it enables multiple differential current sensors to be staggered adjacent to each other. Adjacent current sensors, including four coils (two measuring coils and two return coils), can be positioned closer together due to the interleaving, as the outer via of one coil of the first current sensor can be co-located adjacent to the outer via of one coil of an adjacent or second current sensor. This results in partial overlap of the circumferences of the current sensors.

[0218] Note that in both the four-layer eight-turn coil and the four-layer four-turn coil, each spoke has only one external through-hole and one internal through-hole, which is different from... Figure 4 The coils (each spoke has 3 external through-holes and 1 internal through-hole) form a contrast. This is an improvement that helps increase spoke density and repeatability, as well as reduce the cost of the through-holes.

[0219] Coil wiring

[0220] It is desirable that the measuring coils extend substantially around the conductor being measured for 360 degrees. To ensure that the measuring coils extend substantially around the substrate and provide improved suppression of longitudinal external fields, the start and end points of each measuring coil should be positioned as close to each other as possible—preferably at the same or substantially the same angular position.

[0221] like Figure 2a As shown, the first end of the first measuring coil 204 begins at terminal or node 212 and extends or travels in a counterclockwise direction around the path of the current-carrying conductor 100 (or, in an alternative implementation, in a clockwise direction), terminating at a second end or node 214. The first return coil 206 extends or travels in the opposite direction to the first measuring coil 204 from node 214 to node 216, around the path of the current-carrying conductor or the current-carrying conductor 200 in a clockwise direction. The first end 214 of the first return coil 206 is coupled to the second end 214 of the first measuring coil 204.

[0222] It is desirable that the first end 212 of the first measuring coil 204 and the second end of the first return coil 206 are located in substantially the same position. In order for both to travel 360 degrees around the substrate, the node (node ​​214) of the coupling coil should also be located in substantially the same position as the first end 212 of the first measuring coil 204 and the second end 216 of the first return coil 206.

[0223] like Figure 9e As shown, the external measuring conductors 950 form additional regions on the outer circumference of the coil's turns or loops adjacent to the coil. Therefore, these external measuring conductors 950 can be considered to increase the loop area. For good immunity to external uniform magnetic fields in the X direction of the PCB or substrate, it is important that these external measuring conductors 950, and the additional regions of the turns they form (located on the first side of the substrate, at the 12 o'clock position adjacent to the start and end points of the coil), perfectly match the turns opposite them at the 6 o'clock position (or 180 degrees around the substrate from the start and end points of the coil). However, because the start and end points of the coil cannot occupy the same coordinates on the PCB (which would cause them to short-circuit), they do not match. For example, see reference... Figure 12 Ideally, the first measuring coil would begin and end at the same location or via 1202, and this via 1202 would be at the same radial distance as all other outer circumferential vias (including those opposite it on the other side of the substrate). Instead, the coil begins at 1202 and ends at via 1210, marked "Pf-Pr". If via 1202 remained in its original radial position, at the same circumference as the other outer circumferential vias, this would result in a shortened loop formed by the additional conductor 950. Therefore, vias 1202-1208 can be moved radially outward to increase the loop area of ​​the turn, such that it matches the loop area created by the external measuring conductor 950 opposite it on the other side of the substrate.

[0224] The same applies to the second measuring coil 208 and the second return coil 210.

[0225] To achieve this, node 214 (which may be a via) can be offset circumferentially from the outer circumferential via. However, this results in the area enclosed by the loop at the second end 214 of the first measuring coil and the first end 214 of the first return coil being different from the average area enclosed by the remaining loops of the measuring coil. This may introduce measurement errors.

[0226] To counteract this, the first and last loops of the first measuring coil 204 and the first return coil 206 (also referred to as loops coupled to the first and second ends of the first measuring coil 204 and the first return coil 206) can be coupled to vias or nodes with different radial positions (radial positions are distances taken from the center of the measuring coil). These radial positions allow the average loop area of ​​the first and last loops to be substantially the same as the average loop area of ​​all other loops of the coil.

[0227] Alternatively, the loops at 180 degrees around the coil from the first and last loops may include loop areas different from the average loop area, such that the average area of ​​the loops located at substantially 180 degrees has the same loop area as those loops coupled to the steering via 1210.

[0228] Figure 12 It shows about Figures 8a to 10 This is a part of the current sensor 800 described. Figure 12 The PCB layout shown includes the ends of the measurement coil and the return coil. The first end 212 of the first measurement coil 204 is coupled to the first output via 1202, which can also be referred to as the first via. The second end 216 of the first return coil is coupled to the first common-mode via 1204, which can also be referred to as the second via 1204. The common-mode via can also be referred to as the reference via. The first end 218 of the second measurement coil is coupled to the second output via 1206, which can also be referred to as the third via 1206. The second end 222 of the second return coil 210 is coupled to the second common-mode via 1208, which can also be referred to as the fourth via 1208.

[0229] Then, the output via and the common-mode via can be coupled to the output terminal or the common-mode terminal for coupling to external signal processing circuitry.

[0230] Ideally, to provide improved immunity to external magnetic fields, the start and end points of each of the four coils would be placed in the same physical location on the PCB or substrate. However, this is impossible because multiple vias cannot be in the same location. To place the start and end points of the coils as close to each other as possible, the vias can be offset (e.g., placed on different circumferences, at different radial distances from the coil center). This results in shortening of the spokes or measuring conductors at these locations, leading to a reduction in the area of ​​the loops or turns. This results in reduced immunity to unwanted external magnetic fields. To compensate for this, the four external vias 1202-1208 coupled to the ends of the coils are offset in the radial direction to correct this error.

[0231] Considering only the first measuring coil 204 and the first return coil 206, the first measuring coil 204 includes multiple loops, and the first return coil 206 includes multiple loops. The multiple loops of the first measuring coil 204 and the multiple loops of the first return coil 206 are formed using multiple measuring conductors disposed on two or more layers of a substrate. The measuring conductors are coupled using a first plurality of outer circumferential vias and a first plurality of inner circumferential vias positioned at a first radial distance from the center of the measuring coil and the return coil. The outer circumferential vias, inner circumferential vias, and how each loop is formed have already been described and will not be repeated here.

[0232] The second end of the first measuring coil 204 is coupled to the first end of the first return coil 206 at node 1210. This node 1210 may also be referred to as a “turn-around” via 1210 because it identifies the location where the coil switches direction or “turns around.” In order for the turn-around via 1210 to be positioned substantially adjacent to the first output via 1202 of the first measuring coil 204 and the first common-mode via 1204 of the first return coil 206, the turn-around via 1210 may be positioned at a second radial distance from the center of the measuring coil, which is different from the first radial distance.

[0233] This causes the directional via 1210 to be offset from most of the outer circumferential via, allowing it to be positioned at the same or similar angular location as the first output via 1202 and the first common-mode via 1204. This allows the measurement coil to extend substantially 360 degrees around the substrate. In other words, most of the outer circumferential via can be located at a first radial distance from the center of the measurement coil and the return coil, and the directional via can be located at a different radial distance.

[0234] Offsetting the steering through-hole 1210 in this way results in the loops of the first measuring coil 204 and the second measuring coil 206 coupled to the steering through-hole 1210 having different dimensions than the rest of the coil loops. This reduction in area leads to mismatched coupling at the start of the coil compared to 180 degrees around the coil. This is particularly problematic in the presence of a longitudinal external field.

[0235] To offset this, the size of the loop at the coil start point can be modified or adjusted to compensate for the reduced loop size. Specifically, the first output via 1202 and the first common-mode via 1204 of the loop coupled to the first measuring coil 204 and the first return coil 206 can be modified for compensation.

[0236] The first output via 1202 and the first common-mode via 1204 are located at a third radial distance from the center of the measuring coil. This third radial distance is different from the second radial distance where the steering via 1210 is located.

[0237] Specifically, the third radial distance can be greater than the second radial distance, and the first radial distance can be between the second and third radial distances. In this way, the steering via 1210 is located at a circumference smaller than that of most of the outer circumferential vias, and the first output via 1202 and the first common-mode via 1204 are located at circumferences larger than those of most of the outer circumferential vias (and vice versa).

[0238] The average value of the second and third radial distances can be the same as the first radial distance.

[0239] In other words, by modifying the positions of the vias 1210, 1202, and 1204, the dimensions of the loops coupled to these vias are modified. The loops of the first measuring coil 204 coupled to the first output via 1202 and the first return coil 206 coupled to the first common-mode via 1204 are larger than the loops of the first measuring coil 204 and the first return coil 206 coupled to the 1210. The average area of ​​these four loops is the same as the average area of ​​the remaining loops of the first measuring coil 204 and the first return coil 206. This ensures that loops located at the start and end points of the coils do not cause mismatched noise to couple into the coils, thereby enabling the cancellation of external longitudinal fields.

[0240] Furthermore, to ensure that the vias are positioned as close as possible to each other, the first output via 1202 is located in a first angular position, the first common-mode via 1204 is located in a second angular position, and the turning via is located in a third angular position. The third angular position can be located at an angle between the angle of the first angular position and the angle of the second angular position. The angular position can be measured from the center of the measuring coil. This ensures that the vias are positioned as close as possible to each other.

[0241] Figure 12 The connection of four measuring coils (two forward measuring coils and two return measuring coils) is shown, but it should be understood that it is also applicable to systems with only two measuring coils or more than four measuring coils.

[0242] The system may also include a second measuring coil 208 and a second return coil 210. The second measuring coil 208 includes multiple loops, and the second return coil 210 includes multiple loops. The multiple loops of the second measuring coil 208 and the second return coil 210 are formed using multiple measuring conductors disposed on two or more layers of a substrate. The measuring conductors are coupled using multiple outer circumferential vias and multiple inner circumferential vias positioned at a first radial distance from the center of the measuring coil and the return coil. The outer and inner circumferential vias and how each loop is coupled have already been described and will not be repeated here.

[0243] The second end of the second measuring coil 208 is coupled to the first end of the second return coil 210 at node 1212. This node 1212 may also be referred to as the "reversing" via 1212 because it identifies the location where the coil switching direction or "reversing" occurs. In order for the reversing via 1212 to be positioned substantially adjacent to the second output via 1206 of the second measuring coil 208 and the second common-mode via 1208 of the second return coil 210, the reversing via 1212 may be positioned at a second radial distance from the center of the measuring coil, which is different from the first radial distance.

[0244] This causes the directional via 1212 to be offset from most of the outer circumferential via, allowing it to be positioned at the same or similar angular location as the second output via 1206 and the second common-mode via 1208. This allows the measurement coil to extend substantially 360 degrees around the substrate. In other words, most of the outer circumferential via can be located at a first radial distance from the center of the measurement coil and the return coil, and the directional via can be located at a different radial distance.

[0245] The second output via 1206 and the second common-mode via 1208 are located at a third radial distance from the center of the measuring coil. This third radial distance is different from the second radial distance at which the second steering via 1212 is located.

[0246] The second steering through-hole 1212 is located at a circumference smaller than that of most outer circumferential through-holes, and the second output through-hole 1206 and the second common mode through-hole 1208 are located at a circumference larger than that of most outer circumferential through-holes (and vice versa).

[0247] The loops of the second measuring coil 208 coupled to the second output via 1206 and the second return coil 210 coupled to the second common-mode via 1208 are larger than the loops of the second measuring coil 208 and the second return coil 210 coupled to the second steering via 1212. The average area of ​​these four loops is the same as the average area of ​​the remaining loops of the second measuring coil 208 and the second return coil 210. This ensures that the loops located at the start and end points of the coils do not cause mismatched noise to couple into the coils, thereby enabling the cancellation of external longitudinal fields.

[0248] Furthermore, to ensure the vias are positioned as close as possible to each other, the second output via 1206 is located in the fourth angular position, the second common-mode via 1208 is located in the fifth angular position, and the second steering via 1212 is located in the sixth angular position. The sixth angular position can be located at an angle between the angles of the fourth and fifth angular positions. The angular position can be measured from the center of the measuring coil. This ensures the vias are positioned as close as possible to each other.

[0249] Although preferred as about Figure 12 The compensation described is performed near the start and end points of the coil, but it is also possible to perform compensation on the opposite side of the circumference (basically 180 degrees from the start or end point of the coil).

[0250] Figure 13 Compensation provided at 180 degrees from the start or end point of the coil (opposite to the start or end point of the coil) is shown. The first via 1302 of the third plurality of vias 808 is coupled to the first measuring coil 204. The second via 1304 of the third plurality of vias 808 is coupled to the second measuring coil 208. The first via 1306 of the fourth plurality of vias 810 is coupled to the first return coil 206. The second via 1308 of the fourth plurality of vias 810 is coupled to the second return coil 210. These vias provide interlayer connections of the coil at the outer circumference, as per [reference to...]. Figures 9a to 9e As described. The vias 1302-1308 are positioned closer to the conductor 100 or the path 822 for the conductor than the other vias in the third plurality of vias 808 and the fourth plurality of vias 810. This results in each coil in the coil having a shorter radial length of the turn on the substrate side opposite the start and end points of the coil, thus having a smaller loop area.

[0251] Referring only to the first measuring coil 204 and the first return coil 206, the fourth through-hole 1302 and the fifth through-hole 1306 are located approximately 180° around the substrate from the turning through-hole 1210, wherein the fourth through-hole 1302 and the fifth through-hole 1306 are positioned at a fourth radial distance from the center of the measuring coil. The fourth radial distance may be substantially the same as the second radial distance. The difference between the first radial distance and the second radial distance is substantially the same as the distance between the first radial distance and the fourth radial distance. The second radial distance is less than the first radial distance, and the fourth radial distance is less than the first radial distance.

[0252] The loop of the first measuring coil 204 and the loop of the first return coil 206 are coupled to the fourth through hole 1302 and the fifth through hole 1306, respectively. The fourth through hole 1302 and the fifth through hole 1306 are used to form the first shortened loop of the first measuring coil 204 and the second shortened loop of the first return coil 206.

[0253] Therefore, the shortened loop surrounding the substrate at approximately 180 degrees from the directional via 1210 has a loop area that is substantially the same as the loop coupled to the directional via. Consequently, the noise coupled to these loops should be substantially the same (and of opposite sign), thus enabling easy noise cancellation.

[0254] Referring to the second measuring coil 208 and the second return coil 210, the sixth through hole 1304 and the seventh through hole 1308 are located approximately 180° away from the second turning through hole 1212 around the substrate, wherein the sixth through hole 1304 and the seventh through hole 1308 are located at a fourth radial distance from the center of the measuring coil.

[0255] The loop of the second measuring coil 208 and the loop of the second return coil 210 are coupled to the sixth through hole 1304 and the seventh through hole 1308, respectively. The sixth through hole 1304 and the seventh through hole 1308 are used to form the first shortened loop of the second measuring coil 208 and the second shortened loop of the second return coil 210.

[0256] Therefore, the shortened loop surrounding the substrate at approximately 180 degrees from the second directional via 1212 has a loop area that is substantially the same as the loop coupled to the second directional via 1212. Consequently, the noise coupled to these loops should be substantially the same (and of opposite sign), thus facilitating noise cancellation.

[0257] although Figure 12 and Figure 13 The via positioning for compensation of current sensor 800 is described, but the same via positioning can also be applied to current sensor 500 or any other current sensor that includes two or more layers of coils.

[0258] The modification to the via positioning can be described in another way. The first measuring coil 204 includes a first plurality of loops, and the first return coil 206 includes a second plurality of loops. The first plurality of loops and the second plurality of loops are formed using a plurality of measuring conductors disposed on two or more layers of a substrate. The measuring conductors are coupled using a first plurality of outer circumferential vias and a first plurality of inner circumferential vias (as described throughout the application filing).

[0259] The first measuring coil 204 is coupled to the first return coil 206 at the steering through-hole 1210. A majority of the loops in the first plurality of loops and the second plurality of loops surround the area of ​​the first loop. This loop area is determined by the positioning of the inner and outer circumferential through-holes and the layers forming the measuring conductor. To allow the start and end points of each coil to be positioned as close as possible to each other, the loops in the first plurality of loops coupled to the steering through-hole and the loops in the second plurality of loops coupled to the steering through-hole surround the area of ​​the second loop. The area of ​​the second loop is smaller than or larger than the average loop area of ​​the remaining loops in the first plurality of loops and the second plurality of loops, thereby allowing the loop coupled to the steering through-hole to be positioned closer to the other end of the coil.

[0260] Furthermore, the first loop in the first plurality of loops and the first loop in the second plurality of loops (which is coupled to the output via or terminal at the other end of the coil opposite to the turning via 1210) can surround the area of ​​the third loop. If the area of ​​the second loop is smaller than the average loop area or the area of ​​the first loop, the area of ​​the third loop can be larger than the average loop area or the area of ​​the first loop.

[0261] Output coupling

[0262] Figure 14a The output terminals of current sensors 500 and 800, comprising four current measuring coils, are shown. A first end 212 of the first measuring coil 204 (first output via 1202) is coupled to a first or positive output terminal 1402. A first end 218 of the second measuring coil (second output via 1206) is coupled to a second or negative output terminal 1404. A second end 216 of the first return coil (first common-mode via 1204) is coupled to a reference terminal 1406. A second end 222 of the second return coil 210 (second common-mode via 1208) is coupled to a reference terminal 1406. While each coil is described as coupled to a via, it should be understood that these vias may alternatively be described as nodes, particularly when the coils are already on the correct layer for coupling to the output connection arrangement.

[0263] The first or positive output terminal 1402 can be coupled to a first input of the signal processing circuit. The second or negative output terminal 1404 can be coupled to a second input terminal of the signal processing circuit. The reference terminal 1406 can be coupled to a reference voltage or ground. In this way, the current sensor functions as a differential current sensor, providing differential outputs at the first or positive output terminal 1402 and the second or negative output terminal 1404.

[0264] The coupling between vias 1202, 1204, 1206, and 1208 and the output connection arrangement can introduce undesirable additional loop area. This additional loop area can pick up signals from external noise sources or from the conductor under test. This can reduce the signal-to-noise ratio (SNR) of the current sensor by introducing errors that cannot be canceled in the coil or in the common-mode rejection of the signal processing circuitry. Therefore, it is desirable to ensure that the connection between the measurement coil and the signal processing circuitry (provided by the connection arrangement on the substrate) reduces or cancels noise pickup.

[0265] The connection between the first output via 1202 and the first output terminal 1402 is provided by a first conductive trace or connecting conductor 1408 on the first layer of the substrate. The connection between the second output via 1206 and the second output terminal 1404 is provided by a second conductive trace or connecting conductor 1410 on the first layer of the substrate. The connection between the first common-mode via 1204 and the reference terminal 1406 is provided by a third conductive trace or connecting conductor 1412 on the second layer of the substrate. The connection between the second common-mode via 1208 and the reference terminal 1406 is provided by a fourth conductive trace or connecting conductor 1414 on the second layer of the substrate. The connecting conductors may include conductive materials on different layers of the substrate.

[0266] These traces can also be shown in the diagram. Figure 14a Alternative or three-dimensional views of the current sensor section shown. Figure 14b I saw it in the middle.

[0267] To reduce external magnetic field pickup caused by wiring or connection arrangements to the processing circuitry, the third conductive trace 1412 is located below or within a plane or radial plane substantially the same as the first conductive trace 1408 and the first output terminal 1402. For example, a large portion of the first connecting conductor 1408 and a large portion of the third connecting conductor 1412 lie in a plane perpendicular to the substrate surface. For example, a large portion of the first connecting conductor 1408 overlaps with a large portion of the third connecting conductor 1412.

[0268] This may mean that a portion, a majority, or all of the first connecting conductor 1408 is a mirror image, symmetrical, overlaps, or is aligned with at least a portion of the third connecting conductor 1412. For example, the first connecting conductor 1408 and the third connecting conductor 1412 at least partially follow the same path. When viewed through the substrate or through the main surface of the substrate, this path can be considered as a path extending along a substantially radial plane.

[0269] The first connecting conductor 1408 and the third connecting conductor 1412 have at least partially the same shape. The first connecting conductor 1408 and the third connecting conductor 1412 may have the same shape. Specifically, the third connecting conductor 1412 may have the same shape as both the first connecting conductor and the terminal 1402.

[0270] The first connecting conductor 1408 and the third connecting conductor 1412 are coupled such that current flows in opposite directions in the connecting conductors during use. This causes the magnetic fields generated by the current in the conductors to cancel each other out, and therefore these magnetic fields do not induce a current in the other conductor.

[0271] The third conductive trace 1412 may also have the same shape as one or both of the first conductive trace 1408 and the first output terminal 1402.

[0272] Similarly, the fourth conductive trace 1414 is located below or within the same plane or radial plane as the second conductive trace 1410 and the second output terminal 1404. The fourth conductive trace 1414 may follow the same path as the second conductive trace 1410, have the same shape, etc., as described with respect to the first conductive trace 1408 and the third conductive trace 1412.

[0273] The fourth conductive trace 1414 may also have the same shape as one or both of the second conductive trace 1410 and the second output terminal 1404.

[0274] This reduces noise in the current sensor output because the loop formed by conductive traces 1408 and 1410 on the first layer is canceled out by the loop area formed by conductive traces 1412 and 1414 on the second layer.

[0275] Furthermore, for magnetic fields parallel to the PCB direction, by placing the connecting conductors on the first and second layers with only a thin dielectric layer in between, the unwanted loop area of ​​wiring or connections to the terminals is minimized.

[0276] The distance between the first and second layers is less than the distance between the first and third layers or the distance between the first and fourth layers. The dielectric layer between the first and second layers is less than the dielectric layer between the second and third layers. Although conductive traces and terminals are described as being on the first and second layers of the substrate, they may alternatively be on the third and fourth layers of the PCB, with similarly thin dielectric distances between these layers.

[0277] The measuring coil described throughout the instruction manual can be used as follows: Figure 14a and Figure 14b The connection arrangement shown is used to achieve this, but it should be understood that this connection arrangement can be applied to any current sensor including two or more layers of measuring coils, or one measuring coil and one return conductor. Therefore, Figure 14a Only a portion of the connection arrangement shown (such as the first connecting conductor 1408 and the third connecting conductor 1412) may exist in the connection arrangement when two coils are present.

[0278] The second connecting conductor 1410 and the fourth connecting conductor 1414 may be mirror or symmetrical versions of the first connecting conductor 1408 and the third connecting conductor 1412.

[0279] It is possible to equalize the corresponding loop area in common mode but with different shapes for other wiring and compensation schemes. Furthermore, twisted-pair cables can be reused from either the nominal or common-mode ends of the coil, allowing the processing circuitry to be located elsewhere and potentially shared with other coils.

[0280] Although the connection is arranged in Figure 14a and Figure 14b The arrangement is shown as coupled to specific terminals; however, it should be understood that the connection arrangement may be directly or indirectly coupled to any suitable circuit. For example, the first connecting conductor 1408 may be coupled to a first circuit, the second connecting conductor 1410 may be coupled to a second circuit, the third connecting conductor 1412 may be coupled to a third circuit, and the fourth connecting conductor 1414 may be coupled to a fourth circuit. The first and second circuits may be output circuits, or inputs to other processing circuits, or terminals for coupling to other circuits. The third and fourth circuits may be reference circuits, such as reference nodes or terminals, wherein the reference may be ground or any other suitable reference.

[0281] Figure 15a and Figure 15b A turn or loop of the measuring coil or return coil of any current sensor according to the previously described current sensors is shown. The loop shown in these figures is disposed on the first and third layers of the substrate; however, it can alternatively be implemented on any two layers of the substrate.

[0282] The turn or loop includes a circumferentially extending conductor 1502 on a third layer of the substrate. A first end of the circumferentially extending conductor 1502 is coupled to a second end of a measurement conductor 1504 on the third layer of the substrate, one of a third plurality of measurement conductors. A first end of the measurement conductor 1504 is coupled to a via 1506 in a first plurality of vias or a second plurality of vias. A first end of a measurement conductor 1508 on a first layer of the substrate, one of the first plurality of measurement conductors, is coupled to the via 1506. A second end of the measurement conductor 1508 is coupled to a first end of a circumferentially extending conductor 1510 on the first layer of the substrate. A second end of the circumferentially extending conductor 1510 is coupled to a via 1512 in a third plurality of vias or a fourth plurality of vias.

[0283] Figure 16 A plan view or cross-sectional view of the stacked structure or layer sequence of substrate 1600 is shown. The current sensor described in this specification is implemented across four layers of the substrate. Substrate 1600 can be used in a current measuring coil according to any of the aforementioned figures.

[0284] The substrate 1600 includes a first layer 1602, a second layer 1604, a third layer 1606, and a fourth layer 1608 arranged sequentially on the substrate, such that layers 1-4 are arranged in a direction perpendicular to the surface of the substrate 1600. The first layer 1602 and the second layer 1604 are spaced apart by a first distance 1610. The second layer 1604 and the third layer 1608 are spaced apart by a second distance 1612. The third layer 1606 and the fourth layer 1608 are spaced apart by a third distance 1612.

[0285] The first distance 1610 and the third distance 1614 are substantially the same. For example, the first distance 1610 and the third distance 1614 can be 0.1 mm. Alternatively, the first distance 1610 and the third distance 1614 can be 0.2 mm, 0.3 mm, etc. The second distance 1612 is greater than the first distance 1610 and the third distance 1614. For example, the second distance can be 1.7 mm; alternatively, the second distance can be 1.5 mm, 2 mm, or 1 mm to 2 mm.

[0286] These types of coils can be implemented across four layers in PCBs with more layers, for example, using layers 2 through 5 on a 6-layer board, and using layers 1 and 6 for additional shielding or for conductors carrying the current to be measured, where layer 1 is connected to layer 6 through some vias passing through the central region of the inner circumference of the coil. Other stack-up structures are possible.

[0287] The layers across substrate 1600 provide the loop area for the measurement coil described above. The loop area can be maximized by providing each turn or loop across the first and third layers, the second and fourth layers, the first and fourth layers, or the second and third layers respectively. This ensures that almost the entire substrate thickness is used for the radial loops or turns of both the measurement coil and the return coil.

[0288] Furthermore, conductive traces 1408-1414 are implemented across the first layer 1602 and the second layer 1604 such that the small distance between the conductive traces is equal to the first distance 1610. This minimizes the loop area formed by the conductive traces, reduces coupling noise, and ensures that the magnetic fields of the traces are canceled out.

[0289] Various modifications can be made to the above examples to provide additional examples, whether by adding, deleting, or replacing features, all of which are intended to be covered by the attached aspects.

[0290] The term “coupling” as used above includes both direct electrical connection between two components and indirect electrical connection between two components via one or more intermediate components.

[0291] aspect

[0292] Non-limiting aspects of this disclosure are set forth in the following numbered clauses and aspects.

[0293] The following are aspects of the first group of numbers:

[0294] 1. A current sensor formed on a substrate, the current sensor comprising:

[0295] First measuring coil;

[0296] Second measuring coil;

[0297] First return coil; and

[0298] Second return coil.

[0299] 2. The current sensor according to aspect 1, wherein at least one of the following is applicable:

[0300] The first end of the first return coil is coupled to the second end of the first measurement coil;

[0301] The first end of the second return coil is coupled to the second end of the second measuring coil; and

[0302] The second end of the first return coil is coupled to the second end of the second return coil.

[0303] 3. The current sensor according to aspect 2, wherein at least one of the following is applicable:

[0304] The first end of the first measuring coil is coupled to the first output terminal;

[0305] The first end of the second measuring coil is coupled to the second output terminal; and

[0306] The second end of the first return coil and the second end of the second return coil are coupled to the reference terminal.

[0307] 4. The current sensor according to any of the foregoing aspects, wherein the substrate comprises a first layer, a second layer, a third layer, and a fourth layer.

[0308] 5. The current sensor according to any one of aspects 1 to 4, wherein:

[0309] The first measuring coil includes a first plurality of loops;

[0310] The second measuring coil includes a second plurality of loops;

[0311] The first return coil includes a third plurality of loops; and

[0312] The second return coil includes a fourth plurality of loops.

[0313] 6. The current sensor according to aspect 5, wherein:

[0314] The first measuring coil includes a fifth plurality of loops;

[0315] The second measuring coil includes a sixth plurality of loops;

[0316] The first return coil includes a seventh or more loops; and

[0317] The second return coil includes an eighth plurality of loops.

[0318] 7. The current sensor according to aspect 6, wherein:

[0319] The first plurality of loops are disposed on the first layer and the fourth layer of the substrate; and

[0320] The fifth plurality of loops are disposed on the second layer and the third layer of the substrate.

[0321] 8. The current sensor according to aspect 7, wherein:

[0322] The second plurality of loops are disposed on the fourth layer and the second layer of the substrate; and

[0323] The sixth plurality of loops are disposed on the third layer and the first layer of the substrate.

[0324] 9. The current sensor according to aspect 8, wherein:

[0325] The third plurality of loops are disposed on the second and fourth layers of the substrate; and

[0326] The seventh plurality of loops are disposed on the first layer and the third layer of the substrate.

[0327] 10. The current sensor according to aspect 9, wherein:

[0328] The fourth plurality of loops are disposed on the third and second layers of the substrate; and

[0329] The eighth plurality of loops are disposed on the fourth layer and the first layer of the substrate.

[0330] 11. The current sensor according to aspect 10, wherein the loops of the first measuring coil, the second measuring coil, the first return coil, and the second return coil are positioned in adjacent radial planes.

[0331] 12. The current sensor according to aspect 10 or 11, wherein the loop is arranged on the substrate in the circumferential direction in the following order:

[0332] The first plurality of loops;

[0333] The fourth plurality of loops;

[0334] The second multiple loops;

[0335] The third plurality of loops;

[0336] The fifth multiple loop;

[0337] The eighth and subsequent loops;

[0338] The sixth and subsequent loops; and

[0339] The seventh and subsequent loops.

[0340] 13. The current sensor according to any of the foregoing aspects, wherein the loops in the first plurality of loops are adjacent to the loops in the fourth plurality of loops, the loops in the second plurality of loops, and the loops in the third plurality of loops in the circumferential direction of the sensor.

[0341] 14. The current sensor according to any of the foregoing aspects, wherein the repeating pattern formed by corresponding loops of the first plurality of loops, the second plurality of loops, the third plurality of loops, the fourth plurality of loops, the fifth plurality of loops, the sixth plurality of loops, the seventh plurality of loops, and the eighth plurality of loops repeats once every eight loops.

[0342] 15. The current sensor according to aspect 5, wherein:

[0343] The first plurality of loops are disposed on the first layer and the third layer of the substrate.

[0344] 16. The current sensor according to aspect 15, wherein:

[0345] The second plurality of loops are disposed on the second layer and the fourth layer of the substrate.

[0346] 17. The current sensor according to aspect 16, wherein:

[0347] The third plurality of loops are disposed on the second and fourth layers of the substrate.

[0348] 18. The current sensor according to aspect 17, wherein:

[0349] The fourth plurality of loops are disposed on the third layer and the first layer of the substrate.

[0350] 19. The current sensor according to aspect 18, wherein the first plurality of loops, the second plurality of loops, the third plurality of loops and the fourth plurality of loops are positioned in adjacent radial planes.

[0351] 20. The current sensor according to aspect 19, wherein the loop is arranged on the substrate in the circumferential direction in the following order:

[0352] The first plurality of loops;

[0353] The fourth plurality of loops;

[0354] The second plurality of loops; and

[0355] The third multiple loops.

[0356] 21. The current sensor according to any one of aspects 18 to 20, wherein a loop in the first plurality of loops is adjacent to a loop in the fourth plurality of loops, a loop in the second plurality of loops, and a loop in the third plurality of loops in the circumferential direction of the sensor.

[0357] 22. The current sensor according to any one of aspects 18 to 21, wherein the repeating pattern formed by the loops of the first plurality of loops, the second plurality of loops, the third plurality of loops, and the fourth plurality of loops repeats once every four loops.

[0358] 23. The current sensor according to any of the foregoing aspects, wherein each loop of the first measuring coil and the second measuring coil includes a conductive trace that provides radial advancement from the center of the measuring coil and circumferential advancement around the circumference of the measuring coil.

[0359] 24. The current sensor according to any of the foregoing aspects, wherein each loop of the first return coil and the second return coil includes a conductive trace that provides radial advancement from the center of the return coil and circumferential advancement around the circumference of the return coil.

[0360] 25. The current sensor according to any of the preceding aspects, wherein the current sensor comprises:

[0361] The first plurality of measuring conductors arranged on the first layer;

[0362] A second plurality of measuring conductors arranged on the second layer;

[0363] The third plurality of measuring conductors are arranged on the third layer; and

[0364] The fourth plurality of measuring conductors are arranged on the fourth layer.

[0365] The measuring conductor is provided with radial advance from the center of the coil.

[0366] 26. The current sensor according to aspect 25, wherein the current sensor comprises:

[0367] A plurality of through holes are arranged around the inner circumference of the first measuring coil and the second measuring coil;

[0368] A second plurality of through holes are arranged around the inner circumference of the first return coil and the second return coil;

[0369] A third plurality of through holes arranged around the outer circumference of the first measuring coil and the second measuring coil; and

[0370] A fourth plurality of through holes are arranged around the outer circumference of the first return coil and the second return coil.

[0371] 27. The current sensor according to aspect 26, wherein the first plurality of vias and the second plurality of vias are arranged around a concentric circle.

[0372] 28. The current sensor according to aspect 26, wherein the first plurality of vias and the second plurality of vias are interleaved.

[0373] 29. The current sensor according to any one of aspects 26 to 28, wherein the third plurality of vias and the fourth plurality of vias are arranged around the same circumference.

[0374] 30. The current sensor according to any one of aspects 26 to 28, wherein the third plurality of vias and the fourth plurality of vias are interleaved.

[0375] 31. The current sensor according to any one of aspects 25 to 30, wherein the current sensor further comprises:

[0376] A plurality of circumferentially extending conductors are coupled to the measuring conductor and are arranged to provide propulsion in a circumferential direction around the substrate.

[0377] 32. The current sensor according to aspect 31, wherein the corresponding loop of the measuring coil comprises:

[0378] The first week extends the conductor;

[0379] A first measuring conductor is located on the same layer of the substrate as the first circumferentially extending conductor.

[0380] The first through hole in the plurality of through holes,

[0381] The first end of the first measuring conductor is coupled to the first through hole, and the second end of the first measuring conductor is coupled to the first end of the first circumferential extension conductor;

[0382] A second measuring conductor, the first end of which is coupled to the first via;

[0383] A second circumferentially extending conductor is formed on the same layer of the substrate as the second measuring conductor; and

[0384] The first of the third plurality of through holes

[0385] The second end of the second measuring conductor is coupled to the first end of the second circumferential extension conductor, and the second end of the second circumferential extension conductor is coupled to the first via in the third plurality of vias.

[0386] 33. The current sensor according to aspect 31 or 32, wherein the corresponding loop of the return coil comprises:

[0387] The third week extends the conductor;

[0388] The third measuring conductor is located on the same layer as the third circumferential extending conductor on the substrate;

[0389] The first through hole in the second plurality of through holes,

[0390] The first end of the third measuring conductor is coupled to the first through hole in the second plurality of through holes, and the second end of the third measuring conductor is coupled to the first end of the third circumferential extending conductor;

[0391] A fourth measuring conductor, the first end of which is coupled to the first through hole in the second plurality of through holes;

[0392] A fourth circumferentially extending conductor, and a second circumferentially extending conductor formed on the same layer of the substrate as the fourth measuring conductor; and

[0393] The first of the fourth plurality of through holes

[0394] The second end of the fourth measuring conductor is coupled to the first end of the fourth circumferential extending conductor, and the second end of the fourth circumferential extending conductor is coupled to the first via in the fourth plurality of vias.

[0395] 34. The current sensor according to any one of aspects 25 to 32, wherein the advancing region of said coil conforms to one of the following:

[0396] Adjacent to the first plurality of vias and the second plurality of vias;

[0397] Adjacent to the third plurality of vias and the fourth plurality of vias; or

[0398] It is located between the first plurality of through holes and the third plurality of through holes.

[0399] 35. The current sensor according to any one of aspects 4 to 34, wherein:

[0400] The first end of the first measuring coil is coupled to the first output via.

[0401] The first end of the second measuring coil is coupled to the second output via.

[0402] The second end of the first return coil is coupled to the first common-mode via; and

[0403] The second end of the second return coil is coupled to the second common-mode via.

[0404] 36. The current sensor according to any one of aspects 24 to 35, wherein the first output via, the second output via, the first common-mode via, and the second common-mode via are arranged around an outer circumference, wherein the radius of the outer circumference is greater than the radius of the third plurality of vias or the fourth plurality of vias.

[0405] 37. The current sensor according to any one of aspects 24 to 35, wherein the loop of each of the first measuring coil, the second measuring coil, the first return coil, and the second return coil on the side of the substrate opposite to the first output via, the second output via, the first common-mode via, and the second common-mode via is shorter than the average loop length of the first measuring coil, the second measuring coil, the first return coil, and the second return coil.

[0406] 38. The current sensor according to aspect 36 or 37, wherein:

[0407] The first output via is coupled to the first output terminal using a first conductive trace;

[0408] The second output via is coupled to the second output terminal using a second conductive trace;

[0409] The first common-mode via is coupled to the reference terminal using a third conductive trace;

[0410] The second common-mode via is coupled to the reference terminal using a fourth conductive trace, and

[0411] The first conductive trace and the third conductive trace are located in a first plane, and the second conductive trace and the fourth conductive trace are located in a second plane.

[0412] The following provides another set of numbered aspects:

[0413] 1. A current sensor, the current sensor comprising:

[0414] A substrate with four layers;

[0415] The path for the conductor through the substrate;

[0416] A first measuring coil is disposed on two of the four layers of the substrate and is arranged to extend at least partially around the path;

[0417] A second measuring coil is disposed on two of the four layers of the substrate and is arranged to extend at least partially around the path;

[0418] A third measuring coil, coupled to the first measuring coil, extends at least partially around the path in a direction opposite to that of the first measuring coil, wherein the third measuring coil is disposed on two of the four layers of the substrate, different from the first measuring coil; and

[0419] A fourth measuring coil, coupled to the second measuring coil, extends at least partially around the path in a direction opposite to the second measuring coil, wherein the fourth measuring coil is disposed on two other layers of the four layers of the substrate that are different from the second measuring coil.

[0420] 2. The current sensor according to aspect 1, wherein:

[0421] The first measuring coil is disposed on two different layers of the substrate than the second measuring coil.

[0422] 3. The current sensor according to aspect 1, wherein:

[0423] The first measuring coil and the second measuring coil are disposed on the same two layers of the substrate.

[0424] 4. The current sensor according to aspect 1, wherein:

[0425] The four layers of the substrate include a first layer, a second layer, a third layer, and a fourth layer arranged in sequence.

[0426] 5. The current sensor according to aspect 4, wherein:

[0427] The first measuring coil is disposed on the first layer and the third layer of the substrate;

[0428] The second measuring coil is disposed on the second layer and the fourth layer of the substrate;

[0429] The third measuring coil is disposed on the second and fourth layers of the substrate; and

[0430] The fourth measuring coil is disposed on the first layer and the third layer of the substrate.

[0431] 6. The current sensor according to aspect 4, wherein:

[0432] The first measuring coil is disposed on the first layer and the third layer of the substrate;

[0433] The second measuring coil is disposed on the first layer and the third layer of the substrate.

[0434] The third measuring coil is disposed on the second and fourth layers of the substrate; and

[0435] The fourth measuring coil is disposed on the second layer and the fourth layer of the substrate.

[0436] 7. The current sensor according to aspect 4, wherein:

[0437] The first measuring coil is disposed on the first layer and the fourth layer of the substrate;

[0438] The second measuring coil is disposed on the second layer and the third layer of the substrate.

[0439] The third measuring coil is disposed on the second and third layers of the substrate; and

[0440] The fourth measuring coil is disposed on the first layer and the fourth layer of the substrate.

[0441] 8. The current sensor according to aspect 4, wherein:

[0442] The first measuring coil is disposed on the first layer and the fourth layer of the substrate;

[0443] The second measuring coil is disposed on the first layer and the fourth layer of the substrate;

[0444] The third measuring coil is disposed on the second and third layers of the substrate; and

[0445] The fourth measuring coil is disposed on the second and third layers of the substrate.

[0446] 9. The current sensor according to any of the foregoing aspects, wherein:

[0447] The first measuring coil includes a first plurality of loops;

[0448] The second measuring coil includes a second plurality of loops;

[0449] The third measuring coil includes a third plurality of loops; and

[0450] The fourth measuring coil includes a fourth plurality of loops.

[0451] 10. The current sensor according to aspect 9, wherein corresponding loops of the first plurality of loops, the second plurality of loops, the third plurality of loops, and the fourth plurality of loops are positioned in adjacent radial planes.

[0452] 11. The current sensor according to aspect 10, wherein the radial plane is arranged around the path.

[0453] 12. The current sensor according to any one of aspects 9 to 11, wherein the first measuring coil, the second measuring coil, the third measuring coil and the fourth measuring coil are arranged in a repeating staggered pattern.

[0454] 13. The current sensor according to aspect 12, wherein the repeating interlaced pattern is repeated once every four loops.

[0455] 14. The current sensor according to any one of aspects 9 to 11, wherein the first measuring coil, the second measuring coil, the third measuring coil and the fourth measuring coil are disposed on the substrate such that they form a repeating pattern in the circumferential direction around the path.

[0456] 15. The current sensor according to any one of aspects 9 to 14, wherein the repeating pattern comprises a plurality of pattern units arranged in a repeating manner, wherein each pattern unit of the repeating pattern comprises a loop in the first plurality of loops, a loop in the second plurality of loops, a loop in the third plurality of loops, and a loop in the fourth plurality of loops.

[0457] 16. The current sensor according to any one of aspects 9 to 15, wherein each loop of the measuring coil includes a conductive trace providing radial advancement between the inner and outer circumferences of the measuring coil, and a conductive trace providing circumferential advancement around the path.

[0458] 17. The current sensor according to any one of aspects 9 to 16, wherein the current sensor comprises:

[0459] A plurality of measuring conductors disposed on the first layer;

[0460] A second plurality of measuring conductors are disposed on the second layer;

[0461] A third plurality of measuring conductors are disposed on the third layer; and

[0462] The fourth plurality of measuring conductors are disposed on the fourth layer.

[0463] The measuring conductor provides advance in the radial direction between the inner and outer circumferences of the measuring coil.

[0464] 18. The current sensor according to any one of aspects 9 to 17, wherein the current sensor comprises:

[0465] A plurality of through holes are disposed on the substrate and arranged around the inner circumference of the first measuring coil and the second measuring coil;

[0466] A second plurality of through holes are disposed on the substrate and arranged around the inner circumference of the third measuring coil and the fourth measuring coil;

[0467] A third plurality of through holes are disposed on the substrate and arranged around the outer circumference of the first measuring coil and the second measuring coil; and

[0468] A fourth plurality of through holes are disposed on the substrate and arranged around the outer circumference of the third and fourth measuring coils.

[0469] 19. The current sensor according to aspect 18,

[0470] The loop of the first measuring coil is formed by a measuring conductor on one of the four layers of the substrate and a measuring conductor on another of the four layers of the substrate. The measuring conductors are coupled to each other through corresponding vias in the first plurality of vias, and the loop of the first measuring coil is coupled to another loop of the first measuring coil through corresponding vias in the third plurality of vias.

[0471] 20. The current sensor according to aspect 18 or aspect 19,

[0472] The loop of the second measuring coil is formed by a measuring conductor on one of the four layers of the substrate and a measuring conductor on another of the four layers of the substrate. The measuring conductors are coupled to each other through corresponding vias in the first plurality of vias, and the loop of the second measuring coil is coupled to another loop of the second measuring coil through corresponding vias in the third plurality of vias.

[0473] 21. The current sensor according to any one of aspects 18 to 20,

[0474] The loop of the third measuring coil is formed by a measuring conductor on one of the four layers of the substrate and a measuring conductor on another of the four layers of the substrate. The measuring conductors are coupled to each other through corresponding vias in the second plurality of vias, and the loop of the third measuring coil is coupled to another loop of the third measuring coil through corresponding vias in the fourth plurality of vias.

[0475] 22. The current sensor according to any one of aspects 18 to 21,

[0476] The loop of the fourth measuring coil is formed by a measuring conductor on one of the four layers of the substrate and a measuring conductor on another of the four layers of the substrate. The measuring conductors are coupled to each other through corresponding vias in the second plurality of vias, and the loop of the fourth measuring coil is coupled to another loop of the fourth measuring coil through corresponding vias in the fourth plurality of vias.

[0477] 23. The current sensor according to any one of aspects 18 to 22, wherein the first plurality of vias and the second plurality of vias are arranged around the same circumference.

[0478] 24. The current sensor according to any one of aspects 18 to 22, wherein the first plurality of vias and the second plurality of vias are arranged around an alternating circumference.

[0479] 25. The current sensor according to any of the foregoing aspects, wherein:

[0480] The first measuring coil includes a first end and a second end;

[0481] The second measuring coil includes a first end and a second end;

[0482] The third measuring coil includes a first end and a second end; and

[0483] The fourth measuring coil includes a first end and a second end;

[0484] The second end of the first measuring coil is coupled to the first end of the third measuring coil;

[0485] The second end of the second measuring coil is coupled to the first end of the fourth measuring coil.

[0486] 26. The current sensor according to aspect 25, wherein the second end of the third measuring coil is coupled to the second end of the fourth measuring coil.

[0487] 27. The current sensor according to aspect 25 or 26, wherein at least one of the following is applicable:

[0488] The first end of the first measuring coil is coupled to the first output terminal;

[0489] The first end of the second measuring coil is coupled to the second output terminal; and

[0490] The second end of the third measuring coil and the second end of the fourth measuring coil are coupled to a reference terminal.

[0491] 28. The current sensor according to any of the foregoing aspects, wherein the path for the conductor passes through the measuring coil.

[0492] 29. The current sensor according to aspect 28, wherein the conductor is used to carry current, and wherein the current sensor is used to measure the current carried by the conductor.

[0493] 30. A current sensor, the current sensor comprising:

[0494] A substrate with four layers;

[0495] The path for the conductor through the substrate;

[0496] A first measuring coil is disposed on two of the four layers of the substrate and is arranged to extend at least partially around the path;

[0497] A second measuring coil is disposed on two of the four layers of the substrate and is arranged to extend at least partially around the path;

[0498] A third measuring coil, coupled to the first measuring coil, is disposed on two of the four layers of the substrate and arranged to extend at least partially around the path; and

[0499] A fourth measuring coil, coupled to the second measuring coil, is disposed on two of the four layers of the substrate and arranged to extend at least partially around the path.

[0500] 31. A current sensor, the current sensor comprising:

[0501] A substrate with four layers;

[0502] The path for the conductor through the substrate;

[0503] A first measuring coil is disposed on two of the four layers of the substrate;

[0504] The second measuring coil is disposed on two of the four layers of the substrate;

[0505] A third measuring coil, coupled to the first measuring coil, is disposed on two of the four layers of the substrate; and

[0506] A fourth measuring coil, coupled to the second measuring coil, is disposed on two of the four layers of the substrate.

[0507] The first measuring coil, the second measuring coil, the third measuring coil, and the fourth measuring coil are disposed on the substrate such that they form a repeating pattern in the circumferential direction around the path.

[0508] The following provides another set of numbered aspects:

[0509] 1. A current sensor, the current sensor comprising:

[0510] A four-layer substrate includes a plurality of measuring conductors, a plurality of inner circumferential vias, and a plurality of outer circumferential vias disposed on the four layers of the substrate. The plurality of measuring conductors, the plurality of inner circumferential vias, and the plurality of outer circumferential vias are arranged to form:

[0511] A first measuring coil, the first measuring coil comprising measuring conductors on each of the four layers;

[0512] A second measuring coil, the second measuring coil comprising measuring conductors on each of the four layers;

[0513] A third measuring coil, the third measuring coil comprising measuring conductors on each of the four layers;

[0514] A fourth measuring coil, the fourth measuring coil comprising measuring conductors on each of the four layers;

[0515] Each loop of each measuring coil includes a corresponding inner circumferential through-hole among the plurality of inner circumferential through-holes, and

[0516] Each of the plurality of inner circumferential through holes is located in a unique angular position relative to the other through holes in the plurality of inner circumferential through holes.

[0517] 2. The current sensor according to aspect 1, wherein each loop of each measuring coil includes a corresponding one of the plurality of outer circumferential through holes, wherein each of the plurality of outer circumferential through holes is located in a unique angular position relative to the other through holes in the plurality of outer circumferential through holes.

[0518] 3. The current sensor according to any of the foregoing aspects, wherein:

[0519] The first measuring coil includes a first plurality of loops and a fifth plurality of loops;

[0520] The second measuring coil includes a second plurality of loops and a sixth plurality of loops;

[0521] The third measuring coil includes a third plurality of loops and a seventh plurality of loops; and

[0522] The second return coil includes a fourth plurality of loops and an eighth plurality of loops.

[0523] 4. The current sensor according to aspect 3, wherein:

[0524] The first plurality of loops are disposed on two of the four layers of the substrate, and the fifth plurality of loops are disposed on the other two layers of the four layers of the substrate that are different from the first plurality of loops.

[0525] The second plurality of loops are disposed on two of the four layers of the substrate, and the sixth plurality of loops are disposed on two other layers of the four layers of the substrate that are different from the second plurality of loops.

[0526] The third plurality of loops are disposed on two of the four layers of the substrate, and the seventh plurality of loops are disposed on two other layers of the four layers of the substrate that are different from the third plurality of loops.

[0527] The fourth plurality of loops are disposed on two of the four layers of the substrate, and the eighth plurality of loops are disposed on two other layers of the four layers of the substrate that are different from the fourth plurality of loops.

[0528] 5. The current sensor according to aspect 3 or aspect 4, wherein:

[0529] The first plurality of loops are disposed on the first layer and the fourth layer of the substrate; and

[0530] The fifth plurality of loops are disposed on the second layer and the third layer of the substrate.

[0531] 6. The current sensor according to any one of aspects 3 to 5, wherein:

[0532] The second plurality of loops are disposed on the fourth layer and the second layer of the substrate; and

[0533] The sixth plurality of loops are disposed on the third layer and the first layer of the substrate.

[0534] 7. The current sensor according to any one of aspects 3 to 6, wherein:

[0535] The third plurality of loops are disposed on the second and fourth layers of the substrate; and

[0536] The seventh plurality of loops are disposed on the first layer and the third layer of the substrate.

[0537] 8. The current sensor according to any one of aspects 3 to 7, wherein:

[0538] The fourth plurality of loops are disposed on the third and second layers of the substrate; and

[0539] The eighth plurality of loops are disposed on the fourth layer and the first layer of the substrate.

[0540] 9. The current sensor according to aspect 3, wherein corresponding loops of the first plurality of loops, the second plurality of loops, the third plurality of loops, the fourth plurality of loops, the fifth plurality of loops, the sixth plurality of loops, the seventh plurality of loops, and the eighth plurality of loops are positioned in adjacent radial planes.

[0541] 10. The current sensor according to aspect 9, wherein the radial plane advances in the radial direction between the plurality of inner circumferential through holes and the plurality of outer circumferential through holes.

[0542] 11. The current sensor according to aspect 9 or aspect 10, wherein the radial plane is arranged around the path.

[0543] 12. The current sensor according to any one of aspects 9 to 11, wherein the first measuring coil, the second measuring coil, the third measuring coil, and the fourth measuring coil are arranged in a repeating staggered pattern.

[0544] 13. The current sensor according to aspect 12, wherein the repeating interlaced pattern is repeated once every eight loops.

[0545] 14. The current sensor according to aspect 13, wherein the eight-loop repeating portion of the repeating interlaced pattern comprises one loop in each of a plurality of loops.

[0546] 15. The current sensor according to any one of aspects 9 to 11, wherein the first measuring coil, the second measuring coil, the third measuring coil and the fourth measuring coil are disposed on the substrate such that they form a repeating pattern in the circumferential direction around the path.

[0547] 16. The current sensor according to any one of aspects 9 to 15, wherein the repeating pattern comprises a plurality of pattern units arranged in a repeating manner, wherein each pattern unit of the repeating pattern comprises a loop in the first plurality of loops, a loop in the second plurality of loops, a loop in the third plurality of loops, a loop in the fourth plurality of loops, a loop in the fifth plurality of loops, a loop in the sixth plurality of loops, a loop in the seventh plurality of loops, and a loop in the eighth plurality of loops.

[0548] 17. The current sensor according to any one of aspects 3 to 16, wherein the loop of the measuring coil is arranged on the substrate in a repeating pattern in the following order:

[0549] The loop in the first plurality of loops;

[0550] The fourth plurality of loops;

[0551] The loop in the second plurality of loops;

[0552] The loop in the third plurality of loops;

[0553] The loop in the fifth plurality of loops;

[0554] The loop in the eighth plurality of loops;

[0555] The loops in the sixth plurality of loops; and

[0556] The seventh loop is one of the loops.

[0557] 18. The current sensor according to any one of aspects 3 to 16, wherein the loop of the measuring coil is arranged on the substrate in a repeating pattern in the following order:

[0558] Multiple loops in the first plurality of loops;

[0559] The fourth plurality of loops;

[0560] Multiple loops in the second plurality of loops;

[0561] The third plurality of loops;

[0562] The fifth plurality of loops;

[0563] The eighth plurality of loops;

[0564] The sixth plurality of loops; and

[0565] The seventh plurality of loops.

[0566] 19. The current sensor according to any of the preceding aspects, wherein the current sensor comprises:

[0567] A plurality of measuring conductors disposed on the first layer;

[0568] A second plurality of measuring conductors are disposed on the second layer;

[0569] A third plurality of measuring conductors are disposed on the third layer; and

[0570] The fourth plurality of measuring conductors are disposed on the fourth layer.

[0571] The measuring conductor provides advance in the radial direction between the inner and outer circumferences of the measuring coil.

[0572] 20. The current sensor according to aspect 13:

[0573] The plurality of inner circumferential through holes include a first plurality of through holes arranged around the inner circumference of the first measuring coil and the second measuring coil;

[0574] The plurality of inner circumferential through holes includes a second plurality of through holes arranged around the inner circumference of the third measuring coil and the fourth measuring coil;

[0575] The plurality of outer circumferential through holes includes a third plurality of through holes arranged around the outer circumference of the first measuring coil and the second measuring coil; and

[0576] The plurality of outer circumferential through holes includes a fourth plurality of through holes arranged around the outer circumference of the third measuring coil and the fourth measuring coil.

[0577] 21. The current sensor according to aspect 20,

[0578] The loop of the first measuring coil is formed by a measuring conductor on one of the four layers of the substrate and a measuring conductor on another of the four layers of the substrate. The measuring conductors are coupled to each other through corresponding vias in the first plurality of vias, and the loop of the first measuring coil is coupled to another loop of the first measuring coil through corresponding vias in the third plurality of vias.

[0579] 22. The current sensor according to aspect 20 or aspect 21,

[0580] The loop of the second measuring coil is formed by a measuring conductor on one of the four layers of the substrate and a measuring conductor on another of the four layers of the substrate. The measuring conductors are coupled to each other through corresponding vias in the first plurality of vias, and the loop of the second measuring coil is coupled to another loop of the second measuring coil through corresponding vias in the third plurality of vias.

[0581] 23. The current sensor according to any one of aspects 20 to 22,

[0582] The loop of the third measuring coil is formed by a measuring conductor on one of the four layers of the substrate and a measuring conductor on another of the four layers of the substrate. The measuring conductors are coupled to each other through corresponding vias in the second plurality of vias, and the loop of the third measuring coil is coupled to another loop of the third measuring coil through corresponding vias in the fourth plurality of vias.

[0583] 24. The current sensor according to any one of aspects 20 to 23,

[0584] The loop of the fourth measuring coil is formed by a measuring conductor on one of the four layers of the substrate and a measuring conductor on another of the four layers of the substrate. The measuring conductors are coupled to each other through corresponding vias in the second plurality of vias, and the loop of the fourth measuring coil is coupled to another loop of the fourth measuring coil through corresponding vias in the fourth plurality of vias.

[0585] 25. The current sensor according to any one of aspects 20 to 24, wherein the first plurality of vias and the second plurality of vias are arranged around the same circumference.

[0586] 26. The current sensor according to any one of aspects 20 to 24, wherein the first plurality of vias and the second plurality of vias are arranged around an alternating circumference.

[0587] 27. The current sensor according to any of the foregoing aspects, wherein:

[0588] The first measuring coil includes a first end and a second end;

[0589] The second measuring coil includes a first end and a second end;

[0590] The third measuring coil includes a first end and a second end;

[0591] The fourth measuring coil includes a first end and a second end;

[0592] The second end of the first measuring coil is coupled to the first end of the third measuring coil;

[0593] The second end of the second measuring coil is coupled to the first end of the fourth measuring coil.

[0594] 28. The current sensor according to aspect 27, wherein the second end of the third measuring coil is coupled to the second end of the fourth measuring coil.

[0595] 29. The current sensor according to aspect 27 or 28, wherein at least one of the following is applicable:

[0596] The first end of the first measuring coil is coupled to the first output terminal;

[0597] The first end of the second measuring coil is coupled to the second output terminal; and

[0598] The second end of the third measuring coil and the second end of the fourth measuring coil are coupled to a reference terminal.

[0599] 30. The current sensor according to any of the preceding aspects, wherein the current sensor further includes a path for a conductor passing through the substrate, the path passing through the measuring coil.

[0600] 31. The current sensor according to aspect 30, wherein the path for the conductor passes through the measuring coil.

[0601] 32. The current sensor according to aspect 31, wherein the conductor is used to carry current, and wherein the current sensor is used to measure the current carried by the conductor.

[0602] 33. The current sensor according to any of the foregoing aspects, wherein the first measuring coil, the second measuring coil, the third measuring coil and the fourth measuring coil are arranged to advance at least partially around the path.

[0603] 34. A current sensor, the current sensor comprising:

[0604] A substrate with four layers;

[0605] A first measuring coil is disposed on the four layers of the substrate;

[0606] A second measuring coil is disposed on the four layers of the substrate;

[0607] A third measuring coil is disposed on the fourth layer of the substrate;

[0608] The fourth measuring coil is disposed on the fourth layer of the substrate.

[0609] The majority of the corresponding loop of each measuring coil is located in a unique angular position relative to the majority of the loops of the first measuring coil, the second measuring coil, the third measuring coil, and the fourth measuring coil.

[0610] 35. A current sensor, the current sensor comprising:

[0611] A substrate with four layers;

[0612] A first measuring coil is disposed on the four layers of the substrate;

[0613] A second measuring coil is disposed on the four layers of the substrate;

[0614] A third measuring coil is disposed on the fourth layer of the substrate;

[0615] The fourth measuring coil is disposed on the fourth layer of the substrate.

[0616] The first measuring coil, the second measuring coil, the third measuring coil, and the fourth measuring coil are disposed on the substrate such that they form a repeating pattern in the circumferential direction around the path.

[0617] The following provides another set of numbered aspects:

[0618] 1. A current sensor, the current sensor comprising:

[0619] substrate;

[0620] Path for conductors;

[0621] A first measuring coil is disposed on the substrate and arranged to extend at least partially around the path;

[0622] A second measuring coil is disposed on the substrate and arranged to extend at least partially around the path;

[0623] The first measuring coil includes a first plurality of loops and the second measuring coil includes a second plurality of loops. The first plurality of loops and the second plurality of loops are formed using a plurality of measuring conductors disposed on two or more layers of the substrate. The measuring conductors are coupled using a first plurality of outer circumferential through holes and a first plurality of inner circumferential through holes positioned at a first radial distance from the center of the measuring coil.

[0624] The first measuring coil is coupled to the second measuring coil at a steering through-hole, the steering through-hole being located at a second radial distance from the center of the measuring coil, the second radial distance being different from the first radial distance.

[0625] 2. The current sensor according to aspect 1, wherein the first measuring coil is coupled to a first through-hole and the second measuring coil is coupled to a second through-hole, wherein the first through-hole and the second through-hole are disposed at a third radial distance from the center of the measuring coil.

[0626] 3. The current sensor according to aspect 2, wherein the first through-hole is located in a first angular position, the second through-hole is located in a second angular position, and the directional through-hole is located in a third angular position.

[0627] 4. The current sensor according to aspect 3, wherein the third angular position is located at an angle between the angle of the first angular position and the angle of the second angular position.

[0628] 5. The current sensor according to aspect 3, wherein the third angular position is located at an angle between the angle of the first angular position and the angle of the second angular position.

[0629] 6. The current sensor according to aspect 1, wherein the first measuring coil is coupled to a first node and the second measuring coil is coupled to a second node, wherein the first node and the second node are disposed at a third radial distance from the center of the measuring coil.

[0630] 7. The current sensor according to any one of aspects 2 to 6, wherein the difference between the first radial distance and the second radial distance is substantially the same as the distance between the first radial distance and the third radial distance.

[0631] 8. The current sensor according to any one of aspects 2 to 7, wherein the second radial distance is less than the first radial distance, and wherein the first radial distance is less than the third radial distance.

[0632] 9. The current sensor according to any one of aspects 2 to 7, wherein the third radial distance is less than the first radial distance, and wherein the first radial distance is less than the second radial distance.

[0633] 10. The current sensor according to any of the preceding aspects, wherein the first measuring coil includes a first end and a second end, and the second measuring coil includes a first end and a second end.

[0634] 11. The current sensor according to aspect 10, wherein:

[0635] The first end of the first measuring coil is coupled to the first through hole;

[0636] The second end of the first measuring coil is coupled to the first end of the second measuring coil at the steering through-hole; and

[0637] The second end of the second measuring coil is coupled to the second through hole.

[0638] 12. The current sensor according to any of the foregoing aspects, wherein the first via is coupled to a first terminal and the second via is coupled to a second terminal.

[0639] 13. The current sensor according to aspect 1, wherein the fourth and fifth vias are located approximately 180° from the steering via around the substrate, wherein the fourth and fifth vias are disposed at a fourth radial distance from the center of the measuring coil.

[0640] 14. The current sensor according to aspect 13, wherein the difference between the first radial distance and the second radial distance is substantially the same as the distance between the first radial distance and the fourth radial distance.

[0641] 15. The current sensor according to any one of aspects 13 or 14, wherein the second radial distance is less than the first radial distance, and wherein the first radial distance is less than the fourth radial distance.

[0642] 16. The current sensor according to any one of aspects 13 to 15, wherein the loop of the first measuring coil and the loop of the second measuring coil are respectively coupled to the fourth through hole and the fifth through hole.

[0643] 17. The current sensor according to any one of aspects 13 to 15, wherein the fourth through hole and the fifth through hole are used to form a first shortened loop of the first measuring coil and a second shortened loop of the second measuring coil.

[0644] 18. The current sensor according to aspect 17, wherein the first shortening loop and the second shortening loop are respectively formed using corresponding measuring conductors of the plurality of measuring conductors disposed on two or more layers of the substrate, the measuring conductors being coupled using the fourth via and the fifth via, as well as the first plurality of inner circumferential vias.

[0645] 19. A current sensor, the current sensor comprising:

[0646] substrate;

[0647] Path for conductors;

[0648] A first measuring coil, disposed on the substrate and arranged to extend at least partially around the path; and

[0649] A second measuring coil is disposed on the substrate and arranged to extend at least partially around the path;

[0650] The first measuring coil includes a first plurality of loops and the second measuring coil includes a second plurality of loops. The first plurality of loops and the second plurality of loops are formed using a plurality of measuring conductors disposed on two or more layers of the substrate. The measuring conductors are coupled using a first plurality of outer circumferential vias and a first plurality of inner circumferential vias.

[0651] The first measuring coil is coupled to the second measuring coil at the steering through hole;

[0652] The area of ​​the first ring is surrounded by most of the first ring and the second ring.

[0653] The loops in the first plurality of loops coupled to the steering through hole and the loops in the second plurality of loops coupled to the steering through hole enclose the area of ​​the second loop.

[0654] 20. The current sensor according to aspect 19, wherein the first loop of the first plurality of loops and the first loop of the second plurality of loops surround the area of ​​the third loop.

[0655] 21. The current sensor according to aspect 20, wherein the average value of the second loop area and the third loop area is equal to the first loop area.

[0656] 22. A current sensor, the current sensor comprising:

[0657] substrate;

[0658] Path for conductors;

[0659] A first measuring coil, disposed on the substrate, is arranged to extend at least partially around the path, and includes a first end, a second end, and a first plurality of loops; and

[0660] A second measuring coil is disposed on the substrate and arranged to extend at least partially around the path. The second measuring coil includes a first end, a second end, and a second plurality of loops.

[0661] The first end of the first measuring coil is coupled to a first terminal, the second end of the first measuring coil is coupled to the first end of the second measuring coil, and the second end of the second measuring coil is coupled to a second terminal.

[0662] The majority of the loops of the first measuring coil and the second measuring coil surround the area of ​​the first loop.

[0663] The loops in the first plurality of loops located at the second end of the first measuring coil and the loops in the second plurality of loops located at the first end of the second measuring coil respectively enclose the area of ​​the second loop.

[0664] The loops in the first plurality of loops located at the first end of the first measuring coil and the loops in the second plurality of loops located at the second end of the second measuring coil respectively enclose the area of ​​the third loop.

[0665] The average of the area of ​​the second loop and the area of ​​the third loop is equal to the area of ​​the first loop.

[0666] The following is a set of numbered aspects:

[0667] 1. A current sensor, the current sensor comprising:

[0668] A substrate, the substrate comprising a first layer and a second layer;

[0669] A first measuring coil is disposed on the substrate, and the first measuring coil includes a first end;

[0670] A second measuring coil, disposed on the substrate, includes a first end; and

[0671] Connection arrangement, the connection arrangement including:

[0672] A first connecting conductor is disposed on the first layer of the substrate, wherein the first end of the first measuring coil is used for coupling to a first circuit via the first connecting conductor; and

[0673] A second connecting conductor is disposed on the second layer of the substrate, wherein the first end of the second measuring coil is used for coupling to a second circuit via the second connecting conductor.

[0674] The first connecting conductor on the first layer and the second connecting conductor on the second layer are substantially aligned in a plane perpendicular to the surface of the substrate.

[0675] 2. The current sensor according to aspect 1, wherein the first connecting conductor and the second connecting conductor extend at least partially along the same path.

[0676] 3. The current sensor according to aspect 1 or 2, wherein the first connecting conductor and the second connecting conductor have at least partially the same shape.

[0677] 4. The current sensor according to any of the foregoing aspects, wherein the first connecting conductor and the second connecting conductor have the same shape.

[0678] 5. The current sensor according to any of the foregoing aspects, wherein the first connecting conductor and the second connecting conductor are coupled such that, in use, current flows in opposite directions in the connecting conductor.

[0679] 6. The current sensor according to any of the foregoing aspects, wherein the first circuit includes a measurement circuit.

[0680] 7. The current sensor according to any of the foregoing aspects, wherein the second circuit includes a reference circuit.

[0681] 8. The current sensor according to any of the foregoing aspects, wherein the substrate further comprises a third layer and a fourth layer, and the first layer, the second layer, the third layer and the fourth layer are disposed sequentially through the substrate.

[0682] 9. The current sensor according to aspect 8, wherein the distance between the first layer and the second layer is less than the distance between the first layer and the third layer or the distance between the first layer and the fourth layer.

[0683] 10. The current sensor according to aspect 8 or aspect 9, wherein the dielectric layer between the first layer and the second layer is smaller than the dielectric layer between the second layer and the third layer.

[0684] 11. The current sensor according to any one of aspects 8 to 10, wherein the first measuring coil is disposed across two or more of the four layers of the substrate, and the second measuring coil is disposed across two or more of the four layers of the substrate.

[0685] 12. The current sensor according to any of the foregoing aspects, further comprising:

[0686] A third measuring coil is disposed on the substrate, and the third measuring coil includes a first end;

[0687] A fourth measuring coil is disposed on the substrate, and the fourth measuring coil includes a first end.

[0688] 13. The current sensor according to aspect 12, wherein the connection arrangement further comprises:

[0689] A third connecting conductor is disposed on the first layer of the substrate, wherein the first end of the third measuring coil is used for coupling to a third circuit via the third connecting conductor; and

[0690] A fourth connecting conductor is disposed on the second layer of the substrate, wherein the first end of the fourth measuring coil is used for coupling to a fourth circuit via the fourth connecting conductor.

[0691] The third connecting conductor and the fourth connecting conductor on the first layer are substantially aligned in a plane perpendicular to the surface of the substrate.

[0692] 14. The current sensor according to aspect 13, wherein the third connecting conductor and the fourth connecting conductor are mirror versions of the first connecting conductor and the second connecting conductor.

[0693] 15. The current sensor according to aspect 13 or 14, wherein the first measuring coil is coupled to the second measuring coil, and the third measuring coil is coupled to the fourth measuring coil.

[0694] 16. A current sensor according to any one of aspects 13 to 15, wherein the current sensor includes a path through the substrate, and wherein the first measuring coil and the third measuring coil surround the path in a first circumferential direction, and the second measuring coil and the fourth measuring coil surround the path in a second circumferential direction opposite to the first circumferential direction.

[0695] 17. The current sensor according to any one of aspects 13 to 16, wherein the third circuit is the same as the first circuit, and the fourth circuit is the same as the second circuit.

[0696] 18. A connection arrangement for a current sensor implemented on a printed circuit board (PCB), the connection arrangement comprising:

[0697] A first connecting conductor, disposed on a first layer of the substrate, wherein the first connecting conductor is used to couple a current sensor implemented on the PCB to a first circuit; and

[0698] A second connecting conductor, disposed on a second layer of the substrate, is used to couple the PCB-implemented current sensor to a second circuit.

[0699] The first connecting conductor and the second connecting conductor on the first layer are substantially aligned in a plane perpendicular to the surface of the substrate.

[0700] 19. The connection arrangement according to aspect 18, wherein the first connecting conductor is used for coupling to a first measuring coil of the PCB-implemented current sensor, and the second connecting conductor is used for coupling to a second measuring coil of the PCB-implemented current sensor.

[0701] 20. A current sensor, the current sensor comprising:

[0702] A substrate, the substrate comprising a first layer and a second layer;

[0703] A first measuring coil is disposed on the substrate, and the first measuring coil includes a first end;

[0704] A second measuring coil is disposed on the substrate, and the second measuring coil includes a first end;

[0705] A third measuring coil is disposed on the substrate, and the third measuring coil includes a first end;

[0706] A fourth measuring coil is disposed on the substrate, and the fourth measuring coil includes a first end;

[0707] Connection arrangement, the connection arrangement including:

[0708] A first connecting conductor is disposed on the first layer of the substrate, wherein the first end of the first measuring coil is used for coupling to a first circuit via the first connecting conductor; and

[0709] A second connecting conductor is disposed on the second layer of the substrate, wherein the first end of the second measuring coil is used to couple to a second circuit via the second connecting conductor, wherein the first connecting conductor on the first layer and the second connecting conductor on the second layer are substantially aligned in a plane perpendicular to the surface of the substrate;

[0710] A third connecting conductor is disposed on the first layer of the substrate, wherein the first end of the third measuring coil is used for coupling to a first circuit via the third connecting conductor; and

[0711] A fourth connecting conductor is disposed on the second layer of the substrate, wherein the first end of the fourth measuring coil is used to couple to the second circuit via the fourth connecting conductor, wherein the third connecting conductor on the first layer and the fourth connecting conductor on the second layer are substantially aligned in a plane perpendicular to the surface of the substrate.

[0712] 21. The current sensor according to aspect 20, wherein a second end of the first measuring coil is coupled to a second end of the second measuring coil, and a second end of the third measuring coil is coupled to a second end of the fourth measuring coil.

[0713] 22. The current sensor according to aspect 20 or aspect 21, wherein the first measuring coil and the third measuring coil extend around the substrate in a first circumferential direction, and the second measuring coil and the fourth measuring coil extend around the substrate in a second circumferential direction opposite to the first circumferential direction.

Claims

1. A current sensor, the current sensor comprising: A substrate with four layers; The path for the conductor through the substrate; A first measuring coil is disposed on two of the four layers of the substrate and is arranged to extend at least partially around the path; A second measuring coil is disposed on two of the four layers of the substrate and is arranged to extend at least partially around the path; A third measuring coil, coupled to the first measuring coil, extends at least partially around the path in a direction opposite to the first measuring coil, wherein the third measuring coil is disposed on two other layers of the four layers of the substrate that are different from the first measuring coil; as well as A fourth measuring coil, coupled to the second measuring coil, extends at least partially around the path in a direction opposite to the second measuring coil, wherein the fourth measuring coil is disposed on two other layers of the four layers of the substrate that are different from the second measuring coil.

2. The current sensor according to claim 1, wherein: The first measuring coil is disposed on two different layers of the substrate than the second measuring coil.

3. The current sensor according to claim 1, wherein: The first measuring coil and the second measuring coil are disposed on the same two layers of the substrate.

4. The current sensor according to any one of the preceding claims, wherein: The four layers of the substrate include a first layer, a second layer, a third layer, and a fourth layer arranged in sequence.

5. The current sensor according to claim 4, wherein: The first measuring coil is disposed on the first layer and the third layer of the substrate; The second measuring coil is disposed on the second layer and the fourth layer of the substrate; The third measuring coil is disposed on the second and fourth layers of the substrate; and The fourth measuring coil is disposed on the first layer and the third layer of the substrate.

6. The current sensor according to claim 4 or claim 5, wherein: The first measuring coil includes a first plurality of loops; The second measuring coil includes a second plurality of loops; The third measuring coil includes a third plurality of loops; and The fourth measuring coil includes a fourth plurality of loops.

7. The current sensor of claim 6, wherein the corresponding loops of the first plurality of loops, the second plurality of loops, the third plurality of loops, and the fourth plurality of loops are positioned in adjacent radial planes.

8. The current sensor of claim 7, wherein the radial plane is arranged around the path.

9. The current sensor according to any one of claims 6 to 8, wherein the first measuring coil, the second measuring coil, the third measuring coil and the fourth measuring coil are disposed on the substrate such that they form a repeating pattern in the circumferential direction around the path.

10. The current sensor according to any one of claims 6 to 9, wherein the repeating pattern comprises a plurality of pattern units arranged in a repeating manner, wherein each pattern unit of the repeating pattern comprises a loop in the first plurality of loops, a loop in the second plurality of loops, a loop in the third plurality of loops, and a loop in the fourth plurality of loops.

11. The current sensor according to any one of claims 6 to 10, wherein the current sensor comprises: A plurality of measuring conductors disposed on the first layer; A second plurality of measuring conductors are disposed on the second layer; A third plurality of measuring conductors are disposed on the third layer; as well as The fourth plurality of measuring conductors are disposed on the fourth layer. The measuring conductor provides advance in the radial direction between the inner and outer circumferences of the measuring coil.

12. The current sensor according to any one of claims 6 to 11, wherein the current sensor comprises: A plurality of through holes are disposed on the substrate and arranged around the inner circumference of the first measuring coil and the second measuring coil; A second plurality of through holes are disposed on the substrate and arranged around the inner circumference of the third measuring coil and the fourth measuring coil; A third plurality of through holes are disposed on the substrate and arranged around the outer circumference of the first measuring coil and the second measuring coil; as well as A fourth plurality of through holes are disposed on the substrate and arranged around the outer circumference of the third and fourth measuring coils.

13. The current sensor of claim 12, wherein the loop of the first measuring coil is formed by a measuring conductor on one of the four layers of the substrate and a measuring conductor on another of the four layers of the substrate, the measuring conductors being coupled to each other through corresponding vias in the first plurality of vias, and the loop of the first measuring coil being coupled to another loop of the first measuring coil through corresponding vias in the third plurality of vias.

14. The current sensor according to any one of the preceding claims, wherein: The first measuring coil includes a first end and a second end; The second measuring coil includes a first end and a second end; The third measuring coil includes a first end and a second end; and The fourth measuring coil includes a first end and a second end; The second end of the first measuring coil is coupled to the first end of the third measuring coil; The second end of the second measuring coil is coupled to the first end of the fourth measuring coil.

15. The current sensor of claim 14, wherein the second end of the third measuring coil is coupled to the second end of the fourth measuring coil.

16. The current sensor according to claim 14 or 15, wherein at least one of the following is applicable: The first end of the first measuring coil is coupled to the first output terminal; The first end of the second measuring coil is coupled to the second output terminal; and The second end of the third measuring coil and the second end of the fourth measuring coil are coupled to a reference terminal.

17. The current sensor according to any of the preceding claims, wherein the path for the conductor passes through the measuring coil.

18. The current sensor of claim 17, wherein the conductor is used to carry current, and wherein the current sensor is used to measure the current carried by the conductor.

19. A current sensor, the current sensor comprising: A substrate with four layers; The path for the conductor through the substrate; A first measuring coil is disposed on two of the four layers of the substrate and is arranged to extend at least partially around the path; A second measuring coil is disposed on two of the four layers of the substrate and is arranged to extend at least partially around the path; A third measuring coil, coupled to the first measuring coil, is disposed on two of the four layers of the substrate and arranged to extend at least partially around the path; as well as A fourth measuring coil, coupled to the second measuring coil, is disposed on two of the four layers of the substrate and arranged to extend at least partially around the path.

20. A current sensor, the current sensor comprising: A substrate with four layers; The path for the conductor through the substrate; A first measuring coil is disposed on two of the four layers of the substrate; The second measuring coil is disposed on two of the four layers of the substrate; A third measuring coil, coupled to the first measuring coil, is disposed on two of the four layers of the substrate; as well as A fourth measuring coil, coupled to the second measuring coil, is disposed on two of the four layers of the substrate. The first measuring coil, the second measuring coil, the third measuring coil, and the fourth measuring coil are disposed on the substrate such that they form a repeating pattern in the circumferential direction around the path.

21. A current sensor, the current sensor comprising: A four-layer substrate includes a plurality of measuring conductors, a plurality of inner circumferential vias, and a plurality of outer circumferential vias disposed on the four layers of the substrate. The plurality of measuring conductors, the plurality of inner circumferential vias, and the plurality of outer circumferential vias are arranged to form: A first measuring coil, the first measuring coil comprising measuring conductors on each of the four layers; A second measuring coil, the second measuring coil comprising measuring conductors on each of the four layers; A third measuring coil, the third measuring coil comprising measuring conductors on each of the four layers; A fourth measuring coil, the fourth measuring coil comprising measuring conductors on each of the four layers; Each loop of each measuring coil includes a corresponding inner circumferential through-hole among the plurality of inner circumferential through-holes, and Each of the plurality of inner circumferential through holes is located in a unique angular position relative to the other through holes in the plurality of inner circumferential through holes.

22. The current sensor of claim 21, wherein each loop of each measuring coil includes a corresponding one of the plurality of outer circumferential through holes, wherein each of the plurality of outer circumferential through holes is located in a unique angular position relative to the other through holes in the plurality of outer circumferential through holes.

23. The current sensor according to any one of claims 21 to 23, wherein: The first measuring coil includes a first plurality of loops and a fifth plurality of loops; The second measuring coil includes a second plurality of loops and a sixth plurality of loops; The third measuring coil includes a third plurality of loops and a seventh plurality of loops; and The second return coil includes a fourth plurality of loops and an eighth plurality of loops.

24. The current sensor according to claim 23, wherein: The first plurality of loops are disposed on two of the four layers of the substrate, and the fifth plurality of loops are disposed on the other two layers of the four layers of the substrate that are different from the first plurality of loops. The second plurality of loops are disposed on two of the four layers of the substrate, and the sixth plurality of loops are disposed on two other layers of the four layers of the substrate that are different from the second plurality of loops. The third plurality of loops are disposed on two of the four layers of the substrate, and the seventh plurality of loops are disposed on two other layers of the four layers of the substrate that are different from the third plurality of loops. The fourth plurality of loops are disposed on two of the four layers of the substrate, and the eighth plurality of loops are disposed on two other layers of the four layers of the substrate that are different from the fourth plurality of loops.

25. The current sensor according to claim 23 or claim 24, wherein: The first plurality of loops are disposed on the first layer and the fourth layer of the substrate; and The fifth plurality of loops are disposed on the second layer and the third layer of the substrate.

26. The current sensor according to any one of claims 23 to 25, wherein: The second plurality of loops are disposed on the fourth layer and the second layer of the substrate; and The sixth plurality of loops are disposed on the third layer and the first layer of the substrate.

27. The current sensor according to any one of claims 23 to 26, wherein the corresponding loops of the first plurality of loops, the second plurality of loops, the third plurality of loops, the fourth plurality of loops, the fifth plurality of loops, the sixth plurality of loops, the seventh plurality of loops, and the eighth plurality of loops are positioned in adjacent radial planes.

28. The current sensor of claim 27, wherein the first measuring coil, the second measuring coil, the third measuring coil and the fourth measuring coil are disposed on the substrate such that they form a repeating pattern in the circumferential direction around the path.

29. The current sensor of claim 27 or claim 28, wherein the repeating pattern comprises a plurality of pattern units arranged in a repeating manner, wherein each pattern unit of the repeating pattern comprises a loop in the first plurality of loops, a loop in the second plurality of loops, a loop in the third plurality of loops, a loop in the fourth plurality of loops, a loop in the fifth plurality of loops, a loop in the sixth plurality of loops, a loop in the seventh plurality of loops, and a loop in the eighth plurality of loops.

30. The current sensor according to any one of claims 23 to 29, wherein the loop of the measuring coil is arranged on the substrate in a repeating pattern in the following order: The loop in the first plurality of loops; The fourth plurality of loops; The loop in the second plurality of loops; The loop in the third plurality of loops; The loop in the fifth plurality of loops; The loop in the eighth plurality of loops; The sixth loop in the plurality of loops; as well as The seventh loop is one of the loops.

31. The current sensor according to any one of claims 21 to 30, wherein the current sensor comprises: A plurality of measuring conductors disposed on the first layer; A second plurality of measuring conductors are disposed on the second layer; A third plurality of measuring conductors are disposed on the third layer; as well as The fourth plurality of measuring conductors are disposed on the fourth layer. The measuring conductor provides advance in the radial direction between the inner and outer circumferences of the measuring coil.

32. The current sensor according to claim 31: The plurality of inner circumferential through holes include a first plurality of through holes arranged around the inner circumference of the first measuring coil and the second measuring coil; The plurality of inner circumferential through holes includes a second plurality of through holes arranged around the inner circumference of the third measuring coil and the fourth measuring coil; The plurality of outer circumferential through holes includes a third plurality of through holes arranged around the outer circumference of the first measuring coil and the second measuring coil; and The plurality of outer circumferential through holes includes a fourth plurality of through holes arranged around the outer circumference of the third measuring coil and the fourth measuring coil.

33. The current sensor according to claim 32, The loop of the first measuring coil is formed by a measuring conductor on one of the four layers of the substrate and a measuring conductor on another of the four layers of the substrate. The measuring conductors are coupled to each other through corresponding vias in the first plurality of vias, and the loop of the first measuring coil is coupled to another loop of the first measuring coil through corresponding vias in the third plurality of vias.

34. The current sensor according to any one of claims 21 to 33, wherein: The first measuring coil includes a first end and a second end; The second measuring coil includes a first end and a second end; The third measuring coil includes a first end and a second end; The fourth measuring coil includes a first end and a second end; The second end of the first measuring coil is coupled to the first end of the third measuring coil; The second end of the second measuring coil is coupled to the first end of the fourth measuring coil.

35. The current sensor of claim 34, wherein the second end of the third measuring coil is coupled to the second end of the fourth measuring coil.

36. The current sensor according to claim 34 or 35, wherein at least one of the following is applicable: The first end of the first measuring coil is coupled to the first output terminal; The first end of the second measuring coil is coupled to the second output terminal; and The second end of the third measuring coil and the second end of the fourth measuring coil are coupled to a reference terminal.

37. The current sensor according to any one of claims 21 to 36, wherein the current sensor further comprises a path for a conductor passing through the substrate, the path passing through the measuring coil.

38. The current sensor of claim 37, wherein the path for the conductor passes through the measuring coil.

39. A current sensor, the current sensor comprising: A substrate with four layers; A first measuring coil is disposed on the four layers of the substrate; A second measuring coil is disposed on the four layers of the substrate; A third measuring coil is disposed on the fourth layer of the substrate; The fourth measuring coil is disposed on the fourth layer of the substrate. The majority of the corresponding loop of each measuring coil is located in a unique angular position relative to the majority of the loops of the first measuring coil, the second measuring coil, the third measuring coil, and the fourth measuring coil.

40. A current sensor, the current sensor comprising: A substrate with four layers; A first measuring coil is disposed on the four layers of the substrate; A second measuring coil is disposed on the four layers of the substrate; A third measuring coil is disposed on the fourth layer of the substrate; The fourth measuring coil is disposed on the fourth layer of the substrate. The first measuring coil, the second measuring coil, the third measuring coil, and the fourth measuring coil are disposed on the substrate such that they form a repeating pattern in the circumferential direction around the path.

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